JP2001212756A - Cassette changing mechanism in polishing device - Google Patents

Cassette changing mechanism in polishing device

Info

Publication number
JP2001212756A
JP2001212756A JP2000025885A JP2000025885A JP2001212756A JP 2001212756 A JP2001212756 A JP 2001212756A JP 2000025885 A JP2000025885 A JP 2000025885A JP 2000025885 A JP2000025885 A JP 2000025885A JP 2001212756 A JP2001212756 A JP 2001212756A
Authority
JP
Japan
Prior art keywords
cassette
storage
casing
delivery
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000025885A
Other languages
Japanese (ja)
Inventor
Koichi Hatano
光一 波田野
Yasuo Matsumoto
康男 松本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MEIJI MACHINE
Meiji Machine Co Ltd
Original Assignee
MEIJI MACHINE
Meiji Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MEIJI MACHINE, Meiji Machine Co Ltd filed Critical MEIJI MACHINE
Priority to JP2000025885A priority Critical patent/JP2001212756A/en
Publication of JP2001212756A publication Critical patent/JP2001212756A/en
Pending legal-status Critical Current

Links

Landscapes

  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PROBLEM TO BE SOLVED: To solve problems in a conventional changing method such as application of a collision shock applied to a semiconductor wafer because of a change carried out apart from a casing, a change of an atmosphere inside the casing and penetration of dust and the like because of a large opening part, and a load a worker working in a strained posture for changing. SOLUTION: The cassette changing mechanism is provided with a base, the casing, a delivery side transferring means feeding and transferring a semiconductor wafer housed in a delivery side cassette, a polishing means, and a storage side transferring means housing and transferring the semiconductor wafer to a storage side cassette. In this mechanism, a sliding means sliding the delivery side transferring means including the delivery side cassette and the storage side transferring means including the storage side cassette from the delivery side transfer position or the storage side transfer position to the vicinity of the side wall of the casing is also provided, while an openable window changing between the delivery side cassette and the storage side cassette is arranged on the side wall of the casing.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、半導体ウエハへ自動的
に超高精度の研磨加工を施すためのポリッシングマシー
ン、ラッピングマシーン等の研磨装置に関するものであ
り、更に詳細には、研磨加工前又は研磨加工後の半導体
ウエハが収納されるカセットの研磨装置への取替を容易
とするものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing machine, such as a polishing machine or a lapping machine, for automatically performing ultra-high precision polishing on a semiconductor wafer. This facilitates replacement of a cassette, in which semiconductor wafers after polishing are stored, with a polishing apparatus.

【0002】[0002]

【従来技術】本発明に係るこの種の半導体ウエハは、コ
ンピュータ等の電子関連機器、所謂OA機器、モバイル
機器等の集積回路に多用されており、その開発は日々進
歩しており、最終製品の小型化に伴うより一層の極薄化
と、生産性の観点からより一層の拡径化と、歩留まりの
観点からのより一層の超高精度の平坦及び鏡面の加工精
度が要求されてきている。
2. Description of the Related Art Semiconductor wafers of this type according to the present invention are frequently used in electronic equipment such as computers, so-called OA equipment, integrated circuits such as mobile equipment, and the development thereof is progressing day by day. There has been a demand for further ultra-thinness due to miniaturization, further diameter enlargement from the viewpoint of productivity, and further ultra-high precision flatness and mirror processing accuracy from the viewpoint of yield.

【0003】一般的に半導体ウエハは、円柱状のシリコ
ン結晶体を一定の厚さにスライシングし、そのスライシ
ングした半導体ウエハを更に所望の厚さにするために研
削加工を行っている。
In general, a semiconductor wafer is sliced from a cylindrical silicon crystal to a predetermined thickness, and is subjected to a grinding process to further reduce the sliced semiconductor wafer to a desired thickness.

【0004】通常、研削加工は研削盤のスピンドル軸の
下端に取着されたカップホイールダイヤモンド砥石によ
って粗研削、仕上研削等に分けて行われているが、昨今
要求される半導体ウエハは超高精度の平坦精度と鏡面加
工であり、従来のようなカップホイールダイヤモンド砥
石で研削するだけでは、半導体ウエハに研削によるダメ
ージが残り今求められる超高精度の平坦精度、鏡面加工
を施すのは不可能と成ってきており、研削加工後に更に
研磨加工を必要としている。
[0004] Usually, grinding is performed by rough grinding, finish grinding, and the like using a cup wheel diamond grindstone attached to the lower end of the spindle shaft of the grinding machine. With the flatness and mirror finish of the conventional method, simply grinding with a cup wheel diamond grindstone as in the past would cause damage to the semiconductor wafer due to grinding, making it impossible to apply the ultra-high precision flatness and mirror finish required today. And require further polishing after the grinding.

