IES20000597A2 - Apparatus for testing a plurality of electronic devices - Google Patents

Abstract

Apparatus(1) for testing a plurality of electronic devices(2) comprises a pair of spaced apart paralled racks(5), each of which comprises a plurality of receiving locations(15) arranged in a matrix formed by rows(17) and columns(18) for receiving the respective electronic devices(2). A main carrier(30) which is moveable parallel to the rows(17) between the respective racks(5) carries a plurality of connectors(31) on respective opposite sides thereof for connecting to the electronic devices(2) to be tested in the receiving locations(15). The connectors(31) are carried on respective secondary carriers(42) which in turn are carried on first drive rams(47) mounted on the main carrier(30) for urging the connectors(31) into and out of engagement with the electronic devices(2). Second pneumatic rams(49) are provided for aligning the connectors(31) with the electronic devices(2). The main carrier(30) is sequently alignable with the columns(18) of receiving locations(15) for simultaneously testing the electronic devices(2) in corresponding columns(18) in the respective racks(5). Cables from the connectors(31) are multiplexed to electronic test circuitry for carrying out tests on the respective electronic devices(2). <Figures 2,3 & 5>

Description

OPEN TO PUSUC INSPECTION UNDER SECTION 23 // O 3ULE 23 JNL No. OF, ΙΕΟ Ο 05 91 “Apparatus for testing a plurality of electronic devices” The present invention relates to apparatus for testing a plurality of electronic devices.

According to the invention there is provided apparatus for testing a plurality of electronic devices, the apparatus comprising a rack having a plurality of receiving locations for receiving and supporting the electronic devices during testing, the receiving locations being arranged in a matrix formed by a plurality of rows of the io receiving locations extending in an x-axis direction, and a plurality of columns of the receiving locations extending in a y-axis direction for supporting the electronic devices in a predetermined matrix during testing, the x-axis and y-axis lying in an x-y plane, a plurality of electrical connectors carried on a main carrier, the number of connectors being similar to the number of receiving locations in one of the columns for simultaneously electrically connecting the devices in each column, column by column, to a testing means, the main carrier being moveable with rectilinear motion in the x-axis direction in a plane parallel to the x-y plane for incrementally stepping the main carrier in the x-axis direction for sequentially aligning the electrical connectors with the respective columns of receiving locations, a main drive means for incrementally stepping the main carrier in the x-axis direction, and a secondary drive means for moving the connectors between an inoperative position disconnected from the devices, and an operative position electrically connected to the device.

In one embodiment of the invention the secondary drive means is mounted on the IflT CL-1(so ! g 3/2 §.

IE ο ο 05 9 7 main carrier for driving the electrical connectors relative to the main carrier between the inoperative position and the operative position. Preferably, the electrical connectors are moveable by the secondary drive means in an z-axis direction perpendicularly to the x-y plane between the inoperative position and the operative position.

In one embodiment of the invention a plurality of secondary drive means are provided, one for each electrical connector so that the electrical connectors are moveable independently of each other between the respective inoperative and operative positions.

In another embodiment of the invention each electrical connector is mounted on a corresponding secondary carrier, and the secondary drive means drives the secondary carrier for in turn driving the electrical connectors between the respective inoperative and operative positions.

In one embodiment of the invention each secondary drive means comprises a first drive means for driving the corresponding secondary carrier between the inoperative position and the operative position, and a second drive means for aligning the corresponding secondary carrier, and in turn the corresponding electrical connector with the device in the corresponding receiving location.

In one embodiment of the invention the first drive means acts between the main t carrier and an intermediate carrier located between the main carrier and the secondary carrier. 1E0 0 Ο* 9 τ In another embodiment of the invention the second drive means acts between the corresponding intermediate and secondary carriers.

Preferably, each first drive means comprises a first drive ram, and each second drive means comprises a second drive ram.

In one embodiment of the invention a single first drive ram is provided between the main carrier and each corresponding secondary carrier.

Advantageously, a pair of spaced apart second drive rams are provided between each pair of corresponding intermediate and secondary carriers for urging the secondary carrier in a y-axis direction and a z-y plane, and preferably, four spaced apart second drive rams are provided between each pair of corresponding intermediate and secondary carriers.

