JP2002014143A - Inspection system for electronic circuit board, and recording medium recording progem for the inspection - Google Patents

Abstract

PROBLEM TO BE SOLVED: To easily automate inspection of electronic circuit boards of many kinds and small lot multi-production, at low cost using a common inspection system. SOLUTION: Image data, outputted from an image memory 1g of the circuit board 1 to be tested as the electronic circuit board, are fetched in a FIFO memory 2a of an inspection device 2 by one screen. The image data, read from the FIFO memory 2a, are compared with the image data stored in the image memory 1g per pixel, according to the inspection program loaded into a main memory 1d from a memory card 13 by the transfer program of an ROM 2d. If both data do not agree as a result of comparison, the inspection is stopped. Consequently, abnormality of the data outputted from the circuit board 1 to be tested can be confirmed by operation fault of a display control circuit 1f for automatically judging that the circuit board 1 to be tested is a defective product. The inspection program can be easily changed by supplying it by the memory card 13.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection system and an inspection system for determining whether or not the operation of an electronic circuit board is normal based on an output from the electronic circuit board or an input to the electronic circuit board. And a recording medium on which a program for recording is recorded.

[0002]

2. Description of the Related Art Generally, an electronic apparatus incorporates an electronic circuit board on which a semiconductor device and various electronic circuits are mounted. In manufacturing an electronic device, it is necessary to check whether the electronic circuit board operates normally before assembling the electronic circuit board to a housing of the electronic device in order to ensure normal operation of the electronic device.

When the same kind of electronic circuit board is produced in a relatively large quantity, the inspection time is shortened and the inspection cost can be reduced by automatically performing the inspection using a dedicated inspection device or the like. . However, when there are many types and small numbers of electronic circuit boards, there is a disadvantage that preparing a dedicated inspection apparatus for each electronic circuit board rather causes an increase in inspection cost. For this reason, when inspecting a large variety and a small amount of electronic circuit boards, the inspection is often performed manually.

For example, an electronic circuit board for display processing used in an electronic device having an image display function such as a program display has a CPU, an image memory, a display control circuit, and the like. For such a display processing substrate, an inspection of a display function such as whether or not a signal of a predetermined pattern image is correctly output from the electronic circuit substrate is performed.
In the inspection, specifically, LC
By connecting a display device such as D, the inspector determines whether or not the data of the pattern image output from the display processing substrate is correctly displayed on the LCD by looking at the pattern image displayed on the LCD. . Also, when inspecting a display processing substrate having a drawing function, the inspector also determines whether or not the designated graphic is correctly drawn at a specified position by visually observing the LCD screen.

[0005]

In the case of the above-mentioned display processing substrate, the suitability of a predetermined pattern image can be relatively easily judged by human eyes. In the case where the display position is slightly shifted, such as several dots, it is difficult for human eyes to recognize the display position. Also, when performing inspection on a plurality of items for one board, the displayed inspection screen is automatically switched in sequence, so that even if a defect is determined for a certain item, the inspection is performed during the subsequent inspection. In addition, there is a possibility that the inspector may forget the defective inspection item. As described above, the inspection by a human has a disadvantage that the accuracy of the inspection is reduced and the quality of the substrate is reduced.

The electronic circuit board is not limited to the above-described display processing board, but may also be a one-way board such as an output board for voice processing or voltage output, or an input board for handling a key input signal of a keyboard. For boards that handle signals,
There are also the disadvantages described above. Moreover, since the input and output timings of such signals are usually arbitrary, it is difficult to perform inspection at a predetermined timing for automation of inspection.

SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and it is an object of the present invention to easily and inexpensively automate the inspection using a common inspection system even when inspecting a large variety of small circuit boards. The purpose is.

[0008]

SUMMARY OF THE INVENTION An electronic circuit board inspection system according to the present invention operates on an electronic circuit board having output data generating means for generating output data and a data output path for outputting the output data to the outside. A memory system for temporarily storing output data output from the output data generating unit via the data output path, in order to solve the above problem, A comparison means for comparing the output data stored in the memory means with the output data generated by the output data generation means is provided.

In the above configuration, when the output data generated by the output data generating means on the electronic circuit board to be inspected is output via the data output path, the output data is stored in the memory means. Then, the output data stored in the memory means and the output data generated by the output data generating means are compared by the comparing means. As a result of the comparison,
If the two output data match, it is confirmed that the output data has been correctly output from the output path, that is, that the electronic circuit board is non-defective. If the two output data do not match, it is confirmed that the output data was not correctly output from the output path, that is, that the electronic circuit board is defective.

