JP2001066324A - 容易に変更可能な貫通形終端器を提供するプローブ先端終端装置 - Google Patents

容易に変更可能な貫通形終端器を提供するプローブ先端終端装置

Info

Publication number
JP2001066324A
JP2001066324A JP2000226810A JP2000226810A JP2001066324A JP 2001066324 A JP2001066324 A JP 2001066324A JP 2000226810 A JP2000226810 A JP 2000226810A JP 2000226810 A JP2000226810 A JP 2000226810A JP 2001066324 A JP2001066324 A JP 2001066324A
Authority
JP
Japan
Prior art keywords
probe tip
probe
adapter
termination
circuit board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000226810A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001066324A5 (https=
Inventor
Donald A Whiteman
ドナルド・エイ・ホワイトマン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2001066324A publication Critical patent/JP2001066324A/ja
Publication of JP2001066324A5 publication Critical patent/JP2001066324A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP2000226810A 1999-07-29 2000-07-27 容易に変更可能な貫通形終端器を提供するプローブ先端終端装置 Pending JP2001066324A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/354759 1999-07-29
US09/354,759 US6407562B1 (en) 1999-07-29 1999-07-29 Probe tip terminating device providing an easily changeable feed-through termination

Publications (2)

Publication Number Publication Date
JP2001066324A true JP2001066324A (ja) 2001-03-16
JP2001066324A5 JP2001066324A5 (https=) 2006-10-05

Family

ID=23394800

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000226810A Pending JP2001066324A (ja) 1999-07-29 2000-07-27 容易に変更可能な貫通形終端器を提供するプローブ先端終端装置

Country Status (4)

Country Link
US (1) US6407562B1 (https=)
JP (1) JP2001066324A (https=)
DE (1) DE10028381A1 (https=)
GB (1) GB2352884B (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2365407A (en) * 2000-05-25 2002-02-20 Bamford Excavators Ltd Hydraulic system for a wheel loader machine
KR20040033120A (ko) * 2002-10-11 2004-04-21 주식회사 대양기전 이차전지의 충방전 테스트프로브
KR100452847B1 (ko) * 2002-10-11 2004-10-14 주식회사 대양기전 이차전지의 충방전 테스트프로브
KR100467638B1 (ko) * 2001-08-01 2005-01-24 (주) 위즈도메인 특허 데이터베이스로부터 관련 특허들의 인용관계를 빠른시간내에 검색하여 분석하기 위한 방법
WO2006066676A1 (de) 2004-12-20 2006-06-29 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messspitze für hf-messung
JP2016180746A (ja) * 2015-03-24 2016-10-13 三菱電機株式会社 同軸プローブ

