HUE040364T2 - Tartószerkezet optikai mérõkészülékhez - Google Patents
Tartószerkezet optikai mérõkészülékhezInfo
- Publication number
- HUE040364T2 HUE040364T2 HUE16164345A HUE16164345A HUE040364T2 HU E040364 T2 HUE040364 T2 HU E040364T2 HU E16164345 A HUE16164345 A HU E16164345A HU E16164345 A HUE16164345 A HU E16164345A HU E040364 T2 HUE040364 T2 HU E040364T2
- Authority
- HU
- Hungary
- Prior art keywords
- optical measurement
- holding
- holding device
- measurement device
- optical
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/003—Alignment of optical elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
- G02B7/023—Mountings, adjusting means, or light-tight connections, for optical elements for lenses permitting adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
- G01B5/0004—Supports
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/22—Telecentric objectives or lens systems
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102015105978.9A DE102015105978B3 (de) | 2015-04-20 | 2015-04-20 | Haltevorrichtung für eine optische Messeinrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
HUE040364T2 true HUE040364T2 (hu) | 2019-03-28 |
Family
ID=55699551
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HUE16164345A HUE040364T2 (hu) | 2015-04-20 | 2016-04-08 | Tartószerkezet optikai mérõkészülékhez |
Country Status (6)
Country | Link |
---|---|
US (1) | US10031311B2 (hu) |
EP (1) | EP3086080B1 (hu) |
JP (1) | JP6231153B2 (hu) |
CN (1) | CN106066159B (hu) |
DE (1) | DE102015105978B3 (hu) |
HU (1) | HUE040364T2 (hu) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10409023B2 (en) * | 2016-09-07 | 2019-09-10 | Sensors Unlimited, Inc. | Laser alignment systems |
JP1589602S (hu) * | 2017-03-30 | 2020-10-26 | ||
DE102017113695B3 (de) * | 2017-06-21 | 2018-12-27 | Carl Mahr Holding Gmbh | Wippenloses Messsystem für ein Messgerät |
DE102017113699B3 (de) | 2017-06-21 | 2018-06-28 | Carl Mahr Holding Gmbh | Messsystem mit einer Kugelführungseinheit für ein Messgerät |
CN113866928B (zh) * | 2020-06-12 | 2024-03-15 | 深圳市大族数控科技股份有限公司 | 用于光学器件的调节架及其调节方法 |
CN112678484B (zh) * | 2020-12-25 | 2021-09-07 | 马拉兹(江苏)电梯导轨有限公司 | 电梯导轨双向翻转装置 |
JP7456051B1 (ja) | 2023-07-18 | 2024-03-26 | Dmg森精機株式会社 | 工作機械 |
Family Cites Families (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4298281A (en) * | 1979-07-16 | 1981-11-03 | Libbey-Owens-Ford Company | Laser system for aligning conveyor rolls |
JPS6242678A (ja) * | 1985-08-09 | 1987-02-24 | Olympus Optical Co Ltd | 固体撮像装置 |
DE3531156C1 (de) * | 1985-08-31 | 1986-09-04 | Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln | Verfahren zum Ausrichten der Achse eines zweiten Halters in bezug auf die Achse eines ersten Halters bei einer Pruef- oder Bearbeitungsmaschine |
DE3630702A1 (de) * | 1986-09-09 | 1988-03-17 | Ulrich Wagensommer | Vorrichtung zum vermessen eines werkstueckes |
JPH0438282Y2 (hu) | 1987-02-27 | 1992-09-08 | ||
JPH0497307A (ja) * | 1990-08-15 | 1992-03-30 | Toshiba Corp | レーザ発振管支持装置 |
DE4030994A1 (de) * | 1990-10-01 | 1992-04-02 | Hoefler Messgeraetebau Gmbh Dr | Pruefeinrichtung fuer rotationssymmetrische werkstuecke |
US5457577A (en) * | 1992-01-22 | 1995-10-10 | The United States Of America As Represented By The Secretary Of The Army | Quick-set precision optical holder |
US5363559A (en) * | 1992-11-16 | 1994-11-15 | Burris Company | Telescope inner tube locking device and method |
IT1272101B (it) * | 1993-03-17 | 1997-06-11 | Fondazione Centro S Romanello | Dispositivo di sostegno e posizionamento per filtri ottici |
IT1296542B1 (it) * | 1997-11-07 | 1999-07-09 | Marposs Spa | Apparecchiatura optoelettronica per il controllo dimensionale e/o di forma di componenti con forme tridimensionali complesse. |
