IL106496A0 - Strained interband resonant tunneling negative resistance diode - Google Patents
Strained interband resonant tunneling negative resistance diodeInfo
- Publication number
- IL106496A0 IL106496A0 IL106496A IL10649693A IL106496A0 IL 106496 A0 IL106496 A0 IL 106496A0 IL 106496 A IL106496 A IL 106496A IL 10649693 A IL10649693 A IL 10649693A IL 106496 A0 IL106496 A0 IL 106496A0
- Authority
- IL
- Israel
- Prior art keywords
- strained
- negative resistance
- resonant tunneling
- resistance diode
- interband
- Prior art date
Links
- 230000005641 tunneling Effects 0.000 title 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/122—Single quantum well structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/88—Tunnel-effect diodes
- H01L29/882—Resonant tunneling diodes, i.e. RTD, RTBD
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Computer Hardware Design (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/923,397 US5296721A (en) | 1992-07-31 | 1992-07-31 | Strained interband resonant tunneling negative resistance diode |
Publications (1)
Publication Number | Publication Date |
---|---|
IL106496A0 true IL106496A0 (en) | 1993-11-15 |
Family
ID=25448633
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL106496A IL106496A0 (en) | 1992-07-31 | 1993-07-27 | Strained interband resonant tunneling negative resistance diode |
Country Status (4)
Country | Link |
---|---|
US (1) | US5296721A (fr) |
EP (1) | EP0581239A3 (fr) |
JP (1) | JPH06188437A (fr) |
IL (1) | IL106496A0 (fr) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3226070B2 (ja) * | 1993-10-04 | 2001-11-05 | キヤノン株式会社 | 半導体光素子 |
JP3461893B2 (ja) * | 1994-02-21 | 2003-10-27 | 富士通株式会社 | 光半導体装置 |
US5436469A (en) * | 1994-06-15 | 1995-07-25 | Moll; Nicolas J. | Band minima transistor |
US5497012A (en) * | 1994-06-15 | 1996-03-05 | Hewlett-Packard Company | Unipolar band minima devices |
US5659180A (en) * | 1995-11-13 | 1997-08-19 | Motorola | Heterojunction interband tunnel diodes with improved P/V current ratios |
US6320212B1 (en) | 1999-09-02 | 2001-11-20 | Hrl Laboratories, Llc. | Superlattice fabrication for InAs/GaSb/AISb semiconductor structures |
US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
US6590236B1 (en) | 2000-07-24 | 2003-07-08 | Motorola, Inc. | Semiconductor structure for use with high-frequency signals |
AU2001277001A1 (en) * | 2000-07-24 | 2002-02-05 | Motorola, Inc. | Heterojunction tunneling diodes and process for fabricating same |
US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
US6493497B1 (en) | 2000-09-26 | 2002-12-10 | Motorola, Inc. | Electro-optic structure and process for fabricating same |
US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
US6501121B1 (en) | 2000-11-15 | 2002-12-31 | Motorola, Inc. | Semiconductor structure |
US6583034B2 (en) | 2000-11-22 | 2003-06-24 | Motorola, Inc. | Semiconductor structure including a compliant substrate having a graded monocrystalline layer and methods for fabricating the structure and semiconductor devices including the structure |
US6559471B2 (en) | 2000-12-08 | 2003-05-06 | Motorola, Inc. | Quantum well infrared photodetector and method for fabricating same |
US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
US6531740B2 (en) | 2001-07-17 | 2003-03-11 | Motorola, Inc. | Integrated impedance matching and stability network |
US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
US6498358B1 (en) | 2001-07-20 | 2002-12-24 | Motorola, Inc. | Structure and method for fabricating an electro-optic system having an electrochromic diffraction grating |
US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
WO2010091042A1 (fr) * | 2009-02-03 | 2010-08-12 | Georgia State University Research Foundation, Inc. | Détecteur infrarouge à bande découplée à température de fonctionnement élevée à barrière double et/ou graduelle |
US10615574B2 (en) * | 2018-05-17 | 2020-04-07 | Wisconsin Alumni Research Foundation | Superlattice heterostructures formed with single crystalline semiconductor nanomembranes and amorphous tunneling barrier layers |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4286275A (en) * | 1980-02-04 | 1981-08-25 | International Business Machines Corporation | Semiconductor device |
US4439782A (en) * | 1980-11-21 | 1984-03-27 | University Of Illinois Foundation | Semiconductor device with heterojunction of Alx Ga1-x As--AlAs--Ga |
EP0081007B1 (fr) * | 1981-12-09 | 1986-08-20 | International Business Machines Corporation | Dispositif supraconducteur à jonctions tunnel |
JPS5967676A (ja) * | 1982-10-12 | 1984-04-17 | Nec Corp | 超格子負性抵抗素子 |
JPS5990978A (ja) * | 1982-11-16 | 1984-05-25 | Nec Corp | 超格子負性抵抗素子 |
US4780749A (en) * | 1986-07-01 | 1988-10-25 | Hughes Aircraft Company | Double barrier tunnel diode having modified injection layer |
JPS63276277A (ja) * | 1987-05-08 | 1988-11-14 | Fujitsu Ltd | 半導体負性微分抵抗素子 |
JPH01171280A (ja) * | 1987-12-25 | 1989-07-06 | Fujitsu Ltd | 共鳴トンネルバリア素子 |
JPH01241870A (ja) * | 1988-03-23 | 1989-09-26 | Nec Corp | 共鳴トンネル素子 |
US5113231A (en) * | 1989-09-07 | 1992-05-12 | California Institute Of Technology | Quantum-effect semiconductor devices |
US5132746A (en) * | 1991-01-04 | 1992-07-21 | International Business Machines Corporation | Biaxial-stress barrier shifts in pseudomorphic tunnel devices |
IT1251303B (it) * | 1991-09-11 | 1995-05-08 | Actex Spa | Quadro porta licci alleggerito per telai di tessitura e dispositivo di fissaggio autocentrante dei fiancali di detto quadro |
-
1992
- 1992-07-31 US US07/923,397 patent/US5296721A/en not_active Expired - Lifetime
-
1993
- 1993-07-27 IL IL106496A patent/IL106496A0/xx unknown
- 1993-07-28 EP EP9393111977A patent/EP0581239A3/en not_active Withdrawn
- 1993-08-02 JP JP5191450A patent/JPH06188437A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
US5296721A (en) | 1994-03-22 |
JPH06188437A (ja) | 1994-07-08 |
EP0581239A2 (fr) | 1994-02-02 |
EP0581239A3 (en) | 1994-08-17 |
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