IT1151909B - Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo - Google Patents

Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo

Info

Publication number
IT1151909B
IT1151909B IT22292/82A IT2229282A IT1151909B IT 1151909 B IT1151909 B IT 1151909B IT 22292/82 A IT22292/82 A IT 22292/82A IT 2229282 A IT2229282 A IT 2229282A IT 1151909 B IT1151909 B IT 1151909B
Authority
IT
Italy
Prior art keywords
semiconductive
radiation detection
detection device
radiation
semiconductive device
Prior art date
Application number
IT22292/82A
Other languages
English (en)
Italian (it)
Other versions
IT8222292A0 (it
Inventor
Arthur Marie Eugen Hoeberechts
Rosmalen Gerard Eduard Van
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of IT8222292A0 publication Critical patent/IT8222292A0/it
Application granted granted Critical
Publication of IT1151909B publication Critical patent/IT1151909B/it

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W64/00—Locating users or terminals or network equipment for network management purposes, e.g. mobility management
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/148—Shapes of potential barriers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/95—Circuit arrangements
    • H10F77/953—Circuit arrangements for devices having potential barriers
    • H10F77/957—Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W36/00—Hand-off or reselection arrangements
    • H04W36/04—Reselecting a cell layer in multi-layered cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Automatic Focus Adjustment (AREA)
  • Solid State Image Pick-Up Elements (AREA)
IT22292/82A 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo IT1151909B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.

Publications (2)

Publication Number Publication Date
IT8222292A0 IT8222292A0 (it) 1982-07-07
IT1151909B true IT1151909B (it) 1986-12-24

Family

ID=19837773

Family Applications (1)

Application Number Title Priority Date Filing Date
IT22292/82A IT1151909B (it) 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo

Country Status (11)

Country Link
US (1) US4469945A (enExample)
JP (1) JPS5817665A (enExample)
AU (1) AU549417B2 (enExample)
CA (1) CA1194195A (enExample)
DE (1) DE3225372A1 (enExample)
ES (1) ES513803A0 (enExample)
FR (1) FR2509531A1 (enExample)
GB (1) GB2102201B (enExample)
IE (1) IE53710B1 (enExample)
IT (1) IT1151909B (enExample)
NL (1) NL187374C (enExample)