Ideally, corresponding secondary and intermediate carriers are connected by the corresponding second drive rams so that the intermediate and secondary carriers move as though they were two opposite sides of a parallelogram linkage.

In one embodiment of the invention the main carrier is an elongated carrier extending for a length which corresponds to the length of one of the columns of receiving locations.

In another embodiment of the invention a main guide means is provided for guiding IE 0 0 Ο 5 9 7 the main drive means to move with the rectilinear motion in the x-axis direction.

Preferably, the main guide means comprises a pair of main guide rods, which advantageously, are located at respective opposite ends of the main carrier, the respective main guide rods extending in a generally x-axis direction.

In a further embodiment of the invention the main drive means comprises a main drive ram, and ideally, a pneumatically powered main drive ram.

In one embodiment of the invention a first alignment means is provided in each receiving location for receiving and aligning a device in the corresponding receiving location.

In another embodiment of the invention a second alignment means is provided for aligning each connector with the corresponding device. Preferably, a plurality of the second alignment means are provided, one being provided for each electrical connector.

In a further embodiment of the invention each electrical connector is provided by a pin connector, and preferably, each pin connector is adapted for connecting to a corresponding pin connector of the corresponding device.

In one embodiment of the invention the pin connectors may be identical to each other for connecting to identical electronic devices. Alternatively, some of the pin connectors may be different for connecting to different electronic devices in the respective receiving locations of the respective columns. ΙΕ ο Ο 05 9 7 Ideally, the x-axis direction extends horizontally and the y-axis direction extends vertically.

In a further embodiment of the invention the testing means comprising a test circuit for testing and analysing signals received from the respective electronic devices through the electrical connectors. Ideally, the test circuit is operated under the control of a microprocessor and suitable software.

In another embodiment of the invention a power supply circuit is provided for providing power and test signals to the electronic devices, and ideally the power supply circuit is operated by the microprocessor under the control of the suitable software.

In another embodiment of the invention a multiplexing means is provided for multiplexing signals between the testing means and the respective electronic devices under test so that the respective electronic devices are sequentially tested. Ideally, the multiplexing means comprises a multiplexer.

In a further embodiment of the invention a pair of parallel spaced apart racks are provided, the receiving locations of the respective racks facing each other, and the main carrier means is located between the respective racks and electrical connectors are provided on respective opposite sides of the main carrier for simultaneously connecting to electronic devices to be tested in the receiving locations of opposite columns of the respective racks.

IE Ο Ο 05 9 7 The invention will be more clearly understood from the following description of an embodiment thereof which is given by way of example only with reference to the accompanying drawings, in which: Fig. 1 is a partly cut away top plan view of apparatus according to the invention for testing a plurality of electronic devices, Fig. 2 is a transverse cross-sectional end elevationai view of the apparatus of 10 Fig. 1 on the line Il-Il of Fig. 1, Fig. 3 is a cross-sectional side elevationai view of the apparatus of Fig. 1 on the line Ill-Ill of Fig. 1, Fig. 4 is a block representation of a circuit diagram of the apparatus of Fig. 1, Fig. 5 is an enlarged cross-sectional end elevationai view of a portion of the apparatus of Fig. 1, Fig. 6 is a partly diagrammatic plan view of the portion of Fig. 5 of the apparatus of Fig. 1, Fig. 7 is a side elevationai view of a detail of the apparatus of Fig. 1, Fig. 8 is a front elevationai view of the detail of Fig. 7, IF Ο Ο Ο 5 9 7 Fig. 9 is a perspective view of a part of the detail of Fig. 7, Fig. 10 is a top plan view of the part of the detail of Fig. 9, Fig. 11 is a side elevational view of the part of the detail of Fig. 9, Fig. 12 is a top plan view of a further detail of the apparatus of Fig. 1, and Figs. 13(a) to (d) are schematic views of a portion ofthe apparatus of Fig. 1 in use.

