JP2000247774A - Pulling apparatus of silicon single crystal - Google Patents

Pulling apparatus of silicon single crystal

Info

Publication number
JP2000247774A
JP2000247774A JP11051441A JP5144199A JP2000247774A JP 2000247774 A JP2000247774 A JP 2000247774A JP 11051441 A JP11051441 A JP 11051441A JP 5144199 A JP5144199 A JP 5144199A JP 2000247774 A JP2000247774 A JP 2000247774A
Authority
JP
Japan
Prior art keywords
single crystal
silicon single
shielding member
crystal rod
silicon
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11051441A
Other languages
Japanese (ja)
Other versions
JP3709493B2 (en
Inventor
Kazuhiro Harada
和浩 原田
Yoji Suzuki
洋二 鈴木
Hisashi Furuya
久 降屋
Hitoshi Sasaki
斉 佐々木
Naoki Ono
直樹 小野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Silicon Corp
Original Assignee
Mitsubishi Materials Silicon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Materials Silicon Corp filed Critical Mitsubishi Materials Silicon Corp
Priority to JP05144199A priority Critical patent/JP3709493B2/en
Publication of JP2000247774A publication Critical patent/JP2000247774A/en
Application granted granted Critical
Publication of JP3709493B2 publication Critical patent/JP3709493B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To prevent a silicon single crystal rod from being contaminated by impurities mixed in an inert gas, and further to obtain the highly pure silicon single crystal rod. SOLUTION: A silicon molten liquid 12 is stored in a quartz crucible 13 installed in a chamber 11, and a heater 18 surrounding the outer periphery of the quartz crucible 13 heats the silicon molten liquid 12. A heat-shielding member 26 surrounding the outer periphery of a silicon single crystal rod 25 pulled from the silicon molten liquid 12, and positioned so that the lower end thereof may be at the upper side of the silicon molten liquid 12 so as to form a distance therefrom, shields the radiant heat from the heater 18. A gas- supplying and exhausting means allows an inert gas to flow down between the silicon single crystal rod 25 and the heat-shielding member 26, and to pass the surface of the silicon molten liquid 12 and to be exhausted to the exterior of the chamber 11. A short cylindrical body 31 is installed in the lower part of the heat-shielding member 26 so as to form a prescribed distance from the inner periphery surface of the heat-insulating member 26. The short cylindrical body 31 is made of quartz, and attached through plural attaching ribs.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、シリコン融液から
シリコン単結晶棒を引上げて育成する装置に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for pulling and growing a silicon single crystal rod from a silicon melt.

【0002】[0002]

【従来の技術】従来、この種の装置として、図4に示す
ように、チャンバ1内にシリコン融液2が貯留された石
英るつぼ3が収容され、シリコン単結晶棒5の外周面と
石英るつぼ3の内周面との間にシリコン単結晶棒5を囲
むように筒状の熱遮蔽部材6が挿入され、更に熱遮蔽部
材6の上端が外方に略水平方向に張り出されたものが知
られている。この装置では、熱遮蔽部材6の下端はシリ
コン融液2表面近傍まで延びる。また熱遮蔽部材6の上
端は保温筒9の上端に載置され、この熱遮蔽部材6によ
りヒータ8からシリコン単結晶棒5に照射される輻射熱
が遮断される。更にチャンバ1に接続されたガス給排手
段(図示せず)によりチャンバ1内に不活性ガスを供給
すると、この不活性ガスは二点鎖線の矢印で示すように
シリコン単結晶棒5の外周面を流下し、熱遮蔽部材6下
端及びシリコン融液2表面の隙間を通って石英るつぼ3
外に排出されるようになっている。
2. Description of the Related Art Conventionally, as this type of apparatus, as shown in FIG. 4, a quartz crucible 3 in which a silicon melt 2 is stored in a chamber 1 is accommodated. A cylindrical heat shield member 6 is inserted between the inner peripheral surface of the heat shield member 3 and the silicon single crystal rod 5, and the upper end of the heat shield member 6 projects outward in a substantially horizontal direction. Are known. In this device, the lower end of the heat shielding member 6 extends to near the surface of the silicon melt 2. Further, the upper end of the heat shielding member 6 is placed on the upper end of the heat retaining cylinder 9, and the radiant heat emitted from the heater 8 to the silicon single crystal rod 5 is blocked by the heat shielding member 6. Further, when an inert gas is supplied into the chamber 1 by gas supply / discharge means (not shown) connected to the chamber 1, the inert gas is supplied to the outer peripheral surface of the silicon single crystal rod 5 as shown by a two-dot chain arrow. Through the gap between the lower end of the heat shielding member 6 and the surface of the silicon melt 2 and the quartz crucible 3.
It is designed to be discharged outside.

