IE20010536A1 - A test fixture for testing a printed circuit board - Google Patents
A test fixture for testing a printed circuit boardInfo
- Publication number
- IE20010536A1 IE20010536A1 IE20010536A IE20010536A IE20010536A1 IE 20010536 A1 IE20010536 A1 IE 20010536A1 IE 20010536 A IE20010536 A IE 20010536A IE 20010536 A IE20010536 A IE 20010536A IE 20010536 A1 IE20010536 A1 IE 20010536A1
- Authority
- IE
- Ireland
- Prior art keywords
- main
- test fixture
- support means
- test
- carrier
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
A test (1) for testing a PCB(2) comprises a main framework (4) having a main probe cassette housing (8) which carries a probe board (7) having a plurality of electrically conductive probes (9) (bed of nails) which is replacably mounted in the main framework (4) for facilitating testing of different types of PCB's (2). A main platform (20) carried on a main carrier frame (21) is slidable from a loading position to a ready for test position within the main framework (4). A main drive ram (30) in a base housing (6) drives a secondary support platform (35) for urging the main support platform (20) from the ready for test position to a test position with the PCB (2) engaged by the main probes (9) of the main probe board (7). A secondary cassette housing (36) carrying a secondary probe board (37) with secondary probes (38) is carried on the secondary support platform (35) for engagement with the underside of the printed circuit board (2) when the secondary support platform (35) is urged from a disengaged position to a first engaged position for engaging the main support platform (20) in the ready for test position. Further upward movement of the secondary support platform (32) by the main drive ram (30) urges the main support platform (30) into the test position. Carrier bars (55), which are support on the underside of the main cassette housing (8), carry connectors (56) for engaging
Description
AjesWrxture for testing a printed circuit board”
The present invention relates to a test fixture for testing a printed circuit board (PCB).
Test fixtures for testing PCBs are known and are typically referred to as a “bed of nails”. In general, a “bed of nails” test fixture comprises a housing or a framework within which a probe board is located. The probe board carries a plurality of electrically conductive pin type probes for engaging various parts of the circuitry ot a PCB. A driving arrangement is provided for urging one of the PCB and the probe board into engagement with the other so that the probes engage the circuitry of the PCB. Individual connections are made to the respective probes ofthe probe board for connecting the probes to, for example, a multi-pin plug connector for in turn connecting to suitable control circuitry which applies test signals to the printed circuit board and reads voltages or other parameters across various components and parts of circuits within the PCB for testing the PCB.
One disadvantage of such test fixtures is that in general they are special purpose fixtures, in other words, they are built and supplied for testing one particular type of PCB only. Additionally, in the testing of many PCBs, for example, motherboards and daughterboards and the like for PCs, it is very often necessary to be able to test the PCB circuitry with other boards, such as, daughterboards plugged into the motherboard and vice versa. This, thus, requires relatively complex test fixtures, and in general, due to their complexity they are constructed to test one type of PCB only.
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This, is a considerable disadvantage in that it requires the provision of a relatively expensive test fixture for each type of PCB which is to be tested. In general, companies producing PCBs produce a wide range of different types of PCBs, and this, thus, requires considerable investment in test fixtures. There is therefore a need for a test fixture to overcome this problem.
The present invention is directed towards providing such a test fixture.
According to the invention there is provided a test fixture for testing a PCB, the test fixture comprising a main framework, a main probe carrier having a plurality of main communicating means located thereon for communicating with the PCB for testing thereof, a main receiving means for releasably receiving and locating the main probe carrier in the main framework, a main support means located in the main framework for supporting the PCB therein in communication with the main communicating means of the main probe carrier for testing the PCB, a main drive means for urging the main support means between a ready for test position with the PCB supported thereon remote from the main communicating means of the main probe carrier, and a test position with the PCB supported on the main support means in communication with the main communicating means of the main probe carrier.
In one embodiment of the invention a main latching means is located in the main framework for releasably locating and latching the main probe carrier in the main framework.
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In another embodiment ofthe invention the main receiving means comprises a pair of spaced apart main guide rails for guiding the main probe carrier in the main framework into engagement with the main latching means, and for supporting the main probe carrier in the main framework.
Preferably, the main latching means comprises a main latching ram.
Advantageously, the main latching ram is provided by a pneumatically powered main latching ram.
Preferably, the main probe carrier is slideabiy engageable with the main receiving means.
in one embodiment of the invention a secondary support means for supporting the main support means and for aligning the main support means with the main probe carrier is provided in the main framework. Preferably, the secondary support means operably co-operates with the main drive means for urging the main support means between the ready for test position and the test position.
In one embodiment of the invention the secondary support means is adapted for receiving a first secondary probe carrier having a plurality of first secondary communicating means for communicating with the PCB on the main support means for testing thereof.
In another embodiment of the invention one of the secondary support means and the
IE010536 main support means is moveable relative to the other when the main support means is in the ready for test position between a disengaged position with the first secondary communicating means of the first secondary probe carrier disengaged from a PCB on the main support means, and a first engaged position with the first secondary communicating means communicating with the PCB on the main support means for testing thereof. Preferably, the secondary support means is moveable between the disengaged position and the first engaged position relative to the main support means. Advantageously, drive from the main drive means is transmitted to the main support means through the secondary support means, and the secondary support means is driven by the main drive means between the disengaged position and the first engaged position.
In one embodiment of the invention the secondary support means is moveable by the main drive means between the first engaged position and a second engaged position for urging the main support means between the ready for test position and the test position. Preferably, the secondary support means is moveable between the disengaged position and the first engaged position and the second engaged position in the same direction.
In one embodiment of the invention a main alignment means is provided on the secondary support means for engaging and aligning the main support means with the secondary support means.
In another embodiment of the invention a second secondary probe carrier is
IE010536 mounted on the main framework, the secondary probe carrier having a plurality of second secondary communicating means for communicating with the PCB on the main support means when the main support means is in the test position, the second secondary probe carrier being moveable between remote position with the second secondary communicating means disengaged from the PCB when the main support means is in the test position and an engaged position with the second secondary communicating means engaging the PCB when the main support means is in the test position. Preferably, at least two secondary probe carriers are provided. Advantageously, at least three second secondary probe carriers are provided.
In one embodiment of the invention each second secondary probe carrier is adapted for mounting on the main probe carrier.
In one embodiment of the invention a secondary drive means is provided for each second secondary probe carrier for urging the corresponding second secondary probe carrier between the respective remote and engaged positions. Preferably, each secondary drive means is mounted on the secondary support means and is couplable with the corresponding second secondary probe carrier when the secondary support means is in the second engaged position. Advantageously, each secondary drive means is releasably couplable with the corresponding second secondary probe carrier.
In one embodiment of the invention each second secondary probe carrier is adapted for receiving a connector for engaging a corresponding connector on a PCB.
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Preferably, each second secondary probe carrier is adapted for releasably receiving the connector.
Alternatively, each second secondary probe carrier, or some of the second 5 secondary probe carriers are adapted for receiving a corresponding probe board.
In one embodiment of the invention the first secondary probe carrier is adapted for receiving a corresponding probe board.
In another embodiment of the invention the main probe carrier is adapted for receiving a corresponding probe board.
Preferably, each probe board comprises a plurality of the corresponding communicating means. Advantageously, each communicating means comprises an is electrically conductive probe. Preferably, each main, first and second secondary probe carrier is adapted for releasably receiving the corresponding probe board.
In one embodiment of the invention a main guide means is provided for guiding the secondary support means between the disengaged position and the first engaged position and the second engaged position.
In another embodiment of the invention a main support carrier is mounted in the main framework for carrying the main support means, the main support carrier being moveable between a loading position externally of the main framework for facilitating
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Ί loading and unloading of a PCB onto and from the main support means, and an operable position with the main support means located within the main framework in the ready for test position. Preferably, the main support means is disengageabie from the main support carrier so that the main support means is moveable between the ready for test position and the test position when the main support carrier is in the operable position. Advantageously, a secondary latching means is provided for latching the main support carrier in the operable position. Advantageously, the secondary latching means is mounted on the main framework. Advantageously, the secondary latching means comprises a secondary latching ram. Ideally, the secondary latching ram is provided by a pneumatically operated secondary latching ram.
In one embodiment of the invention a pair of spaced apart secondary guide rails are located in the main framework for slideably supporting the main support carrier and for guiding the main support carrier between the respective loading and operable positions.
In one embodiment of the invention the main drive means comprises a main drive ram. Preferably, the main drive ram is a pneumatically operated main drive ram.
In one embodiment ofthe invention a secondary alignment means is provided on the main support means for aligning a PCB to be tested on the main support means.
The invention will be more clearly understood from the following description of an
IE010536 embodiment thereof which is given by way of example only with reference to the accompanying drawings, in which:
Fig. 1 is a front perspective view of a test fixture according to the invention for 5 testing printed circuit boards,
Fig. 2 is a front perspective view of the test fixture of Fig. 1 illustrating a portion ofthe test fixture in a different position,
Fig. 3 is a rear perspective view of the test fixture of Fig. 1,
Fig. 4 is a front perspective view of a portion of the test fixture of Fig. 1 illustrating a part of the test fixture in a different position to that of Fig. 1,
Fig. 5 is a diagrammatic front elevational view of the test fixture of Fig. 1,
Fig. 6 is a view similar to Fig. 5 of the text fixture of Fig. 1 illustrating parts of the test fixture in a different position,
Fig. 7 is a view similar to Fig. 5 of the test fixture of Fig. 1 illustrating parts of the test fixture in another different position,
Fig. 8 is a view similar to Fig. 5 ofthe test fixture of Fig. 1 illustrating parts of the test fixture in a further different position,
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Fig. 9 is an underneath perspective view of a portion of the test fixture of Fig. 1 with portions of the test fixture removed,
Fig. 10 is an underneath plan view of the portion of the test fixture of Fig. 9,
Fig. 1 ί is a top perspective view of a part of the portion of the test fixture of Fig. 9,
Fig. 12 is an underneath perspective view of the part of the test fixture of Fig.
11,
Fig. 13 is a perspective view of a detail of the test fixture of Fig. 1,
Fig. 14 is a perspective view of the detail of the test fixture of Fig. 13 illustrating a part of the detail in a different position,
Fig. 15 is a perspective view of another detail of the test fixture of Fig. 1,
Fig. 16 is a perspective view of another detail of the test fixture of Fig. 1,
Fig. 17 is a perspective view of a further detail of the test fixture of Fig. 1, and
Fig. 18 is a perspective view of the detail of Fig. 17 illustrating a portion of the
IE010536 detail in a different position.
Referring to the drawings there is illustrated a test fixture according to the invention indicated generally by the reference numeral 1 for testing a PCB 2 which is illustrated in some of the drawings. The test fixture 1 comprises a main framework 4 having four upstanding pillars 5 which extend upwardly from a base housing 6. A main probe carrier provided by a main probe cassette housing 8 for carrying a main probe board 7 is releasably mounted on the main framework 4, see Figs. 4 to 8. The main probe board 7 will be well known to those skilled in the art. Briefly, it comprises an insulated panel and a plurality of main communicating means provided by electrically conductive main pin type probes 9 extending downwardly from the main probe board 7 for electrically engaging the circuitry on the PCB 2. Such probe boards are typically referred to as “beds of nails”, and will be well known to those skilled in the art.
The main cassette housing 8 is releasably mounted on the main framework 4 for facilitating replacement of the main cassette housing 8 with other housings which carry main probe boards for testing different types of PCBs 2. A main receiving means comprising two pairs of main guide members 10 and 11 slideably engage corresponding guide rails 13 on the main cassette housing 8 for supporting the main cassette housing 8 in the main framework 4 and for slideably guiding the main cassette housing 8 into an aligned position in the main framework 4, see Figs. 2 to 4. A main latching means, see Figs. 3, 13 and 14, for latching the main cassette housing 8 in the main framework 4 and for retaining it in the aligned position
IE010536 comprises a pair of main latching pneumatic rams 12 mounted on a rear crossbar 14 extending between the rear pillars 5 of the main framework 4. Piston rods 15 of the main rams 12 engage corresponding eyes 16 in eye brackets 17 extending rearwardly from the main cassette housing 8. Abutment members 18 on the crossbar
14 abut the cassette housing 8 when it is in the aligned position within the main framework 4, prior to engagement of the eye brackets 17 by the main rams 12.
A main support means for supporting each PCB 2 in the main framework 4 comprises a main support platform 20 which is carried in a main support carrier, io namely, a main carrier frame 21. The main carrier frame 21 is slideably carried on a pair of secondary guide rails 22 mounted on the pillars 5 of the main framework 4, and is slideable horizontally between an external loading position illustrated in Fig. 1 for facilitating loading and unloading of PCBs 2 onto the main support platform 20, and an operable position with the main support platform 20 in a ready for test position illustrated in Fig. 2 within the main framework 4. The main support platform 20 is disengageable from the main carrier frame 21 for facilitating vertical movement of the main support platform 20 relative to the main carrier frame 21 so that the main support platform 20 is moveable between the ready for test position and a test position illustrated in Figs. 7 and 8 with a PCB carried on the main support platform
engaged by the main probes 9 of the main probe cassette housing 8 for testing of the PCB 2. The movement of the main support platform 20 will be described in more detail below.
A main carrier frame alignment means for aligning the main carrier frame 21 in the
IE010536 operable position comprises an abutment block 24 which is mounted on the base housing 6 to the rear thereof for engaging the main carrier frame 21 when in the operable position. A secondary latching means for latching the main carrier frame 21 in the operable position comprises a secondary pneumatic latching ram 25 which is also mounted on the base housing 6 adjacent the abutment block 24. A piston rod 26 of the secondary latching ram 25 engages an eye 27 in a rear cross member 28 of the main carrier frame 21 when the main carrier frame 21 is aligned in the operable position, see Figs. 3 and 15.
A main drive means comprising a main pneumatically powered drive ram 30 is mounted in the base housing 6 for urging the main support platform 20 between the ready for test position within the main framework 4 when the main carrier frame 21 is in the operable position, and a test position with the PCB 2 in engagement with the main probes 9 of the main cassette housing 8, see Figs. 5 to 12. The main drive ram
comprises a cylinder 32 and a piston rod 33 of large diameter extending from the cylinder 32. inlet and outlet pneumatic ports to the cylinder 32 for accommodating air to and from the cylinder 32 are not shown but will be well known to those skilled in the art. A base plate 34 secured to the cylinder 32 is provided for securing the cylinder 32 in the base housing 6 in alignment with the framework 4.
A secondary support means comprising a secondary support platform 35 is carried on and secured to the piston rod 33 and is driven by the main drive ram 30 for in turn urging the main platform 20 between the ready for test position and the test position as will be described below. The secondary platform 35, however, has a secondary
IE010536 function and that is to support a first secondary probe carrier, in this embodiment of the invention a secondary cassette housing 36 which carries a secondary probe board 37 which in turn carries a plurality of first secondary communicating means, namely, secondary electrically conductive pin type probes 38 for engaging circuitry on the underside of the PCB 2, see Figs. 5 to 8. The main support platform 20 is provided with a plurality of openings 39 only one of which is illustrated in Fig. 6 for accommodating groups of the first secondary probes 38 from the secondary cassette housing 36 for engaging the circuitry ofthe PCB 2. The secondary support platform 35 is moveable by the main drive ram 30 vertically between a disengaged position and respective first and second engaged positions.
In the disengaged position the secondary support platform 35 is located remote from the main support platform 20 in the position illustrated in Fig. 5 with the secondary probes 38 of the secondary probe board 37 disengaged from a PCB 2 located on the main support platform 20. In the first engaged position the secondary support platform 35 is located in a position relatively close to the main support platform, see Fig. 6 with the secondary probes 38 ofthe secondary probe board 37 engaging the PCB 2 located on the main support platform 20 with the main support platform 20 in the ready for test position. Four bosses 43 extending upwardly from the secondary support platform 35 engage the main support platform 20 as the secondary support platform 35 is moved into the first engaged position, so that further upward movement of the secondary support platform 35 from the first engaged position to the second engaged position disengages the main support platform 20 from the main carrier frame 21 as the main support platform 20 is being urged from the ready
IE010536 for test to the test position. In the second engaged position the secondary support platform 35 is in the position illustrated in Figs. 7 and 8 having moved the main support platform 20 from the ready for test position into the test position with the PCB 2 on the main support platform 20 engaged by the main probes 9 of the main probe board 7. Accordingly, as the secondary support platform 35 is urged from the disengaged position to the second engaged position the bosses 43 on the secondary support platform 35 engage the main support platform 20 in the ready for test position and then urge the main support platform 20 from the ready for test position into the test position.
A main guide means comprising keys 40 located on opposite sides of the piston rod 33 engage keyways 41 in guide members 42 extending from the cylinder 32 of the main ram 30 for keying and guiding the piston rod 33, and for moving the secondary support platform 35 in alignment with the main framework 4 between the respective disengaged and the first and second engaged position with the respective platforms 20 and 35 in alignment with the main cassette housing 8, and in alignment with each other.
A main alignment means for aligning the main support platform 20 with the secondary support platform 35 comprises four alignment rams 45 which are mounted on the secondary support platform 35. Piston rods 46 of the alignment rams 45 acting through the secondary platform 35 and the bosses 43 on the secondary platform 35 are urged upwardly for engaging alignment bores 48 in the main support platform 20 when the main support platform 20 is supported in the
IE010536 ready for test position on the main carrier frame 21. The alignment rams 45 are operated for engaging the piston rods 46 in the alignment bores 48 of the main support platform 20 as the main drive ram 30 is moving the secondary support platform 35 from the disengaged position to the first engaged position. The alignment rams 45 are further operated as the main drive ram 30 is urging the secondary support platform 35 from the first engaged position to the second engaged position for engaging corresponding alignment bores 49 in the underside of the main cassette housing 8, see Fig. 9, for ensuring alignment ofthe main support platform 20 with the main cassette housing 8, for in turn aligning the PCB 2 with the io main probe board 7. It should be noted that the base housing 6 and the main framework 4 as well as the carrier frame 21 and the main support platform 20 have been omitted from Fig. 9 for the purpose of illustrating components that could otherwise be easily illustrated.
Three second secondary probe carriers provided by respective carrier bars 55, see Figs. 5 to 8 and 9, are slideabiy carried on the underside of the main cassette housing 8, and In turn carry a plurality of second secondary communicating means, namely, a multi-pin plug or socket connector 56 for engaging corresponding multi-pin plug or socket connectors 58 of the PCB 2. The carrier bars 55 are mounted on respective opposite sides of the main cassette housing 8, and to the rear of the main cassette housing 8 and depend downwardly therefrom. For convenience only two of the carrier bars 55 located to respective opposite sides of the main cassette housing 8 are illustrated. The third carrier bar 55 which is located to the rear of the main cassette housing 8 is not illustrated in Figs. 5 to 8. The carrier bars 55 are slideabiy
IE010536 carried on pairs of parallel bearing tracks 60, which are mounted on the underside of the main cassette housing 8 by mounting brackets 61. The carrier bars 55 are slideable on the bearing tracks 60 between a remote position remote from the PCB 2 with the connector 56 disengaged from the corresponding plug or socket connectors
58 of the PCB 2 when the PCB 2 is in the test position, see Fig. 7, and an engaged position with the corresponding connector 56 engaging the corresponding plug or socket connectors 58 of the PCB 2 when the PCB 2 is in the test position, see Fig. 8.
Secondary drive means for urging the carrier bars 55 between the remote and engaged positions comprise three pairs of secondary pneumatic drive rams 64 mounted on the underside of the secondary support platform 35, see Figs. 9 to 12. The secondary drive rams 64 drive the corresponding carrier bars 55 through respective pairs of male and female coupling brackets 66 and 67. The male coupling brackets 66 are mounted on the carrier bars 55. The female coupling brackets 67 are driven by the secondary drive rams 64 through transverse members 65, which are in turn driven by piston rods 63 of the secondary rams 64. Slots 68 in the secondary support platform 35 accommodate the female coupling brackets 67 through the secondary support platform 35, and corresponding slots 69 in the main support platform 20 accommodate the female coupling brackets 67 through the main support platform 20. The male and female coupling brackets 66 and 67 releasably engage each other when the secondary support platform 35 is in the second engaged position. The slots 68 and 69 in the secondary and support platforms 35 and 20, respectively, are of sufficient length to accommodate sufficient linear movement of the female coupling brackets 67 for urging the corresponding carrier
IE010536 bar 55 between the remote and engaged positions. Racks 70 on the female coupling brackets 67 engage corresponding pinions 71 on shafts 73 which are carried in bearings 74 on the underside of the secondary support platform 35 for synchronising the movement of the pairs of female coupling brackets 67 for each carrier bar 55 as the carrier bars 55 are urged between their respective remote and engaged positions.
Secondary alignment means for aligning the PCB 2 on the main support platform 20 comprise four alignment pins 75 for engaging corresponding alignment holes 76 in the PCB 2.
In practice in order to adapt the test fixture 1 for testing different types of PCBs 2, a different main support platform 20 will be provided for each different type of PCB 2. Accordingly, alignment pins 75 will be located in appropriate positions on the main support platform 20 for engaging corresponding holes 76 in the various PCBs 2. A main cassette housing 8 will be provided for each different type of PCB 2 to be tested, as will different types of carrier bars 55. Indeed, in general it is envisaged that the carrier bars will be matched to the main cassette housing 8. In certain cases, where testing of the underside of the PCB 2 is not required, the secondary cassette housing 38 may be dispensed with.
Pneumatic control circuitry (not shown) is provided in the base housing 6 for operating the main and secondary rams 30 and 64 in the appropriate sequence and also for operating the main and secondary latching rams 12 and 25, respectively,
IE010536 and the alignment rams 45. However, the main latching rams 12 will only be operated once when the appropriate main cassette housing 8 has been located in the main framework 4, and will not be operated again until the main cassette housing is to be replaced. The secondary latching ram 25 is operated for latching the main carrier frame 21 each time the main carrier frame 21 is urged into the operable position. A sensor (not shown) is located in the abutment block 24 for sensing when the main carrier frame 21 is in the operable position, and on the sensor (not shown) determining that the main carrier frame 21 is in the operable position the control pneumatic circuitry operates the secondary latching ram 25 for retaining the main carrier frame 21 in the operable position. The control pneumatic circuitry (not shown) then operates the main and secondary rams 30 and 64 and the alignment rams 45 in the appropriate sequence.
A safety guard 80 which is illustrated in Fig. 1 and Fig. 4 is slideably mounted on the front two pillars 5 of the main framework 4 and is slideable between an open position illustrated in Fig. 1 for accommodating movement of the main carrier frame 21 between the loading and operable positions, and a closed position illustrated in Fig.
for preventing access into the main framework 4 during testing of the PCB 2.
Side panels 81 secured to the pillars 5 prevent access into the main framework 4, and a rear panel (not shown) likewise prevents access into the main framework 4.
Cables (not shown) connect the main probes 9 of the main probe board 7 and the secondary probes 38 of secondary probe board 37 and the connectors 56 of the
IE010536 carrier bars 55 to multi-pin connectors 82 which are located on the main cassette housing 8 and the base housing 6 for facilitating connection of the test fixture 1 to a computer suitably programmed for testing the PCBs 2, or to suitable test circuitry. Only the connectors 82 on the main cassette housing 8 are illustrated. The testing of PCBs 2 in test fixtures will be well known to those skilled in the art.
In use, with the appropriate main support platform 20 placed in the main carrier frame 21 and the appropriate main and secondary cassette housings 8 and 36 mounted in the main framework 4, and the secondary support platform 35, io respectively, and with the main cassette housing 8 carrying the appropriate number and type of carrier bars 55 the test fixture 1 is ready for use. The test fixture 1 is then connected to a computer suitably programmed for testing the PCBs 2 to be tested or to suitable test circuitry, and the test fixture 1 is then ready for testing the PCBs 2.
With the main carrier frame 21 in the loading position, a PCB 2 to be tested is placed on the main support platform 20 with the alignment pins 75 engaging the corresponding alignment holes 76 ofthe PCB 2. The main carrier frame 21 is manually urged into the operable position, and on the sensor (not shown) sensing the main carrier frame 21 in the operable position the secondary latching ram 25 is operated for latching the main carrier frame 21 in the operable position. The main ram 30 commences to urge the secondary support platform 35 from the disengaged position, and the alignment rams 45 are operated for urging the piston rods 46 upwardly for engaging the alignment bores 48 in the main support platform 20, and for aligning the main support platform 20 with the secondary support platform 35.
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The main drive ram 30 continues to urge the secondary support platform 35 upwardly to the first engaged position for engaging the secondary probes 38 of the secondary probe board 37 with the underside of the PCB 2. Further upward movement of the main drive ram 30 urges the secondary support platform 35 from the first engaged position to the second engaged position for in turn urging the main support platform 20 with the PCB 2 mounted thereon from the ready for test position to the test position with the main probes 9 of the main probe board 7 engaging the top side of the PCB 2. In this position both the main probes 9 and the secondary probes 38 are in engagement with the PCB 2. The secondary drive rams 64 are io then operated for urging the carrier bars 55 from the remote to the engaged positions for engaging the connectors 56 with corresponding plug or socket connectors 58 on the PCB 2 in the test position.
The PCB 2 is now ready fortesting and appropriate signals are applied to the PCB 2 through the various probes 9 and 38 and through the connectors 56, and voltages and other parameters are read from the PCB 2 through others of the probes 9 and 38 and the connectors 56. This aspect of testing a PCB in a test fixture will be well known to those skilled in the art. When testing of the PCB 2 has been completed, the test fixture 1 is operated in reverse until the secondary latching ram 25 is released, and the main carrier frame 21 is then urged from the operable position to the loading position, and the tested PCB 2 on the main support platform 20 is replaced with the next PCB 2 to be tested.
The advantages of the test fixture according to the invention are many. A
IE010536 particularly important advantage ofthe invention is that as well as facilitating urging of electrically conductive probes into engagement with electrically conductive tracks or components on the printed circuit board, the test fixture also facilitates connection of test circuitry or an appropriately programmed computer to the printed circuit board through plug and/or socket connectors on the printed circuit board. By virtue of the fact that the carrier bars are provided for carrying connectors, connection into the plug/socket connectors ofthe printed circuit board is readily easily made without the need for manual intervention. Additionally, in certain cases, where it is desired to plug a motherboard or a daughterboard into the PCB being tested, the motherboard or daughterboard may be mounted on one or more of the carrier bars, and these can be then connected into appropriate sockets or other connectors in the printed circuit board. Again, such connections can be made without manual intervention. A particularly important advantage of providing for the connection ofthe connectors and/or mother or daughterboards carried on the carrier bars into the plug or sockets of the printed circuit board is that the appropriate connections may be made with significantly greater precision than would otherwise be the case if the connectors or mother or daughterboards were being manually connected.
It will of course be appreciated that in order to facilitate the connection of mother and/or daughter boards into a PCB under test, instead of providing connectors on the carrier bars, the mother or daughter boards would be connected thereon.
Indeed, in certain cases, it is envisaged that the mother or daughter board to which the PCB 2 under test is to be connected during test may be located externally of the test fixture, and in which case, an appropriate connector would be located on the
IE010536 appropriate carrier bar for connecting into the socket of the mother or daughter board, as the case may be. Additionally, or alternatively, some or all of the carrier bars may be adapted for carrying second secondary probe boards with corresponding eiectricaliy conductive secondary probes for engaging, for example, a daughterboard already connected into the PCB board under test for applying signals to or reading signals from the daughterboard.
Claims (42)
1. A test fixture for testing a PCB, the test fixture comprising a main framework, a main probe carrier having a plurality of main communicating means located thereon for communicating with the PCB for testing thereof, a main receiving means 5 for releasably receiving and locating the main probe carrier in the main framework, a main support means located in the main framework for supporting the PCB therein in communication with the main communicating means of the main probe carrier for testing the PCB, a main drive means for urging the main support means between a ready for test position with the PCB supported thereon remote from the main io communicating means of the main probe carrier, and a test position with the PCB supported on the main support means in communication with the main communicating means of the main probe carrier.
2. A test fixture as claimed in Claim 1 in which a main latching means is located 15 in the main framework for releasably locating and latching the main probe carrier in the main framework.
3. A test fixture as claimed in Claim 2 in which the main receiving means comprises a pair of spaced apart main guide rails for guiding the main probe carrier 20 in the main framework into engagement with the main latching means, and for supporting the main probe carrier in the main framework.
4. A test fixture as claimed in Claim 2 or 3 in which the main latching means comprises a main latching ram. IE010536
5. A test fixture as claimed in Claim 4 in which the main latching ram is provided by a pneumatically powered main latching ram. 5
6. A test fixture as claimed in any preceding claim in which the main probe carrier is slideably engageable with the main receiving means.
7. A test fixture as claimed in any preceding claim in which a secondary support means for supporting the main support means and for aligning the main support 10 means with the main probe carrier is provided in the main framework.
8. A test fixture as claimed in Claim 7 in which the secondary support means operably co-operates with the main drive means for urging the main support means between the ready for test position and the test position.
9. A test fixture as claimed in Claim 7 or 8 in which the secondary support means is adapted for receiving a first secondary probe carrier having a plurality of first secondary communicating means for communicating with the PCB on the main support means for testing thereof.
10. A test fixture as claimed in Claim 9 in which one of the secondary support means and the main support means is moveable relative to the other when the main support means is in the ready for test position between a disengaged position with the first secondary communicating means of the first secondary probe carrier IE010536 disengaged from a PCB on the main support means, and a first engaged position with the first secondary communicating means communicating with the PCB on the main support means for testing thereof. 5
11. A test fixture as claimed in Claim 10 in which the secondary support means is moveable between the disengaged position and the first engaged position relative to the main support means.
12. A test fixture as claimed in Claim 11 in which drive from the main drive 10 means is transmitted to the main support means through the secondary support means, and the secondary support means is driven by the main drive means between the disengaged position and the first engaged position.
13. A test fixture as claimed in Claim 12 in which the secondary support means is 15 moveable by the main drive means between the first engaged position and a second engaged position for urging the main support means between the ready for test position and the test position.
14. A test fixture as claimed in Claim 13 in which the secondary support means is 20 moveable between the disengaged position and the first engaged position and the second engaged position in the same direction.
15. A test fixture as claimed in any of Claims 7 to 14 in which a main alignment means is provided on the secondary support means for engaging and aligning the IE010536 main support means with the secondary support means.
16. A test fixture as claimed in any of Claims 7 to 15 in which a second secondary probe carrier is mounted on the main framework, the secondary probe 5 carrier having a plurality of second secondary communicating means for communicating with the PCB on the main support means when the main support means is in the test position, the second secondary probe carrier being moveable between remote position with the second secondary communicating means disengaged from the PCB when the main support means is in the test position and 10 an engaged position with the second secondary communicating means engaging the PCB when the main support means is in the test position.
17. A test fixture as claimed in Claim 16 in which at least two secondary probe carriers are provided.
18. A test fixture as claimed in Claim 16 or 17 in which at least three second secondary probe carriers are provided.
19. A test fixture as claimed in any of Claims 16 to 18 in which each second 20. Secondary probe carrier is adapted for mounting on the main probe carrier.
20. A test fixture as claimed in any of Claims 16 to 19 in which a secondary drive means is provided for each second secondary probe carrier for urging the corresponding second secondary probe carrier between the respective remote and IE010536 engaged positions.
21. A test fixture as claimed in Claim 20 in which each secondary drive means is mounted on the secondary support means and is couplable with the corresponding 5 second secondary probe carrier when the secondary support means is in the second engaged position.
22. A test fixture as claimed in Claim 21 in which each secondary drive means is releasably coupiable with the corresponding second secondary probe carrier.
23. A test fixture as claimed in any of Claims 16 to 22 in which each second secondary probe carrier is adapted for receiving a connector for engaging a corresponding connector on a PCB. 15
24. A test fixture as claimed in Claim 23 in which each second secondary probe carrier is adapted for releasably receiving the connector.
25. A test fixture as claimed in any of Claims 16 to 22 in which each second secondary probe carrier is adapted for receiving a corresponding probe board.
26. A test fixture as claimed in any of Claims 9 to 25 in which the first secondary probe carrier is adapted for receiving a corresponding probe board.
27. A test fixture as claimed in any preceding claim in which the main probe IE010536 carrier is adapted for receiving a corresponding probe board.
28. A test fixture as claimed in any of Claims 25 to 27 in which each probe board comprises a plurality of the corresponding communicating means.
29. A test fixture as claimed in Claim 28 in which each communicating means comprises an electrically conductive probe.
30. A test fixture as claimed in any of Claims 25 to 29 in which each main, first 10 and second secondary probe carrier is adapted for releasably receiving the corresponding probe board.
31. A test fixture as claimed in any of Claims 7 to 30 in which a main guide means is provided for guiding the secondary support means between the 15 disengaged position and the first engaged position and the second engaged position.
32. A test fixture as claimed in any preceding claim in which a main support carrier is mounted in the main framework for carrying the main support means, the 20 main support carrier being moveable between a loading position externally of the main framework for facilitating loading and unloading of a PCB onto and from the main support means, and an operable position with the main support means located within the main framework in the ready for test position. IE010536
33. A test fixture as claimed in Claim 32 in which the main support means is disengageabie from the main support carrier so that the main support means is moveable between the ready for test position and the test position when the main support carrier is in the operable position.