Referring to the drawings there is illustrated apparatus according to the invention indicated generally by the reference numeral 1 for testing a plurality of electronic devices 2. The apparatus 1 comprises a pair of spaced apart parallel racks 5 which are mounted on a base frame 6 having a pair of side members 7 joined by end members 8. A top frame 10 retains the racks 5 appropriately spaced apart and parallel to each other. The top frame 10 comprises a pair of side members 11 joined by a pair of end members 12. Each rack 5 comprises a plurality of receiving locations 15 for receiving the respective electronic devices 2 to be tested. The receiving locations 15 are arranged in a matrix formed by rows 17 and columns 18 of the receiving locations 15. In this embodiment ofthe invention each rack 5 comprises one hqndred and forty-four receiving locations 15 arranged in rows 17, each of twelve receiving locations and columns 18, each of twelve receiving locations. The rows 17 of receiving locations 15 extend in a horizontal x-axis IE ο Ο 0 S 9 7 direction, while the columns 18 of receiving locations extend in a vertical y-axis direction. Each receiving location 15 is defined by a shelf 19 for supporting the electronic device 2 to be tested and a pair of side walls 20 which separate adjacent receiving locations 15 from each other.

A first alignment means for aligning each electronic device 2 in its corresponding receiving location 15 is provided by a pair of lips, namely, a front lip 21 and a side lip 22 located in the corresponding receiving location 15. The first lip 21 of each receiving location extends along a front edge 23 of the shelf 19 for engaging a corresponding portion of the electronic device 2 to be tested. Each side lip 22 extends along one side edge 24 of the shelf 19 of the corresponding receiving location 15 for abutting a corresponding side of the electronic device 2. A pair of moveable clamps, namely, a rear clamp 26 and a side clamp 27 are provided in each receiving location 15 for clamping the corresponding electronic device 2 against the side lips 21 and 22, respectively. The rear clamp 26 is slideably and moveabiy mounted on the shelf 19 for clamping the electronic device 2 against the corresponding front lip 21. The side clamp 27 is located on the opposite side of the shelf 19 to that of the side lip 22 and is slideably and moveabiy mounted on the shelf 19 towards the side lip 22 for clamping the electronic device 2 against the side lip 22.

Suitable locking and securing mechanisms (not shown) are provided in conjunction with the respective rear and side clamps 26 and 27 for locking the clamps 26 and 27 with the electronic device 2 clamped against the corresponding front and side lips 21 and 22, respectively, and properly aligned in the corresponding receiving location 15.

An elongated main carrier 30 carries a plurality of electrical connectors 31 on its IE Ο Ο Ο 5 9 7 respective opposite sides for connecting to the electronic devices 2 in the corresponding receiving locations 15, for in turn connecting the electronic devices 2 to a testing means, namely, a test circuit 34, see Fig. 4, is located between the racks . The main carrier 30 is moveable with rectilinear motion in an x-axis direction for sequentially aligning the electrical connectors 31 with the electronic devices 2 in the respective columns 18 of receiving locations 15. The electrical connectors 31 and their mounting on the main carrier is described in detail below.

A main guide means comprising a pair of main guide rods 35 extend between the io end members 8 and 12 of the base frame 6 and the top frame 10, respectively, for guiding the main carrier 30 with the rectilinear motion in the x-axis direction between the racks 5 so that the main carrier 30 and in turn the electrical connectors 31 can be incrementally stepped in the x-axis direction for sequentially aligning the electrical connectors 31 with respective columns 18 of receiving locations 15 in the respective racks 5. Linear bearings 38 mounted in bearing carriers 39 at the top and bottom of the main carrier 30 slideably engage the guide rods 35.

A main drive means comprising a main pneumatic drive ram 40 is mounted on the top frame 10 for incrementally stepping the main carrier 30 along the guide rods 35 for aligning the respective electrical connectors 31 sequentially with the columns 18 of receiving locations 15. The main drive ram 40 is mounted in one of the end members 12 of the top frame, a piston rod 41 extending from the main drive ram 40 is secured to the bearing carrier 39 at the top of the main carrier 30.

Each electrical connector 31 is carried on a secondary carrier 42 comprising a base IE ο 0 05 9 7 and a side wall 44 and a rear wall 45 extending upwardly from the base 43. An intermediate carrier 46 is located between each corresponding secondary carrier 42 and the main carrier 30. A secondary drive means for driving the respective corresponding intermediate carriers 46 and the corresponding secondary carriers 42 between an inoperative position, see Fig. 13(a) and an operative position, see Fig. 13(d) comprises a plurality of first drive means, namely, first drive rams 47, two being provided to act between each intermediate carrier 46 and the main carrier 30. When the secondary carriers 42 are in the inoperative position, the secondary carriers 42 and in turn the corresponding electrical connectors 31 are spaced apart from the corresponding devices 2 to be tested. In the operative position the electrical connectors 31 are in electrically conductive engagement with the corresponding electronic devices 2 to be tested. A plurality of housings 48 extending from the main carrier 30 on each side thereof house the first drive rams 47.

