JP2001141832A - Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム - Google Patents
Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システムInfo
- Publication number
- JP2001141832A JP2001141832A JP2000260018A JP2000260018A JP2001141832A JP 2001141832 A JP2001141832 A JP 2001141832A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2001141832 A JP2001141832 A JP 2001141832A
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- offset
- gain
- real
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 59
- 238000012937 correction Methods 0.000 title description 19
- 238000000034 method Methods 0.000 claims description 31
- 238000012545 processing Methods 0.000 claims description 7
- 238000012935 Averaging Methods 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims 1
- 230000015654 memory Effects 0.000 description 38
- 238000005259 measurement Methods 0.000 description 13
- 230000005855 radiation Effects 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000011159 matrix material Substances 0.000 description 5
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 230000002277 temperature effect Effects 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012984 biological imaging Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000001151 other effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/617—Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/386,723 US6393098B1 (en) | 1999-08-31 | 1999-08-31 | Amplifier offset and gain correction system for X-ray imaging panel |
| US09/386723 | 1999-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001141832A true JP2001141832A (ja) | 2001-05-25 |
| JP2001141832A5 JP2001141832A5 (enExample) | 2007-10-11 |
Family
ID=23526781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000260018A Withdrawn JP2001141832A (ja) | 1999-08-31 | 2000-08-30 | Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6393098B1 (enExample) |
| EP (1) | EP1081942A1 (enExample) |
| JP (1) | JP2001141832A (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7078693B2 (en) | 2003-05-16 | 2006-07-18 | Canon Kabushiki Kaisha | Radiation imaging apparatus |
| JP2007199090A (ja) * | 2007-05-10 | 2007-08-09 | Nagoya Electric Works Co Ltd | Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム |
| WO2010125609A1 (ja) * | 2009-04-30 | 2010-11-04 | 株式会社島津製作所 | 光または放射線撮像装置 |
| JP2012047516A (ja) * | 2010-08-25 | 2012-03-08 | Sony Corp | 放射線撮像装置 |
| JP2022031480A (ja) * | 2016-11-08 | 2022-02-18 | ホロジック， インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7050098B2 (en) * | 2001-03-29 | 2006-05-23 | Canon Kabushiki Kaisha | Signal processing apparatus and method, and image sensing apparatus having a plurality of image sensing regions per image frame |
| EP1301031A1 (de) | 2001-09-29 | 2003-04-09 | Philips Corporate Intellectual Property GmbH | Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren |
| JP2003284707A (ja) * | 2002-03-27 | 2003-10-07 | Canon Inc | 撮影装置、ゲイン補正方法、記録媒体及びプログラム |
| US7065177B2 (en) | 2002-11-14 | 2006-06-20 | General Electric Company | Method and apparatus for correcting a retained image artifact |
| US6879660B2 (en) * | 2002-12-18 | 2005-04-12 | General Electric Company | Method and apparatus for reducing spectrally-sensitive artifacts |
| EP1530363B1 (en) * | 2003-11-04 | 2010-08-11 | STMicroelectronics (Research & Development) Limited | Improvements in or relating to image sensors |
| US7081628B2 (en) * | 2003-11-10 | 2006-07-25 | Ge Medical Systems Global Technology Company, Llc | Spatially patterned light-blocking layers for radiation imaging detectors |
| US7105828B2 (en) * | 2004-02-10 | 2006-09-12 | Ge Medical Systems Global Technology Company, Llc | Hybrid x-ray detector |
| JP2006068512A (ja) * | 2004-08-06 | 2006-03-16 | Canon Inc | 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム |