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JPS60145563A (ja) * 1984-01-05 1985-08-01 Matsushita Electric Ind Co Ltd ビデオデイスクプレ−ヤ
JPS60185230A (ja) * 1984-03-02 1985-09-20 Pioneer Electronic Corp 焦点誤差検出装置
WO1986003058A1 (en) * 1984-11-13 1986-05-22 Eastman Kodak Company A solid state light sensing device
KR870001302B1 (ko) * 1984-11-20 1987-07-11 대우중공업 주식회사 CO_2레이저 빔 프로파일(Laser Beam Profile) 측정장치
NL8501489A (nl) * 1985-05-24 1986-12-16 Philips Nv Positie-gevoelige stralingsdetector.
US4703168A (en) * 1985-07-22 1987-10-27 Princeton Applied Research Corporation Multiplexed wedge anode detector
NL8601719A (nl) * 1986-07-02 1988-02-01 Philips Nv Electronisch instelbare positiegevoelige stralingsdetector, focusfoutdetectiestelsel voorzien van een dergelijke stralingsdetector, en optische lees- en/of schrijfinrichting voorzien van een dergelijk focusfoutdetectiestelsel.
US4871914A (en) * 1987-05-05 1989-10-03 Sun Nuclear Corporation Low-cost radon detector
US5479018A (en) * 1989-05-08 1995-12-26 Westinghouse Electric Corp. Back surface illuminated infrared detector
NL8901400A (nl) * 1989-06-02 1991-01-02 Philips Nv Halfgeleiderinrichting met een stralingsgevoelig element.
IL96623A0 (en) * 1989-12-26 1991-09-16 Gen Electric Low capacitance,large area semiconductor photodetector and photodetector system
US5475618A (en) * 1993-01-28 1995-12-12 Advanced Micro Devices Apparatus and method for monitoring and controlling an ion implant device
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US5834628A (en) * 1995-11-09 1998-11-10 Consultec Scientific, Inc. Activity weighted particle size distribution system
DE102006013460B3 (de) * 2006-03-23 2007-11-08 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
DE102006013461B3 (de) * 2006-03-23 2007-11-15 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
US8143584B2 (en) * 2008-02-04 2012-03-27 Radon Technologies, Inc. Radon monitor
US9001029B2 (en) 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
WO2012110924A1 (en) 2011-02-15 2012-08-23 Basf Se Detector for optically detecting at least one object
US9040929B2 (en) * 2012-07-30 2015-05-26 International Business Machines Corporation Charge sensors using inverted lateral bipolar junction transistors
KR102088685B1 (ko) 2012-12-19 2020-03-13 바스프 에스이 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
WO2014198625A1 (en) 2013-06-13 2014-12-18 Basf Se Optical detector and method for manufacturing the same
KR20160019067A (ko) 2013-06-13 2016-02-18 바스프 에스이 적어도 하나의 물체의 배향을 광학적으로 검출하기 위한 검출기
US9989623B2 (en) 2013-06-13 2018-06-05 Basf Se Detector for determining a longitudinal coordinate of an object via an intensity distribution of illuminated pixels
KR102191139B1 (ko) 2013-08-19 2020-12-15 바스프 에스이 광학 검출기
WO2015024870A1 (en) 2013-08-19 2015-02-26 Basf Se Detector for determining a position of at least one object
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
CN106716059B (zh) 2014-09-29 2020-03-13 巴斯夫欧洲公司 用于光学确定至少一个对象的位置的检测器
KR102497704B1 (ko) 2014-12-09 2023-02-09 바스프 에스이 광 검출기
US10775505B2 (en) 2015-01-30 2020-09-15 Trinamix Gmbh Detector for an optical detection of at least one object
WO2016146725A1 (en) 2015-03-17 2016-09-22 Basf Se Optical data reader
WO2017012986A1 (en) 2015-07-17 2017-01-26 Trinamix Gmbh Detector for optically detecting at least one object
EP3350988B1 (en) 2015-09-14 2019-08-07 trinamiX GmbH 3d camera
WO2017089553A1 (en) 2015-11-25 2017-06-01 Trinamix Gmbh Detector for optically detecting at least one object
WO2017089540A1 (en) 2015-11-25 2017-06-01 Trinamix Gmbh Detector for optically detecting at least one object
JP2019516097A (ja) 2016-04-06 2019-06-13 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物を光学的に検出するための検出器
KR20190002488A (ko) 2016-04-28 2019-01-08 트리나미엑스 게엠베하 적어도 하나의 물체를 광학적으로 검출하기 위한 검출기
EP3449213A1 (en) 2016-04-28 2019-03-06 trinamiX GmbH Detector for optically detecting at least one object
US11211513B2 (en) 2016-07-29 2021-12-28 Trinamix Gmbh Optical sensor and detector for an optical detection
EP3532796B1 (en) 2016-10-25 2026-04-15 trinamiX GmbH Infrared optical detector with integrated filter
JP7241684B2 (ja) 2016-10-25 2023-03-17 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物の光学的な検出のための検出器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
WO2018091640A2 (en) 2016-11-17 2018-05-24 Trinamix Gmbh Detector for optically detecting at least one object
WO2018096083A1 (en) 2016-11-25 2018-05-31 Trinamix Gmbh Optical detector comprising at least one optical waveguide
US11719818B2 (en) 2017-03-16 2023-08-08 Trinamix Gmbh Detector for optically detecting at least one object
JP7204667B2 (ja) 2017-04-20 2023-01-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光検出器
WO2019002199A1 (en) 2017-06-26 2019-01-03 Trinamix Gmbh DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT
WO2019011803A1 (en) 2017-07-10 2019-01-17 Trinamix Gmbh DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECT
US11668828B2 (en) 2017-08-28 2023-06-06 Trinamix Gmbh Detector for determining a position of at least one object
EP3676630B1 (en) 2017-08-28 2022-11-30 trinamiX GmbH Range finder for determining at least one geometric information
CN115966576B (zh) * 2021-10-13 2025-12-02 思特威(上海)电子科技股份有限公司 图像传感器电荷信号干扰监测装置及监测方法

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Publication number Priority date Publication date Assignee Title
FR2271590B1 (enExample) * 1974-01-15 1978-12-01 Thomson Brandt
NL7803969A (nl) * 1978-04-14 1979-10-16 Philips Nv Opto-elektronisch fokusfout-detektiestelsel.
JPS54162989A (en) * 1978-06-15 1979-12-25 Sony Corp Solid-state pickup unit
US4228354A (en) * 1979-07-13 1980-10-14 Ari Lehto Method for detecting radiation
DE2939518A1 (de) * 1979-09-28 1981-04-16 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte schaltung zur zeilenweisen bildabtastung
US4360732A (en) * 1980-06-16 1982-11-23 Texas Instruments Incorporated Infrared charge transfer device (CTD) system

Also Published As

Publication number Publication date
ES8308451A1 (es) 1983-08-16
NL8103304A (nl) 1983-02-01
JPH037148B2 (enExample) 1991-01-31
NL187374C (nl) 1991-09-02
IE821637L (en) 1983-01-10
GB2102201A (en) 1983-01-26
US4469945A (en) 1984-09-04
IE53710B1 (en) 1989-01-18
AU549417B2 (en) 1986-01-23
ES513803A0 (es) 1983-08-16
JPS5817665A (ja) 1983-02-01
DE3225372A1 (de) 1983-02-17
IT8222292A0 (it) 1982-07-07
FR2509531A1 (fr) 1983-01-14
NL187374B (nl) 1991-04-02
DE3225372C2 (enExample) 1991-12-19
CA1194195A (en) 1985-09-24
FR2509531B1 (enExample) 1985-05-17
GB2102201B (en) 1985-03-06
AU8569082A (en) 1983-01-13

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