JP2001517804A5 - - Google Patents
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- Publication number
- JP2001517804A5 JP2001517804A5 JP2000513305A JP2000513305A JP2001517804A5 JP 2001517804 A5 JP2001517804 A5 JP 2001517804A5 JP 2000513305 A JP2000513305 A JP 2000513305A JP 2000513305 A JP2000513305 A JP 2000513305A JP 2001517804 A5 JP2001517804 A5 JP 2001517804A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US5947197P | 1997-09-22 | 1997-09-22 | |
| US60/059,471 | 1997-09-22 | ||
| PCT/US1998/019764 WO1999016102A1 (en) | 1997-09-22 | 1998-09-22 | Scanning evanescent electro-magnetic microscope |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001517804A JP2001517804A (ja) | 2001-10-09 |
| JP2001517804A5 true JP2001517804A5 (pt) | 2006-01-05 |
| JP4431273B2 JP4431273B2 (ja) | 2010-03-10 |
Family
ID=22023166
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000513305A Expired - Fee Related JP4431273B2 (ja) | 1997-09-22 | 1998-09-22 | 走査型エバネッセント電磁顕微鏡 |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1018138A4 (pt) |
| JP (1) | JP4431273B2 (pt) |
| AU (1) | AU1061599A (pt) |
| WO (1) | WO1999016102A1 (pt) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7550963B1 (en) | 1996-09-20 | 2009-06-23 | The Regents Of The University Of California | Analytical scanning evanescent microwave microscope and control stage |
| US6173604B1 (en) | 1996-09-20 | 2001-01-16 | The Regents Of The University Of California | Scanning evanescent electro-magnetic microscope |
| EP1212625A1 (en) * | 1999-09-10 | 2002-06-12 | University of Maryland, College Park | Quantitative imaging of dielectric permittivity and tunability |
| JP3536973B2 (ja) | 2000-04-20 | 2004-06-14 | 日本電気株式会社 | 同軸プローブおよび該同軸プローブを用いた走査型マイクロ波顕微鏡 |
| CN100370263C (zh) * | 2005-06-23 | 2008-02-20 | 中国科学技术大学 | 用扫描近场微波显微镜测量材料压电系数的方法及装置 |
| JP4732201B2 (ja) * | 2006-03-17 | 2011-07-27 | キヤノン株式会社 | 電磁波を用いたセンシング装置 |
| JP2009229423A (ja) * | 2008-03-25 | 2009-10-08 | Kobe Steel Ltd | 近接場プローブ及びこの近接場プローブを備えた電気的特性測定装置 |
| CN111351807A (zh) * | 2020-04-18 | 2020-06-30 | 李赞 | 使用近场微波的介电谱显微测量 |
| PT118063A (pt) | 2022-06-22 | 2023-12-22 | Univ Aveiro | Microscópio híbrido de varrimento por micro-ondas de campo próximo |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5821410A (en) * | 1996-09-20 | 1998-10-13 | Regents Of The University Of California | Scanning tip microwave near field microscope |
-
1998
- 1998-09-22 AU AU10615/99A patent/AU1061599A/en not_active Abandoned
- 1998-09-22 WO PCT/US1998/019764 patent/WO1999016102A1/en not_active Application Discontinuation
- 1998-09-22 JP JP2000513305A patent/JP4431273B2/ja not_active Expired - Fee Related
- 1998-09-22 EP EP98953178A patent/EP1018138A4/en not_active Withdrawn