Another inspection system for an electronic circuit board according to the present invention controls the operation of an electronic circuit board having a data input path for receiving input data from the outside and a memory means for temporarily storing input data passing through the input path. An inspection system for an electronic circuit board to be inspected, wherein in order to solve the above-described problem, an input data generating unit that generates input data to be input to the electronic circuit board, and a data input path from the input data generating unit. And a comparing means for comparing the input data stored in the memory means with the input data generated by the input data generating means.

In the above configuration, when the input data generated by the data generating means is input via the data input path in the electronic circuit board to be inspected, the input data is stored in the memory means. Then, the input data stored in the memory means and the input data generated by the input data generating means are compared by the comparing means. As a result of the comparison, when the two input data match, it is confirmed that the input data has been correctly input from the input path, that is, that the electronic circuit board is non-defective. If the two input data do not match, it is confirmed that the input data was not correctly input from the input path, that is, that the electronic circuit board is defective.

In any of the above inspection systems,
It is preferable that the comparing means stop the inspection when the comparison means determines that the two data do not match. With this configuration, when both data do not match, that is, when it is confirmed that the electronic circuit board is defective, the inspection does not proceed further even if the inspection items remain, so that the inspection time is reduced. Be shortened.

In any of the above inspection systems,
It is preferable to include a reading unit that reads the inspection program from a removable recording medium that stores a program for executing the comparison process by the comparing unit. By providing such a reading means, if the recording medium is changed, the program is changed. Therefore, by preparing a program corresponding to the type of electronic circuit board, it is possible to inspect various types of electronic circuit boards with the same inspection system. can do.

In any of the above inspection systems,
It is preferable that the comparing means is an arithmetic processing device provided on the electronic circuit board. Depending on the electronic circuit board, C
In some cases, an arithmetic processing device such as a PU is mounted. In such an electronic circuit board, the use of the arithmetic processing device as the comparing means for performing the comparison processing eliminates the need for separately providing a comparing means.

A recording medium on which a program for inspecting an electronic circuit board of the present invention is recorded has an output circuit for generating output data and a data output path for outputting the output data to the outside. A computer-readable recording medium recording a program for inspecting the operation of the above, in order to solve the above problems, the program was output from the output data generating means via the data output path A storage process for temporarily storing output data in a memory unit and a comparison process for comparing the output data stored in the memory unit with the output data generated by the output data generating unit are performed. .

In the above program, when the output data generated by the output data generating means on the electronic circuit board to be inspected is output via the data output path, the output data is stored in the memory means by the storage processing. Then, the output data stored in the memory means and the output data generated by the output data generating means are compared by a comparison process. As a result of the comparison, when the two output data match, the output data is correctly output from the output path, and it is confirmed that the electronic circuit board is non-defective. If the two output data do not match, the output data is not correctly output from the output path, and it is confirmed that the electronic circuit board is defective.

According to another aspect of the present invention, there is provided a recording medium storing a program for inspecting an electronic circuit board, comprising: a data input path for receiving input data from outside; and a memory means for temporarily storing input data passing through the input path. And a computer-readable recording medium recording a program for inspecting the operation of the electronic circuit board having the above, in order to solve the above problems, the program, input data to be input to the electronic circuit board It is characterized by executing a generation process that occurs and a comparison process that compares input data stored in the memory means via the data input path with input data generated in the generation process.

According to the above program, when the input data generated in the data generation processing is input via the data input path in the electronic circuit board to be inspected, the input data is stored in the memory means. Then, the input data stored in the memory means and the input data generated in the input data generation processing are compared by a comparison processing. As a result of the comparison, if the two input data match, the input data is correctly input from the input path, and it is confirmed that the electronic circuit board is non-defective. Also, if both input data do not match,
Input data is not correctly input from the input path, and it is confirmed that the electronic circuit board is defective.

In any of the recording media described above, it is preferable that the comparison process stops the inspection if the comparison results in a mismatch between the two data. Thus, when the two data are inconsistent and the electronic circuit board is confirmed to be defective, the inspection does not proceed any further even if the inspection items remain, thereby shortening the inspection time.

[0020]

DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIGS.

As shown in FIG. 1, the inspection system for an electronic circuit board according to the present embodiment is a system for inspecting a substrate 1 to be inspected as an electronic circuit board.
And an external bus 3.

The substrate 1 to be inspected includes a CPU 1a, a mask RO
M1b, FEPROM (Flash Erasable and Programmab
le ROM) 1c, a main memory 1d, an I / O 1e, a display control circuit 1f, an image memory 1g, and an internal bus 1h. The substrate 1 to be inspected is, for example, a substrate for display processing provided in an electronic device having a display function such as a programmable display.

The CPU 1a, which is an arithmetic processing unit, has an FEP
According to a display processing program stored in the ROM 1c, the display control circuit 1f, the image memory 1g, and the like are controlled to execute display processing, and to control reading and writing of various memories described later. Further, the CPU 1a as a comparing unit executes an inspection program including a process of comparing two image data described later.

