JP2000040014A - Evaluation system of ecu function inspecting device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To efficiently evaluate the function inspecting device of an ECU (electronic control unit). SOLUTION: In this evaluation system, a controller 32 indicates a failure mode to a relay box 22, turns on and off relay and generates a failure state of each inter-pin between an ECU board 16 and a CPU chip 28. In this state, a function inspecting device 10 inspects the board 16 and the chip 28. The controller 32 performs inspection by successively generating various failure states by means of the box 22 and evaluates the function of the device 10.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a function test device for performing a function test of an ECU on which an IC chip is mounted, and to an EC for evaluating whether the function test device can detect an error.
The present invention relates to an evaluation system for a U function inspection device.

[0002]

2. Description of the Related Art Conventionally, various devices have been equipped with an electronic control unit (ECU).
It controls various operations in the device. Even in automobiles, such as engine control and door lock control,
ECUs are used to control various devices, and many E
The CU is mounted on the car. The control targets of such ECUs are increasing more and more, and each ECU is also sophisticated.

The ECU has functions similar to those of a computer, and performs various digital processes by mounting an IC chip having a built-in CPU and the like. Also, it receives various signals and outputs signals for operation control. Therefore, an IC chip is mounted on the board of the ECU,
Each pin of the chip and a pad on the board are connected by soldering.

When the ECU is manufactured, the manufactured E
It is necessary to check whether the CU has a desired function. For this inspection, a function inspection device is used. This function testing device is connected to an ECU, inputs a predetermined test signal to the ECU, and checks the response to check the response.
Test the function of. In particular, it is necessary to check the soldering failure between the ECU board and the IC chip by the function inspection device.

Therefore, at the time of development of the function inspection apparatus, in order to verify whether the soldering failure can be sufficiently checked, an ECU for the soldering failure is manually created, and the judgment result of the function inspection apparatus is recorded. I was checking. That is,
ECUs in which defectives are individually crafted by the number corresponding to the failure mode of the IC chip were prepared and inspected sequentially.

[0006]

Thus, it is possible to verify the function of the function test device. However, the number of pins of the IC chip has been increased and the distance between the pins has been reduced with the recent increase in the functions of ECUs. Therefore, the number of man-hours for the work for the defect increases,
Also, the work itself is becoming more difficult.

SUMMARY OF THE INVENTION The present invention has been made in consideration of the above problems, and has as its object to provide an evaluation system for an ECU function inspection device that can easily evaluate whether the function inspection device can detect an error.

[0008]

SUMMARY OF THE INVENTION The present invention relates to a system for evaluating whether a function inspection device can detect an error in a function inspection device for performing a function inspection of an ECU equipped with an IC chip. Separating the IC chip, interposing a relay box containing a plurality of relays for controlling a plurality of connection relations between the ECU board and the IC chip, controlling ON / OFF of each relay in the relay box, and synchronizing with the control timing. The ECU performs a function test by transmitting and receiving signals between the function test device and the ECU, and based on a result of the function test by the function test device and on / off information of the relay in the relay box, detects an error detection capability of the function test device. It is characterized by being evaluated.

As described above, according to the present invention, the connection between the ECU board and the IC chip can be arbitrarily set by turning on and off the relay in the relay box. Therefore, the failure mode can be sequentially changed, and the inspection by the function inspection device can be performed. Therefore, there is no need to create a defective ECU, and the number of working steps can be greatly reduced. In particular, even if the number of pins is large, each failure mode can be automatically executed, so that the operation evaluation process can be completed in a short time. Further, since the switching of the relays in the relay box is performed automatically, the operation is only required to connect each device, and the operation is very simple.

[0010] Further, by turning on and off a relay in the relay box, open and short states of a connection between the ECU board and the IC chip are generated. As a result, based on poor soldering,
The evaluation can be performed by simulating a pin open, a short between adjacent pins, and the like.

[0011]

Embodiments of the present invention (hereinafter referred to as embodiments) will be described below with reference to the drawings.

An embodiment of a system according to the present invention will be described with reference to FIG. The function test device 10 generates a test signal and tests the function of the ECU from the response. An ECU board 16 is connected to the function inspection device 10 via a cable 12 and a connector 14. The cable 12 is, for example, an RC232C cable, and transmits various electric signals. Connector 14 is EC
It is connected to connection pins provided on the U board 16. E
The CU board 16 has a predetermined circuit mounted thereon, but has an IC socket 18 to which an extension harness 20 is connected instead of an IC chip (hereinafter, referred to as a CPU chip) containing a CPU required for operation. The IC socket 18 has a plurality of pins.
The extension harness 20 which is a bundle of wires corresponding to each pin is connected to a pad provided on the pad 6 by soldering. That is, in the case of a normal ECU, a plurality of pins of a CPU chip are soldered directly (or via an IC socket) to pads on the ECU board 16 to connect the two.
Each wire of the extension harness 20 is connected to each upper pad.

