IL72336A - High density mosfet with field oxide aligned channel stops and method of fabricating the same - Google Patents
High density mosfet with field oxide aligned channel stops and method of fabricating the sameInfo
- Publication number
- IL72336A IL72336A IL72336A IL7233684A IL72336A IL 72336 A IL72336 A IL 72336A IL 72336 A IL72336 A IL 72336A IL 7233684 A IL7233684 A IL 7233684A IL 72336 A IL72336 A IL 72336A
- Authority
- IL
- Israel
- Prior art keywords
- fabricating
- same
- high density
- field oxide
- channel stops
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/266—Bombardment with radiation with high-energy radiation producing ion implantation using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/823481—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type isolation region manufacturing related aspects, e.g. to avoid interaction of isolation region with adjacent structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8236—Combination of enhancement and depletion transistors
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US53792083A | 1983-09-30 | 1983-09-30 |
Publications (2)
Publication Number | Publication Date |
---|---|
IL72336A0 IL72336A0 (en) | 1984-11-30 |
IL72336A true IL72336A (en) | 1988-04-29 |
Family
ID=24144669
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL72336A IL72336A (en) | 1983-09-30 | 1984-07-08 | High density mosfet with field oxide aligned channel stops and method of fabricating the same |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP0157780B1 (xx) |
JP (1) | JPH0616525B2 (xx) |
KR (1) | KR920009744B1 (xx) |
DE (1) | DE3376710D1 (xx) |
IL (1) | IL72336A (xx) |
WO (1) | WO1985001613A1 (xx) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5208168A (en) * | 1990-11-26 | 1993-05-04 | Motorola, Inc. | Semiconductor device having punch-through protected buried contacts and method for making the same |
KR100197656B1 (ko) * | 1995-12-29 | 1999-07-01 | 김영환 | 반도체 에스.오.아이.소자의 제조방법 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5679446A (en) * | 1979-12-04 | 1981-06-30 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Production of semiconductor device |
JPS56111241A (en) * | 1980-02-01 | 1981-09-02 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Preparation of semiconductor device |
FR2506076A1 (fr) * | 1981-05-12 | 1982-11-19 | Efcis | Procede de fabrication de circuits integres de type mos |
JPS58121643A (ja) * | 1982-01-13 | 1983-07-20 | Toshiba Corp | 半導体装置の製造方法 |
US4418094A (en) * | 1982-03-02 | 1983-11-29 | Texas Instruments Incorporated | Vertical-etch direct moat isolation process |
DE3371837D1 (en) * | 1982-12-08 | 1987-07-02 | Ibm | Method for making semiconductor devices having a thick field dielectric and a self-aligned channel stopper |
JPS59161069A (ja) * | 1983-03-04 | 1984-09-11 | Oki Electric Ind Co Ltd | Mos型半導体装置の製造方法 |
-
1983
- 1983-12-12 EP EP84900564A patent/EP0157780B1/en not_active Expired
- 1983-12-12 DE DE8484900564T patent/DE3376710D1/de not_active Expired
- 1983-12-12 JP JP59500651A patent/JPH0616525B2/ja not_active Expired - Lifetime
- 1983-12-12 WO PCT/US1983/001959 patent/WO1985001613A1/en active IP Right Grant
-
1984
- 1984-07-08 IL IL72336A patent/IL72336A/xx not_active IP Right Cessation
- 1984-09-29 KR KR1019840006053A patent/KR920009744B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE3376710D1 (en) | 1988-06-23 |
EP0157780B1 (en) | 1988-05-18 |
WO1985001613A1 (en) | 1985-04-11 |
JPH0616525B2 (ja) | 1994-03-02 |
KR920009744B1 (ko) | 1992-10-22 |
EP0157780A1 (en) | 1985-10-16 |
IL72336A0 (en) | 1984-11-30 |
JPS61500046A (ja) | 1986-01-09 |
KR850002675A (ko) | 1985-05-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
RH | Patent void |