CN117706337A

CN117706337A - Fault location positioning method and system based on HALT and HIL

Info

Publication number: CN117706337A
Application number: CN202410016787.4A
Authority: CN
Inventors: 纪焕礼; 孙凌云; 温读夫; 李婷婷; 魏莉莉; 肖大陆
Original assignee: Weichai Lovol Intelligent Agricultural Technology Co Ltd
Current assignee: Weichai Lovol Intelligent Agricultural Technology Co Ltd
Priority date: 2024-01-05
Filing date: 2024-01-05
Publication date: 2024-03-15

Abstract

The invention provides a fault location method and a fault location system based on HALT and HIL, and relates to the technical field of fault detection; the method comprises the following steps: building a fault positioning test platform which comprises a HALT box and an HIL test assembly; the system comprises: the test platform is provided with a building module, a HALT detection module and an HIL fault positioning module. The fault positioning test platform is built based on the mode that the HALT box and the HIL test assembly are combined, stress is applied to the tested piece through the HALT box, the tested piece is exposed, the strong signal generating and receiving processing functions of the HIL test assembly are utilized, the fault position of the tested piece is rapidly positioned, the fault position is not required to be positioned in a full disc mode, therefore, the time for developing and upgrading hardware can be greatly shortened, and the working efficiency is improved.

Description

Fault location positioning method and system based on HALT and HIL

Technical Field

The invention mainly relates to the technical field of fault detection, in particular to a fault location positioning method and system based on HALT and HIL.

Background

Currently, various industries are developing to mechanization, automation and intelligence, and particularly, under extreme and dangerous environments with high temperature, low temperature and high vibration acceleration, the replacement of manual operation by robots is a trend. Therefore, the requirement of tolerance to extreme stress of the tested piece (such as a chip and a circuit board) is also higher and higher, and the requirement of stress test of the chip and the circuit board is also higher and higher. The current mainstream hardware testing method is to verify and improve the performance of the circuit board through a HALT high acceleration life test, but the device can only apply stress, and the functional test needs an external circuit and signal generation detection device. The existing method is to write a test program in the controller to enable the controller to send out signals uninterruptedly, and the method can only test whether the chip of the output module of the controller works normally in real time, and cannot test the functions of the controller in a full coverage way, so that certain limitations exist.

Disclosure of Invention

Aiming at the defects of the prior art, the invention provides a fault location method and a fault location system based on HALT and HIL.

The technical scheme for solving the technical problems is as follows: a fault location positioning method based on HALT and HIL comprises the following steps:

building a fault positioning test platform, wherein the fault positioning test platform comprises a HALT box and an HIL test assembly;

applying stress to a detected piece which is placed in the HALT box in advance through the HALT box, and generating a fault position detection signal according to a fault phenomenon if a fault occurs;

when the HIL test assembly receives the fault position detection signal, the HIL test assembly is connected with the tested piece, the tested piece is detected through the HIL test assembly by a CAN communication module, if the CAN communication module has no fault, component fault detection is carried out on the tested piece according to detection items in a preset HIL detection list, fault position positioning information of the tested piece is obtained, and the fault position positioning information is displayed.

The beneficial effects of the invention are as follows: based on the mode that HALT case and HIL test module combine together to build fault location test platform, apply stress to the measured piece through the HALT case, make it expose the defect, the powerful signal of reuse HIL test module takes place and receive the function of handling, the fault location of the measured piece is located fast, and does not need the full disk to fix the fault location, consequently can shorten the time of hardware development and upgrading by a wide margin, promote work efficiency.

On the basis of the technical scheme, the invention can be improved as follows.

Further, the step of establishing connection between the HIL testing component and the tested piece includes:

and importing a preset HIL detection list and pin information of the detected piece, wherein the preset HIL detection list comprises detection items of a plurality of components and detection parameters corresponding to the detection items, a simulink whole vehicle model is built based on the preset HIL detection list and the pin information of the detected piece, and connection between the HIL test assembly and the detected piece is built through the simulink whole vehicle model.