【0005】更に、拡径化された半導体ウエハを収納す
るためのカセットもそれに合わせて大型と成り、又、極
薄化、超高精度に加工された半導体ウエハはデリケート
なものと成っており、僅かなショックでもダメージを受
けるものであり、更には、カセットを取替する開口部は
人間が体を乗り出して取替していたため大きい開口部を
有しているものであった。
Further, a cassette for accommodating a semiconductor wafer having an increased diameter is also large in size, and a semiconductor wafer which is extremely thin and processed with ultra-high precision is delicate. Even a slight shock could cause damage, and further, the opening for replacing the cassette had a large opening because a person leaned out of the body and replaced.

【0006】[0006]

【解決しようとする課題】然し乍ら、昨今要求される半
導体ウエハは従来2mm程度の肉厚であったものが1m
m程度への極薄化、又、従来6インチ乃至8インチの直
径であったものが12インチ乃至16インチへの拡径
化、更には、品質の均一化と超高精度の平坦加工、鏡面
加工の仕上であり、従来のカセットの取替のようにケー
シングの側壁から離れた位置で取替していると人力で行
う作業で有り、周辺機器にぶっつけたりして半導体ウエ
ハにショックを与えたり、更には、開口部が大きいため
開閉の度にケーシング内の雰囲気が変化したり、空気中
の塵等が侵入する要因となっており、加えて、無理な姿
勢で取替をしていると作業者に負担がかかっていた。
However, the semiconductor wafer required recently has been reduced to about 2 mm in thickness but 1 m in thickness.
m, ultra-thin to 12 inches to 16 inches instead of 6 to 8 inches in diameter, flattening of uniform quality and ultra-high accuracy, mirror surface It is the finishing of processing, and if it is replaced at a position away from the side wall of the casing like the replacement of the conventional cassette, it is a work to be performed manually, and it may hit the peripheral equipment and shock the semiconductor wafer. Furthermore, since the opening is large, the atmosphere inside the casing changes every time the door is opened and closed, which causes dust and the like in the air to enter, and in addition, when the replacement is performed in an unreasonable posture. Workers were burdened.

【0007】[0007]

【課題を解決する手段】本発明は上述の課題に鑑みて、
鋭意研鑚の結果、これらの課題を解決するもので、基台
と、基台の側方及び上方を覆うケーシングと、ケーシン
グ内の基台に配設された送出側カセットに収納されてい
る半導体ウエハを単品毎に送出移送する送出側移送手段
と、送出側移送手段で移送された半導体ウエハを全自動
で研磨加工する研磨加工手段と、研磨加工手段で研磨加
工された半導体ウエハを単品毎に収納側カセットに収納
移送する収納側移送手段とを備えた研磨装置において、
送出側カセットを含む送出側移送手段と収納側カセット
を含む収納側移送手段とを送出側移送位置又は収納側移
送位置から夫々ケーシングの側壁の近傍位置まで摺動さ
せる摺動手段を設けると共に、ケーシングの側壁に送出
側カセットと収納側カセットとの取替用開閉窓を夫々設
けたものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems.
As a result of intensive studies, these problems have been solved, and a base, a casing that covers the sides and above the base, and a semiconductor housed in a sending-side cassette provided on the base in the casing. A sending-side transfer means for sending and transferring a wafer for each item, a polishing means for automatically polishing the semiconductor wafer transferred by the sending-side transfer means, and a semiconductor wafer polished by the polishing means for each item. A polishing apparatus comprising: a storage-side transfer unit configured to store and transfer to a storage-side cassette;
Sliding means for sliding the delivery-side transfer means including the delivery-side cassette and the storage-side transfer means including the storage-side cassette from the delivery-side transfer position or the storage-side transfer position to a position near the side wall of the casing, respectively; The opening and closing windows for replacing the cassette on the delivery side and the cassette on the storage side are provided on the side wall of the housing.