The mask ROM 1b stores fixed programs such as memory control and fixed data such as font data.

The FEPROM 1c is a rewritable read-only flash memory, and stores, for example, the above-mentioned display processing program and the like. Inspection substrate 1
Is a display processing board incorporated in a programmable display, the FEPROM 1c has an area for storing a display control system program (display processing program), a communication protocol, and data of a user screen, respectively.

The display control system program is a program for realizing basic functions for performing image display control. The communication protocol is a protocol used in communication processing with a PLC (programmable logic controller) connected to the programmable display.
It is uniquely determined according to the model (maker) of C. The user screen is created on a personal computer or the like by drawing software and downloaded to the FEPROM 1c. This user screen is created by combining imaged basic parts such as touch switches, lamps, various display units, characters and figures on a base screen to be displayed on an LCD (liquid crystal display) 12 described later. Screen.

The main memory 1d is constituted by a DRAM or the like, and is mainly used for operations during arithmetic processing such as display control, and is also used for temporary storage of programs and data loaded from each memory. .

The I / O 1e is a part for inputting and outputting data between the substrate 1 to be inspected and external peripheral devices. This I /
O1e includes an input / output circuit and the like, and inputs and outputs data to and from a driver (not shown) that reads and writes data from and to the memory card 11. The memory card 11 is a flash memory, and is preferably a small and detachable type such as a compact flash (registered trademark). The memory card 11 is used not only as a storage medium for storing the above-mentioned user screen when downloading the user screen from a personal computer, but also for storing a display control system program to be upgraded.

The display control circuit 1f converts the image data stored in the image memory 1g according to a command from the CPU 1a into an LCD.
12 is a circuit for performing control for displaying on the substrate 12, and serves as an output path in the substrate 1 to be inspected. The display control circuit 1f outputs image data at a predetermined timing suitable for scanning in display on the LCD 12. For this reason, the display control circuit 1f generates a read address based on a horizontal synchronizing signal, a vertical synchronizing signal, a pixel clock corresponding to one clock for one pixel, etc., and provides the read address to the image memory 1g. The read address is set one by one for each pixel of each line of the image. The display control circuit 1f has a data input / output circuit 1i. The data input / output circuit 1i connects the data input / output terminal of the image memory 1g to the internal bus 1h when writing image data to the image memory 1g, and connects the data input / output terminal to the internal bus 1h when reading image data from the image memory 1g.
Connect to the output line to D12.

The image memory 1g is a semiconductor memory (such as a video RAM) for storing image data in pixel units. The image memory 1g is loaded from the FEPROM 1c or the memory card 11 into the main memory 1d, and sequentially stores the image data read from the main memory 1d for display. The image memory 1g has a function as output data generating means for generating image data as output data on the substrate 1 to be inspected. The image memory 1
g stores image data of a plurality of different images in different areas, and reads out image data at a designated read address.

The internal bus 1h is a bus including a data bus, an address bus, and a control bus necessary for exchanging programs and data between the CPU 1a and the above-described units.

The inspection device 2 has a FIFO (First In First
out) memory (FIFO in the figure) 2a, memory card driver 2b, interface unit (I / F in the figure) 2c,
A ROM 2d and an internal bus 2e are provided. The inspection device 2 may be configured in any form as long as it has these components. For example, a configuration in which these components are arranged on a substrate may be considered.

The FIFO memory 2a as storage means
The buffer memory is a buffer memory that reads out the image data output from the display control circuit 1f in the order of writing, and can store (store) at least one screen of image data. The timing of writing and reading of the FIFO memory 2a is controlled by the CPU 1a.

Memory card driver 2 as reading means
b denotes a driver that reads an inspection program and data recorded on the memory card 13. The memory card 13 as a recording medium is a flash memory similar to the memory card 11 and stores an inspection program and data for inspection corresponding to the substrate 1 to be inspected.

The interface unit 2c includes an input circuit for controlling the input of a test program and data read by the memory card driver 2b. ROM2d
Stores a transfer program for loading the inspection program and data into the main memory 1d.

The internal bus 2e is connected to the CPU 1a and the inspection device 2
And a bus including a data bus, an address bus, and a control bus necessary for exchanging programs and data with the above-described units.

The external bus 3 is a bus directly connecting the internal buses 1h and 2e, and is composed of a bus cable, a connector and the like. The connection to the external bus 3 on the board 1 to be inspected is performed by the board 1 to be inspected when the board 1 has an expansion slot. This eliminates the need to separately provide an interface for connecting the external bus 3 to the substrate 1 to be inspected. Further, by connecting the substrate 1 to be inspected and the inspection device 2 with the external bus 3, the CPU 1a and the RO
M2d is the internal bus 1h, the external bus 3 and the internal bus 2
Since the connection is directly made via the e, the data transfer speed between them is not reduced as compared with a connection structure in which a general-purpose interface (such as I / O) is interposed therebetween.

