JP2000509152A - 水平化され得る器具基部とレーザ光線の自動式の精密水平化装置とを有するレーザー水準儀 - Google Patents
水平化され得る器具基部とレーザ光線の自動式の精密水平化装置とを有するレーザー水準儀Info
- Publication number
- JP2000509152A JP2000509152A JP9538583A JP53858397A JP2000509152A JP 2000509152 A JP2000509152 A JP 2000509152A JP 9538583 A JP9538583 A JP 9538583A JP 53858397 A JP53858397 A JP 53858397A JP 2000509152 A JP2000509152 A JP 2000509152A
- Authority
- JP
- Japan
- Prior art keywords
- laser level
- laser
- inner cylinder
- outer cylinder
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 12
- 238000005259 measurement Methods 0.000 claims description 14
- 239000011248 coating agent Substances 0.000 claims description 2
- 238000000576 coating method Methods 0.000 claims description 2
- 238000000926 separation method Methods 0.000 claims description 2
- 230000005855 radiation Effects 0.000 abstract description 15
- 230000004888 barrier function Effects 0.000 description 6
- 238000013016 damping Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 240000005702 Galium aparine Species 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
- G01C15/002—Active optical surveying means
- G01C15/004—Reference lines, planes or sectors
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Laser Beam Processing (AREA)
- Lasers (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1)水平化可能な放射プラットフォーム(7)と、外側シリンダ(1)内に揺動 するようにつるされていて且つ方向づけエレメントを支持している内側シリンダ (5)を備えるレーザ光線(10)の自動式の精密水平化装置とを有するレーザ ー水準儀において、 − 前記外側シリンダ(1)及び前記内側シリンダ(5)が互いに向き合っ て位置する電極面を有するコンデンサシステムを形成すること、 − 前記電極面のうちの一つがセグメント化されており、当該セグメント( 2、3、4)の分離部(2'、3'、4')がビーム軸(11)の方向に 延在すること、 − 前記外側シリンダ(1)が前記放射プラットフォーム(7)と前記ビー ム軸(11)に中心があるように垂直に結合されていること、及び − 前記コンデンサシステムから前記内側シリンダ(5)の揺動位置の検知 のための信号が導き出され得ること を特徴とするレーザー水準儀。 2)二つより多くの等しいセグメント(2、3、4)が設けられていることを特 徴とする、請求項1に記載のレーザー水準儀。 3)前記外側シリンダ(1)の前記電極面がセグメント化されていることを特徴 とする、請求項1に記載のレーザー水準儀。 4)前記のシリンダのうちの少なくとも一つのシリンダの電極面が、電気的に絶 縁するコーティングを備えていることを特徴とする、 上記請求項のいずれか一項に記載のレーザー水準儀。 5)前記電極セグメント(2、3、4)のそれぞれに不変の基礎容量(C1'、C2 '、C3')が直列に接続されていることを特徴とする、上記請求項のいずれか一 項に記載のレーザー水準儀。 6)容量(C1、C2、C3)の連続的な測定のための唯一つの測定チャンネルが 設けられていることを特徴とする、上記請求項のいずれか一項に記載のレーザー 水準儀。 7)前記放射プラットフォーム(7)がレーザー水準儀ケーシング(14)内に 水平化可能に支持(21)されており、且つ調整原動機(20、20’)により 前記コンデンサシステムの信号に依存して調整され得ることを特徴とする、請求 項1に記載のレーザー水準儀。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19617212.8 | 1996-04-30 | ||
DE19617212A DE19617212C1 (de) | 1996-04-30 | 1996-04-30 | Lasernivellier mit horizontierbarer Instrumentenbasis und selbsttätiger Feinhorizontierung des Laserstrahls |
PCT/EP1997/002172 WO1997041405A1 (de) | 1996-04-30 | 1997-04-26 | Lasernivellier mit horizontierbarer instrumentenbasis und selbsttätiger feinhorizontierung des laserstrahls |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000509152A true JP2000509152A (ja) | 2000-07-18 |
JP3905131B2 JP3905131B2 (ja) | 2007-04-18 |
Family
ID=7792851
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53858397A Expired - Fee Related JP3905131B2 (ja) | 1996-04-30 | 1997-04-26 | 水平化され得る器具基部とレーザ光線の自動式の精密水平化装置とを有するレーザー水準儀 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6313912B1 (ja) |
JP (1) | JP3905131B2 (ja) |
DE (1) | DE19617212C1 (ja) |
WO (1) | WO1997041405A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6922063B2 (en) * | 2003-07-11 | 2005-07-26 | Zircon Corporation | Apparatus and method for capacitive level sensor |
KR101416159B1 (ko) * | 2013-09-06 | 2014-07-14 | 주식회사 기가레인 | 접촉 패드를 구비하는 인쇄회로기판 |
JP6490477B2 (ja) * | 2015-03-31 | 2019-03-27 | 株式会社トプコン | 自動整準方法及び自動整準装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4221483A (en) * | 1978-11-20 | 1980-09-09 | Spectra-Physics, Inc. | Laser beam level instrument |
JPS60210709A (ja) | 1984-04-05 | 1985-10-23 | Tokyo Optical Co Ltd | レ−ザ−測量機械 |
US4717251A (en) * | 1986-02-06 | 1988-01-05 | Cubic Corporation | Elevation measurement in high order surveying |
US4811491A (en) * | 1987-09-04 | 1989-03-14 | Etak, Inc. | Two-axis differential capacitance inclinometer |
US5406713A (en) * | 1988-10-03 | 1995-04-18 | Oman; Robert | Apparatus for maintaining a scientific and measuring instrument or the like in a level plane |
US4949467A (en) * | 1988-10-03 | 1990-08-21 | Robert Oman | Inclinometer including an apparatus for maintaining a scientific and measuring instrument or the like in a level plane |
US4993161A (en) | 1990-01-04 | 1991-02-19 | David White, Inc. | Laser beam level instrument |
EP0459723B1 (en) * | 1990-05-30 | 1996-01-17 | Hitachi, Ltd. | Semiconductor acceleration sensor and vehicle control system using the same |
US6104211A (en) * | 1998-09-11 | 2000-08-15 | Xilinx, Inc. | System for preventing radiation failures in programmable logic devices |
-
1996
- 1996-04-30 DE DE19617212A patent/DE19617212C1/de not_active Expired - Lifetime
-
1997
- 1997-04-26 JP JP53858397A patent/JP3905131B2/ja not_active Expired - Fee Related
- 1997-04-26 WO PCT/EP1997/002172 patent/WO1997041405A1/de active Application Filing
- 1997-04-26 US US09/171,842 patent/US6313912B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
WO1997041405A1 (de) | 1997-11-06 |
DE19617212C1 (de) | 1997-05-28 |
JP3905131B2 (ja) | 2007-04-18 |
US6313912B1 (en) | 2001-11-06 |
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