【0008】従って、本発明の目的は、ポリッシングマ
シーン、ラッピングマシーン等の研磨装置において、送
出側カセット及び収納側カセットの取替を容易とするカ
セット取替機構に創達し、これを提供する目的である。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide and provide a cassette replacing mechanism for easily replacing a sending-side cassette and a storing-side cassette in a polishing machine such as a polishing machine or a lapping machine. is there.

【0009】[0009]

【作用】本発明の半導体ウエハの研磨装置におけるカセ
ット取替機構は、送出側カセットを含む送出側移送手段
及び収納側カセットを含む収納側移送手段とをケーシン
グの側壁の近傍まで摺動できる摺動手段を設け、更に、
ケーシングの側壁に取替用開閉窓を設けたことにより、
ケーシングの外から人間が無理することなく容易にカセ
ットを取替できるもので半導体ウエハに与えるショック
を激減させるものである。
According to the present invention, there is provided a cassette replacement mechanism in a polishing apparatus for a semiconductor wafer, which is capable of sliding a delivery side transfer means including a delivery side cassette and a storage side transfer means including a storage side cassette to a position near a side wall of a casing. Providing means,
By providing a replacement opening / closing window on the side wall of the casing,
The cassette can be easily replaced from outside of the casing by a human without being forced to reduce the shock applied to the semiconductor wafer.

【0010】[0010]

【発明の実施例】斯る目的を達成した本発明の研磨装置
におけるカセット取替機構を以下実施例の図面によって
説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A cassette replacement mechanism in a polishing apparatus according to the present invention which has achieved the above object will be described below with reference to the drawings of the embodiments.

【0011】図1は本発明の研磨装置におけるカセット
取替機構の実施例の説明のための概要平面図である。
FIG. 1 is a schematic plan view for explaining an embodiment of a cassette replacing mechanism in a polishing apparatus according to the present invention.

【0012】本発明は、半導体ウエハへ自動的に超高精
度の研磨加工を施すためのポリッシングマシーン、ラッ
ピングマシーン等の研磨装置に関するものであり、更に
詳細には、研磨加工前又は研磨加工後の半導体ウエハW
が収納されるカセット3a.5aの研磨装置への取替を
容易とするものであり、基台1と、該基台1の側方及び
上方を覆うケーシング2と、該ケーシング2内の基台1
に配設された送出側カセット3aに収納されている半導
体ウエハWを単品毎に送出移送する送出側移送手段3
と、該送出側移送手段3で移送された半導体ウエハWを
全自動で研磨加工する研磨加工手段4と、該研磨加工手
段4で研磨加工された半導体ウエハWを単品毎に収納側
カセット5aに収納移送する収納側移送手段5とを備え
た研磨装置において、前記送出側カセット3aを含む送
出側移送手段3と収納側カセット5aを含む収納側移送
手段5とを送出側移送位置又は収納側移送位置から夫々
ケーシング2の側壁2aの近傍位置まで摺動させる摺動
手段6を設けると共に、ケーシング2の側壁2aに送出
側カセット3aと収納側カセット5aとの取替用開閉窓
7を夫々設けたものである。
The present invention relates to a polishing apparatus such as a polishing machine or a lapping machine for automatically performing ultra-high precision polishing on a semiconductor wafer. More specifically, the present invention relates to a polishing apparatus before or after polishing. Semiconductor wafer W
Is stored in the cassette 3a. The base 1, a casing 2 that covers the side and the upper side of the base 1, and a base 1 in the casing 2.
Sending-side transfer means 3 for sending out and transferring the semiconductor wafers W stored in the sending-side cassette 3a arranged in the unit.
A polishing means 4 for fully automatically polishing the semiconductor wafer W transferred by the sending-side transfer means 3; and a semiconductor wafer W polished by the polishing means 4 in the storage side cassette 5a for each product. In the polishing apparatus provided with the storage-side transfer means 5 for storing and transferring, the delivery-side transfer means 3 including the delivery-side cassette 3a and the storage-side transfer means 5 including the storage-side cassette 5a are provided at the delivery-side transfer position or the storage-side transfer. A sliding means 6 for sliding from the position to a position near the side wall 2a of the casing 2 is provided, and an opening / closing window 7 for replacing the sending-side cassette 3a and the storage-side cassette 5a is provided on the side wall 2a of the casing 2. Things.