When the inspection apparatus 2 is composed of a substrate as described above, the card edge of the substrate is
The board 1 to be inspected and the inspection apparatus 2 are connected by inserting them into the expansion slots (card edge connectors) of the above. If such a connection structure is adopted, the external bus 3
The external bus 3 can be omitted by providing the function of (1).

The operation of the inspection system configured as described above at the time of inspection will be described.

First, the memory control program stored in the mask ROM 1b is executed by the CPU 1a, whereby the transfer program of the ROM 2d in the inspection apparatus 2 is read and loaded into the main memory 1d. When the transfer program is executed by the CPU 1a,
The inspection program stored in the memory card 13 is loaded into the main memory 1d. Also, image memory 1g
Is written with various image data for inspection display included in the inspection program.

Next, the inspection procedure by the above inspection program will be described with reference to the flowchart of FIG.

First, it is checked whether or not the CPU 1a can correctly perform a write operation (read) and a read operation (write) on the image memory 1g (S1). At this time, the buses including the external bus 3 as well as the internal bus 1h are checked. As a result of the read / write check, it is determined whether or not the read / write operation was correctly performed (S2). If the read / write operation was not performed correctly, the inspection is stopped because the substrate 1 to be inspected is defective (S1).
1) While the inspection of the substrate to be inspected 1 is completed, if the inspection is completed correctly, it is checked whether image data is correctly stored in a predetermined area of the image memory 1g (S3). As a result of this check, it is determined whether or not the image data is correctly stored (S4). If the image data is not correctly stored, the inspection is stopped because the inspected substrate 1 is defective (S11). ), The substrate 1 to be inspected
The inspection for is ended.

If the data is stored correctly in S4, the CPU 1a instructs the display control circuit 1f to display image data to be inspected such as a predetermined display pattern stored in the image memory 1g (S5). . Then
The display control circuit 1f operates the image memory 1 based on the instruction.
The image data read from g is output to the LCD 12 (S6). When the LCD 12 receives the image data,
The image of the image data is displayed.

Further, the image data output from the display control circuit 1f is fetched into the FIFO memory 2a of the inspection apparatus 2 (S7), and the image data fetched into the FIFO memory 2a and the image data stored in the image memory 1g are compared. The comparison is performed on a pixel basis (S8). In the comparison of the image data, a frame, a color, blinking, a window, painting of a figure, or the like is used as an image to be compared. Each of these comparisons is processed in a single routine.

As a result of the comparison, it is determined whether or not the two image data match for one screen (S9). Here, if they match, it indicates that the inspected substrate 1 is a non-defective product, and it is determined whether or not the next screen is to be inspected (S10). While the process proceeds to S5, if the inspection is not performed, the inspection for the substrate 1 to be inspected ends.

If both image data do not match for one screen in S9, it is indicated that the substrate 1 to be inspected is defective, and the inspection is immediately stopped (S11).
The inspection for the inspection target substrate 1 is completed.

As described above, in the above inspection procedure, the inspection is terminated when the defect of the inspected substrate 1 is determined each time each inspection step is performed. You will not be forced to proceed or forget to judge the defect. Thereby, inspection efficiency and accuracy can be improved.

Next, the comparison of the image data executed in S8 will be described in detail.

When one screen of image data is stored in the FIFO memory 2a and written into all the registers of the FIFO memory 2a, a high-level signal (output permission signal) is output. When the output permission signal is input as the interrupt request signal, the CPU 1a reads the image data stored in the FIFO memory 2a from the head pixel data. At the same time, the CPU 1a reads the image data from the image memory 1g based on the read address generated by the display control circuit 1f. As a result, the pixel data for the same pixel is read from the FIFO memory 2a and the image memory 1g. At this time, since the data input / output circuit 1i has been switched to the internal bus 1h, the image data from the image memory 1g is taken into the CPU 1a via the internal bus 1h.

The CPU 1a compares the two image data on a pixel-by-pixel basis to determine whether the two image data match. At this time, by comparing the two image data, it is possible to determine not only the position of the pixel but also the match / mismatch of the color and the gradation.

When a certain image is to be displayed in an arbitrary window area, the CPU 1a instructs reading of image data in the window area, and the display control circuit 1f specifies a read address to partially display the image data. Image data is read and output. For the area other than the window area, the image data of the background image is read from the image memory 1g. The image data of the composite image (composite of the background image and the window image) stored in the FIFO memory 2a is read by a command from the CPU 1a,
The image data is compared with the image data read based on the read address.

