JP2000046885A - Apparatus for testing static electricity breakdown endurance amount - Google Patents

Apparatus for testing static electricity breakdown endurance amount

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Publication number
JP2000046885A
JP2000046885A JP10215897A JP21589798A JP2000046885A JP 2000046885 A JP2000046885 A JP 2000046885A JP 10215897 A JP10215897 A JP 10215897A JP 21589798 A JP21589798 A JP 21589798A JP 2000046885 A JP2000046885 A JP 2000046885A
Authority
JP
Japan
Prior art keywords
charging
measured
mounting table
charging plate
charge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10215897A
Other languages
Japanese (ja)
Inventor
Hiroaki Sakai
宏昭 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP10215897A priority Critical patent/JP2000046885A/en
Publication of JP2000046885A publication Critical patent/JP2000046885A/en
Pending legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PROBLEM TO BE SOLVED: To test a static electricity breakdown endurance amount by reproducing a failure mechanism possibly brought about in the present situation not only for a single electronic component, but for objects of a large or complicate shape such as a product with the parts mounted. SOLUTION: A charging means is placed above an object 1 to be measured which is loaded on an object stage 1. An induction charge is induced to the object 11 on the object stage 1 via the charging means. An endurance amount when an internal circuit of the object 11 to be measured breaks down because of the induction charge is measured. The charging means consists of a charging plate 10 arranged opposite to the object 11 to be measured in a noncontact fashion and a corona generator having a corona discharge electrode 8 disposed opposite to the charging plate 10 for charging the charging plate 10.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品単体だけ
でなく電子部品を基板に実装した状態で電子部品の静電
気破壊耐量を求めることができる静電気破壊耐量試験装
置に係り、特に外部の強電界により誘起された電荷によ
って、内部回路が破壊される耐量を測定する静電気破壊
耐量試験装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electrostatic breakdown withstand test apparatus capable of determining the electrostatic breakdown strength of an electronic component in a state where the electronic component is mounted on a substrate as well as an electronic component alone. The present invention relates to an electrostatic discharge withstand test apparatus for measuring a withstand voltage at which an internal circuit is destroyed by an electric charge induced by an electric field.

【0002】[0002]

【従来の技術】従来においては、この種の静電気破壊耐
量試験装置として、例えば特開平6−58985号公報
に開示されているものがあり、図2に示すように、静電
誘導により帯電した電子部品の静電気破壊耐量試験を行
う装置が提案されている。この装置では、接地に対して
電圧を印加する被測定対象物載置台1と、電子部品2の
外部リード端子4から接地側に電荷を放出させる放電電
極3を用いた方式が採られている。
2. Description of the Related Art Conventionally, as this kind of electrostatic breakdown resistance test apparatus, there is one disclosed in, for example, Japanese Patent Application Laid-Open No. 6-58985. As shown in FIG. An apparatus for performing an electrostatic breakdown resistance test of a component has been proposed. This device employs a method using an object mounting table 1 for applying a voltage to the ground and a discharge electrode 3 for discharging electric charges from an external lead terminal 4 of the electronic component 2 to the ground.

【0003】また、上記従来例に加えて、図3に示すよ
うに、被測定対象物載置台1と電子部品2の間に絶縁板
5を設け、外部リード端子4と被測定対象物載置台1と
の間で放電することを防止した方式もある。
[0003] In addition to the above conventional example, as shown in FIG. There is also a method in which discharge between the two is prevented.

【0004】この方式で静電気破壊耐量試験を行う場
合、先ず、被測定対象物載置台1に電圧を印加し、静電
誘導によって発生した電荷を外部リード端子4から放電
電極3を介して接地側に放出させた後、電子部品2の内
部回路の電気的特性を調べることにより破壊の有無の確
認、および破壊される耐量の測定を行うものである。
[0004] When the electrostatic breakdown resistance test is performed by this method, first, a voltage is applied to the object mounting table 1, and charges generated by electrostatic induction are transferred from the external lead terminals 4 to the ground side via the discharge electrodes 3. Then, by checking the electrical characteristics of the internal circuit of the electronic component 2, the presence or absence of destruction is measured, and the breakdown resistance is measured.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、上記従
来例の方式によれば、接地に対して電圧を印加した被測
定対象物載置台1の上に電子部品2を載せる方式である
が、被測定対象物載置台1と外部リード端子4との間が
狭くなるか、または接触してしまう虞れがあるため、高
電圧を印加した場合に、放電を起こしてしまう可能性が
ある。
However, according to the above-mentioned conventional system, the electronic component 2 is mounted on the object mounting table 1 to which a voltage is applied with respect to the ground. Since there is a possibility that the space between the object mounting table 1 and the external lead terminals 4 becomes narrow or comes into contact with each other, a discharge may occur when a high voltage is applied.