【0013】即ち、本発明は、昨今要求される半導体ウ
エハWの極薄化、拡径化、超高精度の平坦精度、鏡面加
工に充分に対応できるポリシングマシーン、ラッピング
マシーン等の全自動研磨装置であって、基台1は当該研
磨装置の後述する各機構を配設するためものであり、全
体的には長方形状を呈しており、基台1の外周辺から立
設させた側壁2aと、該側壁2aの上方辺を接続させた
屋根2bとから成るケーシング2に覆われているもの
で、ケーシング2の内部は定温定湿及び無塵のクリーン
ルームとしているものである。
That is, the present invention provides a fully automatic polishing apparatus for polishing machines, lapping machines, etc., which can sufficiently cope with ultra-thin and large-diameter semiconductor wafers W, ultra-high precision flatness, and mirror finishing. The base 1 is for arranging each mechanism to be described later of the polishing apparatus, has a generally rectangular shape, and has a side wall 2a standing upright from the outer periphery of the base 1. The casing 2 is covered with a roof 2b to which the upper side of the side wall 2a is connected. The inside of the casing 2 is a clean room with constant temperature and humidity and no dust.

【0014】そして、送出側移送手段3は側方へ配設さ
れた駆動源のモーター(図示しない)と、該モーターと
機械的に接続された棒螺子、歯車、ベルト等の伝導機構
によって昇降自在の送出側エレベータ機構(図示しな
い)と、該送出側エレベータ機構の上面に備えた送出側
カセット載置台と、該送出側カセット載置台に載置する
後述する研磨前の多数枚の半導体ウエハWを収納してい
る送出側カセット3aと、該送出側カセット3aの半導
体ウエハWを単品毎に先端に把持機構を備えたエア又は
オイル等で進退するシリンダ等を備えた送出側移送ロボ
ット3b等を含むものである。
The delivery-side transfer means 3 can be moved up and down by a drive source motor (not shown) disposed laterally and a transmission mechanism such as a bar screw, a gear, or a belt mechanically connected to the motor. , A sending-side cassette mounting table provided on the upper surface of the sending-side elevator mechanism, and a large number of semiconductor wafers W to be mounted on the sending-side cassette mounting table before polishing, which will be described later. It includes a delivery-side cassette 3a that houses therein, and a delivery-side transfer robot 3b that includes a cylinder or the like that is provided with a gripping mechanism at the tip of each semiconductor wafer W of the delivery-side cassette 3a and that advances and retreats with air or oil. It is a thing.

【0015】次に、送出側カセット3aは前記送出側カ
セット載置台に載置される函状のもので、内部には水平
に設けた複数の桟体で形成した棚を備え、夫々の棚の上
には研磨加工前の半導体ウエハWが単品毎に収納されて
おり、送出側カセット3aに収納されている研磨加工前
の複数の半導体ウエハWは後述する送出側移送手段3で
単品毎に移送され空になると次の送出側カセット3aと
取り替えるものである。
Next, the delivery-side cassette 3a is a box-shaped one mounted on the delivery-side cassette mounting table, and internally has a plurality of horizontally formed shelves formed of a plurality of crosspieces. The semiconductor wafers W before polishing are stored in individual units on the upper side, and the plurality of semiconductor wafers W before polishing stored in the sending-side cassette 3a are transferred individually by sending-side transfer means 3 described later. When it becomes empty, it is replaced with the next sending-side cassette 3a.

【0016】次いで、送出側カセット3aを載置する送
出側カセット載置台の下方に備えた送出側エレベータ機
構の昇降と、送出側移送ロボット3bの進退、旋回、枢
動、反転と、バキューム吸着、吸盤、挾持手段等の把持
機構とによって把持され、単品毎に後述する研磨加工手
段4に移送されるものである。
Next, the delivery-side elevator mechanism provided below the delivery-side cassette mounting table on which the delivery-side cassette 3a is placed is moved up and down, and the delivery-side transfer robot 3b is advanced, retracted, swiveled, pivoted, inverted, and vacuum-adsorbed. It is gripped by a gripping mechanism such as a suction cup and a holding means, and is transferred to a polishing processing means 4 described later for each piece.

【0017】そして、研磨加工手段4は基台1から回動
及び停止可能に立設させたコラム4aと、該コラム4a
に回転自在に且つ昇降自在に担持させた複数のスピンド
ル軸5bと、該スピンドル軸4bの下端には夫々半導体
ウエハWをバキューム吸着又は水貼り等で取着するヘッ
ド4cとを備えているものである。
The polishing means 4 comprises a column 4a which is erected from the base 1 so as to be able to rotate and stop.
A plurality of spindle shafts 5b rotatably and vertically movable, and heads 4c at the lower ends of the spindle shafts 4b for attaching the semiconductor wafers W by vacuum suction or water bonding, respectively. is there.