When different images are displayed in a plurality of windows, the image data of each screen is stored in the image memory 1g.
Are read from the image data of the window designated by the CPU 1a. In the portion where the windows overlap, first, the image data of the window located below is output, but the image data of the portion where other images overlap thereover is not output. In this case, when image data of different windows exists on the same line, the image data corresponding to the window and the image data of the background image are read out in the order of display. FI
The image data of the composite image (composite of the background image and the multiple window images) stored in the FO memory 2a is
The image data is read out according to the instruction a, and is compared with each image data read out from the image memory 1g based on the above read address.

As described above, when the images of a plurality of windows are displayed in an overlapping manner, the images may not be displayed correctly in the overlapping portion due to a defect of the display control circuit 1f or the like. With respect to such a defect, the inspection system can easily determine the defect of the inspected substrate 1 by comparing the two image data. Therefore, the present inspection system is suitable for the inspection of the inspection target substrate 1 having such a display function.

As described above, this inspection system is read from the image memory 1g and output from the substrate 1 to be inspected based on the inspection program loaded from the memory card 13 by the transfer program in the ROM 2d of the inspection apparatus 2. The read image data is fetched into the FIFO memory 2a of the inspection apparatus 2, and the image data is compared with the image data read from the image memory 1g. It is configured as follows. The inspection program is stored in a removable memory card 13 and is replaceable.

Thus, for example, when inspecting multiple types of inspected substrates 1, when the type is changed, the memory card 1
By loading the inspection program for the inspected substrate 1 into the inspected substrate 1 by replacing the inspecting device 3 with the same inspecting device 2 without changing the inspecting device 2 according to the type. The inspected substrate 1 can be inspected. Therefore, the inspection can be automated using a single inspection apparatus 2 even for a large number of kinds and a small number of substrates to be inspected 1, and the inspection system can be simply configured. In addition, by realizing the inspection automation as described above, it is possible to prevent erroneous inspections that have occurred in the inspection by a person, and to improve the non-defective rate of the substrate,
At the same time, by shortening the inspection time, it becomes possible to reduce the manufacturing cost of the substrate.

In this inspection system, the CPU 1a, the mask ROM 1b, the main memory 1
d, the display control circuit 1f, the image memory 1g, and the internal bus 1h are used as a part of the inspection system. Thereby, the configuration of the inspection device 2 can be simplified.

Here, the above-mentioned multiple types means that there are many types of substrates of the same type (same application) but functionally different, such as substrates for display processing, etc. Does not mean varieties between. Therefore, for example, when inspecting a substrate for display processing and a substrate for audio processing, it is necessary to use different inspection apparatuses.

In this embodiment, an example has been described in which the substrate 1 to be inspected is a substrate for display processing. However, the substrate 1 to be inspected is not limited to such a substrate, and data (signals) can be transmitted unilaterally. To be inspected, or the substrate 1 to which data (signal) is unilaterally input from outside.

For example, as shown in FIG. 3, the substrate to be inspected 4 for outputting an audio signal includes the CPU 1a and the mask RO.
CPU 4 having substantially the same functions as M1b, FEPROM 1c, main memory 1d, and internal bus 1h, respectively.
a, a mask ROM 4b, a FEPROM 4c, a main memory 4d, and an internal bus 4e. The substrate 4 to be inspected includes a D / A converter (D / A in the figure) 4f, an amplifier 4g, and a speaker 4h. The board 4 to be inspected is an electronic circuit board that generates a constant frequency buzzer sound by the speaker 4h. Further, in the substrate 4 to be inspected, the D / A converter 4f, the amplifier 4g, and the speaker 4h
Constitutes an output path.

On the other hand, an inspection apparatus 5 for inspecting the substrate 4 to be inspected has a FIFO memory 2a, a memory card driver 2b, an interface 2c, a ROM 2d, and a FIFO having substantially the same functions as those of the internal bus 2e.
It includes a memory 5a, a memory card driver 5b, an interface unit (I / F in the figure) 5c, a ROM 5d, and an internal bus 5e. In addition, the inspection device 5 includes a microphone 5
f, frequency converter 5g, frequency / voltage converter (in the figure, F
/ V) 5h and an A / D converter (A / D in the figure) 5i. The internal bus 5e is connected to the internal bus 4e of the board 4 to be inspected via the external bus 3 described above.

In the inspection system configured as described above, the inspection program is loaded from the memory card 13 to the main memory 4d functioning as output data generation means on the substrate 4 to be inspected by the transfer program in the ROM 5d. The inspection program includes audio data and frequency data. Audio data for a predetermined period is
The signal is converted into an analog audio signal by the D / A converter 4f and reproduced by the speaker 4h.

On the other hand, in the inspection device 5, the microphone 5f arranged opposite to the speaker 4h receives the reproduced sound of the speaker 4h and outputs an audio signal. This audio signal is converted to a frequency signal (for example, FM signal) by the frequency converter 5g, and the frequency signal is further converted to a voltage corresponding to the frequency by the frequency / voltage converter 5h. This voltage is converted into digital data by the A / D converter 5i, and is sequentially stored as frequency data in the FIFO memory 5a.