【0006】また、外部リード端子4と被測定対象物載
置台1との間で放電しないように被測定対象物載置台1
と電子部品2との間に絶縁板5を介在させる方式では、
被測定対象物載置台1を高電圧に帯電させるため、絶縁
板5自体の絶縁が破壊されてしまい、かなりの危険性が
伴うものである。
In addition, the object mounting table 1 is prevented from discharging between the external lead terminals 4 and the object mounting table 1.
In the method of interposing the insulating plate 5 between the electronic component 2 and
Since the object mounting table 1 is charged to a high voltage, the insulation of the insulating plate 5 itself is destroyed, which involves considerable danger.

【0007】しかも、上記従来例の方式では、試験を行
える部品に制約があり、実装品のような形状が大きく、
また回路部品が複雑なものでは測定が困難である。
In addition, in the above-described conventional method, there are restrictions on the parts that can be tested, and the shape of a mounted product is large.
In addition, it is difficult to perform measurement when the circuit components are complicated.

【0008】さらに、通常想定される故障メカニズム
は、帯電した絶縁物、例えば包装材料等より発生する電
界により静電誘導で静電気帯電しその電荷を放出するこ
とによって故障に至るものであり、従来の方式では、実
際に起こり得る故障メカニズムとは異なるものである。
[0008] Further, a failure mechanism which is usually assumed is that a failure is caused by electrostatically charging by an electrostatic induction by an electric field generated from a charged insulator, for example, a packaging material, and releasing the charge, thereby causing a failure. The scheme is different from the actual possible failure mechanism.

【0009】本出願に係る発明の目的は、電子部品単体
だけに止まらず、その実装品のような、形状が大きいも
のや複雑なものに対しても、現状起こり得る故障メカニ
ズムを再現させて静電気破壊耐量試験を行えるようにす
ることができる静電気破壊耐量試験装置を提供すること
にある。
The object of the invention according to the present application is not limited to a single electronic component, but it is also possible to reproduce a failure mechanism that can occur at present, even for a large or complicated one such as a mounted product thereof, by electrostatic discharge. An object of the present invention is to provide an electrostatic breakdown withstand test apparatus capable of performing a breakdown withstand test.

【0010】[0010]

【課題を解決するための手段】本出願に係る発明の目的
を実現する第1の構成としては、載置する被測定対象物
を帯電させる被測定対象物載置台と、該被測定対象物載
置台上の被測定対象物の端子から電荷を放出させる放電
電極とを有し、該放電電極による被測定対象物の放電後
に電気的特性を調べることにより電気的破壊耐量を検知
するための静電気破壊耐量試験装置において、前記被測
定対象物載置台上に載置した被測定対象物の上方に帯電
手段を配置し、該帯電手段を介して被測定対象物載置台
上の被測定対象物に誘導電荷を誘起させたことを特徴と
する。
As a first configuration for realizing the object of the invention according to the present application, a measuring object mounting table for charging a measuring object to be mounted, and a measuring object mounting table, A discharge electrode for discharging electric charges from a terminal of the object to be measured on the mounting table, and inspecting electrical characteristics after the discharge of the object to be measured by the discharge electrode to detect an electrostatic breakdown withstand. In the proof test apparatus, a charging unit is arranged above the measurement target placed on the measurement target mounting table, and guided to the measurement target on the measurement target mounting table via the charging unit. The electric charge is induced.