【0003】このように構成された装置では、シリコン
融液2中の酸素がSiOガス等となって蒸発するが、こ
のとき熱遮蔽部材6の存在により不活性ガスが熱遮蔽部
材6下端及びシリコン融液2表面の隙間をシリコン単結
晶棒5外周面側から石英るつぼ3内周面側に向って勢い
良く流れるため、上記蒸発したSiOガス等の蒸発物を
シリコン単結晶棒5から遠ざける。この結果、上記蒸発
物がシリコン単結晶棒5に取り込まれてシリコン単結晶
棒5に格子欠陥である転位が発生するのを防止できる。
また熱遮蔽部材6は熱を効率よく遮蔽するため、シリコ
ン単結晶棒5の生産性を向上できるようになっている。
In the apparatus configured as described above, oxygen in the silicon melt 2 evaporates as SiO gas or the like. At this time, due to the presence of the heat shielding member 6, the inert gas is removed from the lower end of the heat shielding member 6 and the silicon Since the gas flows vigorously from the outer peripheral surface of the silicon single crystal rod 5 to the inner peripheral surface of the quartz crucible 3 through the gap on the surface of the melt 2, the evaporated matter such as the above-mentioned SiO gas is kept away from the silicon single crystal rod 5. As a result, it is possible to prevent the above-mentioned evaporated substance from being taken into the silicon single crystal rod 5 and generating dislocations, which are lattice defects, in the silicon single crystal rod 5.
In addition, since the heat shielding member 6 efficiently shields heat, the productivity of the silicon single crystal rod 5 can be improved.

【0004】[0004]

【発明が解決しようとする課題】しかし、上記従来のシ
リコン単結晶の引上げ装置では、シリコン融液2から引
上げられるシリコン単結晶棒5よりも上方に位置する部
材から不純物が発生する場合があり、この不純物が不活
性ガスに混入してシリコン単結晶棒5の外周面まで搬送
される不具合がある。特に、カーボンやモリブデンなど
からなる熱遮蔽部材6が図4に示すように下方に向って
直径が小さく形成された場合には、この熱遮蔽部材6か
ら生じた不純物が不活性ガスの流れによってシリコン単
結晶棒5の下部に案内され、この不純物によりシリコン
単結晶棒5が汚染される恐れがあった。本発明の目的
は、不活性ガスに混入した不純物によるシリコン単結晶
棒の汚染を防止でき、高純度のシリコン単結晶棒を得る
ことができるシリコン単結晶の引上げ装置を提供するこ
とにある。
However, in the above-mentioned conventional silicon single crystal pulling apparatus, impurities may be generated from a member located above the silicon single crystal rod 5 pulled from the silicon melt 2. There is a problem that these impurities are mixed into the inert gas and transported to the outer peripheral surface of the silicon single crystal rod 5. In particular, when the heat shielding member 6 made of carbon, molybdenum, or the like is formed to have a smaller diameter toward the lower side as shown in FIG. 4, impurities generated from the heat shielding member 6 cause silicon impurities to flow due to the flow of the inert gas. The silicon single crystal rod 5 was guided to the lower part of the single crystal rod 5 and was contaminated by the impurities. It is an object of the present invention to provide a silicon single crystal pulling apparatus capable of preventing contamination of a silicon single crystal rod by impurities mixed in an inert gas and obtaining a high purity silicon single crystal rod.

【0005】[0005]

