IL145136A0 - Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes - Google Patents

Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes

Info

Publication number
IL145136A0
IL145136A0 IL14513601A IL14513601A IL145136A0 IL 145136 A0 IL145136 A0 IL 145136A0 IL 14513601 A IL14513601 A IL 14513601A IL 14513601 A IL14513601 A IL 14513601A IL 145136 A0 IL145136 A0 IL 145136A0
Authority
IL
Israel
Prior art keywords
scanning
far
probe microscope
reconfigurable
field optical
Prior art date
Application number
IL14513601A
Other languages
English (en)
Inventor
Aaron Lewis
Anatoly Komissar
Alexander Ratner
Hesham Taha
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to IL14513601A priority Critical patent/IL145136A0/xx
Publication of IL145136A0 publication Critical patent/IL145136A0/xx
Priority to AU2002327461A priority patent/AU2002327461A1/en
Priority to US10/487,391 priority patent/US7047796B2/en
Priority to PCT/US2002/025947 priority patent/WO2003019238A2/en
Priority to EP02763453A priority patent/EP1427983A4/en
Priority to JP2003524047A priority patent/JP2005530125A/ja
Priority to JP2011016791A priority patent/JP2011107157A/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G01Q30/025—Optical microscopes coupled with SPM
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/08—Means for establishing or regulating a desired environmental condition within a sample chamber
    • G01Q30/10—Thermal environment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IL14513601A 2001-08-27 2001-08-27 Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes IL145136A0 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IL14513601A IL145136A0 (en) 2001-08-27 2001-08-27 Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes
AU2002327461A AU2002327461A1 (en) 2001-08-27 2002-08-27 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
US10/487,391 US7047796B2 (en) 2001-08-27 2002-08-27 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
PCT/US2002/025947 WO2003019238A2 (en) 2001-08-27 2002-08-27 Multiple plate tip or sample scanning reconfigurable scanned probe microscope with transparent interfacing of far-field optical microscopes
EP02763453A EP1427983A4 (en) 2001-08-27 2002-08-27 RECONFIGURABLE MULTIPLATE OR SAMPLE SCANNING SCANNED SAMPLE MICROSCOPE WITH TRANSPARENT INTERFACE FOR OPTICAL REMOTE MICROSCOPES
JP2003524047A JP2005530125A (ja) 2001-08-27 2002-08-27 遠方領域の光学顕微鏡の透明インタフェイスを備えた複数プレートのチップまたはサンプルをスキャンする再現可能なスキャンプローブ顕微鏡
JP2011016791A JP2011107157A (ja) 2001-08-27 2011-01-28 遠方領域の光学顕微鏡の透明インタフェイスを備えた複数プレートのチップまたはサンプルをスキャンする再現可能なスキャンプローブ顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL14513601A IL145136A0 (en) 2001-08-27 2001-08-27 Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes

Publications (1)

Publication Number Publication Date
IL145136A0 true IL145136A0 (en) 2002-06-30

Family

ID=11075740

Family Applications (1)

Application Number Title Priority Date Filing Date
IL14513601A IL145136A0 (en) 2001-08-27 2001-08-27 Multiple plate tip or sample scanning reconfigurable scanning probe microscope with transparent interfacing of far-field optical microscopes

Country Status (6)