【0011】上記した構成によれば、従来のように接地
に対して電圧を印加した金属板により被測定対象物を直
接帯電させるのでなく、被測定対象物に対し非接触に配
置させた帯電板により誘導電荷を発生させることによ
り、電子部品単体以外の実装品のような形状の大きな、
しかも複雑な回路構成に対しても静電気放電によって破
壊される静電気破壊耐量を容易に測定することができ
る。また、被測定対象物載置台と被測定対象物との間が
狭くなるか、または接触してしまう虞れがないため、高
電圧を印加した場合に、放電を起こすことがない。
According to the above-described structure, the object to be measured is not directly charged by the metal plate to which a voltage is applied with respect to the ground as in the prior art, but is arranged in a non-contact manner with the object to be measured. By generating an induced charge, a large shape like a mounted product other than a single electronic component,
In addition, it is possible to easily measure the electrostatic breakdown strength of a complicated circuit configuration that is destroyed by electrostatic discharge. In addition, since there is no possibility that the space between the mounting table and the object to be measured becomes narrow or there is no risk of contact, the discharge does not occur when a high voltage is applied.

【0012】本出願に係る発明の目的を実現する第2の
構成としては、前記帯電手段は、被測定対象物に対し非
接触に対向配置した帯電板と、該帯電板に近接したコロ
ナ放電電極を介して帯電板を帯電させるコロナ発生器と
を有することを特徴とする。上記した構成によれば、被
測定対象物載置台を高電圧に帯電させる必要がないた
め、通常起こり得る故障メカニズムを再現させた試験が
行える。
As a second configuration for realizing the object of the invention according to the present application, the charging means comprises: a charging plate which is arranged in non-contact with the object to be measured; and a corona discharge electrode which is close to the charging plate. And a corona generator that charges the charging plate via the charging device. According to the above-described configuration, it is not necessary to charge the object-to-be-measured mounting table to a high voltage, so that a test can be performed in which a failure mechanism that can normally occur is reproduced.

【0013】本出願に係る発明の目的を実現する第3の
構成としては、前記帯電手段には、帯電板に予め帯電し
ている電荷を中和させる除電器を有することを特徴とす
る。上記した構成によれば、除電器により帯電板に予め
帯電している電荷を中和させるだけで、試験前の状態に
容易に復帰させ、次回の試験を迅速に行うことができ
る。
As a third configuration for realizing the object of the invention according to the present application, the charging means includes a static eliminator for neutralizing a charge previously charged on the charging plate. According to the above-described configuration, it is possible to easily return to the state before the test simply by neutralizing the electric charge preliminarily charged on the charging plate by the static eliminator, and to quickly perform the next test.

【0014】本出願に係る発明の目的を実現する第4の
構成としては、前記帯電手段には、前記帯電板の表面電
位を測定する表面電位計を有することを特徴とする。
As a fourth structure for realizing the object of the invention according to the present application, the charging means has a surface voltmeter for measuring the surface potential of the charging plate.

【0015】上記した構成によれば、表面電位計により
帯電板の表面電位を測定しながら所望の帯電電位を制御
することができる。
According to the above configuration, a desired charging potential can be controlled while measuring the surface potential of the charging plate with the surface voltmeter.

【0016】本出願に係る発明の目的を実現する第5の
構成としては、前記帯電板の表面抵抗率が1×1014Ω
以上であることを特徴とする。
According to a fifth configuration for realizing the object of the present invention, the charging plate has a surface resistivity of 1 × 10 14 Ω.
It is characterized by the above.

【0017】上記した構成によれば、帯電板の帯電した
電荷の漏洩を最小限に抑止することができる。
According to the above configuration, it is possible to minimize the leakage of the charged electric charge of the charging plate.

【0018】[0018]

【発明の実施の形態】(第1の実施の形態)図1は、本
発明の第1の実施の形態における静電気破壊耐量試験装
置の概要を示す構成図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS (First Embodiment) FIG. 1 is a block diagram showing the outline of an electrostatic discharge withstand test apparatus according to a first embodiment of the present invention.

【0019】1は、電子部品およびその実装品等の被測
定対象物11を載せるための例えば金属製等の導電性を
有する被測定対象物載置台であり、常に接地状態にされ
ている。5は、被測定対象物載置台1と被測定対象物1
1との間に設置される絶縁板で、被測定対象物載置台1
と被測定対象物11との間で放電するのを防止してい
る。
Reference numeral 1 denotes a conductive object mounting table, for example, made of metal or the like, on which an object 11 to be measured such as an electronic component or a component mounted thereon is mounted, and is always grounded. Reference numeral 5 denotes an object mounting table 1 and an object 1
1 is an insulating plate installed between the mounting table 1
It prevents discharge between the object and the object to be measured 11.