The secondary drive means also comprises two pairs of second drive means, namely, four second drive rams 49 which act between corresponding pairs of intermediate and secondary carriers 46 and 42 for both carrying the secondary carriers 42 on the corresponding intermediate carriers 46, and for urging the secondary carriers 42 upwardly and downwardly in the y-axis direction in a z-y plane for aligning the electrical connectors 31 with the corresponding electronic devices 2. The second drive rams 49 are connected to the corresponding secondary carriers 42 and intermediate carriers 46 by ball joints 50 for facilitating relative movement between the secondary carriers 42 and the corresponding intermediate carriers 46 as though the secondary carriers 42 and intermediate carriers formed opposite sides of a parallelogram linkage, so that the secondary carriers 42 move relative to the corresponding intermediate carriers 46 with parallelogram type action.

A second alignment means for facilitating final alignment of the electrical connectors 31 with the corresponding electronic devices 2 comprises a downwardly inclined base portion 51 of the base 43 of each secondary carrier 42 which extends forwardly of the electrical connector 31, and an outwardly tapered side portion 52 of the side wall 44 which extends forwardly outwardly from the side wall of the secondary carrier 42 and forwardly outwardly of the electrical connector 31. As each secondary carrier 42 is being urged by the first drive ram 47 and the second drive rams 49 from the inoperative to the operative position the inclined base and tapered side portions 51 and 52 of the secondary carrier 42 engage an appropriate corresponding portion of the corresponding electronic device 2 to be tested for in turn urging the secondary carrier 42, and in turn the corresponding electrical connector 31 into alignment with the corresponding electronic device 2 to be tested. A biasing means provided by a spring (not shown) is provided so that the natural bias of the secondary carrier 42 relative to the device to be tested urges the inclined base and tapered side portions 51 and 52 into engagement with the corresponding electronic device 2 to be tested as the secondary carrier 42 is approaching the operative position.

Although not illustrated, suitable guide and keying means are provided for guiding and urging the intermediate carrier 46 and in turn the secondary carrier 42 and in turn each electrical connector 31 between the operative and inoperative positions.

Each electrical connector 31 comprises a housing 53 mounted on the base 43 of the corresponding secondary carrier 42, and a plurality of spring loaded connector pins ¢0 0 05 9 71 extend outwardly from the housing 53 for engaging corresponding pins in the electronic device 2. Although only one electrical connector 31 has been provided on each secondary carrier 42, it will be readily apparent to those skilled in the art that if the electronic devices to be tested were provided with a number of pin and other type connectors, the appropriate number and type of electrical connectors 31 would be provided on each secondary carrier 42. Such electrical connectors 31 mounted on each secondary carrier 42 would be appropriately aligned with the corresponding connectors in the corresponding electronic device 2 to be tested.

Turning now to Fig. 4 a block representation of electrical circuitry of the apparatus 1 will now be described. The test circuit 34 comprises a microprocessor 60 which controls the operation of the circuit 34. A power supply circuit 61 which is adapted to be powered by an AC mains power supply powers the circuit 34. The microprocessor 60 is operated under the control of suitable software for supplying power and appropriate signals to the electrical connectors 31 for powering the devices 2 and for reading signals received through the electrical connectors 31 from the devices 2 under test. A multiplexing means, namely, a multiplexer 63 multiplexes the power to the electrical connectors 31 and the signals between the electrical connectors 31 and the microprocessor 60 so that the electronic devices 2 connected to the electrical connectors 31 are sequentially tested. The microprocessor 60 also controls a main driver 65 for operating the main drive ram 40 for incrementally stepping the main carrier 30 along the guide rods 35 from column 18 to column 18 from the first of cplumns 18 to the last of columns 18. A plurality of secondary drivers 67 are also operated under the control of the microprocessor 60 for operating the first and second drive rams 47 and 49, respectively, for in turn moving the electrical IE Ο Ο Ο 5 9 7 connectors 31 between the operative and inoperative positions.

