JP2000131044A - Defect detection method - Google Patents

Defect detection method

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Publication number
JP2000131044A
JP2000131044A JP10301454A JP30145498A JP2000131044A JP 2000131044 A JP2000131044 A JP 2000131044A JP 10301454 A JP10301454 A JP 10301454A JP 30145498 A JP30145498 A JP 30145498A JP 2000131044 A JP2000131044 A JP 2000131044A
Authority
JP
Japan
Prior art keywords
article
defect
sheet
detection method
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10301454A
Other languages
Japanese (ja)
Inventor
Katsutoshi Ishizuka
勝敏 石塚
Hirokazu Iizuka
宏和 飯塚
Takashi Shimizu
崇 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujimori Kogyo Co Ltd
Original Assignee
Fujimori Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujimori Kogyo Co Ltd filed Critical Fujimori Kogyo Co Ltd
Priority to JP10301454A priority Critical patent/JP2000131044A/en
Publication of JP2000131044A publication Critical patent/JP2000131044A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Controlling Sheets Or Webs (AREA)

Abstract

PROBLEM TO BE SOLVED: To make detectable a defect even if the brightness of an article, e.g. a sheet, is high when a defect accompanied with irregularities is detected. SOLUTION: Surface 2a of an article 2 is irradiated obliquely from above with a light beam and a shade formed by irregularities on the surface 2a is detected as a defect. Preferably, the article 2 is a sheet-like material being carried along the longitudinal direction and the optical axis D of the light beam is orthogonal to the carrying direction of the article 2.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は物品の不良検知方法
に係り、特に、明度の高い物品の表面に形成された、凹
凸を伴う不良を検出する際に用いて好適な不良検知方法
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting a defect of an article, and more particularly to a method of detecting a defect which is suitable for detecting a defect having irregularities formed on the surface of an article having high brightness.

【0002】[0002]

【従来の技術】樹脂製のシートには、製造時に、例えば
図6に符号1で示すような不良が生じる場合がある。こ
の不良1は、シート2の長手方向に沿って延びるスジ部
1aと、スジ部1aの中央部に形成された円形状のフィ
ッシュアイ部1bとからなり、また、図7及び図8にそ
れぞれ示すように、スジ部1aはシート2の表面2aに
対し凹状をなし、フィッシュアイ部1bはシート2の表
面2aに対し凸状をなしている。
2. Description of the Related Art In some cases, a defect such as that indicated by reference numeral 1 in FIG. The defect 1 includes a streak portion 1a extending along the longitudinal direction of the sheet 2 and a circular fisheye portion 1b formed at the center of the streak portion 1a, and is shown in FIGS. 7 and 8, respectively. As described above, the streak portion 1a has a concave shape with respect to the surface 2a of the sheet 2, and the fish eye portion 1b has a convex shape with respect to the surface 2a of the sheet 2.

【0003】この不良1は、シート2の物理的特性及び
美観を損なうため排除する必要がある。そこで、従来で
は、例えばCCDカメラのような光学的装置にてシート
2の表面2aを監視し、装置が測定した表面2aの明度
の差から、不良1を検出していた。
[0003] The defect 1 must be eliminated because it impairs the physical properties and appearance of the sheet 2. Therefore, in the related art, the surface 2a of the sheet 2 is monitored by an optical device such as a CCD camera, and a defect 1 is detected based on a difference in brightness of the surface 2a measured by the device.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、白色や
透明等、明度が高いシート2では、不良1の形成に伴う
表面2aの明度の差が小さく、その結果、特に微細な不
良1に対しては、不良1を検出できない場合があった。
本発明は上記事情に鑑みてなされたもので、シート2の
明度が高い場合でも不良1が検出可能な不良検出方法の
提供をその目的としている。
However, in the sheet 2 having a high brightness such as white or transparent, the difference in the brightness of the surface 2a due to the formation of the defect 1 is small. In some cases, defect 1 could not be detected.
The present invention has been made in view of the above circumstances, and has as its object to provide a defect detection method capable of detecting a defect 1 even when the brightness of the sheet 2 is high.

【0005】[0005]

【課題を解決するための手段】本発明は、平滑な表面を
有する物品の表面に形成された凹凸を伴う不良を検出す
る不良検出方法であって、特に、上記物品の表面に対し
斜め上方から光線を照射し、その結果上記凹凸により形
成された陰影を上記不良として検出することを特徴とし
ている。
SUMMARY OF THE INVENTION The present invention relates to a method for detecting a defect having irregularities formed on the surface of an article having a smooth surface, and particularly to a method for detecting a defect from an obliquely upper side with respect to the surface of the article. The method is characterized in that a light beam is irradiated, and as a result, a shadow formed by the unevenness is detected as the defect.