【0020】3は、被測定対象物11側から接地側に電
荷を放出させる放電電極である。
Reference numeral 3 denotes a discharge electrode for discharging electric charges from the measured object 11 side to the ground side.

【0021】10は、被測定対象物11に近接対向させ
て静電誘導により被測定対象物11の導体部分に誘導電
荷を発生させるための帯電板であり、該帯電板10は、
帯電した電荷が漏洩するのを防ぐため、例えば表面抵抗
率を約1×1014Ω以上に設定してある。
Reference numeral 10 denotes a charging plate for generating an induced charge in a conductor portion of the object 11 to be measured by electrostatic induction in the vicinity of the object 11 to be measured.
In order to prevent the charged charges from leaking, for example, the surface resistivity is set to about 1 × 10 14 Ω or more.

【0022】9は、被測定対象物11に近接させた針状
のコロナ放電電極8を介して局部的な放電を生起させて
帯電板10を所望の電位まで帯電させるための直流式の
コロナ発生器であり、スイッチを介して2つの電源のう
ちの陽極側あるいは陰極側のいずれか側に接続されるこ
とで正極コロナまたは陰極コロナを発生させるように逆
バイアス可能となるように構成されている。
Reference numeral 9 denotes a direct-current corona generator for generating a local discharge through the needle-shaped corona discharge electrode 8 brought close to the measured object 11 to charge the charging plate 10 to a desired potential. And connected to either the anode side or the cathode side of the two power supplies via a switch so as to be capable of being reverse-biased so as to generate a positive corona or a cathode corona. .

【0023】6は、試験前に帯電板10に予め帯電して
いる電荷を中和させるための除電器である。
Reference numeral 6 denotes a static eliminator for neutralizing the electric charge previously charged on the charging plate 10 before the test.

【0024】7は、帯電板10表面の電位を測定するた
めの表面電位計であり、該表面電位計7により帯電板1
0の表面電位を測定しながら所望の帯電電位となるうよ
うに制御できるようにしている。
Reference numeral 7 denotes a surface voltmeter for measuring the potential on the surface of the charging plate 10.
While controlling the surface potential of 0, it can be controlled so as to be a desired charging potential.

【0025】次に、本実施の形態の使用の一例を説明す
る。図1に示すように、除電器6を用いて予め帯電して
いる電荷を中和した後、接地された被測定対象物載置台
1上の絶縁板5の上に被測定対象物11を置く。
Next, an example of use of this embodiment will be described. As shown in FIG. 1, after neutralizing a pre-charged charge using a static eliminator 6, an object 11 to be measured is placed on an insulating plate 5 on a grounded object mounting table 1. .

【0026】次いで、コロナ発生器9により帯電板10
を所望の電位まで帯電させる。この時、帯電板10表面
を表面電位計7で電位を測定しながら所望の帯電電位と
なるように制御する。
Next, the charging plate 10 is
To a desired potential. At this time, the surface of the charging plate 10 is controlled so as to have a desired charging potential while measuring the potential with the surface voltmeter 7.

【0027】所望の電位まで帯電板10を帯電させた
ら、コロナ発生器9を停止し、放電電極3を用いて被測
定対象物11の測定を行いたい端子より電荷を放出す
る。
When the charging plate 10 is charged to a desired potential, the corona generator 9 is stopped, and electric charges are discharged from the terminal at which the object 11 to be measured is to be measured using the discharge electrode 3.

【0028】そして、電荷の放出後、被測定対象物11
の電気的特性を測定し、破壊の有無を調べることにより
静電気破壊耐量が測定される。
After the charge is released, the object to be measured 11
By measuring the electrical characteristics of the device and examining the presence or absence of destruction, the resistance to electrostatic breakdown is measured.

