IT1232516B - Procedimento interno di autodiagnosi e di programmazione della ridondanza per circuiti di memoria e disposizione per l'attuazione del procedimento - Google Patents
Procedimento interno di autodiagnosi e di programmazione della ridondanza per circuiti di memoria e disposizione per l'attuazione del procedimentoInfo
- Publication number
- IT1232516B IT1232516B IT8967702A IT6770289A IT1232516B IT 1232516 B IT1232516 B IT 1232516B IT 8967702 A IT8967702 A IT 8967702A IT 6770289 A IT6770289 A IT 6770289A IT 1232516 B IT1232516 B IT 1232516B
- Authority
- IT
- Italy
- Prior art keywords
- programming
- redundancy
- procedure
- memory
- self
- Prior art date
Links
- 238000000034 method Methods 0.000 title 2
- 238000004092 self-diagnosis Methods 0.000 title 1
- 230000002427 irreversible effect Effects 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DD88318971A DD274923A1 (de) | 1988-08-16 | 1988-08-16 | Internes selbsttest- und redundanzprogrammierungsverfahren fuer speicherschaltkreise und anordnung zur durchfuehrung des verfahrens |
Publications (2)
Publication Number | Publication Date |
---|---|
IT8967702A0 IT8967702A0 (it) | 1989-08-14 |
IT1232516B true IT1232516B (it) | 1992-02-19 |
Family
ID=5601766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT8967702A IT1232516B (it) | 1988-08-16 | 1989-08-14 | Procedimento interno di autodiagnosi e di programmazione della ridondanza per circuiti di memoria e disposizione per l'attuazione del procedimento |
Country Status (5)
Country | Link |
---|---|
DD (1) | DD274923A1 (it) |
DE (1) | DE3924695A1 (it) |
FR (1) | FR2635607A1 (it) |
IT (1) | IT1232516B (it) |
NL (1) | NL8902076A (it) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0675436B1 (en) * | 1994-03-31 | 1999-10-27 | STMicroelectronics, Inc. | Recoverable set associative cache |
DE19963689A1 (de) * | 1999-12-29 | 2001-07-12 | Infineon Technologies Ag | Schaltungsanordnung eines integrierten Halbleiterspeichers zum Speichern von Adressen fehlerhafter Speicherzellen |
DE10002127B4 (de) * | 2000-01-19 | 2012-12-27 | Infineon Technologies Ag | Testverfahren für einen Datenspeicher |
DE10256487B4 (de) | 2002-12-03 | 2008-12-24 | Infineon Technologies Ag | Integrierter Speicher und Verfahren zum Testen eines integrierten Speichers |
DE102004047330B4 (de) | 2004-09-29 | 2011-04-07 | Qimonda Ag | Integrierter Halbleiterspeicher |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2664137B2 (ja) * | 1985-10-29 | 1997-10-15 | 凸版印刷株式会社 | Icカード |
-
1988
- 1988-08-16 DD DD88318971A patent/DD274923A1/de not_active IP Right Cessation
-
1989
- 1989-07-26 DE DE3924695A patent/DE3924695A1/de not_active Withdrawn
- 1989-08-11 FR FR8910811A patent/FR2635607A1/fr active Pending
- 1989-08-14 IT IT8967702A patent/IT1232516B/it active
- 1989-08-16 NL NL8902076A patent/NL8902076A/nl not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
DE3924695A1 (de) | 1990-02-22 |
IT8967702A0 (it) | 1989-08-14 |
NL8902076A (nl) | 1990-03-16 |
DD274923A1 (de) | 1990-01-03 |
FR2635607A1 (fr) | 1990-02-23 |
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