Further, the step of detecting the detected piece by the HIL test assembly through the CAN communication module comprises the following steps:

detecting whether a CAN signal of a detected piece is received or not through the HIL test assembly, and if the CAN signal of the detected piece is received, entering a step of detecting the fault of a component of the detected piece;

if the CAN signal of the tested piece is not received, the power module of the tested piece is electrified and detected, if the information of the fault of the power module is obtained, the fault position is positioned as the fault of the power module of the tested piece, and if the information of the normal power module is obtained, the fault position is positioned as the fault of CAN communication.

Further, the step of performing component fault detection on the tested piece according to the detection items in the preset HIL detection list includes:

and detecting the faults of the resistance type components of the tested piece through the simulink whole car model, and if the readings of the whole car fuel oil level model are abnormal and the readings of the whole car fuel oil level model are not changed along with different resistance value signals input by the HIL test assembly, locating the fault position as the faults of the resistance type components.

Further, in the step of performing component fault detection on the tested piece according to the detection items in the preset HIL detection list, the method further includes:

and detecting faults of the rotating speed acquisition chip on the detected piece through the simulink whole car model, and if the readings of the whole car roller rotating speed module are abnormal and the readings of the whole car roller rotating speed module are not changed along with different PWM signals input by the HIL test assembly, positioning the fault position as the faults of the rotating speed acquisition chip.

and performing voltage acquisition chip fault detection on the tested piece through the simulink whole vehicle model, and if the voltage reading of the whole vehicle handle is abnormal and the voltage reading of the whole vehicle handle is not changed along with different voltage signals input by the HIL test assembly, positioning the fault position as a voltage acquisition chip fault.

Further, in the step of applying stress to the test piece placed in advance in the HALT box by the HALT box, if a fault occurs, generating a fault position detection signal according to a fault phenomenon, further comprising:

the HALT box is used for carrying out high-acceleration life aging detection on the detected piece, verifying whether the vibration limit and the high-temperature limit and the low-temperature limit of the detected piece reach or exceed required values, and if the vibration limit and the high-temperature limit and the low-temperature limit reach the required values and have no faults, detecting the vibration limit and the high-temperature limit and the low-temperature limit of the detected piece pass; if the tested piece fails before meeting the requirement, generating a failure position detection signal according to the failure phenomenon.

The other technical scheme for solving the technical problems is as follows: a HALT and HIL-based fault location system comprising:

the test platform building module is used for building a fault location test platform, and the fault location test platform comprises a HALT box and an HIL test assembly;

the HALT detection module is used for applying stress to a detected piece which is placed in the HALT box in advance through the HALT box, and if the detected piece fails, a failure position detection signal is generated according to a failure phenomenon;

and the HIL fault positioning module is used for establishing connection between the HIL test assembly and the tested piece when the HIL test assembly receives the fault position detection signal, detecting the tested piece through the HIL test assembly by using the CAN communication module, if the CAN communication module has no fault, detecting the fault of the tested piece by using the components according to the detection items in the preset HIL detection list, obtaining the fault position positioning information of the tested piece, and displaying the fault position positioning information.

Drawings

FIG. 1 is a schematic flow chart of a fault location method according to an embodiment of the present invention;

FIG. 2 is a second flow chart of a fault location method according to an embodiment of the present invention;

fig. 3 is a functional block diagram of a fault location device according to an embodiment of the present invention.

Detailed Description

For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

In the description of the present invention, it should also be noted that, unless explicitly stated and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" should be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.

As shown in fig. 1 and fig. 2, the fault location method based on HALT and HIL provided by the embodiment of the present invention includes:

and building a fault positioning test platform, wherein the fault positioning test platform comprises a HALT box and an HIL test assembly.

Applying stress to a detected piece which is placed in the HALT box in advance through the HALT box, and generating a fault position detection signal according to a fault phenomenon if a fault occurs; specifically, the tested piece is placed into the HALT box for fixing, stress such as temperature, acceleration and the like is applied through the function of the HALT box, or various signals such as resistance, voltage, current, frequency and the like are provided, the performance of the tested piece (such as a controller) is tested, the function of the whole circuit board is abnormal, the hardware defect is exposed, and various output signals of the tested piece can be monitored. It should be appreciated that failure phenomena include virtual joint drop-out, internal failure, and the like.

