CN106908682A - Slidingtype probe tester and method - Google Patents

Slidingtype probe tester and method Download PDF

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Publication number
CN106908682A
CN106908682A CN201510969033.1A CN201510969033A CN106908682A CN 106908682 A CN106908682 A CN 106908682A CN 201510969033 A CN201510969033 A CN 201510969033A CN 106908682 A CN106908682 A CN 106908682A
Authority
CN
China
Prior art keywords
test
product
probe
slidingtype
supporting part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201510969033.1A
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Chinese (zh)
Other versions
CN106908682B (en
Inventor
杨必祥
程传波
吴伟
胡鹏
石怡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KUNSHAN WANSHENG ELECTRONICS CO Ltd
Original Assignee
KUNSHAN WANSHENG ELECTRONICS CO Ltd
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Application filed by KUNSHAN WANSHENG ELECTRONICS CO Ltd filed Critical KUNSHAN WANSHENG ELECTRONICS CO Ltd
Priority to CN201510969033.1A priority Critical patent/CN106908682B/en
Publication of CN106908682A publication Critical patent/CN106908682A/en
Application granted granted Critical
Publication of CN106908682B publication Critical patent/CN106908682B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013Testing passive components
    • G01R31/016Testing of capacitors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06794Devices for sensing when probes are in contact, or in position to contact, with measured object

Abstract

The invention provides a kind of slidingtype probe tester, it includes:Product supporting part, thereon for placing test product;Drive division, it drives test product to move linearly;Probe portion, it is fixedly installed on support and is maintained at fixed position, and the syringe needle in probe portion extends to the test position of product supporting part, and test product is transported to behind test position and needle contact.Present invention also offers a kind of slidingtype probe test method.The present invention to slide test in the way of test product is tested so that test is without the time paused, testing efficiency is significantly improved, while eliminating the mode that pressure is surveyed, can effectively protect the products from damaging.

