IN2014MN00876A - - Google Patents
Info
- Publication number
- IN2014MN00876A IN2014MN00876A IN876MUN2014A IN2014MN00876A IN 2014MN00876 A IN2014MN00876 A IN 2014MN00876A IN 876MUN2014 A IN876MUN2014 A IN 876MUN2014A IN 2014MN00876 A IN2014MN00876 A IN 2014MN00876A
- Authority
- IN
- India
- Prior art keywords
- calibration data
- improving
- computing device
- disclosure relate
- technologies
- Prior art date
Links
- 238000011982 device technology Methods 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3206—Monitoring of events, devices or parameters that trigger a change in power modality
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
- G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3234—Power saving characterised by the action undertaken
- G06F1/329—Power saving characterised by the action undertaken by task scheduling
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F15/00—Digital computers in general; Data processing equipment in general
-
- G—PHYSICS
- G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
- G16Z—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS, NOT OTHERWISE PROVIDED FOR
- G16Z99/00—Subject matter not provided for in other main groups of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Manufacturing & Machinery (AREA)
- Remote Sensing (AREA)
- Computer Hardware Design (AREA)
- Gyroscopes (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Telephone Function (AREA)
- Image Processing (AREA)
- User Interface Of Digital Computer (AREA)
- Power Sources (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201161559030P | 2011-11-11 | 2011-11-11 | |
US13/673,950 US9581466B2 (en) | 2011-11-11 | 2012-11-09 | Sensor auto-calibration |
US13/673,967 US9534924B2 (en) | 2011-11-11 | 2012-11-09 | Sensor auto-calibration |
US13/673,962 US9546883B2 (en) | 2011-11-11 | 2012-11-09 | Sensor auto-calibration |
PCT/US2012/064710 WO2013071257A2 (en) | 2011-11-11 | 2012-11-12 | Sensor auto-calibration |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2014MN00876A true IN2014MN00876A (ru) | 2015-04-17 |
Family
ID=48280614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN876MUN2014 IN2014MN00876A (ru) | 2011-11-11 | 2012-11-12 |
Country Status (7)
Country | Link |
---|---|
US (3) | US9581466B2 (ru) |
EP (3) | EP3021196A1 (ru) |
JP (1) | JP5908104B2 (ru) |
KR (3) | KR101844439B1 (ru) |
CN (1) | CN104081313B (ru) |
IN (1) | IN2014MN00876A (ru) |
WO (1) | WO2013071257A2 (ru) |
Families Citing this family (58)
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FR2975485B1 (fr) * | 2011-05-20 | 2013-05-10 | Sagem Defense Securite | Procede de calibration d'un ensemble inertiel comportant une phase dynamique entre deux phases statiques |
US9581466B2 (en) | 2011-11-11 | 2017-02-28 | Qualcomm Incorporated | Sensor auto-calibration |
US10324108B2 (en) | 2012-02-07 | 2019-06-18 | Mcube, Inc. | Dynamic offset correction for calibration of MEMS sensor |
US10197587B2 (en) | 2012-03-17 | 2019-02-05 | MCube Inc. | Device and method for using time rate of change of sensor data to determine device rotation |
US20150260545A1 (en) * | 2012-03-30 | 2015-09-17 | Google Inc. | Gyroscope calibration |
US20140025330A1 (en) * | 2012-07-11 | 2014-01-23 | Mcube, Inc. | Dynamic temperature calibration |
US9471539B2 (en) * | 2012-08-24 | 2016-10-18 | Blackberry Limited | Method and devices for determining noise variance for gyroscope |
EP2801804B1 (en) * | 2013-05-06 | 2018-07-11 | Sensirion AG | Self-calibrating temperature sensor within a mobile terminal device |
EP2802128B1 (en) * | 2013-05-06 | 2018-07-11 | Sensirion AG | Self-calibrating temperature sensor within a mobile terminal device |
