JP3767317B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP3767317B2
JP3767317B2 JP2000123686A JP2000123686A JP3767317B2 JP 3767317 B2 JP3767317 B2 JP 3767317B2 JP 2000123686 A JP2000123686 A JP 2000123686A JP 2000123686 A JP2000123686 A JP 2000123686A JP 3767317 B2 JP3767317 B2 JP 3767317B2
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Japan
Prior art keywords
ions
electrode
voltage
ion trap
quadrupole ion
Prior art date
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Expired - Fee Related
Application number
JP2000123686A
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English (en)
Japanese (ja)
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JP2001307675A (ja
JP2001307675A5 (enExample
Inventor
集 平林
昭彦 奥村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2000123686A priority Critical patent/JP3767317B2/ja
Publication of JP2001307675A publication Critical patent/JP2001307675A/ja
Publication of JP2001307675A5 publication Critical patent/JP2001307675A5/ja
Application granted granted Critical
Publication of JP3767317B2 publication Critical patent/JP3767317B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4295—Storage methods

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2000123686A 2000-04-19 2000-04-19 質量分析装置 Expired - Fee Related JP3767317B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000123686A JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Publications (3)

Publication Number Publication Date
JP2001307675A JP2001307675A (ja) 2001-11-02
JP2001307675A5 JP2001307675A5 (enExample) 2005-07-14
JP3767317B2 true JP3767317B2 (ja) 2006-04-19

Family

ID=18633931

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000123686A Expired - Fee Related JP3767317B2 (ja) 2000-04-19 2000-04-19 質量分析装置

Country Status (1)

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JP (1) JP3767317B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014169754A1 (zh) * 2013-04-18 2014-10-23 岛津分析技术研发（上海）有限公司 离子导引装置以及离子导引方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4167593B2 (ja) 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
US7041968B2 (en) * 2003-03-20 2006-05-09 Science & Technology Corporation @ Unm Distance of flight spectrometer for MS and simultaneous scanless MS/MS
US7947950B2 (en) 2003-03-20 2011-05-24 Stc.Unm Energy focus for distance of flight mass spectometry with constant momentum acceleration and an ion mirror
JP4690641B2 (ja) * 2003-07-28 2011-06-01 株式会社日立ハイテクノロジーズ 質量分析計
JP4701720B2 (ja) * 2005-01-11 2011-06-15 株式会社島津製作所 Ｍａｌｄｉイオントラップ型質量分析装置及び分析方法
JP4848657B2 (ja) * 2005-03-28 2011-12-28 株式会社島津製作所 Ｍｓ／ｍｓ型質量分析装置
JP4894916B2 (ja) * 2007-04-09 2012-03-14 株式会社島津製作所 イオントラップ質量分析装置
JPWO2009031179A1 (ja) * 2007-09-04 2010-12-09 株式会社島津製作所 質量分析装置
JP7143737B2 (ja) * 2018-11-21 2022-09-29 株式会社島津製作所 質量分析装置、イオン発生タイミング制御方法およびイオン発生タイミング制御プログラム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014169754A1 (zh) * 2013-04-18 2014-10-23 岛津分析技术研发（上海）有限公司 离子导引装置以及离子导引方法
US10014168B2 (en) 2013-04-18 2018-07-03 Shimadzu Research Laboratory (Shanghai) Co., Ltd. Ion guiding device and ion guiding method

Also Published As

Publication number Publication date
JP2001307675A (ja) 2001-11-02

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