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US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
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DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US7053750B2 (en) * 2002-04-18 2006-05-30 Agilent Technologies, Inc. Voltage probe systems having improved bandwidth capability
JP2005527823A (ja) 2002-05-23 2005-09-15 カスケード マイクロテック インコーポレイテッド デバイスのテスト用プローブ
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US6900649B1 (en) 2003-09-23 2005-05-31 Keithley Instruments, Inc. High frequency RF interconnect for semiconductor automatic test equipment
US7371128B2 (en) * 2003-10-14 2008-05-13 Precision Interconnect, Inc. Cable terminal with air-enhanced contact pins
US7364474B2 (en) * 2003-10-14 2008-04-29 Precision Interconnect, Inc. Cable terminal with contact pins including electrical component
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202004021093U1 (de) 2003-12-24 2006-09-28 Cascade Microtech, Inc., Beaverton Aktiver Halbleiterscheibenmessfühler
US7015709B2 (en) * 2004-05-12 2006-03-21 Delphi Technologies, Inc. Ultra-broadband differential voltage probes
JP2008502167A (ja) 2004-06-07 2008-01-24 カスケード マイクロテック インコーポレイテッド 熱光学チャック
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
KR20070058522A (ko) 2004-09-13 2007-06-08 캐스케이드 마이크로테크 인코포레이티드 양측 프루빙 구조
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7242202B2 (en) * 2005-05-31 2007-07-10 Agilent Technologies, Inc. Signal probe and probe assembly
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
DE202007018733U1 (de) 2006-06-09 2009-03-26 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
CN201303164Y (zh) * 2008-07-24 2009-09-02 富士康(昆山)电脑接插件有限公司 射频同轴连接器
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
WO2010059247A2 (en) 2008-11-21 2010-05-27 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8531191B2 (en) 2010-11-22 2013-09-10 General Electric Company Sensor assembly and methods of measuring a proximity of a machine component to a sensor
US8593156B2 (en) 2010-11-22 2013-11-26 General Electric Company Sensor assembly and microwave emitter for use in a sensor assembly
US8854052B2 (en) 2010-11-22 2014-10-07 General Electric Company Sensor assembly and method of measuring the proximity of a machine component to a sensor
US8624603B2 (en) 2010-11-22 2014-01-07 General Electric Company Sensor assembly and methods of adjusting the operation of a sensor
US8482456B2 (en) 2010-12-16 2013-07-09 General Electric Company Sensor assembly and method of measuring the proximity of a machine component to an emitter
US8742319B2 (en) 2011-12-13 2014-06-03 General Electric Company Sensor and inspection system deploying an optical conduit
US20130328549A1 (en) * 2012-06-07 2013-12-12 Chung Instrument Electronics Industrial Co., Ltd. Rotating mobile probe and probing rod using the same
CN104122417B (zh) * 2013-04-26 2018-09-25 苏州普源精电科技有限公司 一种一体式探头及具有一体式探头的测试测量仪器
US9188606B2 (en) 2013-04-29 2015-11-17 Keysight Technologies, Inc. Oscilloscope current probe with interchangeable range and sensitivity setting modules
US9417266B2 (en) 2014-01-16 2016-08-16 International Business Machines Corporation Implementing handheld transfer impedance probe
US10451515B2 (en) * 2016-09-19 2019-10-22 Electro Scan, Inc. Electric field expansion system for low voltage conductivity inspection
US10816431B1 (en) 2017-09-18 2020-10-27 Electro Scan, Inc. Leak detection system for underground access chambers using conductivity
CN111541072B (zh) * 2020-03-31 2021-10-26 深圳三星通信技术研究有限公司 一种测试转接器
US12174243B2 (en) * 2022-12-14 2024-12-24 Tron Future Tech Inc. Probe assembly, system and method for testing rf device of phased array antenna

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US5183411A (en) * 1992-08-06 1993-02-02 J. A. L. Taiwan Ltd. Coaxial cable
US5373231A (en) * 1993-06-10 1994-12-13 G. G. B. Industries, Inc. Integrated circuit probing apparatus including a capacitor bypass structure
JPH0886808A (ja) 1994-07-20 1996-04-02 Sony Tektronix Corp 高電圧プローブ
US5957717A (en) * 1996-11-26 1999-09-28 Trimble Navigation Limited Range pole with integrated power system
US6079986A (en) * 1998-02-07 2000-06-27 Berg Technology, Inc. Stacking coaxial connector for three printed circuit boards

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2365407A (en) * 2000-05-25 2002-02-20 Bamford Excavators Ltd Hydraulic system for a wheel loader machine
GB2365407B (en) * 2000-05-25 2003-10-08 Bamford Excavators Ltd Hydraulic system for wheeled loader
KR100467638B1 (ko) * 2001-08-01 2005-01-24 (주) 위즈도메인 특허 데이터베이스로부터 관련 특허들의 인용관계를 빠른시간내에 검색하여 분석하기 위한 방법
KR20040033120A (ko) * 2002-10-11 2004-04-21 주식회사 대양기전 이차전지의 충방전 테스트프로브
KR100452847B1 (ko) * 2002-10-11 2004-10-14 주식회사 대양기전 이차전지의 충방전 테스트프로브
WO2006066676A1 (de) 2004-12-20 2006-06-29 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Messspitze für hf-messung
JP2016180746A (ja) * 2015-03-24 2016-10-13 三菱電機株式会社 同軸プローブ

Also Published As

Publication number Publication date
GB0017053D0 (en) 2000-08-30
DE10028381A1 (de) 2001-03-01
GB2352884B (en) 2003-03-05
GB2352884A (en) 2001-02-07
US6407562B1 (en) 2002-06-18

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