【課題を解決するための手段】請求項1に係る発明は、
図1に示すように、チャンバ11内の石英るつぼ13に
貯留されたシリコン融液12から引上げられるシリコン
単結晶棒25の外周面を包囲しかつ下端がシリコン融液
12表面から間隔をあけて上方に位置しヒータ18から
の輻射熱を遮る熱遮蔽部材26と、不活性ガスをシリコ
ン単結晶棒25及び熱遮蔽部材26間を流下させかつシ
リコン融液12表面を通過させてチャンバ11外に排出
するガス給排手段27とを備えたシリコン単結晶の引上
げ装置の改良である。その特徴ある構成は、短筒体31
が熱遮蔽部材26の内周面から所定の間隔をあけて熱遮
蔽部材26の下部に設けられたところにある。この請求
項1に記載されたシリコン単結晶の引上げ装置では、ガ
ス給排手段27によりチャンバ11内に供給された不活
性ガスにはチャンバ11内上部の部材から発生した不純
物が混入する場合があり、この不純物はチャンバ11内
上部の部材表面に沿う不活性ガスの流れに乗って流下
し、更に熱遮蔽部材26内周面に沿って流下する。短筒
体31は熱遮蔽部材26の下部においてこの不純物を含
む不活性ガスをシリコン単結晶棒25に接近させること
なくシリコン融液12の表面まで案内し、チャンバ11
外に排出させる。このため、シリコン単結晶棒25が不
純物により汚染されることは殆どない。
The invention according to claim 1 is
As shown in FIG. 1, an outer peripheral surface of a silicon single crystal rod 25 pulled up from a silicon melt 12 stored in a quartz crucible 13 in a chamber 11 is surrounded and a lower end thereof is spaced upward from the surface of the silicon melt 12 and And the heat shielding member 26 that blocks the radiant heat from the heater 18 and the inert gas flows between the silicon single crystal rod 25 and the heat shielding member 26 and passes through the surface of the silicon melt 12 and is discharged out of the chamber 11. This is an improvement of a silicon single crystal pulling apparatus provided with a gas supply / discharge means 27. The characteristic configuration is the short cylinder 31
Are provided at a lower portion of the heat shielding member 26 at a predetermined interval from the inner peripheral surface of the heat shielding member 26. In the apparatus for pulling a silicon single crystal according to the first aspect of the present invention, the inert gas supplied into the chamber 11 by the gas supply / discharge means 27 may be mixed with impurities generated from the upper member in the chamber 11. The impurities flow down along with the flow of the inert gas along the surface of the upper member in the chamber 11, and further flow down along the inner peripheral surface of the heat shielding member 26. The short cylinder 31 guides the inert gas containing the impurity to the surface of the silicon melt 12 without approaching the silicon single crystal rod 25 under the heat shielding member 26, and
Let it drain out. Therefore, the silicon single crystal rod 25 is hardly contaminated by impurities.

【0006】請求項2に係る発明は、請求項1に係る発
明であって、図3に示すように、熱遮蔽部材26のシリ
コン単結晶棒25を包囲する部分26aが下方に向って
直径が小さく形成され、先端が熱遮蔽部材26の内面に
当接可能に構成された複数の取付リブ31aが短筒体3
1の外周に放射状に形成されたシリコン単結晶の引上げ
装置である。この請求項2に記載されたシリコン単結晶
の引上げ装置では、シリコン単結晶棒25を包囲する部
分26aに上方から短筒体31を挿入することにより、
放射状に形成された取付リブ31aの先端が熱遮蔽部材
26の下部における内周面に当接して短筒体31が取付
けられる。このため、下方に向って直径が小さく形成さ
れた既存の熱遮蔽部材に容易に本発明に係る短筒体31
を取付けることができる。
According to a second aspect of the present invention, as shown in FIG. 3, as shown in FIG. 3, a portion 26a of the heat shielding member 26 surrounding the silicon single crystal rod 25 has a diameter directed downward. The plurality of mounting ribs 31a, which are formed small and whose distal ends can contact the inner surface of the heat shielding member 26,
1 is a pulling apparatus for pulling a silicon single crystal radially formed on the outer periphery of the silicon single crystal. In the silicon single crystal pulling apparatus according to the second aspect, by inserting the short cylindrical body 31 from above into the portion 26a surrounding the silicon single crystal rod 25,
The distal end of the radially-mounted mounting rib 31a contacts the inner peripheral surface of the lower portion of the heat shielding member 26, and the short cylindrical body 31 is mounted. For this reason, the short cylindrical body 31 according to the present invention can be easily attached to the existing heat shielding member having a smaller diameter toward the lower side.
Can be installed.

【0007】一方、取付リブ31aの先端を熱遮蔽部材
26の内周面に当接して取付けた短筒体31は、上方に
持上げることにより熱遮蔽部材26から容易に取外すこ
ともでき、シリコン単結晶棒25引上げ後における引上
げ装置から短筒体31のみを取外して清掃することもで
きる。請求項3に係る発明は、請求項1又は2に係る発
明であって、短筒体31が石英により作られたシリコン
単結晶の引上げ装置である。この請求項3に記載された
シリコン単結晶の引上げ装置では、赤外線を透過させる
石英により短筒体31を作ることにより、短筒体31を
熱遮蔽部材26に取付けても、取付けない場合と比較し
てシリコン単結晶棒25の周囲の温度分布を変更させる
ことはない。
On the other hand, the short cylindrical body 31 with the tip of the mounting rib 31a abutting on the inner peripheral surface of the heat shielding member 26 can be easily removed from the heat shielding member 26 by lifting it up. It is also possible to remove only the short cylinder 31 from the pulling device after pulling the single crystal rod 25 and clean it. The invention according to claim 3 is the invention according to claim 1 or 2, wherein the short cylinder 31 is a silicon single crystal pulling apparatus made of quartz. In the silicon single crystal pulling apparatus according to the third aspect, the short cylindrical body 31 is made of quartz that transmits infrared rays. Thus, the temperature distribution around the silicon single crystal rod 25 is not changed.

