JPH0599970A - Inspection device for electrical equipment - Google Patents
Inspection device for electrical equipmentInfo
- Publication number
- JPH0599970A JPH0599970A JP3259515A JP25951591A JPH0599970A JP H0599970 A JPH0599970 A JP H0599970A JP 3259515 A JP3259515 A JP 3259515A JP 25951591 A JP25951591 A JP 25951591A JP H0599970 A JPH0599970 A JP H0599970A
- Authority
- JP
- Japan
- Prior art keywords
- inspection
- pattern
- response
- output
- inspection pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、プリント配線基板や電
子部品装着ユニットのような電装品を検査して良否を判
別するための電装品の検査装置に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electric component inspection apparatus for inspecting an electric component such as a printed wiring board or an electronic component mounting unit to determine whether it is good or bad.
【0002】[0002]
【従来の技術】図2は、従来のこの種の検査装置の構成
を示すブロック構成図である。同図において、1は検査
装置、2は被検査品(電装品)、3は検査装置1より所
定のタイミングで所定のパターンの出力を送出する出力
部、4は検査装置1内に設けられて検査パターンのデー
タを記憶する検査パターン記憶部である。5は被検査品
2からの応答と検査パターンとを比較する判断部、6は
出力部3からのタイミングデータを受けて出力部3、検
査パターン記憶部4および判断部5などを制御する制御
部である。2. Description of the Related Art FIG. 2 is a block diagram showing the structure of a conventional inspection apparatus of this type. In the figure, 1 is an inspection device, 2 is an inspected product (electrical component), 3 is an output unit for outputting an output of a predetermined pattern from the inspection device 1 at a predetermined timing, and 4 is provided in the inspection device 1. An inspection pattern storage unit that stores inspection pattern data. Reference numeral 5 is a judgment unit for comparing the response from the inspected product 2 with the inspection pattern, and 6 is a control unit for receiving the timing data from the output unit 3 and controlling the output unit 3, the inspection pattern storage unit 4, the judgment unit 5, and the like. Is.
【0003】被検査品2の検査には、検査装置1と被検
査品2とを接続する。予め、検査者が出力部3からの所
定のタイミングの出力パターンに対する正常な電装品2
からの応答を予測もしくは測定し、その結果から必要な
検査パターンを作成して検査パターン記憶部4に記憶さ
せておく。この状態で、まず、検査装置1の出力部3か
ら検査に必要な所定のタイミングで、所定の出力パター
ンの信号を被検査品2に送出すると、被検査品2からの
応答が検査装置1に取り込まれ、これを判断部5が検査
パターン記憶部4に記憶されている検査パターンと比較
することにより、被検査品2の良否の判別などが行なわ
れる。The inspection device 1 and the inspection object 2 are connected to inspect the inspection object 2. In advance, the inspector operates the normal electrical component 2 for the output pattern from the output unit 3 at a predetermined timing.
The response from is predicted or measured, a necessary inspection pattern is created from the result, and stored in the inspection pattern storage unit 4. In this state, first, when a signal having a predetermined output pattern is sent from the output section 3 of the inspection device 1 to the inspected product 2 at a predetermined timing necessary for the inspection, a response from the inspected product 2 is sent to the inspection device 1. The quality of the inspected product 2 is judged by taking in the data and comparing it with the inspection pattern stored in the inspection pattern storage unit 4 by the determination unit 5.
【0004】[0004]
【発明が解決しようとする課題】しかし、上記従来構成
によれば、予め検査者が所定のタイミングデータに対す
る正常な被検査品の応答を予測もしくは測定し、その結
果に基づいて検査に必要な検査パターンを作成しなけれ
ばならず、これに多くの労力を要することになる。ま
た、作成した検査パターンを検査者が検査パターン記憶
部4に入力する手間もあり、その時、入力誤りを招くお
それもある。However, according to the above-mentioned conventional structure, the inspector predicts or measures the response of the normal inspected product to the predetermined timing data in advance, and the inspection required for the inspection is performed based on the result. You have to create a pattern, which is a lot of work. Further, it takes time and labor for the inspector to input the created inspection pattern into the inspection pattern storage unit 4, and at that time, an input error may occur.