【0018】次いで、スピンドル軸4bの下方の適宜位
置には基台1に立設された研磨テーブル(図示しない)
の上面に研磨プレート4dを備えているもので、コラム
4aの回動停止、及び、スピンドル軸4bの降下回転と
によって、ヘッド4cに取着された半導体ウエハWは回
転する研磨プレート4dの間に挾圧されて研磨加工され
るものである。
Next, a polishing table (not shown) erected on the base 1 at an appropriate position below the spindle shaft 4b.
The semiconductor wafer W attached to the head 4c is moved between the rotating polishing plate 4d by the rotation stop of the column 4a and the downward rotation of the spindle shaft 4b. It is sandwiched and polished.

【0019】そして、研磨加工後の半導体ウエハWは実
施例の図面では、洗浄用移送ロボット8によりヘッド4
cから取り外され、洗浄ユニット9に移送されて洗浄さ
れ、更に、洗浄用移送ロボット8により洗浄ユニット9
で洗浄された後に仮置台10へ仮置きされるものであ
る。
In the drawings of the embodiment, the semiconductor wafer W after polishing is transferred to the head 4 by the cleaning transfer robot 8.
c, and is transferred to the cleaning unit 9 for cleaning, and further transferred to the cleaning unit 9 by the cleaning transfer robot 8.
Is temporarily placed on the temporary placement table 10 after being cleaned.

【0020】尚、本発明のカセット取替機構の研磨加工
手段4は図示する実施例の他、スピンドル4bの数、研
磨プレート4dの数等が相違する各種の夫々の目的によ
って多種類の研磨加工手段4があるが、全てを包含する
ものである。
The polishing means 4 of the cassette replacing mechanism according to the present invention is not limited to the embodiment shown in the figure, but may be a variety of types of polishing processing for various purposes in which the number of spindles 4b and the number of polishing plates 4d are different. Means 4 is included, but encompasses all.

【0021】次に、収納側移送手段5は前述の送出側移
送手段3の送出側移送ロボット3b、送出側エレベータ
機構、送出側カセット載置台等と同様な収納側移送ロボ
ット5b、収納側エレベータ機構、収納側カセット載置
台とを備えているものである。
Next, the storage-side transfer means 5 includes a storage-side transfer robot 5b and a storage-side elevator mechanism similar to the delivery-side transfer robot 3b, the delivery-side elevator mechanism, and the delivery-side cassette mounting table of the delivery-side transfer means 3. , And a storage-side cassette mounting table.

【0022】つまり、仮置台10に仮置きされた研磨加
工後の半導体ウエハWを収納側移送ロボット5bのバキ
ューム吸着、吸盤、挾持手段等の把持機構により単品毎
に把持して、収納側移送ロボット5bのエア又はオイル
等による進退、旋回、枢動、反転と、更には、収納側エ
レベータ機構(図示しない)の昇降により、収納側カセ
ット載置台の上に載置された後述する収納側カセット5
aの桟体の間に収納されるものである。
That is, the storage-side transfer robot 5b holds the semiconductor wafer W temporarily polished after being tentatively placed on the temporary mounting table 10 by a holding mechanism such as vacuum suction, suction cup, and holding means of the storage-side transfer robot 5b. The storage side cassette 5 described later mounted on the storage side cassette mounting table by moving forward / backward, turning, pivoting, reversing by air or oil, and raising / lowering the storage side elevator mechanism (not shown).
It is housed between the crosspieces a.

【0023】そして、収納側エレベータ機構は側方へ配
設された駆動源のモーター(図示しない)と、該モータ
ーと機械的に接続された棒螺子、歯車、ベルト等の伝導
機構によって昇降自在としているもので、収納側エレベ
ータ機構の上面には収納側カセット5aを載置する収納
側カセット載置台を備えているものである。
The storage-side elevator mechanism can be moved up and down by a drive source motor (not shown) disposed laterally and a transmission mechanism such as a rod screw, a gear, and a belt mechanically connected to the motor. On the upper surface of the storage-side elevator mechanism, a storage-side cassette mounting table for mounting the storage-side cassette 5a is provided.