【0008】[0008]

【発明の実施の形態】次に本発明の第1の実施の形態を
図面に基づいて説明する。図1に示すように、シリコン
単結晶の引上げ装置10のチャンバ11内には、シリコ
ン融液12を貯留する石英るつぼ13が設けられ、この
石英るつぼ13の外面は黒鉛サセプタ14により被覆さ
れる。石英るつぼ13の下面は上記黒鉛サセプタ14を
介して支軸16の上端に固定され、この支軸16の下部
はるつぼ駆動手段17に接続される。るつぼ駆動手段1
7は図示しないが石英るつぼ13を回転させる第1回転
用モータと、石英るつぼ13を昇降させる昇降用モータ
とを有し、これらのモータにより石英るつぼ13が所定
の方向に回転し得るとともに、上下方向に移動可能とな
っている。石英るつぼ13の外方にはこの石英るつぼ1
3の外周面を所定の間隔をあけて包囲するヒータ18が
設けられ、ヒータ18の外方にはこのヒータ18の外周
面を所定の間隔をあけて包囲する保温筒19が設けられ
る。ヒータ18により石英るつぼ13に投入された高純
度のシリコン多結晶が溶融してシリコン融液12にな
る。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, a first embodiment of the present invention will be described with reference to the drawings. As shown in FIG. 1, a quartz crucible 13 for storing a silicon melt 12 is provided in a chamber 11 of a silicon single crystal pulling apparatus 10, and the outer surface of the quartz crucible 13 is covered with a graphite susceptor 14. The lower surface of the quartz crucible 13 is fixed to the upper end of a support shaft 16 via the graphite susceptor 14, and the lower portion of the support shaft 16 is connected to a crucible driving unit 17. Crucible driving means 1
7 has a first rotation motor (not shown) for rotating the quartz crucible 13 and a lifting / lowering motor for moving the quartz crucible 13 up and down. These motors can rotate the quartz crucible 13 in a predetermined direction. It can be moved in any direction. The quartz crucible 1 is located outside the quartz crucible 13.
A heater 18 surrounding the outer peripheral surface of the heater 3 at a predetermined interval is provided, and a heat retaining cylinder 19 surrounding the outer peripheral surface of the heater 18 at a predetermined interval is provided outside the heater 18. The high-purity silicon polycrystal charged into the quartz crucible 13 by the heater 18 is melted to form the silicon melt 12.

【0009】またチャンバ11の上面にはチャンバ11
より小径の円筒状のケーシング21が設けられる。この
ケーシング21には引上げ手段22が設けられる。引上
げ手段22はケーシング21の上端部に水平状態で旋回
可能に設けられた引上げヘッド(図示せず)と、このヘ
ッドを回転させる第2回転用モータ(図示せず)と、ヘ
ッドから石英るつぼ13の回転中心に向って垂下された
ワイヤケーブル23と、上記ヘッド内に設けられワイヤ
ケーブル23を巻取り又は繰出す引上げ用モータ(図示
せず)とを有する。ワイヤケーブル23の下端にはシリ
コン融液12に浸してシリコン単結晶棒25を引上げる
ための種結晶24が取付けられる。
On the upper surface of the chamber 11, a chamber 11 is provided.
A cylindrical casing 21 having a smaller diameter is provided. The casing 21 is provided with a pulling means 22. The pulling means 22 includes a pulling head (not shown) rotatably provided at the upper end of the casing 21 in a horizontal state, a second rotation motor (not shown) for rotating the head, and a quartz crucible 13 from the head. And a pulling motor (not shown) provided in the head for winding up or feeding out the wire cable 23. At the lower end of the wire cable 23 is attached a seed crystal 24 for dipping in the silicon melt 12 and pulling up the silicon single crystal rod 25.

【0010】シリコン単結晶棒25の外周面と石英るつ
ぼ13の内周面との間にはシリコン単結晶棒25の外周
面を包囲するように熱遮蔽部材26が挿入される。熱遮
蔽部材26は黒鉛により形成され、シリコン単結晶棒2
5を包囲する部分である下方に向うに従って直径が小さ
くなる筒状の筒状部26aと、この筒状部26aの上端
から外方に略水平方向に張り出す円板状のフランジ部2
6bとを有する。筒状部26aの下端はシリコン融液1
2表面近傍まで延び、上端は保温筒19の上端と略同一
高さとなるまで延びる。上記熱遮蔽部材26のフランジ
部26bの下面を保温筒19の上面に設置すると、熱遮
蔽部材26の筒状部26aがチャンバ11内をシリコン
単結晶側とるつぼ内周面側とに区画しかつヒータ18か
らシリコン単結晶棒25に照射される輻射熱を遮断する
ようになっている。
A heat shielding member 26 is inserted between the outer peripheral surface of the silicon single crystal rod 25 and the inner peripheral surface of the quartz crucible 13 so as to surround the outer peripheral surface of the silicon single crystal rod 25. The heat shielding member 26 is formed of graphite, and the silicon single crystal rod 2
5, a cylindrical portion 26a having a diameter decreasing downward as it goes down, and a disk-shaped flange portion 2 projecting outward from the upper end of the cylindrical portion 26a in a substantially horizontal direction.
6b. The lower end of the cylindrical portion 26a is the silicon melt 1
It extends to the vicinity of the two surfaces, and the upper end extends until it is substantially the same height as the upper end of the heat retaining cylinder 19. When the lower surface of the flange portion 26b of the heat shielding member 26 is installed on the upper surface of the heat retaining cylinder 19, the cylindrical portion 26a of the heat shielding member 26 partitions the inside of the chamber 11 into the silicon single crystal side and the crucible inner peripheral surface, and The radiant heat applied to the silicon single crystal rod 25 from the heater 18 is shut off.