【0029】[0029]

【発明の効果】請求項1に係る発明によれば、従来のよ
うに接地に対して電圧を印加した金属板により被測定対
象物を直接帯電させるのでなく、被測定対象物に対し非
接触に配置させた帯電板により誘導電荷を発生させるこ
とにより、電子部品単体以外の実装品のような形状の大
きな、しかも複雑な回路構成に対しても静電気放電によ
って破壊される静電気破壊耐量を容易に測定することが
できる。また、被測定対象物載置台と被測定対象物との
間が狭くなるか、または接触してしまう虞れがないた
め、高電圧を印加した場合に、放電を起こすことがな
い。
According to the first aspect of the present invention, the object to be measured is not directly charged by the metal plate to which a voltage is applied with respect to the ground as in the prior art, but is not contacted with the object to be measured. By generating induced charge by the placed charging plate, it is easy to measure the electrostatic discharge withstand capacity that can be destroyed by electrostatic discharge even for a large and complicated circuit configuration such as a mounted product other than a single electronic component. can do. In addition, since there is no possibility that the space between the mounting table and the object to be measured becomes narrow or there is no risk of contact, the discharge does not occur when a high voltage is applied.

【0030】請求項2に係る発明によれば、被測定対象
物載置台を高電圧に帯電させる必要がないため、通常起
こり得る故障メカニズムを再現させた試験が行える。
According to the second aspect of the present invention, it is not necessary to charge the object mounting table to a high voltage, so that a test that reproduces a failure mechanism that can occur normally can be performed.

【0031】請求項3に係る発明によれば、除電器によ
り帯電板に予め帯電している電荷を中和させるだけで、
試験前の状態に容易に復帰させ、次回の試験を迅速に行
うことができる。
According to the third aspect of the present invention, only by neutralizing the charge pre-charged on the charging plate by the static eliminator,
It can be easily returned to the state before the test, and the next test can be quickly performed.

【0032】請求項4に係る発明によれば、表面電位計
により帯電板の表面電位を測定しながら所望の帯電電位
を制御することができる。
According to the fourth aspect of the present invention, it is possible to control a desired charging potential while measuring the surface potential of the charging plate with the surface voltmeter.

【0033】請求項5に係る発明によれば、帯電板の帯
電した電荷の漏洩を最小限に抑止することができる。
According to the fifth aspect of the present invention, it is possible to minimize the leakage of the charged electric charge of the charging plate.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本出願に係る発明の第1の実施の形態における
試験装置の概略を示す構成図
FIG. 1 is a configuration diagram schematically showing a test apparatus according to a first embodiment of the present invention;

【図2】従来例における試験装置の概略を示す構成図FIG. 2 is a configuration diagram showing an outline of a test apparatus in a conventional example.

【図3】従来例における他の試験装置の概略を示す構成
FIG. 3 is a configuration diagram schematically showing another test apparatus in a conventional example.

【符号の説明】[Explanation of symbols]

1…被測定対象物載置台 2…電子部品 3…放電電極 4…外部リード
端子 5…絶縁板 6…除電器 7…表面電位計 8…コロナ放電
電極 9…直流電源 10…帯電板 11…被測定対象物(電子部品およびその実装品)
DESCRIPTION OF SYMBOLS 1 ... Mounted object to be measured 2 ... Electronic parts 3 ... Discharge electrode 4 ... External lead terminal 5 ... Insulating plate 6 ... Static eliminator 7 ... Surface potential meter 8 ... Corona discharge electrode 9 ... DC power supply 10 ... Charging plate 11 ... Object to be measured (electronic components and their mounted products)