【0006】ここで、上記物品が自らの長手方向に沿っ
て搬送されるシート状をなし、かつ上記光線の光軸が、
上記物品の搬送方向と直交していることが望ましい。
Here, the article is in the form of a sheet conveyed along its own longitudinal direction, and the optical axis of the light beam is
It is desirable that the direction is orthogonal to the transport direction of the article.

【0007】また、上記光線が、上記物品の搬送方向と
直交して配設された複数の光源から出射されることが望
ましい。
[0007] It is desirable that the light beam is emitted from a plurality of light sources arranged orthogonally to the conveying direction of the article.

【0008】一方、本発明の不良検出方法においては、
上記物品の搬送中における上記物品の上下動を防止する
防止手段を有することが望ましい。
On the other hand, in the defect detection method of the present invention,
It is desirable to have a prevention means for preventing the article from moving up and down during the transport of the article.

【0009】[0009]

【発明の実施の形態】以下、図面に基づき、本発明の実
施形態について説明する。また、以下の説明中、上記従
来の技術に記載したものと同様の構成を有する部材につ
いては、上記従来の技術に記載したものと同一の符号を
付して、その説明を省略する。
Embodiments of the present invention will be described below with reference to the drawings. Further, in the following description, members having the same configurations as those described in the above-described conventional technology are denoted by the same reference numerals as those described in the above-described conventional technology, and description thereof is omitted.

【0010】本発明の不良検出方法に使用される装置の
例を図1及び図2に示す。図中符号11はローラ(防止
手段)で、ローラ11には、シート2が、上方から、自
らの長手方向に沿って移動自在に掛け渡されている。こ
こで、シート2は、水平方向に搬送された後、ローラ1
1を支点として下方に屈曲し、図中矢印Aで示すよう
に、下方へと搬送される。その結果、少なくともローラ
11の外周面との接触部位において、シート2の上下動
が防止される。
FIGS. 1 and 2 show an example of an apparatus used in the defect detection method of the present invention. In the figure, reference numeral 11 denotes a roller (prevention means), on which the sheet 2 is movably stretched from above along its own longitudinal direction. Here, after the sheet 2 is conveyed in the horizontal direction, the rollers 1
It is bent downward with 1 as a fulcrum, and is conveyed downward as indicated by arrow A in the figure. As a result, the vertical movement of the sheet 2 is prevented at least at the contact portion with the outer peripheral surface of the roller 11.

【0011】符号12はCCDカメラで、CCDカメラ
12は、ローラ11の上方に下向きに設けられ、かつそ
の撮像範囲は、図1に矢印Bで示すように、シート2の
幅Cより広く設定されている。また、CCDカメラ12
は、図示しない制御部に連結されている。
Reference numeral 12 denotes a CCD camera. The CCD camera 12 is provided downward above the roller 11, and its imaging range is set wider than the width C of the sheet 2 as shown by an arrow B in FIG. ing. In addition, the CCD camera 12
Are connected to a control unit (not shown).

【0012】符号13は投光器で、投光器13は、電源
13aと、電源13aからローラ11側に延びる光ファ
イバ(光源)13bとから概略構成されている。光ファ
イバ13bは、光ファイバ13bから出射された光線の
光軸Dが、シート2の搬送方向と直交し、かつシート2
の表面2aに対し所定の角度で斜め上方から光線を照射
するよう配設されている。ここで、シート2の表面2a
が、その幅方向に沿って均一な光量で照射されるよう、
光線は、シート2を、その全幅にわたり同一の角度で照
射することが望ましい。また、同様の理由により、光線
の拡散角(図1中符号θ)は、0度を最良とし、30度
以内とする。
Reference numeral 13 denotes a light projector, and the light projector 13 is generally constituted by a power source 13a and an optical fiber (light source) 13b extending from the power source 13a to the roller 11 side. In the optical fiber 13b, the optical axis D of the light beam emitted from the optical fiber 13b is orthogonal to the conveying direction of the sheet 2, and
It is arranged to irradiate a light beam obliquely upward from the surface 2a at a predetermined angle. Here, the surface 2a of the sheet 2
Is illuminated with a uniform amount of light along its width,
Preferably, the light beam illuminates the sheet 2 at the same angle over its entire width. For the same reason, the divergence angle of the light beam (symbol θ in FIG. 1) is set to 0 degree as the best and within 30 degrees.

