IT1318042B1 - AUTOMATION SYSTEM FOR SEMICONDUCTOR FACTORY AND METHOD FOR WORKING AT LEAST ONE SEMICONDUCTOR WAFER BOX - Google Patents

AUTOMATION SYSTEM FOR SEMICONDUCTOR FACTORY AND METHOD FOR WORKING AT LEAST ONE SEMICONDUCTOR WAFER BOX

Info

Publication number
IT1318042B1
IT1318042B1 IT2000MI001408A ITMI20001408A IT1318042B1 IT 1318042 B1 IT1318042 B1 IT 1318042B1 IT 2000MI001408 A IT2000MI001408 A IT 2000MI001408A IT MI20001408 A ITMI20001408 A IT MI20001408A IT 1318042 B1 IT1318042 B1 IT 1318042B1
Authority
IT
Italy
Prior art keywords
semiconductor
working
automation system
wafer box
semiconductor wafer
Prior art date
Application number
IT2000MI001408A
Other languages
Italian (it)
Inventor
Young-Jo Kang
Sung-Hae Ha
Kyeong-Seok Park
Original Assignee
Hyundai Electronics Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR10-1999-0023539A external-priority patent/KR100529389B1/en
Priority claimed from KR10-1999-0023540A external-priority patent/KR100507871B1/en
Priority claimed from KR1019990024872A external-priority patent/KR100540471B1/en
Priority claimed from KR10-1999-0028417A external-priority patent/KR100498602B1/en
Application filed by Hyundai Electronics Ind filed Critical Hyundai Electronics Ind
Publication of ITMI20001408A0 publication Critical patent/ITMI20001408A0/en
Publication of ITMI20001408A1 publication Critical patent/ITMI20001408A1/en
Application granted granted Critical
Publication of IT1318042B1 publication Critical patent/IT1318042B1/en

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41865—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by job scheduling, process planning, material flow
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4183—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/31—From computer integrated manufacturing till monitoring
    • G05B2219/31218—Scheduling communication on bus
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32277—Agv schedule integrated into cell schedule
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/60—Electric or hybrid propulsion means for production processes

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • General Factory Administration (AREA)
IT2000MI001408A 1999-06-22 2000-06-22 AUTOMATION SYSTEM FOR SEMICONDUCTOR FACTORY AND METHOD FOR WORKING AT LEAST ONE SEMICONDUCTOR WAFER BOX IT1318042B1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-1999-0023539A KR100529389B1 (en) 1999-06-22 1999-06-22 Method for operating scrubber used in manufacturing semiconductor
KR10-1999-0023540A KR100507871B1 (en) 1999-06-22 1999-06-22 Method for providing recipe to physical vapor depositor in plant manufacturing semiconductor
KR1019990024872A KR100540471B1 (en) 1999-06-28 1999-06-28 System for automatically operating single wafer type equipment used in manufacturing semiconductor and method using for the same
KR10-1999-0028417A KR100498602B1 (en) 1999-07-14 1999-07-14 Method for operating sputtering equipment in manufacturing semiconductor

Publications (3)

Publication Number Publication Date
ITMI20001408A0 ITMI20001408A0 (en) 2000-06-22
ITMI20001408A1 ITMI20001408A1 (en) 2001-12-22
IT1318042B1 true IT1318042B1 (en) 2003-07-21

Family

ID=27483375

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2000MI001408A IT1318042B1 (en) 1999-06-22 2000-06-22 AUTOMATION SYSTEM FOR SEMICONDUCTOR FACTORY AND METHOD FOR WORKING AT LEAST ONE SEMICONDUCTOR WAFER BOX

Country Status (7)

Country Link
JP (1) JP2001068391A (en)
CN (1) CN1196044C (en)
DE (1) DE10030461A1 (en)
FR (1) FR2796474B1 (en)
GB (1) GB2351363B (en)
IT (1) IT1318042B1 (en)
NL (1) NL1015480C2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6535784B2 (en) * 2001-04-26 2003-03-18 Tokyo Electron, Ltd. System and method for scheduling the movement of wafers in a wafer-processing tool
US7337019B2 (en) * 2001-07-16 2008-02-26 Applied Materials, Inc. Integration of fault detection with run-to-run control
US6907305B2 (en) * 2002-04-30 2005-06-14 Advanced Micro Devices, Inc. Agent reactive scheduling in an automated manufacturing environment
JP4673548B2 (en) * 2003-11-12 2011-04-20 東京エレクトロン株式会社 Substrate processing apparatus and control method thereof
CN111301982A (en) * 2019-11-12 2020-06-19 深圳中集智能科技有限公司 Synchronous beat system and control method for container production factory

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4667403A (en) * 1984-05-16 1987-05-26 Siemens Aktiengesellschaft Method for manufacturing electronic card modules
US4974166A (en) * 1987-05-18 1990-11-27 Asyst Technologies, Inc. Processing systems with intelligent article tracking
GB2279775B (en) * 1990-09-17 1995-04-26 Honda Motor Co Ltd Production control method and system therefor
US5668056A (en) * 1990-12-17 1997-09-16 United Microelectronics Corporation Single semiconductor wafer transfer method and manufacturing system
JP3309997B2 (en) * 1991-09-05 2002-07-29 株式会社日立製作所 Compound processing equipment
EP0633207A1 (en) * 1993-07-07 1995-01-11 Siemens Aktiengesellschaft Conveying system for the transport of samples to different treating arrangements
US5432702A (en) * 1994-06-17 1995-07-11 Advanced Micro Devices Inc. Bar code recipe selection system using workstation controllers
US5751581A (en) * 1995-11-13 1998-05-12 Advanced Micro Devices Material movement server

Also Published As

Publication number Publication date
ITMI20001408A1 (en) 2001-12-22
JP2001068391A (en) 2001-03-16
NL1015480C2 (en) 2002-08-22
CN1196044C (en) 2005-04-06
FR2796474A1 (en) 2001-01-19
FR2796474B1 (en) 2006-11-17
DE10030461A1 (en) 2001-01-25
GB2351363B (en) 2003-12-10
CN1280323A (en) 2001-01-17
GB0015352D0 (en) 2000-08-16
ITMI20001408A0 (en) 2000-06-22
GB2351363A (en) 2000-12-27
NL1015480A1 (en) 2000-12-28

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