【0011】チャンバ11にはアルゴンガスや窒素ガス
等の不活性ガスをシリコン単結晶棒25及び熱遮蔽部材
26間を流下させかつシリコン融液12表面を通過させ
てチャンバ11外に排出するガス給排手段27が接続さ
れる。ガス給排手段27は一端がケーシング21の上部
周壁に接続され他端がエアタンク(図示せず)に接続さ
れたガス供給パイプ27aと、一端がチャンバ11の下
壁に接続され他端が真空ポンプ(図示せず)に接続され
たガス排出パイプ27bとを有する。ガス供給パイプ2
7a及びガス排出パイプ27bにはこれらのパイプ27
a,27bを流れる不活性ガスの流量を調整する第1及
び第2流量調整弁27c,27dがそれぞれ設けられ
る。
An inert gas such as an argon gas or a nitrogen gas flows into the chamber 11 between the silicon single crystal rod 25 and the heat shielding member 26 and passes through the surface of the silicon melt 12 to be discharged out of the chamber 11. Discharge means 27 is connected. The gas supply / discharge means 27 has a gas supply pipe 27a having one end connected to the upper peripheral wall of the casing 21 and the other end connected to an air tank (not shown), and a vacuum pump having one end connected to the lower wall of the chamber 11 and the other end. (Not shown) and a gas discharge pipe 27b. Gas supply pipe 2
7a and the gas discharge pipe 27b
First and second flow control valves 27c and 27d for controlling the flow rate of the inert gas flowing through the first and second inert gases a and 27b are provided, respectively.

【0012】引上げ用モータの出力軸(図示せず)には
ロータリエンコーダ(図示せず)が接続され、るつぼ駆
動手段17には石英るつぼ13内のシリコン融液12の
重量を検出する重量センサ(図示せず)と、支軸16の
昇降位置を検出するリニヤエンコーダ(図示せず)とが
設けられる。ロータリエンコーダ、重量センサ及びリニ
ヤエンコーダの各検出出力はコントローラ(図示せず)
の制御入力に接続され、コントローラの制御出力は引上
げ手段22の引上げ用モータ、るつぼ駆動手段17の昇
降用モータにそれぞれ接続される。またコントローラに
はメモリ(図示せず)が設けられ、このメモリにはロー
タリエンコーダの検出出力に対するワイヤケーブル23
の巻取り長さ、即ちシリコン単結晶棒25の引上げ長さ
がマップとして記憶され、重量センサの検出出力に対す
る石英るつぼ13内のシリコン融液12の液面レベルが
マップとして記憶される。コントローラは重量センサの
検出出力に基づいて石英るつぼ13内のシリコン融液1
2の液面が常に一定のレベルに保つように、るつぼ駆動
手段17の昇降用モータを制御する。
A rotary encoder (not shown) is connected to an output shaft (not shown) of the pulling motor, and a weight sensor (for detecting the weight of the silicon melt 12 in the quartz crucible 13) is connected to the crucible driving means 17. (Not shown), and a linear encoder (not shown) for detecting the elevation position of the support shaft 16. Each detection output of the rotary encoder, weight sensor and linear encoder is a controller (not shown)
And the control output of the controller is connected to a pulling motor of the pulling means 22 and a lifting motor of the crucible driving means 17, respectively. The controller is provided with a memory (not shown), and the memory has a wire cable 23 for detecting output of the rotary encoder.
Is stored as a map, and the liquid level of the silicon melt 12 in the quartz crucible 13 with respect to the detection output of the weight sensor is stored as a map. The controller controls the silicon melt 1 in the quartz crucible 13 based on the detection output of the weight sensor.
The lifting motor of the crucible driving means 17 is controlled so that the liquid level of No. 2 is always kept at a constant level.