【0013】不良1の検出に際しては、シート2を長手
方向に沿って搬送するとともに、光ファイバ13bから
シート2の表面2aに対し光線を照射する。すると、図
7,8に示すように、表面2aに対しそれぞれ凹状をな
すスジ部1a及び凸状をなすフィッシュアイ部1bに
は、照射側(図7,8中左方)と反対側にそれぞれ陰影
E,Fが形成される。
When detecting the defect 1, the sheet 2 is conveyed along the longitudinal direction, and a light beam is emitted from the optical fiber 13b to the surface 2a of the sheet 2. Then, as shown in FIGS. 7 and 8, the streak portion 1a and the fisheye portion 1b which are respectively concave with respect to the surface 2a are respectively provided on the opposite side to the irradiation side (left side in FIGS. 7 and 8). Shadings E and F are formed.

【0014】また、上記操作と同時に、光線の照射部位
をCCDカメラ12にて撮像する。撮像された映像は、
CCDカメラ12内にシート2の幅方向に沿って配列さ
れた複数のCCDセンサ(図3中符号12a)にて映像
信号(図3中符号14)化されるが、陰影E,Fが形成
された部位では、他の部位より明度が低下するため、図
3中符号14aで示すように、映像信号14のレベルも
低下する。次いで、この映像信号14を更に微分処理し
てS/N比を高めた微分信号15を得、この微分信号1
5を、所定の設定値(図3中符号16)と比較する。
Simultaneously with the above operation, an image of the irradiated area is captured by the CCD camera 12. The captured video is
A plurality of CCD sensors (reference numeral 12a in FIG. 3) arranged in the CCD camera 12 along the width direction of the sheet 2 are converted into video signals (reference numeral 14 in FIG. 3), but shadows E and F are formed. Since the brightness of the portion is lower than that of the other portions, the level of the video signal 14 also decreases as indicated by reference numeral 14a in FIG. Next, the video signal 14 is further differentiated to obtain a differentiated signal 15 having an increased S / N ratio.
5 is compared with a predetermined set value (reference numeral 16 in FIG. 3).

【0015】そして、陰影E,Fの形成部位における微
分信号15のピーク(図3中符号15a)が設定値16
を越えた場合に、このピーク15aを不良1として検出
する。すなわち、本発明においては、光線の照射に伴い
不良1の形成部位に形成された陰影E,Fを検出するこ
とにより、不良1の検出を行っている。ここで、映像信
号14の微分処理及び微分信号15と設定値16との比
較は、上記制御部にて自動的に行われる。また、検出さ
れた不良1の位置データ(シート2の長手方向及び幅方
向に沿った位置)は上記制御部に記憶され、不良1の除
去に際し利用される。
The peak of the differential signal 15 at the formation of the shadows E and F (reference numeral 15a in FIG. 3) is the set value 16
Is exceeded, this peak 15a is detected as defective 1. That is, in the present invention, the defect 1 is detected by detecting the shadows E and F formed at the formation site of the defect 1 due to the irradiation of the light beam. Here, the differential processing of the video signal 14 and the comparison between the differential signal 15 and the set value 16 are automatically performed by the control unit. The position data of the detected defect 1 (the position along the longitudinal direction and the width direction of the sheet 2) is stored in the control unit, and is used for removing the defect 1.

【0016】上記した不良検出方法によれば、陰影E,
Fを不良1として検出しているため、シート2の明度が
高い程、陰影E,Fとの明度の差(微分信号15の陰影
E,F形成部位におけるS/N比)が高くなり、不良1
の検出が容易となる。また、シート2が透明な場合に
は、シート2の下方に、例えば白色等、高明度の物品を
置くことにより、陰影E,Fの検出が可能となる。
According to the above defect detection method, the shadows E,
Since F is detected as defective 1, as the brightness of the sheet 2 is higher, the difference in lightness from the shadows E and F (the S / N ratio of the differential signal 15 at the portions where the shadows E and F are formed) becomes higher. 1
Can be easily detected. When the sheet 2 is transparent, the shadows E and F can be detected by placing a high-brightness article such as white under the sheet 2.