Description

Slidingtype probe tester and method
Technical field
The present invention relates to a kind of probe test technology, in particular to a kind of slidingtype probe tester And method.
Background technology
For electronic components such as capacitors, it generally needs to carry out energization test by probe before dispatching from the factory, and comes Detect whether its electrical property reaches factory calibration.
The probe test for product is mainly realized by two ways at present.One kind is manually to hold probe Pen is tested against product;Another kind is probe to be installed in the drive devices such as cylinder, by cylinder Probe is driven constantly to move up and down to carry out contact product and tested.
Existing this probe structure mode in other words, unsteady state, probe are all in order at due to probe Reliability be easily affected, while probe for constantly motion in, in two test jobs of product Between can be among pause interval more long, also there is inferior position on testing efficiency;Also, especially for For the upper and lower structure of air cylinder driven probe, the table of product can be constantly hit by the probe that cylinder is driven Face, when hitting dynamics control is bad, it is easy to cause the damage of product.
The content of the invention
In consideration of it, the invention provides a kind of slidingtype probe tester and method, it is intended to solve existing skill Low and easy damaged product the problem of caused testing efficiency in product test in art.
On one side, the invention provides a kind of slidingtype probe tester, it includes:
Product supporting part, thereon for placing test product;
Drive division, it drives test product to move linearly;
Probe portion, it is fixedly installed on support and is maintained at fixed position, and the syringe needle in probe portion extends to product Product supporting part test position, test product be transported to test position after with needle contact.
Further, above-mentioned drive division is installed on product supporting part, and drive division includes motor and conveyer belt, Test product is positioned on conveyer belt.
Further, above-mentioned drive division connection product supporting part, product supporting part drives acting linear by drive division Motion.
Further, above-mentioned drive division includes motor and screw mandrel, and product supporting part is arranged on screw mandrel.
Further, above-mentioned slidingtype probe tester also includes induction part, and test product is by induction part When, induction part is triggered and causes probe portion to be powered, otherwise then probe portion is in off-position.
Further, the syringe needle in above-mentioned probe portion is L-shaped, and side and the test product of its dogleg section connect Touch.
Further, guide rod is slideably equipped with the said goods supporting part and support, and guide rod is located at and produces Spring is arranged with part between product supporting part and support.
Further, bearing, guide rod connection bearing are additionally provided with the said goods supporting part.
Another further aspect, present invention also offers a kind of slidingtype probe test method, it is comprised the following steps:
Test product is fed forward with direction of linear motion;
Test product enters test position, touches the syringe needle in the probe portion for being maintained at fixed position, probe portion this When be in off-position;
Induction part is triggered after sensing the test product being located in test position, causes probe portion to be powered, syringe needle Start to test test product;
Test product completion test continues to be fed forward leaves test position, and induction part causes probe portion to power off, visits Recover off-position in pin portion.
Further, above-mentioned syringe needle is L-shaped, and the side of its dogleg section contacts with test product.
The slidingtype probe tester that the present invention is provided, is mainly provided with product supporting part, drive division and spy Pin portion, test product makees the linear movement of continous way in the presence of product supporting part and drive division, then visits Pin portion is contacted due to being remained with test product, the probe in probe portion just to slide test in the way of to test Product is tested, so that test is without the time paused, testing efficiency is significantly improved, The mode that pressure is surveyed is eliminated simultaneously, can effectively protect the products from damaging.
The present invention additionally provides slidingtype probe test method, as a result of above-mentioned slidingtype probe test Device, therefore foregoing advantage has been likewise supplied with, will not be repeated here.
Brief description of the drawings
By reading the detailed description of hereafter preferred embodiment, various other advantages and benefit are for ability Domain those of ordinary skill will be clear understanding.Accompanying drawing is only used for showing the purpose of preferred embodiment, and simultaneously It is not considered as limitation of the present invention.And in whole accompanying drawing, identical is denoted by the same reference numerals Part.In the accompanying drawings:
Fig. 1 is slidingtype probe tester provided in an embodiment of the present invention in some embodiments in main view Structural representation under angle;
Fig. 2 be slidingtype probe tester provided in an embodiment of the present invention in other implementation methods in master Structural representation under angle;
Fig. 3 is structural representation of the slidingtype probe tester provided in an embodiment of the present invention under depression angle Figure;