【0024】更には、研磨加工後の半導体ウエハWを収
納する収納側カセット5aは前述の送出側カセット3a
と同様な函状のものであり、内部に複数の棚を設け、夫
々の棚の上に研磨加工後の半導体ウエハWが単品毎に収
納されるものである。
Further, the storage side cassette 5a for storing the polished semiconductor wafer W is the same as the above-mentioned delivery side cassette 3a.
A plurality of shelves are provided inside, and the polished semiconductor wafer W is stored on each shelf for each single product.

【0025】本発明の研磨装置におけるカセット取替機
構は、前記送出側カセット3aを含む送出側移送手段
3、及び、収納側カセット5aを含む収納側移送手段5
の下方に夫々ケーシング2の側壁2aの近傍まで摺動可
能な摺動手段6を設けているものである。
The cassette replacement mechanism in the polishing apparatus of the present invention includes a delivery-side transfer means 3 including the delivery-side cassette 3a and a storage-side transfer means 5 including a storage-side cassette 5a.
And sliding means 6 slidable to the vicinity of the side wall 2a of the casing 2 respectively.

【0026】次いで、摺動手段6は送出側移送手段3、
及び、収納側移送手段5の下方に摺動台6aを設け、摺
動台6aと基台1との間には溝部と、該溝部に嵌入して
摺動可能な突条6bで摺動させても、基体1にレール6
bを配設し、該レール6bの上を摺動するロール等を設
けても構わないものである。
Next, the sliding means 6 is the sending-side transport means 3,
Further, a slide table 6a is provided below the storage-side transfer means 5, and a groove is provided between the slide table 6a and the base 1, and the slide 6a is slid by a ridge 6b which can be inserted into the groove and slidable. However, the rail 6
b, and a roll or the like that slides on the rail 6b may be provided.

【0027】更に、ケーシング2の側壁2aに設けた夫
々の取替用開閉窓7は送出用カセット3a及び収納用カ
セット5aより若干大きく形成すればよく、側壁2aに
設けた取替用開閉窓7の近傍に摺動手段6によって移送
されているもので、夫々のカセット3a.5aの近傍の
ケーシング2には夫々取替用開閉窓7を設けており、順
次、空に成った送出側カセット3a及び満杯に成った収
納用カセット5aは取替用開閉窓7より人力によって取
り替えるものである。
Further, each replacement opening / closing window 7 provided on the side wall 2a of the casing 2 may be formed slightly larger than the sending cassette 3a and the storage cassette 5a, and the replacement opening / closing window 7 provided on the side wall 2a. Are transported to the vicinity of the respective cassettes 3a. The casing 2 in the vicinity of 5a is provided with a replacement opening / closing window 7, and the empty sending-out cassette 3a and the full storage cassette 5a are sequentially replaced manually by the replacement opening / closing window 7. Things.

【0028】[0028]

【発明の効果】本発明は前述の構成により、研磨加工前
及び研磨加工後の半導体ウエハを送出又は収納する送出
側カセット又は収納側カセットは取替のとき、ケーシン
グの側壁に設けた取替用開閉窓の近傍に移動しており、
取替用開閉窓を開けて空に成った又は満杯に成ったカセ
ットを取り替えることができ、デリケートな半導体ウエ
ハにショックを与えることを激減させ、更に、取替用開
閉窓が小さくて済むためケーシング内の環境の変化を防
止でき、更には、研磨加工面に他部材の接触や埃等の付
着が防止でき超高精度に維持できる画期的な発明であ
る。
According to the present invention, according to the above-described structure, when the sending-out cassette or the storing-side cassette for sending or storing the semiconductor wafer before and after the polishing is replaced, the replacement cassette provided on the side wall of the casing is used. It is moving near the opening window,
The replacement opening / closing window can be opened to replace an empty or full cassette, shocking delicate semiconductor wafers can be drastically reduced, and further, the casing can be reduced because the replacement opening / closing window can be made smaller. This is an epoch-making invention that can prevent changes in the internal environment, and can also prevent contact of other members and adhesion of dust and the like to the polished surface and maintain ultra-high accuracy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】図1は本発明の研磨装置におけるカセット取替
機構の実施例の説明のための概要平面図である。
FIG. 1 is a schematic plan view for explaining an embodiment of a cassette replacing mechanism in a polishing apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

