IL144323A0 - Method and device for analysing a highly dynamic wavefront - Google Patents
Method and device for analysing a highly dynamic wavefrontInfo
- Publication number
- IL144323A0 IL144323A0 IL14432300A IL14432300A IL144323A0 IL 144323 A0 IL144323 A0 IL 144323A0 IL 14432300 A IL14432300 A IL 14432300A IL 14432300 A IL14432300 A IL 14432300A IL 144323 A0 IL144323 A0 IL 144323A0
- Authority
- IL
- Israel
- Prior art keywords
- subaperature
- spot
- analysing
- spi
- localization
- Prior art date
Links
- 230000004807 localization Effects 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 2
- 238000006073 displacement reaction Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Steroid Compounds (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9900366A FR2788597B1 (fr) | 1999-01-15 | 1999-01-15 | Procede et dispositif d'analyse de front d'onde a grande dynamique |
PCT/FR2000/000063 WO2000042401A2 (fr) | 1999-01-15 | 2000-01-14 | Procede et dispositif d'analyse d'un front d'onde a grande dynamique |
Publications (1)
Publication Number | Publication Date |
---|---|
IL144323A0 true IL144323A0 (en) | 2002-05-23 |
Family
ID=9540875
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL14432300A IL144323A0 (en) | 1999-01-15 | 2000-01-14 | Method and device for analysing a highly dynamic wavefront |
Country Status (9)
Country | Link |
---|---|
US (1) | US6750957B1 (de) |
EP (1) | EP1157261B1 (de) |
JP (1) | JP2002535608A (de) |
AT (1) | ATE245808T1 (de) |
AU (1) | AU3053600A (de) |
DE (1) | DE60004020T2 (de) |
FR (1) | FR2788597B1 (de) |
IL (1) | IL144323A0 (de) |
WO (1) | WO2000042401A2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19938203A1 (de) | 1999-08-11 | 2001-02-15 | Aesculap Meditec Gmbh | Verfahren und Vorrichtung zur Korrektur von Sehfehlern des menschlichen Auges |
US6199986B1 (en) * | 1999-10-21 | 2001-03-13 | University Of Rochester | Rapid, automatic measurement of the eye's wave aberration |
US20030107814A1 (en) * | 2001-12-11 | 2003-06-12 | Altmann Griffith E. | Method and apparatus for improving the dynamic range and accuracy of a Shack-Hartmann wavefront sensor |
DE10333813A1 (de) | 2003-07-24 | 2005-02-17 | Technovision GmbH Gesellschaft für die Entwicklung medizinischer Technologie | Online-Wellenfrontmessung und Anzeige |
FR2879736B1 (fr) * | 2004-12-20 | 2007-02-02 | Essilor Int | Procede et dispositif de mesure sans contact de la courbure d'un objet ophtalmique |
US20070077071A1 (en) * | 2005-09-30 | 2007-04-05 | Mikhail Belenkiy | System for measuring atmospheric turbulence |
US8158917B2 (en) * | 2005-12-13 | 2012-04-17 | Agency For Science Technology And Research | Optical wavefront sensor and optical wavefront sensing method |
CA2645670C (en) * | 2006-03-14 | 2016-12-06 | Amo Manufacturing Usa, Llc | Spatial frequency wavefront sensor system and method |
DE102008003916A1 (de) | 2007-01-23 | 2008-07-24 | Carl Zeiss Smt Ag | Projektionsbelichtungsanlage für die Mikrolithographie mit Messvorrichtung sowie Verfahren zum Messen einer Bestrahlungsstärkeverteilung |