| WO2008102598A1 (ja) * | 2007-02-21 | 2008-08-28 | Konica Minolta Medical & Graphic, Inc. | 放射線画像撮影装置及び放射線画像撮影システム |
| JP5493852B2 (ja) * | 2007-02-21 | 2014-05-14 | コニカミノルタ株式会社 | 放射線画像撮影装置 |
| CN101690418B (zh) * | 2007-05-31 | 2015-06-03 | 通用电气公司 | 促进修正图像重建中的增益波动的方法和系统 |
| US7963697B2 (en) * | 2009-01-20 | 2011-06-21 | General Electric Company | Gain calibration and correction technique for digital imaging systems |
| JP6887812B2 (ja) * | 2017-01-18 | 2021-06-16 | キヤノン株式会社 | 放射線撮像装置及び放射線撮像システム |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2531477A1 (de) * | 1975-07-15 | 1977-02-03 | Philips Patentverwaltung | Anordnung zur ermittlung der absorption oder der emission einer strahlung |
| JPH04113766A (ja) | 1990-09-04 | 1992-04-15 | Canon Inc | 固体撮像装置 |
| JP2931088B2 (ja) | 1990-11-30 | 1999-08-09 | キヤノン株式会社 | マルチチップ型光電変換装置 |
| JPH04286464A (ja) * | 1991-03-15 | 1992-10-12 | Rohm Co Ltd | イメージセンサの出力回路 |
| US5340988A (en) | 1993-04-05 | 1994-08-23 | General Electric Company | High resolution radiation imaging system |
| US5430785A (en) * | 1994-04-11 | 1995-07-04 | General Electric Company | Detector channel gain calibration using focal spot wobble |
| US5430298A (en) | 1994-06-21 | 1995-07-04 | General Electric Company | CT array with improved photosensor linearity and reduced crosstalk |
| US5579358A (en) | 1995-05-26 | 1996-11-26 | General Electric Company | Compensation for movement in computed tomography equipment |
| US5610404A (en) | 1995-09-05 | 1997-03-11 | General Electric Company | Flat panel imaging device with ground plane electrode |
| US5724095A (en) | 1995-10-03 | 1998-03-03 | Omnivision Technologies Inc. | Charge amplifier for MOS imaging array and method of making same |
| EP0773669B1 (en) | 1995-10-31 | 2000-01-12 | Interuniversitair Micro-Elektronica Centrum Vzw | Circuit, pixel, device and method for reducing fixed pattern noise in solid state imaging devices |
| US5736732A (en) | 1996-12-23 | 1998-04-07 | General Electric Company | Induced charge prevention in semiconductor imaging devices |
| US6194696B1 (en) * | 1998-03-10 | 2001-02-27 | Photobit Corporation | Active pixel sensor with current mode readout |
| US6002277A (en) * | 1998-04-06 | 1999-12-14 | Intersil Corporation | Sample-and-hold circuit having reduced parasitic diode effects and related methods |
-
1999
- 1999-08-31 US US09/386,723 patent/US6393098B1/en not_active Expired - Fee Related
-
2000
- 2000-08-16 EP EP00307006A patent/EP1081942A1/en not_active Withdrawn
- 2000-08-30 JP JP2000260018A patent/JP2001141832A/ja not_active Withdrawn
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7078693B2 (en) | 2003-05-16 | 2006-07-18 | Canon Kabushiki Kaisha | Radiation imaging apparatus |
| JP2007199090A (ja) * | 2007-05-10 | 2007-08-09 | Nagoya Electric Works Co Ltd | Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム |
| WO2010125609A1 (ja) * | 2009-04-30 | 2010-11-04 | 株式会社島津製作所 | 光または放射線撮像装置 |
| JP2012047516A (ja) * | 2010-08-25 | 2012-03-08 | Sony Corp | 放射線撮像装置 |
| CN102420945A (zh) * | 2010-08-25 | 2012-04-18 | 索尼公司 | 放射线图像拾取设备 |
| US8859978B2 (en) | 2010-08-25 | 2014-10-14 | Sony Corporation | Radiation image pickup device |
| CN102420945B (zh) * | 2010-08-25 | 2017-12-26 | 索尼半导体解决方案公司 | 放射线图像拾取设备 |
| JP2022031480A (ja) * | 2016-11-08 | 2022-02-18 | ホロジック， インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
| JP7499745B2 (ja) | 2016-11-08 | 2024-06-14 | ホロジック， インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6393098B1 (en) | 2002-05-21 |
| EP1081942A1 (en) | 2001-03-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070827 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070827 |
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| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20080227 |