JP2001326344A5 - - Google Patents
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- Publication number
- JP2001326344A5 JP2001326344A5 JP2001081327A JP2001081327A JP2001326344A5 JP 2001326344 A5 JP2001326344 A5 JP 2001326344A5 JP 2001081327 A JP2001081327 A JP 2001081327A JP 2001081327 A JP2001081327 A JP 2001081327A JP 2001326344 A5 JP2001326344 A5 JP 2001326344A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/533051 | 2000-03-22 | ||
| US09/533,051 US6693671B1 (en) | 2000-03-22 | 2000-03-22 | Fast-dump structure for full-frame image sensors with lod antiblooming structures |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001326344A JP2001326344A (ja) | 2001-11-22 |
| JP2001326344A5 true JP2001326344A5 (enExample) | 2008-04-24 |
| JP4743983B2 JP4743983B2 (ja) | 2011-08-10 |
Family
ID=24124256
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001081327A Expired - Lifetime JP4743983B2 (ja) | 2000-03-22 | 2001-03-21 | 電荷結合イメージセンサ装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6693671B1 (enExample) |
| EP (1) | EP1137071B1 (enExample) |
| JP (1) | JP4743983B2 (enExample) |
| DE (1) | DE60142943D1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001238134A (ja) * | 2000-02-23 | 2001-08-31 | Sony Corp | 固体撮像素子およびその駆動方法並びにカメラシステム |
| US6995795B1 (en) | 2000-09-12 | 2006-02-07 | Eastman Kodak Company | Method for reducing dark current |
| US20050068441A1 (en) * | 2003-09-26 | 2005-03-31 | Eastman Kodak Company | Multiple output CCD for color imaging |
| US7492404B2 (en) | 2004-08-27 | 2009-02-17 | Eastman Kodak Company | Fast flush structure for solid-state image sensors |
| US20080007622A1 (en) * | 2006-06-08 | 2008-01-10 | Eastman Kodak Company | Method of improving solid-state image sensor sensitivity |
| JP2009177018A (ja) * | 2008-01-25 | 2009-08-06 | Sanyo Electric Co Ltd | 固体撮像素子及びその製造方法 |
| US8134630B2 (en) * | 2008-05-09 | 2012-03-13 | Truesense Imaging, Inc. | System and method for draining residual charge from charge-coupled device (CCD) shift registers in image sensors having reset drains |
| US8329499B2 (en) * | 2008-12-10 | 2012-12-11 | Truesense Imaging, Inc. | Method of forming lateral overflow drain and channel stop regions in image sensors |
| JP5243983B2 (ja) * | 2009-01-30 | 2013-07-24 | 浜松ホトニクス株式会社 | 電子増倍機能内蔵型の固体撮像素子 |
| JP5300577B2 (ja) * | 2009-04-23 | 2013-09-25 | 三菱電機株式会社 | Ｔｄｉ方式のイメージセンサ、及び該イメージセンサの駆動方法 |
| US8800130B2 (en) | 2011-05-25 | 2014-08-12 | Truesense Imaging, Inc. | Methods for producing image sensors having multi-purpose architecture |
| US8773563B2 (en) | 2011-05-25 | 2014-07-08 | Truesense Imaging, Inc. | Multi-purpose architecture for CCD image sensors |
| US9049353B2 (en) | 2011-09-28 | 2015-06-02 | Semiconductor Components Industries, Llc | Time-delay-and-integrate image sensors having variable integration times |
| CN105611197B (zh) * | 2015-12-23 | 2018-08-17 | 中国科学院长春光学精密机械与物理研究所 | 无抗溢出功能帧转移ccd的抗饱和读出方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5817788A (ja) * | 1981-07-23 | 1983-02-02 | Toshiba Corp | 固体撮像装置 |
| US4528596A (en) * | 1982-11-30 | 1985-07-09 | Rca Corporation | Suppression of edge effects arising in CCD imager field registers |
| US4611140A (en) | 1985-08-26 | 1986-09-09 | The United States Of America As Represented By The Secretary Of The Navy | Saw-CTD parallel to serial imager |
| KR900007234B1 (ko) * | 1986-07-07 | 1990-10-05 | 가부시기가이샤 히다찌세이사구쇼 | 전하이송형 고체촬상소자 |
| US4972254A (en) * | 1987-02-24 | 1990-11-20 | Kabushiki Kaisha Toshiba | Solid state image sensors for reproducing high definition images |
| US5121214A (en) | 1990-06-29 | 1992-06-09 | The United States Of America As Represented By The United States Department Of Energy | Method for eliminating artifacts in CCD imagers |
| US5130774A (en) * | 1990-07-12 | 1992-07-14 | Eastman Kodak Company | Antiblooming structure for solid-state image sensor |
| AU1995092A (en) | 1991-05-10 | 1992-12-30 | Q-Dot. Inc. | High-speed peristaltic ccd imager with gaas fet output |
| US5355165A (en) | 1992-08-06 | 1994-10-11 | Princeton Scientific Instruments, Inc. | Very high frame rate CCD imager |
| US5343297A (en) | 1992-09-17 | 1994-08-30 | General Electric Company | Charge amplifier with precise, integer gain |
| US5440343A (en) | 1994-02-28 | 1995-08-08 | Eastman Kodak Company | Motion/still electronic image sensing apparatus |
| US5668597A (en) | 1994-12-30 | 1997-09-16 | Eastman Kodak Company | Electronic camera with rapid automatic focus of an image upon a progressive scan image sensor |
| DE69632172T2 (de) * | 1995-02-21 | 2005-04-21 | Dalsa Corp | Ladungsgekoppelte bildaufnahmeanordnung |
| JP3590944B2 (ja) * | 1996-02-23 | 2004-11-17 | 日本テキサス・インスツルメンツ株式会社 | 電荷結合型半導体装置 |
| JP3750221B2 (ja) * | 1996-10-01 | 2006-03-01 | ソニー株式会社 | 固体撮像装置 |
| JP2894323B2 (ja) * | 1997-06-23 | 1999-05-24 | 日本電気株式会社 | 固体撮像装置およびその製造方法 |
| US6051857A (en) * | 1998-01-07 | 2000-04-18 | Innovision, Inc. | Solid-state imaging device and method of detecting optical signals using the same |
| JP2000134540A (ja) * | 1998-10-29 | 2000-05-12 | Nec Corp | 固体撮像装置及びその駆動方法 |
-
2000
- 2000-03-22 US US09/533,051 patent/US6693671B1/en not_active Expired - Lifetime
-
2001
- 2001-03-12 EP EP01200931A patent/EP1137071B1/en not_active Expired - Lifetime
- 2001-03-12 DE DE60142943T patent/DE60142943D1/de not_active Expired - Lifetime
- 2001-03-21 JP JP2001081327A patent/JP4743983B2/ja not_active Expired - Lifetime