Fig. 4 is that the structure of the syringe needle in the probe portion of slidingtype probe tester provided in an embodiment of the present invention is shown It is intended to.
Specific embodiment
The exemplary embodiment of the disclosure is more fully described below with reference to accompanying drawings.Although being shown in accompanying drawing The exemplary embodiment of the disclosure, it being understood, however, that may be realized in various forms the disclosure without should be by Embodiments set forth here is limited.Conversely, there is provided these embodiments are able to be best understood from this It is open, and can by the scope of the present disclosure it is complete convey to those skilled in the art.
Slidingtype probe tester embodiment:
Referring to Fig. 1 to Fig. 3, slidingtype probe tester provided in an embodiment of the present invention is shown in figure Preferred structure.The slidingtype probe tester includes product supporting part 1, drive division 3 and probe portion 4, It is used to place test product 2 on product supporting part 1, by taking capacitor as an example, it can be used for placing capacitor The upper pin portions for being used to test, and for more firm fixed pin, product supporting part 1 can be set To have reeded table top, and in order to improve insulating properties and wearability, product supporting part 1 can also use stone English glass is made, and drive division 3 then drives test product 2 to move linearly, and probe portion 4 is fixedly installed in branch On frame 42 and it is maintained at fixed position, the syringe needle 41 in probe portion 4 extends to the test position of product supporting part 1 11, test product 2 is contacted after being transported to test position 11 with syringe needle 41.
Wherein, how to drive test product 2 to move linearly for drive division 3, can use following two Concrete mode is realized.First, referring to Fig. 1, drive division 3 is installed on product supporting part 1, drive division 3 include motor 31 and conveyer belt 32, and test product 2 is positioned on conveyer belt 32;Second, referring to Fig. 2, The connection product of drive division 3 supporting part 1, product supporting part 1 is driven by drive division 3 and moved linearly, the drive Dynamic portion 3 can specifically include motor 33 and screw mandrel 34, and product supporting part 1 is arranged on screw mandrel 34.
The slidingtype probe tester that the present embodiment is provided, is mainly provided with product supporting part, drive division With probe portion, test product makees the linear movement of continous way in the presence of product supporting part and drive division, so Probe portion is contacted due to being remained with test product afterwards, the probe in probe portion just to slide test in the way of pair Test product is tested, so that test is without the time paused, testing efficiency is significantly carried Height, while eliminating the mode that pressure is surveyed, can effectively protect the products from damaging.
Referring to Fig. 1, induction part 5 is also provided with, when test product 2 is by induction part 5, the quilt of induction part 5 Trigger and cause probe portion 4 to be powered, on the contrary then probe portion 4 is in off-position so that and syringe needle 41 can be with It is lasting to keep the contact with test product 2, without worry energization always and may to test product 2 or Say that equipment damage caused in itself, power consumption etc. influence.The induction part 5 specifically can from Fibre Optical Sensor, Pressure sensor etc., and be installed on support 42 by installing plate 51.
Referring to Fig. 4, the syringe needle 41 in probe portion 4 is L-shaped, side and the test of its dogleg section 411 Product 2 is contacted, the validity that can keep probe portion 4 that test product 2 is tested in sliding survey mode, more The mode of sliding survey is adapted to goodly.
Referring to Fig. 1 to Fig. 3, guide rod 6 is slideably equipped with product supporting part 1 and support 42, and lead Bar 6 is located on the part between product supporting part 1 and support 42 and is arranged with spring 61, can be in order to producing Spacing between product supporting part 1 and support 42 is adjusted.Bearing 62 is additionally provided with product supporting part 1, Guide rod 6 connects bearing 62, is convenient for regulation.
Slidingtype probe test method embodiment:
The present embodiment also proposed a kind of slidingtype probe test method, with reference to shown in Fig. 1 to Fig. 3, its bag Include following steps:
Test product 2 is fed forward with direction of linear motion;
Test product 2 enters test position 11, touches the syringe needle 41 in the probe portion 4 for being maintained at fixed position, Probe portion 4 is now in off-position;
Induction part 5 is triggered after sensing the test product 2 being located in test position 11, causes probe portion 4 It is powered, syringe needle 41 starts to test test product 2;
The completion test of test product 2 continues to be fed forward leaves test position 11, and induction part 5 causes probe portion 4 Recover off-position in power-off, probe portion 4.
Wherein, syringe needle 41 is L-shaped, and the side of its dogleg section 411 contacts with test product 2.
Above method particular content is identical with above-mentioned slidingtype probe tester, is not repeated to explain herein State.
Obviously, those skilled in the art can carry out various changes and modification without deviating from this hair to the present invention Bright spirit and scope.So, if it is of the invention these modification and modification belong to the claims in the present invention and Within the scope of its equivalent technologies, then the present invention is also intended to comprising these changes and modification.