【0005】本発明は上記のような問題点を解消するた
めになされたもので、検査を実施するに先立って検査パ
ターンを作成したり、入力するための労力が省けるとと
もに、入力誤りもなくすることができる電装品の検査装
置を提供することを目的とする。The present invention has been made to solve the above problems, and saves labor for creating and inputting an inspection pattern prior to performing inspection, and eliminates input errors. An object of the present invention is to provide an inspection device for electrical components that can be used.
【0006】[0006]
【課題を解決するための手段】上記目的を達成するため
本発明は、出力部から検査に必要な出力パターンを所定
のタイミングで被検査品に送出し、被検査品からの応答
と検査パターン記憶部に記憶されている検査パターンと
を判断部で比較させて被検査品の検査を行なう電装品の
検査装置において、検査に先立って正常な電装品からの
応答を検査パターンとして自動的に検査パターン記憶部
に入力する入力手段を設けた構成としたものである。In order to achieve the above object, the present invention sends an output pattern required for inspection from an output section to an inspected product at a predetermined timing, and stores a response from the inspected product and an inspection pattern storage. In the inspection equipment for electrical equipment that compares the inspection pattern stored in the inspection section with the determination section to inspect the inspected product, the inspection pattern is automatically the response from the normal electrical equipment as the inspection pattern prior to the inspection. The configuration is such that input means for inputting to the storage unit is provided.
【0007】[0007]
【作用】上記構成において、検査装置が正常な電装品か
らの応答を検査パターンにする学習機能をもつことにな
り、したがって、検査に先立って出力部から所定の出力
パターンを正常な電装品に送出すれば、必要な検査パタ
ーンが検査パターン記憶部に自動的に記憶されるもの
で、検査パターンの作成の手間が省け、入力ミスの発生
もなくなる。In the above structure, the inspection device has the learning function of making the response from the normal electric component into the inspection pattern. Therefore, the predetermined output pattern is sent from the output section to the normal electric component prior to the inspection. By doing so, the required inspection pattern is automatically stored in the inspection pattern storage unit, which saves the trouble of creating the inspection pattern and eliminates the occurrence of input errors.
【0008】[0008]
【実施例】以下、本発明の実施例を図面にもとづいて説
明する。図1は、本発明の一実施例による電装品の検査
装置を示すブロック構成図であり、図2で示す従来例と
同一部所には、同一符号を付して説明を省略する。Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 is a block configuration diagram showing an inspection apparatus for an electric component according to an embodiment of the present invention. The same parts as those in the conventional example shown in FIG.
【0009】図1において、被検査品2と検査パターン
記憶部4との間には、検査に先立って正常な電装品2か
らの応答を取り込んで、自動的に必要な検査パターンと
して検査パターン記憶部4に切換可能に入力させて学習
させる入力手段として切換部7が設けられている。8は
上記検査パターン記憶部4と判断部5との間に設けられ
て正常な電装品2からの応答が検査パターン記憶部4に
入力される際に開放される切換部である。In FIG. 1, a response from a normal electrical component 2 is fetched between the inspected product 2 and the inspection pattern storage unit 4 and the inspection pattern is automatically stored as a required inspection pattern. A switching unit 7 is provided as an input means for allowing the unit 4 to switchably input and learn. A switching unit 8 is provided between the inspection pattern storage unit 4 and the determination unit 5 and is opened when a response from the normal electrical component 2 is input to the inspection pattern storage unit 4.
【0010】以下、上記構成における作用について説明
する。はじめに、検査に先立って、切換部7を検査パタ
ーン記憶部4の側にセットし、他方の切換部8を開放側
にセットする。まず、出力部3から検査に必要な出力パ
ターンの信号を正常な電装品2に送出させれば、この正
常な電装品2からの応答が切換部7を介して取り込ま
れ、必要な検査パターンが自動作成されて検査パターン
記憶部4に入力される。すなわち、上記正常な電装品2
からの応答が検査に必要な検査パターンとして検査パタ
ーン記憶部4に入力されてこれを学習することになる。
この場合、検査に先立っての検査パターンの作成および
その入力の自動化が達成されて労力の軽減化が図れると
ともに、入力誤りのおそれもなくなる。The operation of the above structure will be described below. First, prior to the inspection, the switching unit 7 is set on the inspection pattern storage unit 4 side, and the other switching unit 8 is set on the open side. First, if a signal of an output pattern required for inspection is sent from the output unit 3 to the normal electrical component 2, the response from this normal electrical component 2 is taken in via the switching unit 7, and the required inspection pattern is obtained. It is automatically created and input to the inspection pattern storage unit 4. That is, the normal electrical component 2
The response from is input to the inspection pattern storage unit 4 as an inspection pattern necessary for the inspection and learned.