US9165533B2 (en) * | 2013-06-06 | 2015-10-20 | Microsoft Technology Licensing, Llc | Display rotation management |
US9939874B2 (en) | 2013-11-26 | 2018-04-10 | Lenovo (Singapore) Pte. Ltd. | Selectively disabling sensors and associated functions |
US20150192440A1 (en) * | 2014-01-07 | 2015-07-09 | InvenSense, Incorporated | Systems and Methods for Initiating Calibration of a Sensor |
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US9495801B2 (en) | 2014-05-01 | 2016-11-15 | Microsoft Technology Licensing, Llc | Pose tracking an augmented reality device |
KR20150142332A (ko) * | 2014-06-11 | 2015-12-22 | 삼성전자주식회사 | 센서값을 측정하는 방법 및 이를 수행하는 전자 장치 |
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US9519041B2 (en) | 2014-08-21 | 2016-12-13 | Qualcomm Incorporated | System and method for providing an accurate and cost-effective current sensor calibration |
US20160059120A1 (en) * | 2014-08-28 | 2016-03-03 | Aquimo, Llc | Method of using motion states of a control device for control of a system |
EP3218674B1 (en) * | 2014-11-11 | 2021-06-23 | Intel Corporation | Extended kalman filter based autonomous magnetometer calibration |
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KR102305093B1 (ko) * | 2015-02-26 | 2021-09-28 | 삼성전자주식회사 | 전자 장치 및 전자 장치의 자이로 센서 칼리브레이션 방법 |
US9651399B2 (en) * | 2015-03-25 | 2017-05-16 | Northrop Grumman Systems Corporation | Continuous calibration of an inertial system |
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US10869393B2 (en) * | 2015-06-29 | 2020-12-15 | Microsoft Technology Licensing, Llc | Pedestal mounting of sensor system |
EP3316771A1 (en) * | 2015-06-30 | 2018-05-09 | Koninklijke Philips N.V. | A sensor system and method which makes use of multiple ppg sensors |
US10551226B2 (en) * | 2015-11-19 | 2020-02-04 | Jabil Inc. | System and method for scalable cloud-based sensor calibration |
CN105571614B (zh) * | 2015-12-14 | 2018-05-29 | 广东欧珀移动通信有限公司 | 磁传感器校准方法及装置 |
US10078544B2 (en) * | 2015-12-19 | 2018-09-18 | Intel Corporation | Apparatus and method for an on-chip reliability controller |
DE102016201250A1 (de) * | 2016-01-28 | 2017-08-03 | Conti Temic Microelectronic Gmbh | Verfahren und Vorrichtung zur Reichweitenbestimmung eines Sensors für ein Kraftfahrzeug |
DE102016201900B4 (de) * | 2016-02-09 | 2024-05-29 | Dialog Semiconductor B.V. | Kalibrierung von Vektoren in einem Messsystem |
US10393555B2 (en) * | 2016-12-14 | 2019-08-27 | Infineon Technologies Ag | Calibration of an angle sensor without a need for regular rotation |
US11119112B2 (en) | 2017-08-02 | 2021-09-14 | Samsung Electronics Co., Ltd. | Method for compensating gyroscope drift on an electronic device |
KR101979429B1 (ko) * | 2017-08-14 | 2019-05-16 | 네이버랩스 주식회사 | 전동식 이동 대차의 힘 감지 센서 캘리브레이션 방법 및 그 장치 |
TWI643071B (zh) * | 2017-10-18 | 2018-12-01 | 銘祥科技實業股份有限公司 | Artificial intelligence sensing device calibration system and calibration method |
CN109932630B (zh) * | 2017-12-15 | 2021-08-03 | 朋程科技股份有限公司 | 过温度检测电路及其测试方法 |
CN110501035B (zh) * | 2018-05-18 | 2022-03-15 | 好庆科技企业股份有限公司 | 感测器及感测器的自动校正方法 |
US10816612B2 (en) * | 2018-05-30 | 2020-10-27 | Apple Inc. | Cross-axis shield for out-of-plane magnetometer |
CN110646087A (zh) * | 2018-06-26 | 2020-01-03 | 鸿富锦精密电子(郑州)有限公司 | 环境光传感器分析方法、系统与电子装置 |
JP6998285B2 (ja) * | 2018-10-11 | 2022-02-10 | Tdk株式会社 | 磁気センサ装置 |
DE102018217814B4 (de) * | 2018-10-18 | 2020-06-18 | Robert Bosch Gmbh | Verfahren zur Offsetkalibrierung eines Drehratensensorsignals eines Drehratensensors, System, Computerprogramm |
JP7239349B2 (ja) * | 2019-02-28 | 2023-03-14 | ラピスセミコンダクタ株式会社 | オフセット算出装置、オフセット補正装置及びオフセット算出方法 |