This frequency data is read from the FIFO memory 5a by the CPU 4a, and is sequentially compared with the frequency data read from the main memory 4d at the same time. As a result of the comparison, if the two frequency data match, the board under test 4 is determined to be a non-defective product capable of reproducing the buzzer sound at the specified frequency. It is determined that the product cannot reproduce the buzzer sound at the specified frequency. This allows, for example,
Solvent for cleaning the substrate 4 to be inspected enters the inside of the loudspeaker 4h and the diaphragm of the loudspeaker 4h is deteriorated, so that the substrate 4 to be inspected whose output frequency is deviated from a prescribed frequency is easily determined to be defective. be able to.

In an inspection by a person, it is difficult to distinguish a subtle change in the frequency of the sound output from the speaker 4h. It is also conceivable to separately provide an inspection device having a microphone, a frequency converter, and the like, and determine whether the substrate 4 to be inspected is good or not by comparing the detected frequency with a prescribed frequency by a person. Inspection efficiency is low. On the other hand, according to the inspection system as described above, the inspection is automated by the inspection program,
Inspection efficiency is improved.

However, in this inspection system, since analog signals are handled, even if the substrate 4 to be inspected reproduces a buzzer sound at a prescribed frequency, the two frequency data may not completely match due to the influence of noise or the like. Therefore, it is preferable to set the frequency data serving as a reference for comparison to a value within a predetermined range, and design the inspection program such that if the frequency data to be inspected is a value within the range, it is regarded as a non-defective product.

As another inspection system, an LCD is used.
An inspection system in which the backlight inverter substrate described above is used as an electronic circuit substrate to be inspected. In this inspection system, although not shown, some inspection voltages are prepared as voltage data in an inspection program in a voltage range for adjusting the brightness of the backlight, and the voltages are provided in a preceding stage of the inverter circuit. D for voltage adjustment
Input to C / DC converter. The output voltage of the DC / DC converter is taken into an inspection device, converted into digital voltage data by an A / D converter, and sequentially written to a FIFO memory. Then, the quality of the board is determined by comparing the voltage data with the voltage data stored in the memory in advance.

In this inspection system, it is possible to automatically determine whether or not the voltage applied to the inverter circuit is output from the DC / DC converter as the specified voltage. 2. Description of the Related Art Conventionally, in order to inspect a voltage applied to an inverter circuit, for example, a voltage detection circuit is provided on an inverter board, and a person compares a voltage detected by the voltage detection circuit with a specified voltage. On the other hand, if the present inspection system is used, the output voltage of the DC / DC converter is taken out as it is and used for the inspection as described above, so that there is no need to provide a voltage detection circuit in the inverter circuit.

It should be noted that, in the present inspection system, since the inverter substrate generally does not have a CPU or various memories as in the above-described substrate to be inspected 1, these are provided in the inspection apparatus. Therefore, between the inverter board and the inspection device, not the external bus 3 described above, but a connection line for inputting the inspection voltage from the inspection device to the inverter substrate and the output voltage from the inverter substrate to the inspection device. Connection line for connection.

Further, as a data input type electronic circuit board, there is a computer board including a keyboard interface. As shown in FIG.
Are a CPU 6a, a mask ROM 6b, and a main memory 6 having substantially the same functions as those of the CPU 1a, the mask ROM 1b, the main memory 1c, and the internal bus 1d, respectively.
c and an internal bus 6d. The substrate 6 to be inspected includes a buffer 6e and an input port 6f as an input path. Buffer 6e as memory means
Is composed of, for example, a FIFO memory, and adjusts data transfer between the system side and the keyboard side where the timing of the system clock and the keyboard clock are asynchronous. The board to be inspected 6 is a board that temporarily stores (stores) key data input from the keyboard 14 in the buffer 6e via the input port 6f and sends out the key data to the internal bus 6d.

On the other hand, the inspection device 7 for inspecting the substrate 6 to be inspected includes a memory card driver 7a, an interface unit 7b having substantially the same functions as those of the memory card driver 2b, the interface unit 2c, the ROM 2d, and the internal bus 2e. , ROM 7c and internal bus 7d
It has. In addition, the inspection device 7 includes a switch matrix 7e.

The switch matrix 7e, unlike the switch matrix provided on the keyboard, includes a switching element for turning on each contact of the matrix, and is a pseudo-switch for turning on the contacts based on a command given by the inspection program. Functions as a keyboard.
The switch matrix 7e functions as input data generation means for generating input data in the inspection device 7.

The internal bus 7d is connected to the external bus 3 described above.
Is connected to the internal bus 6d of the substrate 6 to be inspected.