In this case, the creation of the inspection pattern prior to the inspection and the automation of its input can be achieved to reduce the labor and eliminate the risk of an input error.
【0011】この後、切換部7を判断部5側にセットす
る一方、他方の切換部8も判断部5側にセットして被検
査品2の検査を行なう。すなわち、出力部3から検査に
必要な出力パターンの信号を所定のタイミングで被検査
品2に送出し、被検査品2からの応答を、先に検査パタ
ーン記憶部4に記憶されている検査パターンとして比較
することで、上記被検査品2の良否などの検査が行なわ
れる。After that, the switching unit 7 is set on the determination unit 5 side, while the other switching unit 8 is also set on the determination unit 5 side to inspect the article 2 to be inspected. That is, a signal of an output pattern required for the inspection is sent from the output unit 3 to the inspected product 2 at a predetermined timing, and the response from the inspected product 2 is stored in the inspection pattern storage unit 4 in advance. As a result, the quality of the inspected product 2 is inspected.
【0012】[0012]
【発明の効果】以上のように本発明によれば、検査に先
立って正常な電装品からの応答を取り込んで、自動的に
検査パターン記憶部に検査に必要な検査パターンとして
入力させるようにしたので、検査に要する労力が軽減さ
れるとともに、入力誤りの発生するおそれも解消され
る。As described above, according to the present invention, a response from a normal electrical component is fetched prior to the inspection and is automatically input to the inspection pattern storage unit as the inspection pattern required for the inspection. Therefore, the labor required for the inspection is reduced, and the risk of an input error is eliminated.
【図面の簡単な説明】[Brief description of drawings]
【図1】本発明の一実施例による電装品の検査装置を示
すブロック構成図である。FIG. 1 is a block diagram showing an inspection apparatus for an electrical component according to an embodiment of the present invention.
【図2】従来の電装品の検査装置を示すブロック構成図
である。FIG. 2 is a block diagram showing a conventional inspection apparatus for electrical components.
2 電装品(被検査品) 3 出力部 4 検査パターン記憶部 5 判断部 2 Electrical component (inspected product) 3 Output unit 4 Inspection pattern storage unit 5 Judgment unit
Claims (1)
所定のタイミングで被検査品に送出し、被検査品からの
応答と検査パターン記憶部に記憶されている検査パター
ンとを判断部で比較させて被検査品の検査を行なう電装
品の検査装置において、検査に先立って正常な電装品か
らの応答を検査パターンとして自動的に検査パターン記
憶部に入力する入力手段を設けたことを特徴とする電装
品の検査装置。1. An output pattern required for inspection is sent from an output unit to an inspected product at a predetermined timing, and a response from the inspected product and an inspection pattern stored in an inspection pattern storage unit are compared by a determination unit. In the inspection device for the electric component for inspecting the inspected product, an input means for automatically inputting a response from the normal electric component as an inspection pattern to the inspection pattern storage unit prior to the inspection is provided. Inspection equipment for electrical components.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3259515A JPH0599970A (en) | 1991-10-08 | 1991-10-08 | Inspection device for electrical equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3259515A JPH0599970A (en) | 1991-10-08 | 1991-10-08 | Inspection device for electrical equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0599970A true JPH0599970A (en) | 1993-04-23 |
Family
ID=17335178
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3259515A Pending JPH0599970A (en) | 1991-10-08 | 1991-10-08 | Inspection device for electrical equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0599970A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6017006B1 (en) * | 2015-11-05 | 2016-10-26 | 三菱電機株式会社 | Information output system and connection determination method |
-
1991
- 1991-10-08 JP JP3259515A patent/JPH0599970A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6017006B1 (en) * | 2015-11-05 | 2016-10-26 | 三菱電機株式会社 | Information output system and connection determination method |
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