In this embodiment, a fault location test platform is built based on a mode that the HALT box and the HIL test assembly are combined, stress is applied to the tested piece through the HALT box, so that the tested piece is exposed to the defect, a fault phenomenon is found, and the specific fault position of the tested piece is quickly located by utilizing the powerful functions of signal generation and receiving processing of the HIL test assembly without locating the fault position in a full disc, so that the time for developing and upgrading hardware can be greatly shortened, and the working efficiency is improved.

Specifically, in the step of applying stress to the measured piece placed in the HALT box in advance through the HALT box, if a fault occurs, generating a fault position detection signal according to a fault phenomenon, the method further includes:

In this embodiment, the test piece passes the test if the applied external stress exceeds the HALT box specification and there is still no failure.

Specifically, the step of establishing connection between the HIL testing component and the tested piece includes:

It should be appreciated that the simulink model is built based on the part program under test and pin definition. And (3) establishing connection between the controller to be tested (namely the tested piece) and the HIL rack (namely the HIL test assembly) through the established simulink whole vehicle model by using the ConfigerationDesk of the HIL.

The ConfigerationDesk is a tool of HIL, CAN be utilized to set up input/output interfaces such as PWM, current, resistance, voltage and CAN required by various controllers to be tested, CAN also receive feedback signals (such as CAN message, PWM, voltage and the like) of the controllers to be tested through the interfaces, and simultaneously, a simulink whole vehicle model which is matched with the interface is built, and the controllers to be tested and the HIL rack are connected through the interfaces, so that signals required by any controllers to be tested CAN be sent, and feedback data of the controllers to be tested CAN be monitored in real time; and displaying the feedback result of the controller to be tested in a parameter display area of the HIL rack through logic calculation of the simulink whole vehicle model so as to monitor the state of the controller to be tested in the HALT test process in real time.

In order to improve the readability of the acquired signals, and facilitate better display in the console of the control desk, the detection parameters need to be configured. The signals of current, resistance, voltage and the like can be logically processed, for example, the collected voltage unit is V, but the reading is very small, the output value can be multiplied by 1000 in a simulink whole vehicle model, the conversion is performed to mV, for example, 0.01V is converted to 10mV, the readability is improved, and the error is not easy to occur.

In this embodiment, the connection between the HIL test assembly and the tested piece is established by building a complete simulink model, and fault detection and location are performed on the tested piece by using the complete simulink model.

Specifically, the step of performing CAN communication module detection on the tested piece through the HIL test assembly includes:

It should be understood that during the HALT test, all signals of the CAN are found to be no longer updated, and the CAN cannot be used to send instructions, but all hard-wired signals and other non-CAN signals are not affected, for example, the handle is pushed to the forward position, and the forward solenoid valve signal has an output, and then a certain chip or component of the CAN module fails.

In this embodiment, a controller to be tested (i.e. a tested piece) is connected with an HIL rack (i.e. an HIL testing component), and is placed into a HALT box to be fixed, so that the controller to be tested is verified to function normally, then HALT test is performed, and after a fault occurs, the fault position of the controller to be tested is located through the HIL rack.

As shown in fig. 2, the following illustrates a process of performing data analysis on component failures of a tested piece in the HIL test assembly:

one of the fault types, resistor-type component fault:

It should be understood that if the controller power module and the CAN communication module work normally: if the reading of the whole vehicle fuel level model shows abnormality and the reading does not change along with the change of the HIL input resistance signal, the controller fuel level resistance calculation chip or the resistor fails.

For example: and if the oil quantity signal does not change along with the input, judging that the oil quantity module is faulty.

Second fault type, rotation speed acquisition chip fault:

It should be understood that if the controller power module and the CAN communication module work normally: if the readings of the whole vehicle roller rotating speed module are abnormal and the readings are not changed along with the change of the HIL input PWM signal, the controller rotating speed acquisition pin or the rotating speed logic processing chip fails.