【0013】この実施の形態の特徴ある構成は、短筒体
31が熱遮蔽部材26の内周面から所定の間隔をあけて
熱遮蔽部材26の下部に設けられたところにある。図3
に示すように、短筒体31の外周には4本の取付リブ3
1aが放射状に形成され、取付リブ31aの先端は熱遮
蔽部材26の内面に当接可能に構成される。短筒体31
及び取付リブ31aは透明な石英により一体的に作ら
れ、短筒体31の熱遮蔽部材26への取付けは下方に向
って直径が小さく形成された筒状部26aに上方から図
の実線矢印で示すように挿入することにより行われる。
筒状部26aに上方から挿入された短筒体31は筒状部
26aの下部において放射状に形成された取付リブ31
aの先端が内周面に当接することにより取付けられ、短
筒体31は図の破線矢印で示すように上方に持上げるこ
とにより熱遮蔽部材26から取外し可能に取付けられ
る。なお、図では4本の取付リブ31aが形成された場
合を示すが、この取付リブ31aは4本に限らず、3本
又は5本以上でも良い。
A characteristic configuration of this embodiment is that the short cylindrical body 31 is provided at a lower portion of the heat shielding member 26 at a predetermined interval from the inner peripheral surface of the heat shielding member 26. FIG.
As shown in the figure, four mounting ribs 3
1 a is formed radially, and the tip of the mounting rib 31 a is configured to be able to contact the inner surface of the heat shielding member 26. Short cylinder 31
The mounting rib 31a is integrally formed of transparent quartz, and the short cylindrical body 31 is attached to the heat shielding member 26 by attaching a solid arrow in the figure to the cylindrical portion 26a having a smaller diameter toward the lower side. This is done by inserting as shown.
The short tubular body 31 inserted into the tubular portion 26a from above is provided with a mounting rib 31 formed radially below the tubular portion 26a.
The short cylindrical body 31 is detachably attached to the heat shielding member 26 by lifting the short cylindrical body 31 upward as shown by a broken line arrow in the drawing. Although the figure shows a case where four mounting ribs 31a are formed, the number of the mounting ribs 31a is not limited to four, and may be three or five or more.

【0014】このように構成されたシリコン単結晶の引
上げ装置の動作を説明する。図1に示すように、シリコ
ン単結晶棒25を引上げるときには、第1及び第2流量
調整弁27c,27dを調整することにより、シリコン
融液12表面と熱遮蔽部材26下端との間に不活性ガス
を通過させ、シリコン融液12から蒸発するSiOガス
等の蒸発物をシリコン単結晶棒25から遠ざける。
The operation of the silicon single crystal pulling apparatus thus constructed will be described. As shown in FIG. 1, when pulling up the silicon single crystal rod 25, by adjusting the first and second flow control valves 27c and 27d, an improper connection between the surface of the silicon melt 12 and the lower end of the heat shielding member 26 is obtained. The active gas is passed through, and evaporates such as SiO gas evaporating from the silicon melt 12 are kept away from the silicon single crystal rod 25.

【0015】一方、ガス供給パイプ27aからチャンバ
11内に供給された不活性ガスにはチャンバ11内上部
の部材から発生した鉄や銅等の重金属の不純物が混入す
る場合がある。この不純物はチャンバ11内上部の部材
表面に沿う不活性ガスの流れに乗って流下し、図2の一
点鎖線矢印で示すように熱遮蔽部材26の筒状部26a
内周面に沿って流下する。この場合、短筒体31は熱遮
蔽部材26の下部においてシリコン単結晶棒25及び熱
遮蔽部材26間を流下する不活性ガスのうち熱遮蔽部材
26の表面に沿って流下する不活性ガスをシリコン単結
晶棒25から離間させた状態でシリコン融液12の表面
まで案内する。即ち、短筒体31は不純物を含む不活性
ガスをシリコン単結晶棒25に接近させることなくシリ
コン融液12の表面まで案内し、シリコン融液12の表
面まで案内された不活性ガスはその後熱遮蔽部材16下
端及びシリコン融液12表面の隙間を通り、不純物を殆
ど含まない破線矢印で示す不活性ガスとともにチャンバ
11外に排出される。この結果、シリコン融液12から
引上げられるシリコン単結晶棒25周囲の不活性ガスは
不純物を殆ど含まず、上記シリコン単結晶棒25が不純
物により汚染されることは殆どないので、高純度のシリ
コン単結晶棒25を製造することができる。
On the other hand, the inert gas supplied from the gas supply pipe 27a into the chamber 11 sometimes contains impurities of heavy metals such as iron and copper generated from members at the upper portion of the chamber 11. The impurities flow down along with the flow of the inert gas along the surface of the upper member in the chamber 11, and as shown by the dashed-dotted arrow in FIG.
It flows down along the inner peripheral surface. In this case, the short cylindrical body 31 converts the inert gas flowing down along the surface of the heat shielding member 26 out of the inert gas flowing between the silicon single crystal rod 25 and the heat shielding member 26 below the heat shielding member 26 into silicon. It is guided to the surface of the silicon melt 12 while being separated from the single crystal rod 25. That is, the short cylinder 31 guides the inert gas containing impurities to the surface of the silicon melt 12 without approaching the silicon single crystal rod 25, and the inert gas guided to the surface of the silicon melt 12 is then heated. The gas passes through the gap between the lower end of the shielding member 16 and the surface of the silicon melt 12 and is discharged to the outside of the chamber 11 together with the inert gas indicated by the broken arrow containing almost no impurities. As a result, the inert gas around the silicon single crystal rod 25 pulled up from the silicon melt 12 contains almost no impurities, and the silicon single crystal rod 25 is hardly contaminated with impurities. The crystal rod 25 can be manufactured.