【0017】また、設定値16を適当な値に設定するこ
とにより、表面2aに施された梨地等の処理や、表面2
aに形成された不良1ではないスジ等を検出することな
く、不良1のみを検出することが可能である。更に、明
度の差を伴う不良であれば、例えばシート2に混入また
は付着した異物等、他の不良も検出可能である。加え
て、シート2の上下動がローラ11により防止されるた
め、シート2の上下動に伴う測定値の変動が防止され
る。
Also, by setting the set value 16 to an appropriate value, it is possible to treat the matte or the like applied to the
It is possible to detect only the defect 1 without detecting a streak or the like that is not the defect 1 formed in the area a. Furthermore, if the defect involves a difference in lightness, other defects such as, for example, foreign matter mixed or attached to the sheet 2 can be detected. In addition, since the up and down movement of the sheet 2 is prevented by the roller 11, the fluctuation of the measured value due to the up and down movement of the sheet 2 is prevented.

【0018】本発明の不良検出方法に使用される装置の
他の例を図4及び図5に示す。この装置では、光源に、
電源13aからローラ11側に延びる、上下一対の光フ
ァイバ13bを用いている。ここで、光ファイバ13b
は、個々の光ファイバ13bから出射された光線の光軸
Dが、シート2の搬送方向と直交し、かつシート2の表
面2aに対し所定の角度で斜め上方から光線を照射する
よう配設されている。また、シート2の表面2aが、そ
の幅方向に沿って均一な光量で照射されるよう、上記一
対の光ファイバ13bのうち、上方に位置する光ファイ
バ13b(光ファイバ13bの設置側から見て遠い側を
照射する光ファイバ13b)の長さは、下方に位置する
光ファイバ13bよりもシート2側に延長されている。
他の構成は上記図1及び図2に示す装置と同様である。
FIGS. 4 and 5 show another example of the apparatus used in the defect detection method of the present invention. In this device, the light source
A pair of upper and lower optical fibers 13b extending from the power supply 13a toward the roller 11 is used. Here, the optical fiber 13b
Are arranged so that the optical axis D of the light beam emitted from each optical fiber 13b is orthogonal to the conveying direction of the sheet 2 and irradiates the light beam obliquely from above at a predetermined angle to the surface 2a of the sheet 2. ing. Also, the upper optical fiber 13b of the pair of optical fibers 13b (as viewed from the installation side of the optical fiber 13b), so that the surface 2a of the sheet 2 is irradiated with a uniform amount of light along the width direction. The length of the optical fiber 13b) for irradiating the far side is extended to the sheet 2 side than the optical fiber 13b located below.
Other configurations are the same as those of the apparatus shown in FIGS.

【0019】なお、CCDカメラ12の設置位置や撮像
範囲、シート2の上下動防止方法、更には投光器13の
種類、光源13bの数、投光範囲等は、本願の趣旨を逸
脱すない範囲で適宜変更可能であることは言うまでもな
い。また、上記した不良検出方法は、表面が平滑で、か
つ凹凸を伴う不良を有する物品であれば、3シート2以
外の物品にも適用可能である。
The installation position and the imaging range of the CCD camera 12, the method of preventing the sheet 2 from moving up and down, the type of the light projecting device 13, the number of the light sources 13b, the light projecting range, etc. are within the scope of the present invention. Needless to say, it can be changed as appropriate. In addition, the above-described defect detection method can be applied to an article other than the three sheets 2 as long as the article has a smooth surface and a defect with irregularities.

【0020】[0020]

【発明の効果】以上説明した通り、本発明に係る不良検
出方法によれば、物品の表面に対し斜め上方から光線を
照射し、その結果、不良の形成部位に形成された陰影を
不良として検出しているため、物品の明度が高い程、陰
影との明度の差が高くなり、不良の検出が容易となる。
よって、本発明に係る不良検出方法によれば、従来困難
であった、明度が高い物品に対しても、不良の検出が可
能である。
As described above, according to the defect detection method according to the present invention, a light beam is applied to the surface of an article from obliquely above, and as a result, a shadow formed at a defective portion is detected as a defect. Therefore, as the brightness of the article is higher, the difference between the brightness and the shade is higher, and the defect can be easily detected.
Therefore, according to the defect detection method according to the present invention, it is possible to detect a defect even with respect to an article having high brightness, which has been difficult in the past.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の不良検出方法に使用される装置の例
を示す図2中矢印Iに沿った側面図である。
FIG. 1 is a side view along an arrow I in FIG. 2 showing an example of an apparatus used for a failure detection method of the present invention.

【図2】 本発明の不良検出方法に使用される装置の例
を示す図1中矢印IIに沿った側面図である。
FIG. 2 is a side view along an arrow II in FIG. 1 showing an example of an apparatus used in the defect detection method of the present invention.

