HK25584A - Method and device for testing electrical conductors - Google Patents

Method and device for testing electrical conductors

Info

Publication number
HK25584A
HK25584A HK255/84A HK25584A HK25584A HK 25584 A HK25584 A HK 25584A HK 255/84 A HK255/84 A HK 255/84A HK 25584 A HK25584 A HK 25584A HK 25584 A HK25584 A HK 25584A
Authority
HK
Hong Kong
Prior art keywords
electrical conductors
testing electrical
testing
conductors
electrical
Prior art date
Application number
HK255/84A
Other languages
English (en)
Inventor
Alan Taylour English
Gabriel Lorimer Miller
Original Assignee
Western Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US05/949,578 external-priority patent/US4213087A/en
Application filed by Western Electric Co filed Critical Western Electric Co
Publication of HK25584A publication Critical patent/HK25584A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
HK255/84A 1977-10-31 1984-03-22 Method and device for testing electrical conductors HK25584A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84721377A 1977-10-31 1977-10-31
US05/949,578 US4213087A (en) 1978-10-10 1978-10-10 Method and device for testing electrical conductor elements

Publications (1)

Publication Number Publication Date
HK25584A true HK25584A (en) 1984-03-30

Family

ID=27126694

Family Applications (1)

Application Number Title Priority Date Filing Date
HK255/84A HK25584A (en) 1977-10-31 1984-03-22 Method and device for testing electrical conductors

Country Status (12)

Country Link
JP (1) JPS5488777A (de)
CA (1) CA1120545A (de)
CH (1) CH635686A5 (de)
DE (1) DE2847074A1 (de)
DK (1) DK483278A (de)
FR (1) FR2407483A1 (de)
GB (1) GB2007850B (de)
HK (1) HK25584A (de)
IT (1) IT1099851B (de)
NL (1) NL7810608A (de)
SE (1) SE433782B (de)
SG (1) SG56382G (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4547724A (en) * 1983-02-07 1985-10-15 Tektronix, Inc. Method and apparatus for detection of non-linear electrical devices
JPH0630444B2 (ja) * 1985-05-02 1994-04-20 株式会社日立製作所 Ａ／ｄ変換器試験方式

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3500188A (en) * 1966-06-02 1970-03-10 Amp Inc Method and means for measuring constriction resistance based on nonlinearity
GB1221704A (en) * 1968-09-16 1971-02-10 Dale Electronics Method for testing the resistance characteristics of self-heated electric resistors
US3692987A (en) * 1970-07-06 1972-09-19 Western Electric Co Methods and apparatus for allocating the measured noise and resistance of a thin-film resistor between the resistor proper and the contact pads therefor
US3746973A (en) * 1972-05-05 1973-07-17 Ibm Testing of metallization networks on insulative substrates supporting semiconductor chips
US3803483A (en) * 1972-05-05 1974-04-09 Ibm Semiconductor structure for testing of metallization networks on insulative substrates supporting semiconductor chips
US3974443A (en) * 1975-01-02 1976-08-10 International Business Machines Corporation Conductive line width and resistivity measuring system

Also Published As

Publication number Publication date
SE433782B (sv) 1984-06-12
SE7811012L (sv) 1979-05-01
FR2407483A1 (fr) 1979-05-25
CH635686A5 (de) 1983-04-15
NL7810608A (nl) 1979-05-02
FR2407483B1 (de) 1983-09-16
DE2847074A1 (de) 1979-05-03
GB2007850A (en) 1979-05-23
CA1120545A (en) 1982-03-23
IT1099851B (it) 1985-09-28
DK483278A (da) 1979-05-01
GB2007850B (en) 1982-05-12
IT7829239A0 (it) 1978-10-30
JPS5488777A (en) 1979-07-14
SG56382G (en) 1983-09-02

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