IL148873A - Interferometric method for endpointing plasma etch processes - Google Patents

Interferometric method for endpointing plasma etch processes

Info

Publication number
IL148873A
IL148873A IL14887300A IL14887300A IL148873A IL 148873 A IL148873 A IL 148873A IL 14887300 A IL14887300 A IL 14887300A IL 14887300 A IL14887300 A IL 14887300A IL 148873 A IL148873 A IL 148873A
Authority
IL
Israel
Prior art keywords
endpointing
plasma etch
etch processes
interferometric method
interferometric
Prior art date
Application number
IL14887300A
Other languages
English (en)
Other versions
IL148873A0 (en
Inventor
Arthur M Howald
Original Assignee
Lam Res Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Res Corp filed Critical Lam Res Corp
Publication of IL148873A0 publication Critical patent/IL148873A0/xx
Publication of IL148873A publication Critical patent/IL148873A/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/3065—Plasma etching; Reactive-ion etching
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/005—Control means for lapping machines or devices
    • B24B37/013—Devices or means for detecting lapping completion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32917—Plasma diagnostics
    • H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/26—Acting in response to an ongoing measurement without interruption of processing, e.g. endpoint detection, in-situ thickness measurement

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Drying Of Semiconductors (AREA)
IL14887300A 1999-09-30 2000-09-27 Interferometric method for endpointing plasma etch processes IL148873A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/409,840 US6400458B1 (en) 1999-09-30 1999-09-30 Interferometric method for endpointing plasma etch processes
PCT/US2000/026600 WO2001024255A2 (en) 1999-09-30 2000-09-27 Interferometric method for endpointing plasma etch processes

Publications (2)

Publication Number Publication Date
IL148873A0 IL148873A0 (en) 2002-09-12
IL148873A true IL148873A (en) 2005-08-31

Family

ID=23622195

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14887300A IL148873A (en) 1999-09-30 2000-09-27 Interferometric method for endpointing plasma etch processes

Country Status (7)

Country Link
US (1) US6400458B1 (xx)
EP (1) EP1218935A2 (xx)
JP (1) JP2003510845A (xx)
KR (1) KR20020041445A (xx)
IL (1) IL148873A (xx)
TW (1) TWI239382B (xx)
WO (1) WO2001024255A2 (xx)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6390019B1 (en) * 1998-06-11 2002-05-21 Applied Materials, Inc. Chamber having improved process monitoring window
US6791692B2 (en) * 2000-11-29 2004-09-14 Lightwind Corporation Method and device utilizing plasma source for real-time gas sampling
EP1265278A1 (en) * 2001-06-06 2002-12-11 Infineon Technologies AG Method for manufacturing a trench capacitor with an isolation trench
US6888639B2 (en) * 2001-09-24 2005-05-03 Applied Materials, Inc. In-situ film thickness measurement using spectral interference at grazing incidence
US6939811B2 (en) * 2002-09-25 2005-09-06 Lam Research Corporation Apparatus and method for controlling etch depth
JP2006186222A (ja) * 2004-12-28 2006-07-13 Matsushita Electric Ind Co Ltd プラズマ処理装置
KR101346081B1 (ko) * 2006-06-20 2013-12-31 참엔지니어링(주) 플라스마 에칭 챔버
JP5081497B2 (ja) * 2007-05-22 2012-11-28 株式会社日立ハイテクノロジーズ プラズマ処理装置
JP5688227B2 (ja) * 2010-02-26 2015-03-25 株式会社日立ハイテクノロジーズ エッチング装置、制御シミュレータ、及び半導体装置製造方法
US9543225B2 (en) * 2014-04-29 2017-01-10 Lam Research Corporation Systems and methods for detecting endpoint for through-silicon via reveal applications
EP3038132B1 (en) 2014-12-22 2020-03-11 IMEC vzw Method and apparatus for real-time monitoring of plasma etch uniformity
KR102659670B1 (ko) * 2019-07-31 2024-04-19 에스케이하이닉스 주식회사 두께 측정 장치 및 방법