In use, the electronic devices 2 to be tested are loaded into the receiving locations 15 and are aligned and clamped therein. The test circuit 34 is appropriately programmed to test the electronic devices 2 which have been loaded into the receiving locations. The main drive ram 40 is operated for initially aligning the main carrier 30 with the first column of receiving locations 15 and the first drive rams 47 are operated for urging the intermediate carriers 46 from the inoperative towards the operative position. As the secondary carriers 42 are approaching the operative position the inclined base portions 51 and the tapered side portion 52s of secondary carriers 42 engage the corresponding electronic devices 2, the second drive rams 42 are operated for aligning the electrical connectors 31 with the corresponding electronic devices 2 in the two opposite columns with which the main carrier 30 is aligned. The test circuit 34 is operated for sequentially testing the twenty-four electronic devices 2 in the two columns of receiving locations 15 with which the main carrier 30 is aligned. When testing of the twenty-four electronic devices 2 has been completed the first drive rams 47 and second drive rams 49 are operated for urging the secondary carriers 42 from the operative to the inoperative position. The main drive ram 40 is then operated for incrementally moving the main carrier 30 in the x20 axis direction to the next pair of opposite adjacent columns 18 of receiving locations 15, and the first and second drive rams 47 and 49, respectively, are then operated as already described for connecting the corresponding electrical connectors 31 with the next twenty-fqur electronic devices to be tested and so on until all two hundred and eighty-eight electronic devices have been tested. ΙΕ ο Ο 05 9 7 It will be appreciated that as the electronic devices 2 in the receiving locations 15 of each column 18 have been tested, the electronic devices in the columns of receiving locations 15 which have been tested may be removed and replaced by the next batch of electronic devices to be tested, so that when the last ofthe two hundred and eighty-eight electronic devices have been tested, the main drive ram 40 can be operated immediately for returning the main carrier 30 to the first pair of opposite columns of twenty-four receiving locations, and testing ofthe devices in these receiving locations can commence immediately. io The invention is not limited to the embodiment hereinbefore described which may be varied in construction and detail.

Claims (5)

1. Apparatus for testing a plurality of electronic devices, the apparatus comprising a rack having a plurality of receiving locations for receiving and supporting the electronic devices during testing, the receiving locations being arranged in a matrix formed by a plurality of rows of the receiving locations extending in an x-axis direction, and a plurality of columns of the receiving locations extending in a y-axis direction for supporting the electronic devices in a predetermined matrix during testing, the x-axis and y-axis lying in an x-y plane, a plurality of electrical connectors carried on a main carrier, the number of connectors being similar to the number of receiving locations in one of the columns for simultaneously electrically connecting the devices in each column, column by column, to a testing means, the main carrier being moveable with rectilinear motion in the x-axis direction in a plane parallel to the x-y plane for incrementally stepping the main carrier in the x-axis direction for sequentially aligning the electrical connectors with the respective columns of receiving locations, a main drive means for incrementally stepping the main carrier in the x-axis direction, and a secondary drive means for moving the connectors between an inoperative position disconnected from the devices, and an operative position electrically connected to the device.

2. Apparatus as claimed in Claim in which the electrical connectors are moveable in an z-axis direction perpendicularly to the x-y plane between the inoperative position and the operative position, and the secondary drive means is mounted on the main carrier for driving the electrical connectors relative to the main IE Ο Ο Ο 5 9 7 carrier between the inoperative position and the operative position.

3. Apparatus as claimed in Claim 1 or 2 in which a plurality of secondary drive means are provided, one for each electrical connector so that the electrical 5 connectors are moveable independently of each other between the respective inoperative and operative positions.

4. Apparatus as claimed in any preceding claim in which each electrical connector is mounted on a secondary carrier, and each secondary drive means 10 comprises a first drive means for driving the corresponding secondary carrier between the inoperative position and the operative position, and a second drive means for aligning the corresponding secondary carrier, and in turn the corresponding electrical connector with the device in the corresponding receiving location.

5. Apparatus for testing a plurality of electronic devices, the apparatus being substantially as described herein with reference to and as illustrated in the accompanying drawings.