In the inspection system configured as described above, the inspection program is loaded from the memory card 13 to the main memory 6c by the transfer program of the ROM 7c. The inspection program includes key data and contact data corresponding to the key data. Contact data on the contact to be inspected is supplied from the main memory 6c to the switch matrix 7e of the inspection device 7 via the internal bus 6d, the external bus 3 and the internal bus 7d. In the switch matrix 7e, the contact corresponding to the contact data is turned on by the switching element. This allows O
The key data of the N-contact is output from the switch matrix 7e.

On the other hand, on the substrate 6 to be inspected, the key data from the inspection device 7 is stored in the buffer 6e through the input port 6f. The key data is read from the buffer 6e by the CPU 6a, and is simultaneously compared with the key data read from the main memory 6c. As a result of the comparison, if the two key data match, the key data is determined to be a non-defective product that can be correctly input through the keyboard interface, while if the two key data do not match, the key data is determined to be a defective product that the key data cannot be correctly input. Is done.

Here, the processing procedure of the inspection by the above inspection program will be described with reference to the flowchart of FIG.

First, contact data is supplied from the main memory 6c to the switch matrix 7e (S21), and the designated contact in the switch matrix 7e is turned on (S22). The key data generated thereby is temporarily fetched into the buffer 6e of the substrate 6 to be inspected (S23), and the key data read therefrom is compared with the key data read from the main memory 6c (S24). The comparison of the key data for each key to be inspected is processed by one routine.

As a result of the comparison, it is determined whether or not the key data of one key matches (S25). Here, if they match, it indicates that the inspected substrate 6 is a non-defective product, and it is determined whether or not the next key is to be inspected (S26). If the next key is to be inspected, While the processing shifts to S21, when the inspection is not performed, the inspection on the inspected substrate 6 is ended.

If the key data does not match for one key in S25, it is indicated that the inspected substrate 6 is defective, and the inspection is immediately stopped (S2).
7), the inspection of the inspection target substrate 6 is completed.

In a conventional inspection by a person, the CPU 6a sends the result of pressing a key of the keyboard 14 to the inspector using some means while the keyboard 14 is actually connected to the board 6 to be inspected. By notifying, it checks whether the key input can be performed correctly. In such an inspection, not only is there a possibility that a key may be depressed by an inspector, but also the inspection is time-consuming due to manual operation. On the other hand, in the above-described inspection system, the inspection is automated, so that the inspection can be performed in a short time without error.

The electronic circuit board of the data input type may be a board provided with not only an input from a keyboard but also an interface of another input device such as a mouse.

[0081]

As described above, the electronic circuit board inspection system according to the present invention provides an electronic circuit board having an output data generating means for generating output data and a data output path for outputting the output data to the outside. Memory means for temporarily storing output data output from the output data generation means via the data output path, for inspecting operation;
A configuration is provided that includes a comparison unit that compares the output data stored in the memory unit with the output data generated by the output data generation unit.

As a result of the comparison, if the two output data match, it is confirmed that the electronic circuit board is good. If the two output data do not match, the electronic circuit board is defective. Is confirmed. Therefore,
Since inspection of electronic circuit boards without manual operation is realized,
There is an effect that the inspection can be easily automated.

Another inspection system for an electronic circuit board according to the present invention relates to an operation of an electronic circuit board having a data input path for receiving input data from the outside and a memory means for temporarily storing input data passed through the input path. Input data generating means for generating input data to be input to the electronic circuit board for inspection; input data stored in the memory means via the data input path from the input data generating means; and the input data generating means And a comparing means for comparing the input data generated in the step (c) with the input data.

As a result of the comparison, when the two input data match, it is confirmed that the electronic circuit board is good. On the other hand, when the two input data do not match, that is, the electronic circuit board is defective. It is confirmed that. Therefore, since the inspection of the electronic circuit board without manual operation is realized, there is an effect that the inspection can be easily automated.

In any of the above inspection systems,
When the comparison means determines that the two data do not match by comparing, the inspection is stopped. When the two data do not match, that is, when it is confirmed that the electronic circuit board is defective, the inspection item remains. Inspection does not proceed any further even if it is, so the inspection time is shortened. Therefore, there is an effect that a more efficient inspection can be performed.

In each of the above inspection systems,
By providing the reading means for reading the inspection program from a removable recording medium storing a program for executing the comparing process by the comparing means, the program is changed by changing the recording medium. Therefore, by preparing a program corresponding to the type of electronic circuit board, it is possible to inspect many types of electronic circuit boards with the same inspection system. Therefore, there is an effect that the inspection system can be simplified.

In any of the above inspection systems,
Since the comparison means is an arithmetic processing unit provided on the electronic circuit board, the electronic circuit board on which the arithmetic processing unit such as a CPU is mounted performs the comparison processing by using the arithmetic processing unit, thereby making the comparison. There is no need to provide a separate means. Therefore, there is an effect that the inspection system can be further simplified.