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 載置する被測定対象物を帯電させる被測
定対象物載置台と、該被測定対象物載置台上の被測定対
象物の端子から電荷を放出させる放電電極とを有し、該
放電電極による被測定対象物の放電後に電気的特性を調
べることにより電気的破壊耐量を検知するための静電気
破壊耐量試験装置において、前記被測定対象物載置台上
に載置した被測定対象物の上方に帯電手段を配置し、該
帯電手段を介して被測定対象物載置台上の被測定対象物
に誘導電荷を誘起させたことを特徴とする静電気破壊耐
量試験装置。
An object mounting table for charging an object to be mounted, and a discharge electrode for discharging electric charges from a terminal of the object on the object mounting table, In an electrostatic discharge immunity test apparatus for detecting electrical breakdown strength by examining electrical characteristics after discharge of the measurement object by the discharge electrode, the measurement object mounted on the measurement object mounting table A charging means is disposed above the device, and induced charge is induced on the object to be measured on the object mounting table via the charging means.
【請求項2】 前記帯電手段は、被測定対象物に対し非
接触に対向配置した帯電板と、該帯電板に近接したコロ
ナ放電電極を介して帯電板を帯電させるコロナ発生器と
を有することを特徴とする請求項1記載の静電気破壊耐
量試験装置。
2. The image forming apparatus according to claim 1, wherein the charging unit includes a charging plate disposed to face the object to be measured in a non-contact manner, and a corona generator configured to charge the charging plate via a corona discharge electrode close to the charging plate. The electrostatic breakdown resistance test apparatus according to claim 1, wherein:
【請求項3】 前記帯電手段には、帯電板に予め帯電し
ている電荷を中和させる除電器を有することを特徴とす
る請求項2記載の静電気破壊耐量試験装置。
3. The electrostatic breakdown withstanding test apparatus according to claim 2, wherein said charging means includes a static eliminator for neutralizing a charge previously charged on the charging plate.
【請求項4】 前記帯電手段には、前記帯電板の表面電
位を測定する表面電位計を有することを特徴とする請求
項2記載の静電気破壊耐量試験装置。
4. The apparatus according to claim 2, wherein said charging means has a surface voltmeter for measuring a surface potential of said charging plate.
【請求項5】 前記帯電板の表面抵抗率が1×1014Ω
以上であることを特徴とする請求項2乃至4のいずれか
記載の静電気破壊耐量試験装置。
5. The charging plate has a surface resistivity of 1 × 10 14 Ω.
The electrostatic breakdown withstand test apparatus according to any one of claims 2 to 4, wherein:
JP10215897A 1998-07-30 1998-07-30 Apparatus for testing static electricity breakdown endurance amount Pending JP2000046885A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10215897A JP2000046885A (en) 1998-07-30 1998-07-30 Apparatus for testing static electricity breakdown endurance amount

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10215897A JP2000046885A (en) 1998-07-30 1998-07-30 Apparatus for testing static electricity breakdown endurance amount

Publications (1)

Publication Number Publication Date
JP2000046885A true JP2000046885A (en) 2000-02-18

Family

ID=16680073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10215897A Pending JP2000046885A (en) 1998-07-30 1998-07-30 Apparatus for testing static electricity breakdown endurance amount

Country Status (1)

Country Link
JP (1) JP2000046885A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100351693B1 (en) * 1999-10-20 2002-09-11 닛본 덴기 가부시끼가이샤 Apparatus for measuring electric charge
CN102759688A (en) * 2011-04-27 2012-10-31 夏普株式会社 High voltage detection device
JP2012230090A (en) * 2011-04-27 2012-11-22 Sharp Corp High voltage inspection device
JP2012230089A (en) * 2011-04-27 2012-11-22 Sharp Corp High voltage inspection device
EP2639591A4 (en) * 2010-11-10 2015-06-24 Tokyo Electronics Trading Co Ltd Device for inspecting electric field variation resistance of electronic devices and method for detecting electric field variation resistance of electronic devices
CN105158617A (en) * 2015-10-01 2015-12-16 汪金龙 Charge-discharge simulator based on electron induction

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100351693B1 (en) * 1999-10-20 2002-09-11 닛본 덴기 가부시끼가이샤 Apparatus for measuring electric charge
EP2639591A4 (en) * 2010-11-10 2015-06-24 Tokyo Electronics Trading Co Ltd Device for inspecting electric field variation resistance of electronic devices and method for detecting electric field variation resistance of electronic devices
CN102759688A (en) * 2011-04-27 2012-10-31 夏普株式会社 High voltage detection device
JP2012230090A (en) * 2011-04-27 2012-11-22 Sharp Corp High voltage inspection device
JP2012230089A (en) * 2011-04-27 2012-11-22 Sharp Corp High voltage inspection device
CN105158617A (en) * 2015-10-01 2015-12-16 汪金龙 Charge-discharge simulator based on electron induction
CN105158617B (en) * 2015-10-01 2019-06-07 景祝强 A kind of charge and discharge electric simulator induced based on electronics

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