Country Link
US (1) US7047796B2 (ja)
EP (1) EP1427983A4 (ja)
JP (2) JP2005530125A (ja)
AU (1) AU2002327461A1 (ja)
IL (1) IL145136A0 (ja)
WO (1) WO2003019238A2 (ja)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006504136A (ja) 2002-10-21 2006-02-02 ナノインク インコーポレーティッド ナノメートル・スケール設計構造、その製造方法および装置、マスク修復、強化、および製造への適用
WO2006012893A1 (de) * 2004-08-05 2006-02-09 Jpk Instruments Ag Vorrichtung zum aufnehmen einer messprobe
JP4323412B2 (ja) * 2004-11-02 2009-09-02 株式会社ミツトヨ 表面性状測定用探針およびこれを用いた顕微鏡
GB2443674B (en) * 2006-10-04 2008-11-26 Oxford Instr Superconductivity Flow-cooled magnet system
US7692138B1 (en) 2006-10-23 2010-04-06 David James Ray Integrated scanning probe microscope and confocal microscope
US7842920B2 (en) 2006-12-14 2010-11-30 Dcg Systems, Inc. Methods and systems of performing device failure analysis, electrical characterization and physical characterization
US8720256B2 (en) * 2007-02-20 2014-05-13 Wayne Allen Bonin Off-axis imaging for indentation instruments
WO2008131416A1 (en) * 2007-04-24 2008-10-30 The University Of Akron Method and apparatus for performing apertureless near-field scanning optical microscopy
IL197329A0 (en) * 2009-03-01 2009-12-24 David Lewis A scanned probe microscope without interference or geometric constraint for single or multiple probe operation in air or liquid
FR2955938B1 (fr) 2010-01-29 2012-08-03 Commissariat Energie Atomique Dispositif electronique de pilotage et d'amplification pour une sonde locale piezoelectrique de mesure de force sous un faisceau de particules
CN103616532B (zh) * 2013-11-06 2015-10-28 中国科学技术大学 低回差高重复扫描探针显微镜独立扫描器
KR101675489B1 (ko) * 2014-12-24 2016-11-14 한국표준과학연구원 헤드 일체형 원자간력 현미경 및 이를 포함한 융합 현미경
WO2016138373A1 (en) * 2015-02-26 2016-09-01 Xallent, LLC Multiple integrated tips scanning probe microscope
KR102012577B1 (ko) 2015-02-26 2019-08-20 살렌트, 엘엘씨 나노-전자-기계적-시스템 프로브들을 제작하기 위한 방법들 및 시스템들
CN104749160B (zh) * 2015-03-06 2017-09-12 华南师范大学 一种并列双针尖增强的拉曼光谱扫描成像方法
US10866273B2 (en) 2016-03-09 2020-12-15 Xallent, LLC Functional prober chip
WO2018089022A1 (en) * 2016-11-11 2018-05-17 Aaron Lewis Enhancing optical signals with probe tips optimized for chemical potential and optical characteristics
WO2018187525A1 (en) 2017-04-06 2018-10-11 Kwame Amponsah Nanoelectromechanical devices with metal-to-metal contacts
US10663484B2 (en) 2018-02-14 2020-05-26 Xallent, LLC Multiple integrated tips scanning probe microscope with pre-alignment components

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5017577A (en) * 1986-04-25 1991-05-21 Burroughs Wellcome Co. Methods for treating viral infection
US5289004A (en) 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
JP3021872B2 (ja) * 1991-11-21 2000-03-15 オリンパス光学工業株式会社 カンチレバー、原子間力顕微鏡
JP3202303B2 (ja) 1992-02-20 2001-08-27 セイコーインスツルメンツ株式会社 原子間力顕微鏡
EP0746857A4 (en) * 1992-03-13 2001-01-03 Thermomicroscopes Corp SCANNING PROBE MICROSCOPE
JP3081979B2 (ja) * 1992-05-08 2000-08-28 セイコーインスツルメンツ株式会社 顕微鏡
JPH0612907U (ja) * 1992-07-15 1994-02-18 オリンパス光学工業株式会社 走査型トンネル顕微鏡およびその試料台
US5440920A (en) * 1994-02-03 1995-08-15 Molecular Imaging Systems Scanning force microscope with beam tracking lens
JPH0835972A (ja) * 1994-07-21 1996-02-06 Olympus Optical Co Ltd 簡易型ｓｐｍ装置
US5675154A (en) 1995-02-10 1997-10-07 Molecular Imaging Corporation Scanning probe microscope
US5949070A (en) * 1995-08-18 1999-09-07 Gamble; Ronald C. Scanning force microscope with integral laser-scanner-cantilever and independent stationary detector
JPH09218211A (ja) * 1996-02-13 1997-08-19 Horiba Ltd カンチレバー走査プローブ顕微鏡
JPH10283972A (ja) * 1997-04-10 1998-10-23 Seiko Instr Inc 走査型プローブ顕微鏡を用いた加工、記録、再生装置
US6246054B1 (en) * 1997-06-10 2001-06-12 Olympus Optical Co., Ltd. Scanning probe microscope suitable for observing the sidewalls of steps in a specimen and measuring the tilt angle of the sidewalls
JPH1114636A (ja) * 1997-06-26 1999-01-22 Olympus Optical Co Ltd 透過照明装置
JP3511361B2 (ja) * 1997-08-04 2004-03-29 セイコーインスツルメンツ株式会社 走査プローブ顕微鏡
JP3905254B2 (ja) * 1998-06-22 2007-04-18 エスアイアイ・ナノテクノロジー株式会社 走査型プローブ顕微鏡
JP2000009624A (ja) * 1998-06-22 2000-01-14 Seiko Instruments Inc 走査型プローブ顕微鏡
JP3784570B2 (ja) * 1999-04-02 2006-06-14 日本電子株式会社 走査型プローブ顕微鏡
JP4526626B2 (ja) * 1999-12-20 2010-08-18 独立行政法人科学技術振興機構 電気特性評価装置

Also Published As

Publication number Publication date
EP1427983A4 (en) 2008-01-23
JP2005530125A (ja) 2005-10-06
US20040216518A1 (en) 2004-11-04
AU2002327461A1 (en) 2003-03-10
WO2003019238A3 (en) 2003-10-09
WO2003019238A2 (en) 2003-03-06
US7047796B2 (en) 2006-05-23
JP2011107157A (ja) 2011-06-02
EP1427983A2 (en) 2004-06-16

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