【0016】[0016]

【発明の効果】以上述べたように、本発明によれば、シ
リコン単結晶棒及び熱遮蔽部材間を流下する不活性ガス
のうち熱遮蔽部材の表面に沿って流下する不純物を含む
不活性ガスを短筒体がシリコン単結晶棒に接近させるこ
となく案内してチャンバ外に排出するように構成したの
で、シリコン単結晶棒周囲の不活性ガスは不純物を殆ど
含まず、上記シリコン単結晶棒が不純物により汚染され
ることは殆どない。この結果、高純度のシリコン単結晶
棒を製造することができる。また、熱遮蔽部材のシリコ
ン単結晶棒を包囲する部分が下方に向って直径が小さく
形成された場合に、放射状に形成された複数の取付リブ
を介して短筒体を取付けるようにすれば、上方から短筒
体を挿入するだけの簡単な作業で短筒体を取付けること
ができ、下方に向って直径が小さく形成された既存の熱
遮蔽部材に容易に本発明に係る短筒体を取付けることが
できる。一方、取付リブを介して取付けられた短筒体は
上方に持上げることにより熱遮蔽部材から取外すことが
できるので、シリコン単結晶棒引上げ後における引上げ
装置から短筒体のみを取外して清掃することもできる。
更に、短筒体を透明な石英により作れば、この石英は赤
外線を透過するので短筒体を熱遮蔽部材に取付けても、
取付けない場合と比較してシリコン単結晶棒の周囲の温
度分布を変更させることはない。
As described above, according to the present invention, the inert gas containing impurities flowing down along the surface of the heat shielding member among the inert gas flowing between the silicon single crystal rod and the heat shielding member. Is configured so that the short cylinder guides the silicon single crystal rod without approaching the silicon single crystal rod and discharges it outside the chamber.Therefore, the inert gas around the silicon single crystal rod contains almost no impurities, and the silicon single crystal rod is Almost no contamination by impurities. As a result, a high-purity silicon single crystal rod can be manufactured. Further, when the portion surrounding the silicon single crystal rod of the heat shielding member is formed to have a smaller diameter toward the lower side, if the short cylindrical body is mounted via a plurality of mounting ribs formed radially, The short cylinder can be attached by a simple operation simply by inserting the short cylinder from above, and the short cylinder according to the present invention can be easily attached to an existing heat shielding member having a small diameter toward the bottom. be able to. On the other hand, the short cylinder attached via the mounting rib can be removed from the heat shielding member by lifting it upward, so that only the short cylinder is removed from the pulling device after the silicon single crystal rod is pulled and cleaned. Can also.
Furthermore, if the short cylinder is made of transparent quartz, this quartz transmits infrared rays, so even if the short cylinder is attached to the heat shielding member,
The temperature distribution around the silicon single crystal rod is not changed as compared with the case where the rod is not attached.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の引上げ装置の縦断面図。FIG. 1 is a longitudinal sectional view of a pulling device of the present invention.

【図2】図1のA部拡大断面図。FIG. 2 is an enlarged sectional view of a portion A in FIG.

【図3】その引上げ装置の短筒体を含む熱遮蔽部材の要
部破断斜視図。
FIG. 3 is a cutaway perspective view of a main part of a heat shielding member including a short cylinder of the pulling device.

