JP2001324440A - 走査型近接場光学顕微鏡 - Google Patents
走査型近接場光学顕微鏡Info
- Publication number
- JP2001324440A JP2001324440A JP2000141833A JP2000141833A JP2001324440A JP 2001324440 A JP2001324440 A JP 2001324440A JP 2000141833 A JP2000141833 A JP 2000141833A JP 2000141833 A JP2000141833 A JP 2000141833A JP 2001324440 A JP2001324440 A JP 2001324440A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- light
- optical microscope
- probe
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 93
- 239000000523 sample Substances 0.000 claims abstract description 103
- 230000007246 mechanism Effects 0.000 claims abstract description 24
- 238000001514 detection method Methods 0.000 claims description 14
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 230000007480 spreading Effects 0.000 abstract description 3
- 238000005286 illumination Methods 0.000 abstract 1
- 238000006243 chemical reaction Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 238000004651 near-field scanning optical microscopy Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 239000013307 optical fiber Substances 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000004005 microsphere Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000141833A JP2001324440A (ja) | 2000-05-15 | 2000-05-15 | 走査型近接場光学顕微鏡 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000141833A JP2001324440A (ja) | 2000-05-15 | 2000-05-15 | 走査型近接場光学顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001324440A true JP2001324440A (ja) | 2001-11-22 |
| JP2001324440A5 JP2001324440A5 (enExample) | 2007-07-19 |
Family
ID=18648899
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000141833A Pending JP2001324440A (ja) | 2000-05-15 | 2000-05-15 | 走査型近接場光学顕微鏡 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2001324440A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005010501A1 (ja) * | 2003-07-29 | 2005-02-03 | Toudai Tlo, Ltd. | 走査型プローブ顕微鏡 |
| JP2014071925A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi High-Technologies Corp | 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置 |
-
2000
- 2000-05-15 JP JP2000141833A patent/JP2001324440A/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005010501A1 (ja) * | 2003-07-29 | 2005-02-03 | Toudai Tlo, Ltd. | 走査型プローブ顕微鏡 |
| JP2014071925A (ja) * | 2012-09-28 | 2014-04-21 | Hitachi High-Technologies Corp | 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070509 |
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| A977 | Report on retrieval |
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| A131 | Notification of reasons for refusal |
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