【図3】 本発明の不良検出方法の手順を示す図であ
る。
FIG. 3 is a diagram showing a procedure of a defect detection method of the present invention.

【図4】 本発明の不良検出方法に使用される装置の例
を示す図5中矢印IVに沿った側面図である。
FIG. 4 is a side view taken along an arrow IV in FIG. 5, showing an example of an apparatus used in the failure detection method of the present invention.

【図5】 本発明の不良検出方法に使用される装置の例
を示す図4中矢印Vに沿った側面図である。
FIG. 5 is a side view along an arrow V in FIG. 4 showing an example of an apparatus used for the failure detection method of the present invention.

【図6】 本発明が適用される物品における不良の形成
状況を示す図である。
FIG. 6 is a diagram showing a defect formation state in an article to which the present invention is applied.

【図7】 本発明が適用される物品における不良の形成
状況を示す図6中VII−VII線に沿った断面図であ
る。
FIG. 7 is a cross-sectional view taken along the line VII-VII in FIG. 6, showing a defect formation state in an article to which the present invention is applied.

【図8】 本発明が適用される物品における不良の形成
状況を示す図6中VIII−VIII線に沿った断面図
である。
FIG. 8 is a cross-sectional view taken along the line VIII-VIII in FIG. 6 showing a state of formation of a defect in an article to which the present invention is applied.

【符号の説明】[Explanation of symbols]

1 不良 2 シート(物品) 2a シートの表面 11 ローラ(防止手段) 13b 光ファイバ(光源) D 光線の光軸 E,F 陰影 Reference Signs List 1 defective 2 sheet (article) 2a sheet surface 11 roller (prevention means) 13b optical fiber (light source) D optical axis of light beam E, F shadow

フロントページの続き (72)発明者 清水 崇 東京都中央区日本橋馬喰町1丁目4番16号 藤森工業株式会社内 Fターム(参考) 2F065 AA49 BB13 BB15 CC02 FF02 FF42 GG13 HH12 HH14 JJ02 JJ03 JJ09 JJ25 JJ26 LL02 PP16 QQ07 QQ13 QQ25 RR03 3F048 AB05 BA08 DC12 Continuation of the front page (72) Inventor Takashi Shimizu F-term (reference) 2F065 AA49 BB13 BB15 CC02 FF02 FF42 GG13 HH12 HH14 JJ02 JJ03 JJ09 JJ25 JJ26 LL02 PP16 QQ07 QQ13 QQ25 RR03 3F048 AB05 BA08 DC12

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 平滑な表面を有する物品の表面に形成さ
れた凹凸を伴う不良を検出する不良検出方法であって、 上記物品の表面に対し斜め上方から光線を照射し、その
結果上記凹凸により形成された陰影を上記不良として検
出することを特徴とする不良検出方法。
1. A defect detecting method for detecting a defect with irregularities formed on a surface of an article having a smooth surface, wherein the surface of the article is irradiated with a light beam obliquely from above, and as a result, A defect detection method, wherein a formed shadow is detected as the defect.
【請求項2】 上記物品が自らの長手方向に沿って搬送
されるシート状をなし、かつ上記光線の光軸が、上記物
品の搬送方向と直交していることを特徴とする請求項1
に記載の不良検出方法。
2. An article according to claim 1, wherein said article is in the form of a sheet conveyed along its own longitudinal direction, and an optical axis of said light beam is orthogonal to a conveying direction of said article.
The defect detection method described in 1.
【請求項3】 上記光線が、上記物品の搬送方向と直交
して配設された複数の光源から出射されることを特徴と
する請求項2に記載の不良検出方法。
3. The defect detection method according to claim 2, wherein the light beam is emitted from a plurality of light sources arranged orthogonally to a conveying direction of the article.
【請求項4】 上記物品の搬送中における上記物品の上
下動を防止する防止手段を有することを特徴とする請求
項2または3に記載の不良検出方法。
4. The defect detection method according to claim 2, further comprising a prevention unit for preventing the article from moving up and down while the article is being conveyed.
JP10301454A 1998-10-22 1998-10-22 Defect detection method Pending JP2000131044A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300711A (en) * 2005-04-20 2006-11-02 Omron Corp Defect inspection method for metallic cap, regulation method for inspection thereof, and defect inspection method for metallic cap

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300711A (en) * 2005-04-20 2006-11-02 Omron Corp Defect inspection method for metallic cap, regulation method for inspection thereof, and defect inspection method for metallic cap

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