A recording medium on which a program for inspecting an electronic circuit board according to the present invention is recorded has an output circuit for generating output data and a data output path for outputting the output data to the outside. In order to check the operation of the above, the program is configured to temporarily store in the memory means output data output from the output data generating means via the data output path, and to store the output data in the memory means. And performing a comparison process of comparing the output data with the output data generated by the output data generating means.

A recording medium on which another program for testing an electronic circuit board according to the present invention is recorded is a data input path for receiving input data from outside, and a memory means for temporarily storing input data passed through the input path. In order to inspect the operation of the electronic circuit board having the above, the program generates input data to be input to the electronic circuit board, and input data stored in the memory means via the data input path. And a comparison process for comparing the input data generated in the generation process.

With any of the above-mentioned recording media, the pass / fail of the electronic circuit board is confirmed based on whether or not both output data match as a result of the comparison. Therefore, since the inspection of the electronic circuit board without manual operation is realized, there is an effect that the inspection can be easily automated.

In any of the above recording media, if the comparison processing determines that the two data do not match, the inspection is stopped, and if it is confirmed that the electronic circuit board is defective, Even if the inspection items remain, the inspection does not proceed any further, so that the inspection time is reduced. Therefore, there is an effect that a more efficient inspection can be performed.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of an inspection system according to an embodiment of the present invention.

FIG. 2 is a flowchart showing a processing procedure of an inspection by the inspection system.

FIG. 3 is a block diagram showing a configuration of another inspection system according to one embodiment of the present invention.

FIG. 4 is a block diagram showing a configuration of still another inspection system according to one embodiment of the present invention.

FIG. 5 is a flowchart showing a processing procedure of an inspection by the inspection system of FIG. 4;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Inspection board (electronic circuit board) 1a CPU (comparison means, arithmetic processing unit) 1f Display control circuit (output path) 1g Image memory (output data generation means) 2 Inspection apparatus 2a FIFO memory (memory means) 2b Memory card driver (Reading means) 2d ROM 3 External bus 4 Board to be inspected (electronic circuit board) 4d Main memory (output data generating means) 4f D / A converter (output path) 4g Amplifier (output path) 4h Speaker (output path) 5 Inspection device 5a FIFO memory (memory means) 5b Memory card driver (reading means) 5d ROM 6 Board to be inspected (electronic circuit board) 6e Buffer (memory means) 6f Input port (input path) 7 Inspection device 7b Memory card driver (reading) Means) 7c ROM 7e Switch matrix (input data generating means) 13 Memory card (recording medium)

Claims (8)

[Claims] 1. An electronic circuit board inspection system for inspecting the operation of an electronic circuit board, comprising: output data generating means for generating output data; and a data output path for outputting the output data to the outside. Memory means for temporarily storing output data output from the data generating means via the data output path; and comparing output data stored in the memory means with output data generated by the output data generating means. An electronic circuit board inspection system, comprising: a comparison unit. 2. An electronic circuit board inspection system for inspecting the operation of an electronic circuit board, comprising: a data input path for receiving input data from the outside; and a memory means for temporarily storing input data passed through the input path. Input data generating means for generating input data to be input to the electronic circuit board; input data stored in the memory means via the data input path from the input data generating means; and input data generated by the input data generating means. An inspection system for an electronic circuit board, comprising: comparison means for comparing with input data. 3. The electronic circuit board inspection system according to claim 1, wherein said comparing means stops the inspection when the comparison means determines that the two data do not match. 4. The apparatus according to claim 1, further comprising reading means for reading the inspection program from a removable recording medium on which a program for executing the comparing process by the comparing means is recorded. 3. The electronic circuit board inspection system according to claim 1. 5. The electronic circuit board inspection system according to claim 1, wherein said comparing means is an arithmetic processing unit provided on the electronic circuit board. 6. A computer-readable recording medium on which a program for inspecting the operation of an electronic circuit board having output data generating means for generating output data and a data output path for outputting the output data to the outside is recorded. A storage process for temporarily storing output data output from the output data generation unit via the data output path in a memory unit; and output data stored in the memory unit and the output data generation unit. And a comparison process for comparing output data generated in the recording medium. 7. A computer readable recording program for inspecting the operation of an electronic circuit board having a data input path for receiving input data from the outside and a memory means for temporarily storing input data passed through the input path. A recording medium capable of generating input data to be input to the electronic circuit board; and input data stored in the memory means via the data input path and input data generated in the generation processing. A recording medium on which a program for executing a comparison process for comparison is recorded. 8. The recording medium according to claim 6, wherein the comparison processing stops the inspection when the comparison results in a mismatch between the two data.