JP2001307675A5 - - Google Patents

Download PDF

Info

Publication number
JP2001307675A5
JP2001307675A5 JP2000123686A JP2000123686A JP2001307675A5 JP 2001307675 A5 JP2001307675 A5 JP 2001307675A5 JP 2000123686 A JP2000123686 A JP 2000123686A JP 2000123686 A JP2000123686 A JP 2000123686A JP 2001307675 A5 JP2001307675 A5 JP 2001307675A5
Authority
JP
Japan
Prior art keywords
electrode
ions
mass
unit
power source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000123686A
Other languages
English (en)
Japanese (ja)
Other versions
JP3767317B2 (ja
JP2001307675A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000123686A priority Critical patent/JP3767317B2/ja
Priority claimed from JP2000123686A external-priority patent/JP3767317B2/ja
Publication of JP2001307675A publication Critical patent/JP2001307675A/ja
Publication of JP2001307675A5 publication Critical patent/JP2001307675A5/ja
Application granted granted Critical
Publication of JP3767317B2 publication Critical patent/JP3767317B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2000123686A 2000-04-19 2000-04-19 質量分析装置 Expired - Fee Related JP3767317B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Publications (3)

Publication Number Publication Date
JP2001307675A JP2001307675A (ja) 2001-11-02
JP2001307675A5 true JP2001307675A5 (enExample) 2005-07-14
JP3767317B2 JP3767317B2 (ja) 2006-04-19

Family

ID=18633931

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000123686A Expired - Fee Related JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Country Status (1)

Country Link
JP (1) JP3767317B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003065405A1 (fr) * 2002-01-31 2003-08-07 Hitachi High-Technologies Corporation Spectrometre de masse a ionisation par electrospray et procede associe
US7947950B2 (en) 2003-03-20 2011-05-24 Stc.Unm Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror
US7041968B2 (en) * 2003-03-20 2006-05-09 Science & Technology Corporation @ Unm Distance of flight spectrometer for MS and simultaneous scanless MS/MS
JP4690641B2 (ja) * 2003-07-28 2011-06-01 株式会社日立ハイテクノロジーズ 質量分析計
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
JP4848657B2 (ja) * 2005-03-28 2011-12-28 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
WO2008126383A1 (ja) * 2007-04-09 2008-10-23 Shimadzu Corporation イオントラップ質量分析装置
JPWO2009031179A1 (ja) * 2007-09-04 2010-12-09 株式会社島津製作所 質量分析装置
CN104112642B (zh) * 2013-04-18 2017-05-24 岛津分析技术研发（上海）有限公司 离子导引装置以及离子导引方法
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

Similar Documents

Publication Publication Date Title
JP2001307675A5 (enExample)
Ding et al. A digital ion trap mass spectrometer coupled with atmospheric pressure ion sources
DK1474820T3 (da) Ionfælde med permanent magnet og massespektrometer som anvender sådan en magnet
JP2002289583A5 (enExample)
RU2002125110A (ru) Плазменный ускоритель
WO2004102755A3 (ja) イオン発生素子、イオン発生装置、電気機器
WO2004030129A3 (en) Faims apparatus and method for separating ions in the gas phase
ATE301870T1 (de) Massenspektrometrisches verfahren mit zwei sperrfeldern gleicher form
Splendore et al. A new ion ejection method employing an asymmetric trapping field to improve the mass scanning performance of an electrodynamic ion trap
JP3785042B2 (ja) 無線周波共振器の高速起動及び／高速終了の方法
Bruce et al. Selected ion accumulation of noncovalent complexes in a Fourier transform ion cyclotron resonance mass spectrometer
van Agthoven et al. Two‐dimensional mass spectrometry in a linear ion trap, an in silico model
DE50313006D1 (de) Hochfrequenz-Elektronenquelle, insbesondere Neutralisator
JP2006294582A5 (enExample)
Loo et al. A dynamic collisional-radiative model of a low-pressure mercury-argon discharge lamp: A physical approach to modeling fluorescent lamps for circuit simulations
Guan et al. Broadband axialization in an ion cyclotron resonance ion trap
JP3767317B2 (ja) 質量分析装置
WO2006081075A8 (en) Correcting phases for ion polarity in ion trap mass spectrometry
US7282708B2 (en) Method of selecting ions in an ion storage device
JPH02103856A (ja) イオントラップ型質量分析計の操作方法
RU98111323A (ru) Спектрометр нелинейности дрейфа ионов
WO2008036439A3 (en) Compact high performance chemical detector
RU2002134362A (ru) Способ производства энергии
JP2008541021A5 (enExample)
Qiu et al. Effect of pulsed discharge on the ignition of pulse modulated radio frequency glow discharge at atmospheric pressure