US5956190A (en) * | 1998-01-09 | 1999-09-21 | Sieg; Brian T. | Astronomy guide scope mounting system |
DE19840801B4 (de) * | 1998-09-08 | 2005-09-15 | Walter Maschinenbau Gmbh | Werkzeugmaschine mit automatischer Prozesssteuerung/Überwachung und Verfahren zum Bearbeiten |
DE19927872A1 (de) * | 1999-04-01 | 2000-10-26 | Werth Messtechnik Gmbh | Vorrichtung und Verfahren zum Messen eines Objektes bzw. dessen Struktur, insbesondere solcher mit Vorsprüngen wie Zähnen eines Fräswerkzeuges |
CA2429363C (en) | 2000-11-28 | 2007-08-14 | Honda Giken Kogyo Kabushiki Kaisha | Method of and apparatus for adjusting optical component, and optical unit |
DE10152038C5 (de) | 2001-10-19 | 2008-06-26 | Hommel-Etamic Gmbh | Verfahren zur optoelektronischen Bestimmung von Gewindeparametern |
DE10319947B4 (de) * | 2003-05-02 | 2010-06-02 | Hommel-Etamic Gmbh | Einrichtung zur Messung der Umfangsgestalt rotationssymmetrischer Werkstücke |
JP5622068B2 (ja) * | 2005-11-15 | 2014-11-12 | 株式会社ニコン | 面位置検出装置、露光装置、およびデバイスの製造方法 |
EP3171220A1 (en) * | 2006-01-19 | 2017-05-24 | Nikon Corporation | Exposure apparatus, exposure method, and device manufacturing method |
JP4512627B2 (ja) * | 2007-10-03 | 2010-07-28 | キヤノン株式会社 | 測定装置、露光装置及びデバイス製造方法 |
US8550444B2 (en) * | 2007-10-23 | 2013-10-08 | Gii Acquisition, Llc | Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station |
DE102008013308A1 (de) * | 2008-03-08 | 2009-09-10 | Carl Mahr Holding Gmbh | Erweiterbare Werkzeugmessmaschine |
US8004694B2 (en) * | 2009-03-27 | 2011-08-23 | Gll Acquistion LLC | System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station |
DE102010008416A1 (de) * | 2010-02-18 | 2011-08-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 80686 | Vorrichtung und Verfahren zur optischen Vermessung eines stift- oder stabförmigen Körpers |
DE102010054742A1 (de) * | 2010-12-16 | 2012-06-21 | E. Zoller GmbH & Co. KG Einstell- und Messgeräte | Einstell- und/oder Messgerätevorrichtung |
US8528140B1 (en) * | 2011-07-01 | 2013-09-10 | McCann Industries, LLC | Adjustable scope mount |
US9354437B2 (en) * | 2012-02-29 | 2016-05-31 | Suzhou Synta Optical Technology Co., Ltd. | Object finder mounting apparatus, systems for viewing objects and methods for using same |
CN102566036B (zh) * | 2012-02-29 | 2014-03-26 | 苏州信达光电科技有限公司 | 多功能寻标器 |
DE102012104008B3 (de) | 2012-05-08 | 2013-11-07 | Jenoptik Industrial Metrology Germany Gmbh | Vorrichtung und Verfahren zum Messen von Form-, Lage- und Dimensionsmerkmalen an Maschinenelementen |
JP6029394B2 (ja) * | 2012-09-11 | 2016-11-24 | 株式会社キーエンス | 形状測定装置 |
DE102013201136B4 (de) * | 2013-01-24 | 2023-01-19 | Siemens Healthcare Gmbh | Vorhersage eines voraussichtlichen Kontrastmittelverlaufs |
KR101450672B1 (ko) * | 2013-07-22 | 2014-10-22 | 이기원 | 천체 망원경의 다용도 뷰 파인더 |
-
2015
- 2015-04-20 DE DE102015105978.9A patent/DE102015105978B3/de not_active Withdrawn - After Issue
-
2016
- 2016-04-08 EP EP16164345.7A patent/EP3086080B1/de active Active
- 2016-04-08 HU HUE16164345A patent/HUE040364T2/hu unknown
- 2016-04-19 CN CN201610244488.1A patent/CN106066159B/zh active Active
- 2016-04-20 US US15/133,370 patent/US10031311B2/en active Active
- 2016-04-20 JP JP2016084173A patent/JP6231153B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
EP3086080B1 (de) | 2018-11-07 |
US20160306133A1 (en) | 2016-10-20 |
CN106066159A (zh) | 2016-11-02 |
JP6231153B2 (ja) | 2017-11-15 |
DE102015105978B3 (de) | 2016-09-15 |
EP3086080A1 (de) | 2016-10-26 |
JP2016206193A (ja) | 2016-12-08 |
CN106066159B (zh) | 2019-07-12 |
US10031311B2 (en) | 2018-07-24 |
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