The extension harness 20 includes a relay box 22
Is connected to the extension harness 24 via the. The relay box 22 has a built-in relay corresponding to each wire of the extension harnesses 20, 24, and controls connection between the extension harnesses 20, 24. That is, by individually turning on and off the relays in the relay box 22, the extension harness 2
The electrical connections between the 0, 24 wires can be turned on and off individually. Further, a relay for short-circuiting between the wires is built in the relay box 22, and each pin (at least an adjacent pin) of the IC socket 18 is provided.
It is possible to short the space.

The extension harness 24 is connected to a CPU board 26, and a CPU chip 28 is connected to the CPU board 26 via an IC socket 30. Therefore, the extension harness 2 is connected to the ECU board 16.
0, a relay box 22, an extension harness 24, a CPU board 26, a CPU chip 28 via an IC socket 30.
Is connected. Therefore, each pin of the CPU chip 28,
Each relay of the relay box 22 is located between the corresponding pads of the ECU board 16 so that the connection between them can be turned on / off, or the adjacent pins can be short-circuited.

A controller 32 is connected to the function test apparatus 10. The controller 32 controls the start of measurement of the function test apparatus 10, collects test results from the function test apparatus 10, Record. In addition, the controller 32 controls the on / off of each relay by supplying an instruction on the on / off of each relay in the relay box 22 to the relay box 22.

Therefore, after the controller 32 determines the state of the relay in the relay box 22, the function inspection device 1
By performing a predetermined test according to 0 and receiving the result, the result of the test in the determined state can be collected in the controller 32. Therefore, a poor soldering such as an open due to a poor connection of each pin or a short circuit with an adjacent pin can be simulated by controlling on / off of a relay in the relay box 22.

Here, the operation procedure will be described with reference to FIG. First, the controller 32 issues a failure mode instruction to the relay box 22 (S11). That is, 1-pin open, 2-pin open,...
One of short-circuits between adjacent pins, such as 3-pin short,..., Is selected to indicate the failure mode. As a result, in the relay box 22, the corresponding relay is turned on / off, and the defective state of the designated mode is set.

Next, the controller 32 instructs the function test apparatus 10 to start measurement (S12). In response to this instruction, the function test apparatus 10 outputs a predetermined signal to the EC.
Supply to U board 16. Thus, the ECU board 16 to which the CPU chip 28 is connected via the relay box 22 performs a corresponding operation, and a response is supplied to the function test apparatus 10. The function inspection device 10 transmits the inspection result for each inspection item to the controller 32 from this response. The controller 32 receives and records the inspection result (S13). This inspection result is a judgment result of whether or not there is an abnormality corresponding to the failure mode, and an item of the abnormality (for example, information on a pin having an abnormal voltage value).
And so on.

If the recording for one mode has been completed, it is determined whether or not all the inspections have been completed (S14). If not completed, the process returns to the instruction of the next defective mode, and the inspection is performed. Do. In this way, when the inspections for all the failure modes are completed, it is determined whether or not the corresponding failures have been detected for all the failure modes (S15). It is determined that there is no problem with respect to the inspection (S16), and if NO, it is determined that there is a problem (S17), and information about which failure was not detected is output together with information about which detection was not possible. . Note that S14 is replaced by YE of S15.
The process may be moved between S and S16, and the process may be terminated when there is at least one determination that there is no abnormality.

As described above, according to the system of the present embodiment, the failure mode can be sequentially changed and the inspection by the function inspection apparatus can be performed. Therefore, each bad E
There is no need to create a CU, and the number of work steps can be significantly reduced. In particular, even if the number of pins is large, each failure mode can be automatically executed, so that the operation evaluation process can be completed in a short time. Further, the relay itself can be switched within the relay box, so that the operation itself is very easy.

[0021]

As described above, according to the present invention,
By turning on and off the relay in the relay box, it is possible to simulate an open in the IC chip and a short circuit between adjacent pins. Therefore, the work of creating a soldering failure is unnecessary, and a difficult work is not required, and the time for evaluating the function inspection device can be significantly reduced.

[Brief description of the drawings]

FIG. 1 is a diagram showing an overall configuration of a system.

FIG. 2 is a flowchart illustrating an operation.

[Explanation of symbols]

10 function inspection device, 16 ECU board, 22 relay box, 28 CPU chip, 32 controller.

Claims (2)

[Claims] 1. A system for evaluating whether a function inspection device capable of detecting a function of an ECU having an IC chip mounted thereon is capable of detecting an error. A function inspection device and an ECU are provided, interposing a relay box containing a plurality of relays for controlling a plurality of connection relationships between IC chips, controlling on / off of each relay in the relay box, and synchronizing with control timing.
Transmitting and receiving signals to and from the ECU, performing a function test on the ECU, and evaluating an error detection capability of the function test device based on the result of the function test performed by the function test device and the ON / OFF information of the relay in the relay box. Evaluation system for ECU function testing equipment. 2. The system according to claim 1, wherein the on / off state of a relay in the relay box causes an open / short state of a connection between an ECU board and an IC chip.
Evaluation system for functional inspection devices.