IN2012DE00181A - - Google Patents

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Publication number
IN2012DE00181A
IN2012DE00181A IN181DE2012A IN2012DE00181A IN 2012DE00181 A IN2012DE00181 A IN 2012DE00181A IN 181DE2012 A IN181DE2012 A IN 181DE2012A IN 2012DE00181 A IN2012DE00181 A IN 2012DE00181A
Authority
IN
India
Prior art keywords
electrode
sample
layer structure
contact
pressure
Prior art date
Application number
Other languages
English (en)
Inventor
Atanu Saha
Krishnamurthy Anand
Hari Nadathur Seshadri
Karthick Vilapakkam Gourishankar
Filippo Cappuccini
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IN2012DE00181A publication Critical patent/IN2012DE00181A/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
IN181DE2012 2011-02-04 2012-01-20 IN2012DE00181A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US13/021,328 US8692564B2 (en) 2011-02-04 2011-02-04 System and method for use in determining the thickness of a layer of interest in a multi-layer structure

Publications (1)

Publication Number Publication Date
IN2012DE00181A true IN2012DE00181A (fr) 2015-08-21

Family

ID=45655366

Family Applications (1)

Application Number Title Priority Date Filing Date
IN181DE2012 IN2012DE00181A (fr) 2011-02-04 2012-01-20

Country Status (9)

Country Link
US (1) US8692564B2 (fr)
EP (1) EP2485042B1 (fr)
JP (1) JP6188117B2 (fr)
KR (1) KR101899154B1 (fr)
CN (1) CN102628668B (fr)
AU (1) AU2012200547B2 (fr)
CA (1) CA2765640C (fr)
IN (1) IN2012DE00181A (fr)
RU (1) RU2589526C2 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104034295A (zh) * 2014-06-05 2014-09-10 格力电器（武汉）有限公司 材料厚度检测设备及其使用方法
JP6176220B2 (ja) * 2014-10-14 2017-08-09 トヨタ自動車株式会社 検査装置
TWI636233B (zh) * 2014-12-12 2018-09-21 美商通用電機股份有限公司 用於測量物件厚度的方法及裝置
WO2016163229A1 (fr) * 2015-04-09 2016-10-13 株式会社村田製作所 Procédé permettant de mesurer des caractéristiques électriques d'un composant électronique et dispositif de mesure de caractéristiques électriques
DE102016117881A1 (de) 2016-09-22 2018-03-22 Thyssenkrupp Ag Verfahren und Vorrichtung zur zerstörungsfreien Bestimmung der Dicke einer Kernschicht eines Sandwichblechs
KR20200005466A (ko) * 2018-07-06 2020-01-15 주식회사 엘지화학 전도성 물질의 비표면적 측정 방법

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US4310389A (en) * 1980-06-16 1982-01-12 Chrysler Corporation Method for simultaneous determination of thickness and electrochemical potential in multilayer plated deposits
JPS58166202U (ja) * 1982-04-30 1983-11-05 東洋電機製造株式会社 電気駆動車両の制御装置
SU1185066A1 (ru) * 1984-05-22 1985-10-15 Московский Ордена Октябрьской Революции И Ордена Трудового Красного Знамени Институт Нефтехимической И Газовой Промышленности Им.И.М.Губкина Способ определени толщины многослойных электропроводных покрытий
SU1572170A1 (ru) * 1987-04-21 1992-07-30 Предприятие П/Я В-8769 Способ контрол толщины диэлектрической пленки на электропровод щей подложке
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JPH07198642A (ja) * 1993-12-28 1995-08-01 Bridgestone Corp ゴム組成物の電気抵抗測定機能を備える加硫特性試験機
RU2194243C2 (ru) * 1995-12-22 2002-12-10 Сименс Акциенгезелльшафт Способ и устройство для определения толщины электрически проводящего слоя
JPH1019948A (ja) * 1996-06-28 1998-01-23 Sekisui Chem Co Ltd 微粒子導電抵抗測定器用圧子及び試料台
JP3658504B2 (ja) * 1998-07-09 2005-06-08 株式会社日立製作所 表面層厚さ測定装置
US6208146B1 (en) * 1999-02-08 2001-03-27 General Motors Corporation Method and apparatus for measuring contact resistance for spot welding simulations
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JP4840952B2 (ja) * 2000-09-19 2011-12-21 株式会社フィジオン 生体電気インピーダンス計測方法及び計測装置、並びに該計測装置を用いた健康指針管理アドバイス装置
US6512379B2 (en) 2001-02-05 2003-01-28 Siemens Westinghouse Power Corporation Condition monitoring of turbine blades and vanes in service
US6730918B2 (en) 2001-12-20 2004-05-04 General Electric Company Apparatus for determining past-service conditions and remaining life of thermal barrier coatings and components having such coatings
US7582359B2 (en) 2002-09-23 2009-09-01 Siemens Energy, Inc. Apparatus and method of monitoring operating parameters of a gas turbine
JP2004333311A (ja) * 2003-05-08 2004-11-25 Toyota Central Res & Dev Lab Inc 材料物性の高電圧測定方法とその高電圧測定装置
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JP2006071576A (ja) * 2004-09-06 2006-03-16 Hiroshima Univ 金属材料の高温酸化モニタリング方法、モニタリング装置、モニタリングプログラムおよびモニタリングプログラムを記録したコンピュータ読取可能な記録媒体
KR20070044647A (ko) * 2005-10-25 2007-04-30 현대자동차주식회사 스폿용접 비파괴 검사장치
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KR101064658B1 (ko) * 2009-10-26 2011-09-16 한국지질자원연구원 상대함수율에 따른 시편의 전기비저항 계측방법
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Also Published As

Publication number Publication date
US8692564B2 (en) 2014-04-08
RU2012103469A (ru) 2013-08-10
AU2012200547A1 (en) 2012-08-23
RU2589526C2 (ru) 2016-07-10
CA2765640A1 (fr) 2012-08-04
JP6188117B2 (ja) 2017-08-30
KR101899154B1 (ko) 2018-09-14
EP2485042B1 (fr) 2016-11-23
US20120200304A1 (en) 2012-08-09
CA2765640C (fr) 2020-01-14
CN102628668B (zh) 2017-03-01
EP2485042A1 (fr) 2012-08-08
JP2012163557A (ja) 2012-08-30
CN102628668A (zh) 2012-08-08
AU2012200547B2 (en) 2015-05-07
KR20120090816A (ko) 2012-08-17

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