【図4】従来例を示す図2に対応する断面図。FIG. 4 is a sectional view showing a conventional example and corresponding to FIG. 2;

【符号の説明】[Explanation of symbols]

10 シリコン単結晶の引上げ装置 11 チャンバ 12 シリコン融液 13 石英るつぼ 18 ヒータ 25 シリコン単結晶棒 26 熱遮蔽部材 27 ガス給排手段 31 短筒体 31a 取付リブ Reference Signs List 10 silicon single crystal pulling apparatus 11 chamber 12 silicon melt 13 quartz crucible 18 heater 25 silicon single crystal rod 26 heat shielding member 27 gas supply / discharge means 31 short cylindrical body 31a mounting rib

───────────────────────────────────────────────────── フロントページの続き (72)発明者 降屋 久 東京都千代田区大手町1丁目5番1号 三 菱マテリアルシリコン株式会社内 (72)発明者 佐々木 斉 東京都千代田区大手町1丁目5番1号 三 菱マテリアルシリコン株式会社内 (72)発明者 小野 直樹 東京都千代田区大手町1丁目5番1号 三 菱マテリアルシリコン株式会社内 Fターム(参考) 4G077 AA02 BA04 CF00 EG18 EG19 FK18 HA12 PE24 PE27  ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Hisashi Furuya 1-5-1, Otemachi, Chiyoda-ku, Tokyo Within Mitsubishi Materials Silicon Corporation (72) Inventor Hitoshi Sasaki 1-5, Otemachi, Chiyoda-ku, Tokyo No. 1 Mitsubishi Materials Silicon Corporation (72) Inventor Naoki Ono 1-5-1, Otemachi, Chiyoda-ku, Tokyo F-term (reference) 4M077 AA02 BA04 CF00 EG18 EG19 FK18 HA12 PE24 PE27

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 チャンバ(11)内の石英るつぼ(13)に貯留
されたシリコン融液(12)から引上げられるシリコン単結
晶棒(25)の外周面を包囲しかつ下端が前記シリコン融液
(12)表面から間隔をあけて上方に位置しヒータ(18)から
の輻射熱を遮る熱遮蔽部材(26)と、不活性ガスを前記シ
リコン単結晶棒(25)及び前記熱遮蔽部材(26)間を流下さ
せかつ前記シリコン融液(12)表面を通過させて前記チャ
ンバ(11)外に排出するガス給排手段(27)とを備えたシリ
コン単結晶の引上げ装置において、 短筒体(31)が前記熱遮蔽部材(26)の内周面から所定の間
隔をあけて前記熱遮蔽部材(26)の下部に設けられたこと
を特徴とするシリコン単結晶の引上げ装置。
1. A silicon single crystal rod (25) which is pulled up from a silicon melt (12) stored in a quartz crucible (13) in a chamber (11) and has a lower end surrounding the silicon melt.
(12) a heat shielding member (26) that is located above at an interval from the surface and blocks radiant heat from the heater (18), and the inert gas is the silicon single crystal rod (25) and the heat shielding member (26). A gas supply / discharge means (27) for discharging the mixture through the surface of the silicon melt (12) and discharging it out of the chamber (11). ) Is provided below the heat shield member (26) at a predetermined distance from the inner peripheral surface of the heat shield member (26).
【請求項2】 熱遮蔽部材(26)のシリコン単結晶棒(25)
を包囲する部分(26a)が下方に向って直径が小さく形成
され、先端が前記熱遮蔽部材(26)の内面に当接可能に構
成された複数の取付リブ(31a)が短筒体(31)の外周に放
射状に形成された請求項1記載のシリコン単結晶の引上
げ装置。
2. A silicon single crystal rod (25) of a heat shielding member (26).
A plurality of mounting ribs (31a), each of which is formed to have a smaller diameter toward the lower side and a distal end configured to be able to contact the inner surface of the heat shielding member (26), include a short cylindrical body (31). 2. The apparatus for pulling a silicon single crystal according to claim 1, wherein the apparatus is radially formed on the outer periphery of (1).
【請求項3】 短筒体(31)が石英により作られた請求項
1又は2記載のシリコン単結晶の引上げ装置。
3. The apparatus for pulling a silicon single crystal according to claim 1, wherein the short cylinder body is made of quartz.
JP05144199A 1999-02-26 1999-02-26 Silicon single crystal pulling device Expired - Lifetime JP3709493B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP05144199A JP3709493B2 (en) 1999-02-26 1999-02-26 Silicon single crystal pulling device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP05144199A JP3709493B2 (en) 1999-02-26 1999-02-26 Silicon single crystal pulling device

Publications (2)

Publication Number Publication Date
JP2000247774A true JP2000247774A (en) 2000-09-12
JP3709493B2 JP3709493B2 (en) 2005-10-26

Family

ID=12887027

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3709493B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022518858A (en) * 2019-02-01 2022-03-16 ヅィング セミコンダクター コーポレーション Semiconductor crystal growth device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022518858A (en) * 2019-02-01 2022-03-16 ヅィング セミコンダクター コーポレーション Semiconductor crystal growth device
JP7295252B2 (en) 2019-02-01 2023-06-20 ヅィング セミコンダクター コーポレーション Semiconductor crystal growth equipment

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