For example: and if the rotating speed of the roller is displayed incorrectly, judging that the rotating speed processing chip is faulty.

The rotational speed unit collected in the controller is generally rpm/s, and the display rotational speed unit of the whole vehicle is rpm/min, so that in order to improve the test readability, the signals need to be logically processed in a model. The acquired rotation speed signal multiplied by 60 is displayed, and the output signal divided by 60 is sent to the controller.

Third fault type, voltage acquisition chip fault:

It should be understood that if the controller power module and the CAN communication module work normally: if the voltage reading of the handle of the whole vehicle is abnormal and the reading is not changed along with the change of the HIL input voltage signal, the voltage signal acquisition pin or the voltage processing chip of the controller is in fault.

For example: and if the voltage of the handle is displayed incorrectly, judging that the voltage acquisition chip is faulty.

It should be appreciated that the types of faults are numerous and are not limited to the examples described above.

In the above embodiments, all faults can directly and accurately determine which module fails according to the feedback information of the tested piece received by the built fault positioning test platform, and further, the fault positioning and checking can be implemented on the tested piece by searching the detection item corresponding to the fault phenomenon in the preset HIL detection list through the simulink model, so that the time spent in positioning and checking the fault position is shortened, the working efficiency is improved, and meanwhile, the functions of generating and receiving the signals with strong HIL are utilized, so that the state of the tested piece in the full-function coverage monitoring HALT test can be realized, which cannot be realized by means of brushing test programs on the tested piece (such as a PCB board) at present.

As shown in fig. 3, a fault location system based on HALT and HIL provided in an embodiment of the present invention includes:

Specifically, in the HIL fault location module, the connection between the HIL test component and the tested piece is established, specifically:

Specifically, in the HIL fault location module, the detection of the CAN communication module on the tested piece by the HIL test component specifically includes:

The invention utilizes HIL rack modeling to be connected with the controller, can realize providing all types of input signals of the tested piece and monitoring all output signals of the tested piece, not only truly realizes the function of testing 100% of the tested piece and avoids the fault which is exposed and is difficult to find by omitting the HALT test, but also can interact with the tested piece in real time, accurately positions the fault position according to the monitoring data, reduces the investigation range, greatly shortens the time consumed by fault investigation and improves the development efficiency of the PCB of the circuit.

In comparison, when the HALT test is performed, the special test program is burnt on the PCB, so that 100% functional full-coverage test of the tested part cannot be realized, namely, faults which are difficult to find cannot be ignored; and the device cannot interact with the tested piece in real time, so that the fault position is positioned, and only whether the tested piece is still working normally can be judged.

It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

The foregoing description of the preferred embodiments of the invention is not intended to limit the invention to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and scope of the invention are intended to be included within the scope of the invention.

Claims

1. A fault location method based on HALT and HIL, comprising:

2. The fault location method of claim 1, wherein the step of establishing a connection between the HIL test assembly and the test object comprises:

3. The fault location method according to claim 2, wherein the step of performing CAN communication module detection on the object to be detected by the HIL test assembly includes:

4. The fault location method according to claim 2, wherein the step of performing component fault detection on the test piece according to a detection item in a preset HIL detection list includes:

5. The fault location method according to claim 2, wherein in the step of performing component fault detection on the tested piece according to the detection items in the preset HIL detection list, the method further comprises:

6. The fault location method according to claim 2, wherein in the step of performing component fault detection on the tested piece according to the detection items in the preset HIL detection list, the method further comprises:

7. The fault location method according to any one of claims 1 to 6, wherein in the step of applying stress to the test piece previously placed in the HALT box through the HALT box, if a fault occurs, generating a fault location detection signal according to a fault phenomenon, further comprising:

8. A HALT and HIL-based fault location system comprising:

9. The fault location system according to claim 8, wherein in the HIL fault location module, the HIL test component is connected to the tested piece, specifically:

10. The fault location system according to claim 9, wherein in the HIL fault location module, the detection of the CAN communication module on the tested piece by the HIL test component is specifically: