CN106908682B - Sliding type probe testing device and method - Google Patents
Sliding type probe testing device and method Download PDFInfo
- Publication number
- CN106908682B CN106908682B CN201510969033.1A CN201510969033A CN106908682B CN 106908682 B CN106908682 B CN 106908682B CN 201510969033 A CN201510969033 A CN 201510969033A CN 106908682 B CN106908682 B CN 106908682B
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- Prior art keywords
- test
- product
- probe
- sliding
- test product
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06794—Devices for sensing when probes are in contact, or in position to contact, with measured object
Abstract
The invention provides a sliding probe testing device, which comprises: a product carrying part on which a test product is placed; a driving part for driving the test product to perform linear motion; and the probe part is fixedly arranged on the bracket and kept at a fixed position, the needle head of the probe part extends to the test position of the product bearing part, and the test product is contacted with the needle head after being conveyed to the test position. The invention also provides a sliding type probe testing method. The invention tests the test product in a sliding test mode, so that the test has no pause time, the test efficiency is obviously improved, and meanwhile, the pressure test mode is canceled, and the product can be effectively protected from damage.
Description
Technical Field
The invention relates to a probe testing technology, in particular to a sliding type probe testing device and method.
Background
For electronic components such as capacitors, it is generally necessary to perform an energization test by a probe before shipment to detect whether the electrical properties thereof meet the shipment standards.
Currently, the probe test for products is mainly realized in two ways. One is to manually hold the probe pen to test the product; and the other is that the probe is arranged on a driving device such as a cylinder and the like, and the cylinder drives the probe to move up and down continuously to contact a product for testing.
The existing probe structure or mode has the disadvantages that the reliability of the probe is easily affected because the probe is in an unstable state, and the probe can be in a longer pause interval between the test operations of two products in continuous movement, so that the test efficiency is also poor; in addition, especially for the structure of the cylinder driving the probe up and down, the probe driven by the cylinder can continuously strike the surface of the product, and when the striking force is not well controlled, the product is easily damaged.
Disclosure of Invention
In view of the above, the present invention provides a sliding probe testing device and method, which aims to solve the problems of low testing efficiency and easy damage to products caused in the product testing in the prior art.
In one aspect, the present invention provides a sliding probe testing apparatus, comprising:
a product carrying part on which a test product is placed;
a driving part for driving the test product to perform linear motion;
and the probe part is fixedly arranged on the bracket and kept at a fixed position, the needle head of the probe part extends to the test position of the product bearing part, and the test product is contacted with the needle head after being conveyed to the test position.
Further, the driving part is mounted on the product bearing part, the driving part comprises a first motor and a conveyor belt, and the test product is placed on the conveyor belt.
Further, the driving part is connected with the product bearing part, and the product bearing part is driven by the driving part to perform linear motion.
Further, the driving part comprises a second motor and a screw rod, and the product bearing part is arranged on the screw rod in a penetrating way.
Further, the sliding probe testing device further comprises a sensing part, when the tested product passes through the sensing part, the sensing part is triggered and leads to the probe part to be electrified, otherwise, the probe part is in an outage state.
Further, the needle of the probe part is L-shaped, and the side surface of the bending part is contacted with the test product.
Further, the product bearing part and the bracket are internally and slidably provided with guide rods, and the part of the guide rods between the product bearing part and the bracket is sleeved with springs.
Further, a bearing is further arranged in the product bearing part, and the guide rod is connected with the bearing.
In still another aspect, the present invention also provides a sliding probe testing method, which includes the steps of:
conveying the test product forward in a linear movement direction;
the test product enters the test position and contacts with the needle head of the probe part which is kept at the fixed position, and the probe part is in a power-off state at the moment;
the sensing part senses a test product in the test position and then is triggered to lead the probe part to be electrified, and the needle head starts to test the test product;
the test product is conveyed forwards to leave the test position after completing the test, the sensing part causes the probe part to be powered off, and the probe part is restored to the power-off state.
Further, the needle is L-shaped, and the side surface of the bending part of the needle contacts with the test product.
The sliding type probe testing device provided by the invention is mainly provided with the product bearing part, the driving part and the probe part, the tested product continuously moves linearly under the action of the product bearing part and the driving part, and then the probe part is always contacted with the tested product, so that the probe of the probe part tests the tested product in a sliding testing mode, the testing time without pause is obviously improved, the pressing testing mode is cancelled, and the product can be effectively protected from being damaged.
The sliding probe testing method provided by the invention also has the advantages because the sliding probe testing device is adopted, and the details are not repeated here.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to designate like parts throughout the figures. In the drawings:
FIG. 1 is a schematic diagram of a sliding probe testing device according to an embodiment of the present invention at a main viewing angle;
FIG. 2 is a schematic diagram of a sliding probe testing device according to an embodiment of the invention under a main viewing angle in other embodiments;
fig. 3 is a schematic structural diagram of a sliding probe testing device according to an embodiment of the present invention in a top view;
fig. 4 is a schematic structural diagram of a needle head of a probe portion of a sliding probe testing device according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Sliding probe test apparatus embodiment:
referring to fig. 1 to 3, preferred structures of a sliding type probe testing apparatus according to an embodiment of the present invention are shown. The sliding type probe testing device comprises a product bearing part 1, a driving part 3 and a probe part 4, wherein a tested product 2 is placed on the product bearing part 1, a capacitor is taken as an example, the sliding type probe testing device can be used for placing a pin part used for testing on the capacitor, the product bearing part 1 can be provided with a table surface with a groove for more stable fixing pins, the product bearing part 1 can be made of quartz glass for improving insulativity and wear resistance, the driving part 3 drives the tested product 2 to linearly move, the probe part 4 is fixedly arranged on a bracket 42 and is kept at a fixed position, a needle head 41 of the probe part 4 extends to a testing position 11 of the product bearing part 1, and the tested product 2 is contacted with the needle head 41 after being conveyed to the testing position 11.
The following two specific ways can be adopted for how the driving part 3 drives the test product 2 to perform the linear motion. First, referring to fig. 1, a driving part 3 is installed on a product bearing part 1, the driving part 3 includes a first motor 31 and a conveyor belt 32, and a test product 2 is placed on the conveyor belt 32; secondly, referring to fig. 2, the driving part 3 is connected with the product bearing part 1, the product bearing part 1 is driven by the driving part 3 to perform linear motion, the driving part 3 specifically may include a second motor 33 and a screw 34, and the product bearing part 1 is arranged on the screw 34 in a penetrating manner.
The sliding type probe testing device provided by the embodiment is mainly provided with the product bearing part, the driving part and the probe part, the tested product is subjected to continuous linear motion under the action of the product bearing part and the driving part, then the probe part is always contacted with the tested product, and the probe of the probe part tests the tested product in a sliding testing mode, so that the testing time without pause is obviously improved, the pressing testing mode is canceled, and the product can be effectively protected from being damaged.
Referring to fig. 1, a sensing portion 5 is further provided, when the test product 2 passes through the sensing portion 5, the sensing portion 5 is triggered and causes the probe portion 4 to be electrified, otherwise, the probe portion 4 is in an outage state, so that the needle 41 can continuously keep in contact with the test product 2, and the influence of damage, power consumption and the like possibly caused by the test product 2 or the equipment itself due to the constant electrification is avoided. The sensing portion 5 may be specifically selected from a fiber optic sensor, a pressure sensor, and the like, and is mounted on the bracket 42 via a mounting plate 51.
Referring to fig. 4, the needle 41 of the probe portion 4 has an L shape, and the side surface of the bending portion 411 contacts with the test product 2, so that the effectiveness of the probe portion 4 on the test product 2 in the slide test mode can be maintained, and the slide test mode is better adapted.
Referring to fig. 1 to 3, the guide rod 6 is slidably disposed in the product bearing portion 1 and the bracket 42, and a spring 61 is sleeved on a portion of the guide rod 6 between the product bearing portion 1 and the bracket 42, so that the distance between the product bearing portion 1 and the bracket 42 can be conveniently adjusted. The bearing 62 is also arranged in the product bearing part 1, and the guide rod 6 is connected with the bearing 62, so that the regulation is convenient.
Sliding probe test method embodiment:
the embodiment also provides a sliding probe testing method, which is shown in fig. 1 to 3, and comprises the following steps:
conveying the test product 2 forward in the direction of linear movement;
the test product 2 enters the test site 11 and contacts the needle 41 of the probe part 4 held at the fixed position, and the probe part 4 is in the power-off state at this time;
the sensing part 5 senses the test product 2 in the test position 11 and then is triggered, so that the probe part 4 is electrified, and the needle 41 starts to test the test product 2;
the test product 2 is conveyed forward from the test station 11 after the test is completed, the sensing part 5 causes the probe part 4 to be powered off, and the probe part 4 is restored to the powered-off state.
Wherein the needle 41 has an L-shape, and the side of its bent portion 411 is in contact with the test product 2.
The method is the same as the sliding probe test apparatus, and will not be repeated here.
It will be apparent to those skilled in the art that various modifications and variations can be made to the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.
Claims (7)
1. Sliding probe testing arrangement, its characterized in that includes:
a product carrier (1) on which a test product (2) is placed;
a driving part (3) for driving the test product (2) to perform linear motion;
a probe portion (4) fixedly mounted on a holder (42) and held in a fixed position, a needle (41) of the probe portion (4) extending to a test site (11) of a product carrying portion (1), the test product (2) being transported to the test site (11) and then contacting the needle (41);
the utility model provides a test device, including product carrier portion (1), drive portion (3) install in on product carrier portion (1), drive portion (3) include first motor (31) and conveyer belt (32), test product (2) place in on conveyer belt (32), drive portion (3) are connected product carrier portion (1), product carrier portion (1) by drive portion (3) drive is linear motion, drive portion (3) include second motor (33) and lead screw (34), product carrier portion (1) wear to locate on lead screw (34).
2. The sliding probe testing apparatus according to claim 1, further comprising a sensing portion (5), wherein the sensing portion (5) is triggered and causes the probe portion (4) to be energized when the test product (2) passes the sensing portion (5), and vice versa the probe portion (4) is in a de-energized state.
3. A sliding probe testing device according to claim 1 or 2, characterized in that the needle head (41) of the probe part (4) has an L-shape, the side of the bent portion (411) of which is in contact with the test product (2).
4. The sliding probe testing apparatus according to claim 1, wherein the product carrying part (1) and the bracket (42) are slidably provided with guide rods (6), and the parts of the guide rods (6) between the product carrying part (1) and the bracket (42) are sleeved with springs (61).
5. The sliding probe testing apparatus according to claim 4, wherein a bearing (62) is further provided in the product carrying portion (1), and the guide rod (6) is connected to the bearing (62).
6. The sliding type probe testing method of the sliding type probe testing apparatus according to any one of claims 1 to 5, comprising the steps of:
conveying the test product (2) forward in a linear movement direction;
the test product (2) enters a test position (11) and contacts a needle (41) of the probe part (4) kept at a fixed position, and the probe part (4) is in a power-off state at the moment;
the sensing part (5) senses the test product (2) in the test position (11) and then is triggered to lead the probe part (4) to be electrified, and the needle head (41) starts to test the test product (2);
the test product (2) is continuously conveyed forwards to leave the test position (11) after the test is finished, the sensing part (5) causes the probe part (4) to be powered off, and the probe part (4) is restored to the power-off state.
7. The sliding probe testing method according to claim 6, wherein the needle (41) has an L shape, and the side of the bent portion (411) thereof is in contact with the test product (2).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510969033.1A CN106908682B (en) | 2015-12-22 | 2015-12-22 | Sliding type probe testing device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510969033.1A CN106908682B (en) | 2015-12-22 | 2015-12-22 | Sliding type probe testing device and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106908682A CN106908682A (en) | 2017-06-30 |
| CN106908682B true CN106908682B (en) | 2023-08-04 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510969033.1A Active CN106908682B (en) | 2015-12-22 | 2015-12-22 | Sliding type probe testing device and method |
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| Country | Link |
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| CN (1) | CN106908682B (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4866375A (en) * | 1984-06-22 | 1989-09-12 | Malloy James T | Universal test fixture |
| IE20010536A1 (en) * | 2000-06-06 | 2001-12-12 | Ate Services Ltd | A test fixture for testing a printed circuit board |
| JP2007240339A (en) * | 2006-03-09 | 2007-09-20 | Space Creation:Kk | Linearly moving dimension measuring device |
| CN103616585A (en) * | 2013-11-26 | 2014-03-05 | 南通大学 | Image locating control dual-probe automatic testing device based on midpoint tracking |
| CN103792481A (en) * | 2012-11-02 | 2014-05-14 | 纬创资通股份有限公司 | Circuit board automatic testing device and circuit board automatic testing method |
| CN104251923A (en) * | 2014-09-17 | 2014-12-31 | 深圳市大族激光科技股份有限公司 | Two-wire testing probe device and application method thereof |
| CN204065333U (en) * | 2014-07-10 | 2014-12-31 | 浙江通达磁业有限公司 | Probe mounting structure in a kind of pressure resistant test tool |
| CN104251686A (en) * | 2013-06-28 | 2014-12-31 | 鸿富锦精密工业（深圳）有限公司 | Flatness detecting machine |
| CN205450156U (en) * | 2015-12-22 | 2016-08-10 | 昆山万盛电子有限公司 | Slidingtype probe test device |
-
2015
- 2015-12-22 CN CN201510969033.1A patent/CN106908682B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4866375A (en) * | 1984-06-22 | 1989-09-12 | Malloy James T | Universal test fixture |
| IE20010536A1 (en) * | 2000-06-06 | 2001-12-12 | Ate Services Ltd | A test fixture for testing a printed circuit board |
| JP2007240339A (en) * | 2006-03-09 | 2007-09-20 | Space Creation:Kk | Linearly moving dimension measuring device |
| CN103792481A (en) * | 2012-11-02 | 2014-05-14 | 纬创资通股份有限公司 | Circuit board automatic testing device and circuit board automatic testing method |
| CN104251686A (en) * | 2013-06-28 | 2014-12-31 | 鸿富锦精密工业（深圳）有限公司 | Flatness detecting machine |
| CN103616585A (en) * | 2013-11-26 | 2014-03-05 | 南通大学 | Image locating control dual-probe automatic testing device based on midpoint tracking |
| CN204065333U (en) * | 2014-07-10 | 2014-12-31 | 浙江通达磁业有限公司 | Probe mounting structure in a kind of pressure resistant test tool |
| CN104251923A (en) * | 2014-09-17 | 2014-12-31 | 深圳市大族激光科技股份有限公司 | Two-wire testing probe device and application method thereof |
| CN205450156U (en) * | 2015-12-22 | 2016-08-10 | 昆山万盛电子有限公司 | Slidingtype probe test device |
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| Publication number | Publication date |
|---|---|
| CN106908682A (en) | 2017-06-30 |
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