W 半導体ウエハ 1 基台 2 ケーシング 3 送出側移送手段 3a 送出側カセット 3b 送出側移送ロボット 4 研磨加工手段 4a コラム 4b スピンドル軸 4c ヘッド 4d 研磨プレート 5 収納側移送手段 5a 収納側カセット 5b 収納側移送ロボット 6 摺動手段 6a 摺動台 6b 突条又はレール 7 取替用開閉窓 8 洗浄用移送ロボット 9 洗浄ユニット 10 仮置台 W Semiconductor wafer 1 Base 2 Casing 3 Delivery side transfer means 3a Delivery side cassette 3b Delivery side transfer robot 4 Polishing means 4a Column 4b Spindle shaft 4c Head 4d Polishing plate 5 Storage side transfer means 5a Storage side cassette 5b Storage side transfer robot Reference Signs List 6 sliding means 6a sliding table 6b ridge or rail 7 replacement opening / closing window 8 cleaning transfer robot 9 cleaning unit 10 temporary table

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 3C034 AA20 BB84 DD10 DD20 3C058 AB03 CB03 CB04 DA17 5F031 CA02 DA01 FA01 FA03 FA07 FA11 FA12 FA15 FA21 GA08 GA10 GA12 GA43 GA47 GA60 HA12 HA13 HA46 HA48 HA58 HA59 MA13 MA22 NA02  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 3C034 AA20 BB84 DD10 DD20 3C058 AB03 CB03 CB04 DA17 5F031 CA02 DA01 FA01 FA03 FA07 FA11 FA12 FA15 FA21 GA08 GA10 GA12 GA43 GA47 GA60 HA12 HA13 HA46 HA48 HA58 HA59 MA13 MA22 NA02

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】基台と、該基台の側方及び上方を覆うケー
シングと、該ケーシング内の基台に配設された送出側カ
セットに収納されている半導体ウエハを単品毎に送出移
送する送出側移送手段と、該送出側移送手段で移送され
た半導体ウエハを全自動で研磨加工する研磨加工手段
と、該研磨加工手段で研磨加工された半導体ウエハを単
品毎に収納側カセットに収納移送する収納側移送手段と
を備えた研磨装置において、前記送出側カセットを含む
送出側移送手段と収納側カセットを含む収納側移送手段
とを送出側移送位置又は収納側移送位置から夫々ケーシ
ングの側壁の近傍位置まで摺動させる摺動手段を設ける
と共に、ケーシングの側壁に送出側カセットと収納側カ
セットとの取替用開閉窓を夫々設けたことを特徴とする
研磨装置におけるカセット取替機構。
1. A base, a casing for covering the side and upper side of the base, and a semiconductor wafer stored in a sending-side cassette disposed on the base in the casing, for transferring and transferring the semiconductor wafers individually. Sending-side transfer means, polishing means for fully automatically polishing the semiconductor wafer transferred by the sending-side transfer means, and storing and transferring the semiconductor wafer polished by the polishing means to the storage-side cassette for each product And a storage-side transfer means including the delivery-side cassette, and a storage-side transfer means including the storage-side cassette being moved from the delivery-side transfer position or the storage-side transfer position to the side wall of the casing, respectively. A polishing means, wherein a sliding means for sliding to a nearby position is provided, and an opening / closing window for switching between a sending-side cassette and a storage-side cassette is provided on a side wall of the casing. Tsu door replacement mechanism.
JP2000025885A 2000-02-03 2000-02-03 Cassette changing mechanism in polishing device Pending JP2001212756A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000025885A JP2001212756A (en) 2000-02-03 2000-02-03 Cassette changing mechanism in polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000025885A JP2001212756A (en) 2000-02-03 2000-02-03 Cassette changing mechanism in polishing device

Publications (1)

Publication Number Publication Date
JP2001212756A true JP2001212756A (en) 2001-08-07

Family

ID=18551680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000025885A Pending JP2001212756A (en) 2000-02-03 2000-02-03 Cassette changing mechanism in polishing device

Country Status (1)

Country Link
JP (1) JP2001212756A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005019439A (en) * 2003-06-23 2005-01-20 Tokyo Seimitsu Co Ltd Method and device for receiving and delivering wafer and wafer processing device using them

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005019439A (en) * 2003-06-23 2005-01-20 Tokyo Seimitsu Co Ltd Method and device for receiving and delivering wafer and wafer processing device using them

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