HUE042782T2 - Nagyfrekvenciás vizsgálócsap szerkezet centrírozó szakasszal - Google Patents
Nagyfrekvenciás vizsgálócsap szerkezet centrírozó szakasszalInfo
- Publication number
- HUE042782T2 HUE042782T2 HUE12704376A HUE12704376A HUE042782T2 HU E042782 T2 HUE042782 T2 HU E042782T2 HU E12704376 A HUE12704376 A HU E12704376A HU E12704376 A HUE12704376 A HU E12704376A HU E042782 T2 HUE042782 T2 HU E042782T2
- Authority
- HU
- Hungary
- Prior art keywords
- test probe
- probe device
- frequency test
- centering portion
- centering
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE202011001670U DE202011001670U1 (de) | 2011-01-18 | 2011-01-18 | Hochfrequenz-Prüfstift Vorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
HUE042782T2 true HUE042782T2 (hu) | 2019-07-29 |
Family
ID=43829277
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HUE12704376A HUE042782T2 (hu) | 2011-01-18 | 2012-01-18 | Nagyfrekvenciás vizsgálócsap szerkezet centrírozó szakasszal |
Country Status (7)
Country | Link |
---|---|
US (1) | US9250265B2 (hu) |
EP (1) | EP2666022B1 (hu) |
CN (1) | CN103443634B (hu) |
DE (1) | DE202011001670U1 (hu) |
HU (1) | HUE042782T2 (hu) |
PT (1) | PT2666022T (hu) |
WO (1) | WO2012101018A1 (hu) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015102435A (ja) * | 2013-11-26 | 2015-06-04 | 株式会社村田製作所 | 検査装置 |
WO2015116224A1 (en) * | 2014-01-31 | 2015-08-06 | Hewlett-Packard Development Company, L.P. | Test probe |
DE202014104152U1 (de) * | 2014-09-04 | 2015-12-08 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Steckervorrichtung |
WO2016072193A1 (ja) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | プローブ |
JP6515877B2 (ja) * | 2016-06-17 | 2019-05-22 | オムロン株式会社 | プローブピン |
DE202019106237U1 (de) * | 2019-11-08 | 2020-12-04 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
DE202019106239U1 (de) * | 2019-11-08 | 2020-12-04 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
USD926139S1 (en) * | 2020-01-13 | 2021-07-27 | Ingun Prüfmittelbau Gmbh | Contact plug |
US11293976B1 (en) * | 2020-09-25 | 2022-04-05 | Essai, Inc. | Integrated circuit device test tooling with dual angle cavities |
DE202022104119U1 (de) | 2022-07-21 | 2022-10-07 | Feinmetall Gesellschaft mit beschränkter Haftung | Prüfstiftvorrichtung |
DE102022118310A1 (de) | 2022-07-21 | 2024-02-01 | Feinmetall Gesellschaft mit beschränkter Haftung | Prüfstiftvorrichtung |
CN117405963B (zh) * | 2023-12-14 | 2024-02-13 | 青岛大志美德电气有限公司 | 一种具有防护结构的过电压保护器 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4740746A (en) | 1984-11-13 | 1988-04-26 | Tektronix, Inc. | Controlled impedance microcircuit probe |
US5982187A (en) * | 1993-07-01 | 1999-11-09 | Alphatest Corporation | Resilient connector having a tubular spring |
JP3286183B2 (ja) | 1996-09-30 | 2002-05-27 | アジレント・テクノロジー株式会社 | 同軸コネクタフローティングマウント装置 |
KR100429057B1 (ko) | 1998-11-25 | 2004-04-29 | 리카 일렉트로닉스 인터내셔널, 인크. | 전기 접촉 시스템 |
US6603297B1 (en) | 2000-08-21 | 2003-08-05 | Tektronix, Inc. | Probe tip adapter for a measurement probe |
US6937045B2 (en) * | 2002-07-18 | 2005-08-30 | Aries Electronics, Inc. | Shielded integrated circuit probe |
US7015708B2 (en) * | 2003-07-11 | 2006-03-21 | Gore Enterprise Holdings, Inc. | Method and apparatus for a high frequency, impedance controlled probing device with flexible ground contacts |
US20060103397A1 (en) | 2004-10-29 | 2006-05-18 | Parker Kenneth P | Method and apparatus for a twisting fixture probe for probing test access point structures |
EP2180326B1 (en) * | 2008-10-24 | 2017-05-03 | Tyco Electronics Services GmbH | Test probe |
CN101923103A (zh) | 2009-06-16 | 2010-12-22 | 励威电子股份有限公司 | 运用于影像感测芯片的高频测试的悬臂式探针卡 |
-
2011
- 2011-01-18 DE DE202011001670U patent/DE202011001670U1/de not_active Expired - Lifetime
-
2012
- 2012-01-18 WO PCT/EP2012/050698 patent/WO2012101018A1/de active Application Filing
- 2012-01-18 PT PT12704376T patent/PT2666022T/pt unknown
- 2012-01-18 HU HUE12704376A patent/HUE042782T2/hu unknown
- 2012-01-18 CN CN201280014036.4A patent/CN103443634B/zh active Active
- 2012-01-18 US US13/980,116 patent/US9250265B2/en active Active
- 2012-01-18 EP EP12704376.8A patent/EP2666022B1/de active Active
Also Published As
Publication number | Publication date |
---|---|
US20130285691A1 (en) | 2013-10-31 |
PT2666022T (pt) | 2019-01-29 |
US9250265B2 (en) | 2016-02-02 |
EP2666022B1 (de) | 2018-10-24 |
DE202011001670U1 (de) | 2011-03-31 |
CN103443634A (zh) | 2013-12-11 |
EP2666022A1 (de) | 2013-11-27 |
CN103443634B (zh) | 2015-07-15 |
WO2012101018A1 (de) | 2012-08-02 |
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