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4317698A (en) * 1980-11-13 1982-03-02 Applied Process Technology, Inc. End point detection in etching wafers and the like
US4415402A (en) 1981-04-02 1983-11-15 The Perkin-Elmer Corporation End-point detection in plasma etching or phosphosilicate glass
US4454001A (en) 1982-08-27 1984-06-12 At&T Bell Laboratories Interferometric method and apparatus for measuring etch rate and fabricating devices
US4496425A (en) * 1984-01-30 1985-01-29 At&T Technologies, Inc. Technique for determining the end point of an etching process
US4618262A (en) 1984-04-13 1986-10-21 Applied Materials, Inc. Laser interferometer system and method for monitoring and controlling IC processing
US4680084A (en) 1984-08-21 1987-07-14 American Telephone And Telegraph Company, At&T Bell Laboratories Interferometric methods and apparatus for device fabrication
US4782219A (en) * 1986-07-02 1988-11-01 Laser Identification Systems, Inc. System and method for reading specular barcodes
JPH01183122A (ja) 1988-01-18 1989-07-20 Fujitsu Ltd 真空チャンバ用光学窓
US5151584A (en) 1988-07-20 1992-09-29 Applied Materials, Inc. Method and apparatus for endpoint detection in a semiconductor wafer etching system
US4953982A (en) 1988-07-20 1990-09-04 Applied Materials, Inc. Method and apparatus for endpoint detection in a semiconductor wafer etching system
US5077464A (en) 1988-07-20 1991-12-31 Applied Materials, Inc. Method and apparatus for endpoint detection in a semiconductor wafer etching system
US4927485A (en) 1988-07-28 1990-05-22 Applied Materials, Inc. Laser interferometer system for monitoring and controlling IC processing
JPH02216818A (ja) 1989-02-17 1990-08-29 Babcock Hitachi Kk 光応用薄膜製造装置
US5337144A (en) 1990-06-19 1994-08-09 Applied Materials, Inc. Etch rate monitor using collimated light and method of using same
US5362356A (en) 1990-12-20 1994-11-08 Lsi Logic Corporation Plasma etching process control
EP0511448A1 (en) 1991-04-30 1992-11-04 International Business Machines Corporation Method and apparatus for in-situ and on-line monitoring of a trench formation process
FR2680414B1 (fr) 1991-08-14 1995-05-24 Sofie Ensemble d'observation et de mesures interferometriques simultanees par laser, en particulier sur des structures a couches minces.
US5361137A (en) * 1992-08-31 1994-11-01 Texas Instruments Incorporated Process control for submicron linewidth measurement
US5450205A (en) * 1993-05-28 1995-09-12 Massachusetts Institute Of Technology Apparatus and method for real-time measurement of thin film layer thickness and changes thereof
US5407524A (en) 1993-08-13 1995-04-18 Lsi Logic Corporation End-point detection in plasma etching by monitoring radio frequency matching network
FR2718231B1 (fr) 1994-04-05 1996-06-21 Sofie Procédé et dispositif pour quantifier in situ la morphologie et l'épaisseur dans une zone localisée d'une couche superficielle en cours de traitement sur une structure à couches minces .
JPH0868754A (ja) 1994-08-29 1996-03-12 Sony Corp 内部現象の状況監視窓の透明度測定方法
DE69510032T2 (de) 1995-03-31 2000-01-27 Ibm Verfahren und Gerät zur Überwachung des Trockenätzens eines dielektrischen Films bis zu einer gegebenen Dicke
JPH1064884A (ja) 1996-08-13 1998-03-06 Fujitsu Ltd エッチング装置及びエッチング方法
JPH1167732A (ja) 1997-08-22 1999-03-09 Matsushita Electron Corp プラズマプロセスのモニタリング方法およびモニタリング装置
JP3833810B2 (ja) 1998-03-04 2006-10-18 株式会社日立製作所 半導体の製造方法並びにプラズマ処理方法およびその装置
US6077387A (en) 1999-02-10 2000-06-20 Stmicroelectronics, Inc. Plasma emission detection for process control via fluorescent relay

Also Published As

Publication number Publication date
JP2003510845A (ja) 2003-03-18
US6400458B1 (en) 2002-06-04
WO2001024255A3 (en) 2001-12-20
WO2001024255A9 (en) 2002-09-26
TWI239382B (en) 2005-09-11
IL148873A0 (en) 2002-09-12
WO2001024255A2 (en) 2001-04-05
EP1218935A2 (en) 2002-07-03
KR20020041445A (ko) 2002-06-01

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Legal Events

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FF Patent granted
KB Patent renewed
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