FR2913493B1 (fr) * | 2007-03-08 | 2009-04-17 | Essilor Int | Procede d'analyse pour la mesure sans contact des courbures locales d'un objet ophtalmique |
JP6080427B2 (ja) | 2012-08-10 | 2017-02-15 | キヤノン株式会社 | シャック・ハルトマンセンサとそれを利用した波面計測方法 |
DE102014010667B4 (de) * | 2014-07-18 | 2017-07-13 | Berliner Glas Kgaa Herbert Kubatz Gmbh & Co | Verfahren und Vorrichtung zur Messung der Form einer Wellenfront eines optischen Strahlungsfeldes |
JP6508896B2 (ja) * | 2014-08-08 | 2019-05-08 | キヤノン株式会社 | 光波面センサにおける光スポット重心位置取得方法、光波面計測方法およびプログラム |
US10546117B1 (en) * | 2016-11-15 | 2020-01-28 | Symantec Corporation | Systems and methods for managing security programs |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2945489B2 (ja) * | 1991-01-11 | 1999-09-06 | 浜松ホトニクス株式会社 | 画像検出装置 |
JP2534170B2 (ja) * | 1991-07-11 | 1996-09-11 | 三菱電機株式会社 | 鏡面形状測定装置 |
US5233174A (en) * | 1992-03-11 | 1993-08-03 | Hughes Danbury Optical Systems, Inc. | Wavefront sensor having a lenslet array as a null corrector |
US5493391A (en) * | 1994-07-11 | 1996-02-20 | Sandia Corporation | One dimensional wavefront distortion sensor comprising a lens array system |
JPH0915057A (ja) * | 1995-06-26 | 1997-01-17 | Mitsubishi Electric Corp | 波面センサ並びに波面計測方法 |
US5629765A (en) * | 1995-12-15 | 1997-05-13 | Adaptive Optics Associates, Inc. | Wavefront measuring system with integral geometric reference (IGR) |
US6271914B1 (en) * | 1996-11-25 | 2001-08-07 | Autonomous Technologies Corporation | Objective measurement and correction of optical systems using wavefront analysis |
DE19705119A1 (de) * | 1997-02-11 | 1998-08-13 | Johannes Prof Dr Schwider | Verfahren zur Erhöhung der Meßdynamik des Shack-Hartmann Sensors |
US6548797B1 (en) * | 2000-10-20 | 2003-04-15 | Nikon Corporation | Apparatus and method for measuring a wavefront using a screen with apertures adjacent to a multi-lens array |
-
1999
- 1999-01-15 FR FR9900366A patent/FR2788597B1/fr not_active Expired - Fee Related
-
2000
- 2000-01-14 WO PCT/FR2000/000063 patent/WO2000042401A2/fr active IP Right Grant
- 2000-01-14 AU AU30536/00A patent/AU3053600A/en not_active Abandoned
- 2000-01-14 US US09/889,307 patent/US6750957B1/en not_active Expired - Fee Related
- 2000-01-14 DE DE60004020T patent/DE60004020T2/de not_active Expired - Lifetime
- 2000-01-14 AT AT00900571T patent/ATE245808T1/de not_active IP Right Cessation
- 2000-01-14 EP EP00900571A patent/EP1157261B1/de not_active Expired - Lifetime
- 2000-01-14 JP JP2000593927A patent/JP2002535608A/ja active Pending
- 2000-01-14 IL IL14432300A patent/IL144323A0/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ATE245808T1 (de) | 2003-08-15 |
DE60004020T2 (de) | 2004-06-03 |
DE60004020D1 (de) | 2003-08-28 |
FR2788597A1 (fr) | 2000-07-21 |
EP1157261B1 (de) | 2003-07-23 |
WO2000042401A3 (fr) | 2001-08-16 |
JP2002535608A (ja) | 2002-10-22 |
FR2788597B1 (fr) | 2001-02-23 |
EP1157261A2 (de) | 2001-11-28 |
US6750957B1 (en) | 2004-06-15 |
AU3053600A (en) | 2000-08-01 |
WO2000042401A2 (fr) | 2000-07-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FF | Patent granted | ||
KB | Patent renewed | ||
KB | Patent renewed | ||
MM9K | Patent not in force due to non-payment of renewal fees |