JP2001141832A - Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム - Google Patents

Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム

Info

Publication number
JP2001141832A
JP2001141832A JP2000260018A JP2000260018A JP2001141832A JP 2001141832 A JP2001141832 A JP 2001141832A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2001141832 A JP2001141832 A JP 2001141832A
Authority
JP
Japan
Prior art keywords
amplifier
offset
gain
real
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000260018A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001141832A5 (enExample
Inventor
Douglas Albagli
ダグラス・アルバグリ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2001141832A publication Critical patent/JP2001141832A/ja
Publication of JP2001141832A5 publication Critical patent/JP2001141832A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/617—Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
JP2000260018A 1999-08-31 2000-08-30 Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム Withdrawn JP2001141832A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/386,723 US6393098B1 (en) 1999-08-31 1999-08-31 Amplifier offset and gain correction system for X-ray imaging panel
US09/386723 1999-08-31

Publications (2)

Publication Number Publication Date
JP2001141832A true JP2001141832A (ja) 2001-05-25
JP2001141832A5 JP2001141832A5 (enExample) 2007-10-11

Family

ID=23526781

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000260018A Withdrawn JP2001141832A (ja) 1999-08-31 2000-08-30 Ｘ線撮像パネル用の増幅器オフセット及びゲイン補正システム

Country Status (3)

Country Link
US (1) US6393098B1 (enExample)
EP (1) EP1081942A1 (enExample)
JP (1) JP2001141832A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7078693B2 (en) 2003-05-16 2006-07-18 Canon Kabushiki Kaisha Radiation imaging apparatus
JP2007199090A (ja) * 2007-05-10 2007-08-09 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム
WO2010125609A1 (ja) * 2009-04-30 2010-11-04 株式会社島津製作所 光または放射線撮像装置
JP2012047516A (ja) * 2010-08-25 2012-03-08 Sony Corp 放射線撮像装置
JP2022031480A (ja) * 2016-11-08 2022-02-18 ホロジック， インコーポレイテッド 湾曲した圧迫要素を用いた撮像

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Publication number Priority date Publication date Assignee Title
US7050098B2 (en) * 2001-03-29 2006-05-23 Canon Kabushiki Kaisha Signal processing apparatus and method, and image sensing apparatus having a plurality of image sensing regions per image frame
EP1301031A1 (de) 2001-09-29 2003-04-09 Philips Corporate Intellectual Property GmbH Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren
JP2003284707A (ja) * 2002-03-27 2003-10-07 Canon Inc 撮影装置、ゲイン補正方法、記録媒体及びプログラム
US7065177B2 (en) 2002-11-14 2006-06-20 General Electric Company Method and apparatus for correcting a retained image artifact
US6879660B2 (en) * 2002-12-18 2005-04-12 General Electric Company Method and apparatus for reducing spectrally-sensitive artifacts
EP1530363B1 (en) * 2003-11-04 2010-08-11 STMicroelectronics (Research & Development) Limited Improvements in or relating to image sensors
US7081628B2 (en) * 2003-11-10 2006-07-25 Ge Medical Systems Global Technology Company, Llc Spatially patterned light-blocking layers for radiation imaging detectors
US7105828B2 (en) * 2004-02-10 2006-09-12 Ge Medical Systems Global Technology Company, Llc Hybrid x-ray detector
JP2006068512A (ja) * 2004-08-06 2006-03-16 Canon Inc 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム
WO2008102598A1 (ja) * 2007-02-21 2008-08-28 Konica Minolta Medical & Graphic, Inc. 放射線画像撮影装置及び放射線画像撮影システム
JP5493852B2 (ja) * 2007-02-21 2014-05-14 コニカミノルタ株式会社 放射線画像撮影装置
WO2008147416A1 (en) * 2007-05-31 2008-12-04 General Electric Company Methods and systems to facilitate correcting gain fluctuations in image
US7963697B2 (en) * 2009-01-20 2011-06-21 General Electric Company Gain calibration and correction technique for digital imaging systems
JP6887812B2 (ja) * 2017-01-18 2021-06-16 キヤノン株式会社 放射線撮像装置及び放射線撮像システム

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DE2531477A1 (de) * 1975-07-15 1977-02-03 Philips Patentverwaltung Anordnung zur ermittlung der absorption oder der emission einer strahlung
JPH04113766A (ja) 1990-09-04 1992-04-15 Canon Inc 固体撮像装置
JP2931088B2 (ja) 1990-11-30 1999-08-09 キヤノン株式会社 マルチチップ型光電変換装置
JPH04286464A (ja) * 1991-03-15 1992-10-12 Rohm Co Ltd イメージセンサの出力回路
US5340988A (en) 1993-04-05 1994-08-23 General Electric Company High resolution radiation imaging system
US5430785A (en) * 1994-04-11 1995-07-04 General Electric Company Detector channel gain calibration using focal spot wobble
US5430298A (en) 1994-06-21 1995-07-04 General Electric Company CT array with improved photosensor linearity and reduced crosstalk
US5579358A (en) 1995-05-26 1996-11-26 General Electric Company Compensation for movement in computed tomography equipment
US5610404A (en) 1995-09-05 1997-03-11 General Electric Company Flat panel imaging device with ground plane electrode
US5724095A (en) 1995-10-03 1998-03-03 Omnivision Technologies Inc. Charge amplifier for MOS imaging array and method of making same
DE69606147T2 (de) 1995-10-31 2000-06-29 Interuniversitair Micro-Electronica Centrum Vzw, Leuven-Heverlee Schaltung, Bildelement, Vorrichtung und Verfahren zur Verminderung des Rauschens örtlich unveränderlicher Muster in Festkörperbildaufnahmevorrichtungen
US5736732A (en) 1996-12-23 1998-04-07 General Electric Company Induced charge prevention in semiconductor imaging devices
US6194696B1 (en) * 1998-03-10 2001-02-27 Photobit Corporation Active pixel sensor with current mode readout
US6002277A (en) * 1998-04-06 1999-12-14 Intersil Corporation Sample-and-hold circuit having reduced parasitic diode effects and related methods

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7078693B2 (en) 2003-05-16 2006-07-18 Canon Kabushiki Kaisha Radiation imaging apparatus
JP2007199090A (ja) * 2007-05-10 2007-08-09 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査装置の制御プログラム
WO2010125609A1 (ja) * 2009-04-30 2010-11-04 株式会社島津製作所 光または放射線撮像装置
JP2012047516A (ja) * 2010-08-25 2012-03-08 Sony Corp 放射線撮像装置
CN102420945A (zh) * 2010-08-25 2012-04-18 索尼公司 放射线图像拾取设备
US8859978B2 (en) 2010-08-25 2014-10-14 Sony Corporation Radiation image pickup device
CN102420945B (zh) * 2010-08-25 2017-12-26 索尼半导体解决方案公司 放射线图像拾取设备
JP2022031480A (ja) * 2016-11-08 2022-02-18 ホロジック， インコーポレイテッド 湾曲した圧迫要素を用いた撮像
JP7499745B2 (ja) 2016-11-08 2024-06-14 ホロジック， インコーポレイテッド 湾曲した圧迫要素を用いた撮像

Also Published As

Publication number Publication date
US6393098B1 (en) 2002-05-21
EP1081942A1 (en) 2001-03-07

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