JP2001174565A5 - - Google Patents

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Publication number
JP2001174565A5
JP2001174565A5 JP2000295357A JP2000295357A JP2001174565A5 JP 2001174565 A5 JP2001174565 A5 JP 2001174565A5 JP 2000295357 A JP2000295357 A JP 2000295357A JP 2000295357 A JP2000295357 A JP 2000295357A JP 2001174565 A5 JP2001174565 A5 JP 2001174565A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2000295357A
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Japanese (ja)
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JP4717993B2 (ja
JP2001174565A (ja
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Publication date
Priority claimed from US09/407,350 external-priority patent/US6437338B1/en
Application filed filed Critical
Publication of JP2001174565A publication Critical patent/JP2001174565A/ja
Publication of JP2001174565A5 publication Critical patent/JP2001174565A5/ja
Application granted granted Critical
Publication of JP4717993B2 publication Critical patent/JP4717993B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2000295357A 1999-09-29 2000-09-28 X線イメージング・システムにおいて検出器アレイをスキャンするための方法及び装置 Expired - Lifetime JP4717993B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/407350 1999-09-29
US09/407,350 US6437338B1 (en) 1999-09-29 1999-09-29 Method and apparatus for scanning a detector array in an x-ray imaging system

Publications (3)

Publication Number Publication Date
JP2001174565A JP2001174565A (ja) 2001-06-29
JP2001174565A5 true JP2001174565A5 (enExample) 2009-11-12
JP4717993B2 JP4717993B2 (ja) 2011-07-06

Family

ID=23611672

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000295357A Expired - Lifetime JP4717993B2 (ja) 1999-09-29 2000-09-28 X線イメージング・システムにおいて検出器アレイをスキャンするための方法及び装置

Country Status (4)

Country Link
US (1) US6437338B1 (enExample)
EP (1) EP1089555A1 (enExample)
JP (1) JP4717993B2 (enExample)
IL (1) IL138357A0 (enExample)

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US6914227B2 (en) * 2001-06-25 2005-07-05 Canon Kabushiki Kaisha Image sensing apparatus capable of outputting image by converting resolution by adding and reading out a plurality of pixels, its control method, and image sensing system
DE10147808A1 (de) * 2001-09-27 2003-04-10 Conti Temic Microelectronic Bildaufnehmer, insbesondere zur dreidimensionalen Erfassung von Objekten oder Szenen
DE10156629A1 (de) 2001-11-17 2003-05-28 Philips Corp Intellectual Pty Anordnung von Steuerelementen
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DE10245715A1 (de) * 2002-10-01 2004-04-15 Philips Intellectual Property & Standards Gmbh Verfahren und Vorrichtung zur Erzeugung von Teilabbildungen
US6963631B2 (en) * 2002-10-25 2005-11-08 Koninklijke Philips Electronics N.V. Dynamic detector interlacing for computed tomography
JP4621653B2 (ja) 2003-01-16 2011-01-26 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ センサー素子の配列
DE10307752B4 (de) * 2003-02-14 2007-10-11 Siemens Ag Röntgendetektor
US6859514B2 (en) * 2003-03-14 2005-02-22 Ge Medical Systems Global Technology Company Llc CT detector array with uniform cross-talk
US7081628B2 (en) * 2003-11-10 2006-07-25 Ge Medical Systems Global Technology Company, Llc Spatially patterned light-blocking layers for radiation imaging detectors
EP1532927B1 (fr) 2003-11-21 2007-12-19 Eastman Kodak Company Appareil de radiologie dentaire
US7119341B2 (en) 2003-12-08 2006-10-10 General Electric Company Split scan line and combined data line x-ray detectors
JP2007104219A (ja) * 2005-10-03 2007-04-19 Canon Inc 放射線撮影装置及びその制御方法、放射線撮影システム
DE102005049228B4 (de) * 2005-10-14 2014-03-27 Siemens Aktiengesellschaft Detektor mit einem Array von Photodioden
US9423511B2 (en) 2007-05-16 2016-08-23 Koninklijke Philips N.V. Virtual PET detector and quasi-pixelated readout scheme for PET
JP2009273886A (ja) * 2008-05-12 2009-11-26 Siemens Medical Solutions Usa Inc 医用画像データの適応的処理システム
JP2010190830A (ja) * 2009-02-20 2010-09-02 Hamamatsu Photonics Kk 放射線検出装置
US8324586B2 (en) * 2009-05-18 2012-12-04 General Electric Company Configurable multi resolution flat panel detector
EP2362641B1 (en) * 2010-02-18 2017-03-22 Raytheon Company Imaging System
US8511823B2 (en) 2010-02-18 2013-08-20 Raytheon Company Imaging system
JP5848759B2 (ja) 2010-06-21 2016-01-27 コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. 低線量ctイメージングを実行するための方法及びシステム
US9277141B2 (en) 2010-08-12 2016-03-01 Raytheon Company System, method, and software for image processing
JP5617541B2 (ja) * 2010-11-04 2014-11-05 コニカミノルタ株式会社 放射線画像撮影装置
KR101298913B1 (ko) 2011-08-23 2013-08-20 한국전기연구원 광 스위칭 방식을 이용하는 디지털 엑스―선 영상 검출기의 스캔 방법
US9013615B2 (en) 2011-09-21 2015-04-21 Semiconductor Components Industries, Llc Image sensor with flexible interconnect capabilities
JP5963217B2 (ja) * 2012-06-20 2016-08-03 株式会社日立製作所 X線ct装置
JP6561428B2 (ja) * 2013-08-05 2019-08-21 株式会社ニコン 電子機器、制御方法、及び制御プログラム
JP6274501B2 (ja) * 2013-11-26 2018-02-07 キヤノンメディカルシステムズ株式会社 X線診断装置
JP6342175B2 (ja) 2014-02-10 2018-06-13 キヤノンメディカルシステムズ株式会社 X線ct装置
JP6601465B2 (ja) * 2017-08-15 2019-11-06 株式会社ニコン 撮像装置

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