US11221266B2 (en) * | 2019-05-22 | 2022-01-11 | Baker Hughes Oilfield Operations Llc | Automatic zero reset for a pressure transducer |
US11391825B2 (en) * | 2019-07-02 | 2022-07-19 | Waymo Llc | Sensor calibration parameter sensitivity analysis |
KR20210014303A (ko) | 2019-07-30 | 2021-02-09 | 삼성전자주식회사 | 스타일러스에 대한 보정을 수행하는 전자 장치 및 이의 동작 방법 |
CN110934588B (zh) * | 2019-10-23 | 2022-05-31 | 青岛精安医疗科技有限责任公司 | 呼吸传感器灵敏度校准方法 |
CN112985383A (zh) * | 2019-12-14 | 2021-06-18 | 北京原子机器人科技有限公司 | 基于相互补偿的多陀螺仪系统 |
CN111486840A (zh) * | 2020-06-28 | 2020-08-04 | 北京云迹科技有限公司 | 机器人定位方法、装置、机器人及可读存储介质 |
DE102020215703A1 (de) | 2020-12-11 | 2022-06-15 | Robert Bosch Gesellschaft mit beschränkter Haftung | Sensorvorrichtung und Verfahren zum Kalibrieren einer Sensorvorrichtung |
US11815568B2 (en) | 2020-12-28 | 2023-11-14 | Stmicroelectronics, Inc. | System and method for fast magnetometer calibration using gyroscope |
US11620580B2 (en) * | 2021-04-01 | 2023-04-04 | Banjo Health Inc. | Methods and systems for probabilistic filtering of candidate intervention representations |
US11965939B2 (en) | 2021-04-12 | 2024-04-23 | Samsung Electronics Co., Ltd. | Electronic device compensating for geomagnetic sensing data and method for controlling the same |
DE102022204010A1 (de) | 2021-04-29 | 2022-11-03 | Robert Bosch Engineering And Business Solutions Private Limited | System und Verfahren zum Bestimmen eines Temperaturkompensationsversatzwerts in einem Gyroskop einer Vorrichtung |
CN113358825B (zh) * | 2021-06-02 | 2023-03-24 | 重庆大学 | 一种带同化算法的室内空气质量检测器 |
CN113588132B (zh) * | 2021-07-27 | 2023-08-08 | 吉林省中赢高科技有限公司 | 一种温度处理方法及装置 |
WO2023085682A1 (ko) * | 2021-11-15 | 2023-05-19 | 삼성전자 주식회사 | 배터리와 연관된 정보를 획득하기 위한 전자 장치 및 그 동작 방법 |
CN116338242B (zh) * | 2023-05-26 | 2023-08-04 | 有数(深圳)智能科技有限公司 | 一种振弦数据采集仪及其控制方法 |
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-
2012
- 2012-11-09 US US13/673,950 patent/US9581466B2/en not_active Expired - Fee Related
- 2012-11-09 US US13/673,967 patent/US9534924B2/en not_active Expired - Fee Related
- 2012-11-09 US US13/673,962 patent/US9546883B2/en not_active Expired - Fee Related
- 2012-11-12 EP EP15201939.4A patent/EP3021196A1/en not_active Withdrawn
- 2012-11-12 EP EP12788703.2A patent/EP2776901B1/en not_active Not-in-force
- 2012-11-12 WO PCT/US2012/064710 patent/WO2013071257A2/en active Application Filing
- 2012-11-12 IN IN876MUN2014 patent/IN2014MN00876A/en unknown
- 2012-11-12 KR KR1020167015535A patent/KR101844439B1/ko active IP Right Grant
- 2012-11-12 KR KR1020167015532A patent/KR101844453B1/ko active IP Right Grant
- 2012-11-12 KR KR1020147015833A patent/KR101682537B1/ko active IP Right Grant
- 2012-11-12 EP EP15201932.9A patent/EP3021195A1/en not_active Withdrawn
- 2012-11-12 JP JP2014541381A patent/JP5908104B2/ja not_active Expired - Fee Related
- 2012-11-12 CN CN201280055570.XA patent/CN104081313B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR101844453B1 (ko) | 2018-04-02 |
US20130124127A1 (en) | 2013-05-16 |
KR101682537B1 (ko) | 2016-12-05 |
KR20140100517A (ko) | 2014-08-14 |
EP3021195A1 (en) | 2016-05-18 |
US9546883B2 (en) | 2017-01-17 |
KR101844439B1 (ko) | 2018-04-02 |
KR20160075800A (ko) | 2016-06-29 |
US9581466B2 (en) | 2017-02-28 |
EP2776901B1 (en) | 2016-02-24 |
US9534924B2 (en) | 2017-01-03 |
WO2013071257A3 (en) | 2013-11-07 |
WO2013071257A2 (en) | 2013-05-16 |
US20130121367A1 (en) | 2013-05-16 |
EP2776901A2 (en) | 2014-09-17 |
CN104081313B (zh) | 2017-10-31 |
EP3021196A1 (en) | 2016-05-18 |
KR20160075799A (ko) | 2016-06-29 |
US20130124126A1 (en) | 2013-05-16 |
CN104081313A (zh) | 2014-10-01 |
JP5908104B2 (ja) | 2016-04-26 |
JP2015506005A (ja) | 2015-02-26 |
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