HK73390A - X-ray device - Google Patents

X-ray device

Info

Publication number
HK73390A
HK73390A HK73390A HK73390A HK73390A HK 73390 A HK73390 A HK 73390A HK 73390 A HK73390 A HK 73390A HK 73390 A HK73390 A HK 73390A HK 73390 A HK73390 A HK 73390A
Authority
HK
Hong Kong
Prior art keywords
ray device
ray
Prior art date
Application number
HK73390A
Other languages
English (en)
Inventor
Toshiyuki Koga
Original Assignee
Seiko Instr Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr Inc filed Critical Seiko Instr Inc
Publication of HK73390A publication Critical patent/HK73390A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Toxicology (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
HK73390A 1982-06-03 1990-09-13 X-ray device HK73390A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置

Publications (1)

Publication Number Publication Date
HK73390A true HK73390A (en) 1990-09-21

Family

ID=13785118

Family Applications (1)

Application Number Title Priority Date Filing Date
HK73390A HK73390A (en) 1982-06-03 1990-09-13 X-ray device

Country Status (6)

Country Link
JP (1) JPS58184655U (fr)
DE (1) DE3319984A1 (fr)
FR (1) FR2528266B1 (fr)
GB (1) GB2121168B (fr)
HK (1) HK73390A (fr)
NL (1) NL8301987A (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3731973A1 (de) * 1987-09-23 1989-04-13 Helmut Fischer Gmbh & Co Vorrichtung zur stabilisierung fuer roentgenfluoreszenzschichtdicken-messgeraete und verfahren hierzu
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光ｘ線膜厚計
FR2721789A1 (fr) * 1994-06-24 1995-12-29 Ge Medical Syst Sa Appareil d'irradiation comprenant des moyens de mesure de l'exposition.
EP0781992B1 (fr) * 1995-12-21 2006-06-07 Horiba, Ltd. Appareil d'analyse de fluorescence à rayons X
JP5839284B2 (ja) * 2012-05-01 2016-01-06 アースニクス株式会社 γ線反射型計測装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
DE3062151D1 (en) * 1979-02-09 1983-04-07 Martin Marietta Corp Element analysis unit
JPS5758300U (fr) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
FR2528266A1 (fr) 1983-12-09
GB8315135D0 (en) 1983-07-06
JPS58184655U (ja) 1983-12-08
GB2121168B (en) 1986-02-19
JPH0328400Y2 (fr) 1991-06-18
FR2528266B1 (fr) 1988-07-08
NL8301987A (nl) 1984-01-02
DE3319984A1 (de) 1983-12-08
GB2121168A (en) 1983-12-14

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