34. A test fixture as claimed in Claim 32 or 33 in which a secondary latching means is provided for latching the main support carrier in the operable position.
35. A test fixture as claimed in Claim 34 in which the secondary latching means 10 is mounted on the main framework.
36. A test fixture as claimed in Claim 34 or 35 in which the secondary latching means comprises a secondary latching ram. 15
37. A test fixture as claimed in Claim 36 in which the secondary latching ram is provided by a pneumatically operated secondary latching ram.
38. A test fixture as claimed in any of Claims 32 to 37 in which a pair of spaced apart secondary guide rails are located in the main framework for slideably 20 supporting the main support carrier and for guiding the main support carrier between the respective loading and operable positions.
39. A test fixture as claimed in any preceding claim in which the main drive means comprises a main drive ram. IE010536
40. A test fixture as claimed in Claim 39 in which the main drive ram is a pneumatically operated main drive ram. 5
41. A test fixture as claimed in any preceding claim in which a secondary alignment means is provided on the main support means for aligning a PCB to be tested on the main support means.
42. A test fixture for testing a PCB, the test fixture being substantially as 10 described herein with reference to and as illustrated in the accompanying drawings.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IE20010536A IE20010536A1 (en) | 2000-06-06 | 2001-06-06 | A test fixture for testing a printed circuit board |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IE20000455 | 2000-06-06 | ||
| IE20010536A IE20010536A1 (en) | 2000-06-06 | 2001-06-06 | A test fixture for testing a printed circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IE20010536A1 true IE20010536A1 (en) | 2001-12-12 |
Family
ID=11042625
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IE20010540A IES20010540A2 (en) | 2000-06-06 | 2001-06-06 | A test fixture for testing a printed circuit board |
| IE20010536A IE20010536A1 (en) | 2000-06-06 | 2001-06-06 | A test fixture for testing a printed circuit board |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IE20010540A IES20010540A2 (en) | 2000-06-06 | 2001-06-06 | A test fixture for testing a printed circuit board |
Country Status (2)
| Country | Link |
|---|---|
| GB (1) | GB2367369A (en) |
| IE (2) | IES20010540A2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106908682A (en) * | 2015-12-22 | 2017-06-30 | 昆山万盛电子有限公司 | Slidingtype probe tester and method |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6628130B2 (en) | 2001-07-18 | 2003-09-30 | Agilent Technologies, Inc. | Wireless test fixture for printed circuit board test systems |
| GB2405945B (en) * | 2003-09-11 | 2006-10-25 | Agilent Technologies Inc | Printed circuit board assembly test apparatus |
| CN100388001C (en) * | 2004-05-24 | 2008-05-14 | 名威科技实业有限公司 | Detecting chip with multiple detecting units |
| CN102944832A (en) * | 2012-11-23 | 2013-02-27 | 大连运明自动化技术有限公司 | Needle bed detecting unit for automatic detector module of printed circuit board (PCB) |
| TW201430349A (en) * | 2013-01-16 | 2014-08-01 | Chipbond Technology Corp | Smart card testing apparatus |
| KR101872876B1 (en) * | 2016-10-17 | 2018-07-11 | (주)영우디에스피 | Apparatus for exchanging OLED probe unit |
| CN108983071B (en) * | 2018-07-31 | 2020-12-22 | 重庆匠颖科技有限公司 | PCB test method with plug and socket |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3970934A (en) * | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
| US4288745A (en) * | 1980-07-22 | 1981-09-08 | Ostby & Barton Company | Printed circuit board testing means |
| US4797610A (en) * | 1986-05-08 | 1989-01-10 | Miguel Fombellida | Electronic test fixture |
| US4746861A (en) * | 1986-08-21 | 1988-05-24 | Tti Testron, Inc. | Test fixture for printed circuit board assembly |
| US5094584A (en) * | 1989-04-06 | 1992-03-10 | Hewlett-Packard Company | Method and apparatus for automatically changing printed circuit board test fixtures |
| WO1998025152A1 (en) * | 1996-12-05 | 1998-06-11 | A.T.E. Services Limited | A test fixture |
-
2001
- 2001-06-06 IE IE20010540A patent/IES20010540A2/en not_active IP Right Cessation
- 2001-06-06 GB GB0113779A patent/GB2367369A/en not_active Withdrawn
- 2001-06-06 IE IE20010536A patent/IE20010536A1/en not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106908682A (en) * | 2015-12-22 | 2017-06-30 | 昆山万盛电子有限公司 | Slidingtype probe tester and method |
| CN106908682B (en) * | 2015-12-22 | 2023-08-04 | 昆山万盛电子有限公司 | Sliding type probe testing device and method |
Also Published As
| Publication number | Publication date |
|---|---|
| IES20010540A2 (en) | 2002-02-06 |
| GB0113779D0 (en) | 2001-07-25 |
| GB2367369A (en) | 2002-04-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM9A | Patent lapsed through non-payment of renewal fee |