Claims (10)

1. slidingtype probe tester, it is characterised in that including:
Product supporting part (1), thereon for placing test product (2);
Drive division (3), it drives the test product (2) to move linearly;
Probe portion (4), it is fixedly installed on support (42) and is maintained at fixed position, the probe portion (4) syringe needle (41) extends to test position (11) of product supporting part (1), the test product (2) Contacted with the syringe needle (41) after being transported to the test position (11).
2. slidingtype probe tester according to claim 1, it is characterised in that the driving Portion (3) is installed on the product supporting part (1), the drive division (3) including motor (31) and Conveyer belt (32), the test product (2) is positioned on the conveyer belt (32).
3. slidingtype probe tester according to claim 1, it is characterised in that the driving Portion (3) connects the product supporting part (1), and the product supporting part (1) is by the drive division (3) Driving is moved linearly.
4. slidingtype probe tester according to claim 3, it is characterised in that the driving Portion (3) includes motor (33) and screw mandrel (34), and the product supporting part (1) is arranged in the screw mandrel (34) on.
5. slidingtype probe tester according to claim 1, it is characterised in that also including sense Portion (5) is answered, when the test product (2) is by the induction part (5), induction part (5) quilt Trigger and cause the probe portion (4) to be powered, on the contrary then the probe portion (4) is in off-position.
6. slidingtype probe tester according to claim 1 or 5, it is characterised in that described The syringe needle (41) in probe portion (4) is L-shaped, and the side of its dogleg section (411) is produced with the test Product (2) are contacted.
7. slidingtype probe tester according to claim 1, it is characterised in that the product Guide rod (6), and the guide rod (6) are slideably equipped with supporting part (1) and the support (42) Spring (61) is arranged with part between the product supporting part (1) and the support (42).
8. slidingtype probe tester according to claim 7, it is characterised in that the product Bearing (62) is additionally provided with supporting part (1), the guide rod (6) connects the bearing (62).
9. slidingtype probe test method, it is characterised in that comprise the following steps:
Test product (2) is fed forward with direction of linear motion;
The test product (2) enters test position (11), touches the probe portion (4) for being maintained at fixed position Syringe needle (41), the probe portion (4) is now in off-position;
Touched after the test product (2) that induction part (5) senses in the test position (11) Hair, causes the probe portion (4) to be powered, and the syringe needle (41) starts to test the test product (2);
Test product (2) completion test continues to be fed forward leaves the test position (11), the induction part (5) the probe portion (4) is caused to power off, the probe portion (4) recovers off-position.
10. slidingtype probe test method according to claim 9, it is characterised in that the syringe needle (41) L-shaped, the side of its dogleg section (411) contacts with the test product (2).
CN201510969033.1A 2015-12-22 2015-12-22 Sliding type probe testing device and method Active CN106908682B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510969033.1A CN106908682B (en) 2015-12-22 2015-12-22 Sliding type probe testing device and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510969033.1A CN106908682B (en) 2015-12-22 2015-12-22 Sliding type probe testing device and method

Publications (2)

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CN106908682A true CN106908682A (en) 2017-06-30
CN106908682B CN106908682B (en) 2023-08-04

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Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4866375A (en) * 1984-06-22 1989-09-12 Malloy James T Universal test fixture
IE20010536A1 (en) * 2000-06-06 2001-12-12 Ate Services Ltd A test fixture for testing a printed circuit board
JP2007240339A (en) * 2006-03-09 2007-09-20 Space Creation:Kk Linearly moving dimension measuring device
CN103616585A (en) * 2013-11-26 2014-03-05 南通大学 Image locating control dual-probe automatic testing device based on midpoint tracking
CN103792481A (en) * 2012-11-02 2014-05-14 纬创资通股份有限公司 Circuit board automatic testing device and circuit board automatic testing method
CN104251923A (en) * 2014-09-17 2014-12-31 深圳市大族激光科技股份有限公司 Two-wire testing probe device and application method thereof
CN204065333U (en) * 2014-07-10 2014-12-31 浙江通达磁业有限公司 Probe mounting structure in a kind of pressure resistant test tool
CN104251686A (en) * 2013-06-28 2014-12-31 鸿富锦精密工业(深圳)有限公司 Flatness detecting machine
CN205450156U (en) * 2015-12-22 2016-08-10 昆山万盛电子有限公司 Slidingtype probe test device

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4866375A (en) * 1984-06-22 1989-09-12 Malloy James T Universal test fixture
IE20010536A1 (en) * 2000-06-06 2001-12-12 Ate Services Ltd A test fixture for testing a printed circuit board
JP2007240339A (en) * 2006-03-09 2007-09-20 Space Creation:Kk Linearly moving dimension measuring device
CN103792481A (en) * 2012-11-02 2014-05-14 纬创资通股份有限公司 Circuit board automatic testing device and circuit board automatic testing method
CN104251686A (en) * 2013-06-28 2014-12-31 鸿富锦精密工业(深圳)有限公司 Flatness detecting machine
CN103616585A (en) * 2013-11-26 2014-03-05 南通大学 Image locating control dual-probe automatic testing device based on midpoint tracking
CN204065333U (en) * 2014-07-10 2014-12-31 浙江通达磁业有限公司 Probe mounting structure in a kind of pressure resistant test tool
CN104251923A (en) * 2014-09-17 2014-12-31 深圳市大族激光科技股份有限公司 Two-wire testing probe device and application method thereof
CN205450156U (en) * 2015-12-22 2016-08-10 昆山万盛电子有限公司 Slidingtype probe test device

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