HK18697A - Adapter for a device for testing printed circuit boards - Google Patents

Adapter for a device for testing printed circuit boards

Info

Publication number
HK18697A
HK18697A HK18697A HK18697A HK18697A HK 18697 A HK18697 A HK 18697A HK 18697 A HK18697 A HK 18697A HK 18697 A HK18697 A HK 18697A HK 18697 A HK18697 A HK 18697A
Authority
HK
Hong Kong
Prior art keywords
adapter
printed circuit
circuit boards
testing printed
testing
Prior art date
Application number
HK18697A
Other languages
English (en)
Inventor
Martin Maelzer
Ruediger Dehmel
Hans-Hermann Higgen
Andreas Guelzow
Original Assignee
Luther & Maelzer Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther & Maelzer Gmbh filed Critical Luther & Maelzer Gmbh
Publication of HK18697A publication Critical patent/HK18697A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Tests Of Electronic Circuits (AREA)
HK18697A 1986-11-18 1997-02-20 Adapter for a device for testing printed circuit boards HK18697A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3639359 1986-11-18
DE19873736689 DE3736689A1 (de) 1986-11-18 1987-10-29 Adapter fuer ein leiterplattenpruefgeraet

Publications (1)

Publication Number Publication Date
HK18697A true HK18697A (en) 1997-02-20

Family

ID=25849485

Family Applications (1)

Application Number Title Priority Date Filing Date
HK18697A HK18697A (en) 1986-11-18 1997-02-20 Adapter for a device for testing printed circuit boards

Country Status (4)

Country Link
US (1) US4899104A (fr)
EP (1) EP0268969B1 (fr)
DE (2) DE3736689A1 (fr)
HK (1) HK18697A (fr)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4011434A1 (de) * 1990-04-09 1991-10-10 Atg Electronic Gmbh Verfahren und vorrichtung zum bohren und/oder bestuecken der fuehrungsplatten eines pruefadapters
US5270641A (en) * 1992-01-22 1993-12-14 Everett Charles Technologies, Inc. Dual side access test fixture
DE4206012C1 (en) * 1992-02-27 1993-09-16 Ant Nachrichtentechnik Gmbh, 71522 Backnang, De Circuit board testing adaptor assembly system - uses eccentrically weighted motor to vibrate sleeve which supplies test pins for fitting in adaptor bores
US5311120A (en) * 1993-01-06 1994-05-10 Bartholomew Mark R Test fixture with test function feature
DE4323276A1 (de) * 1993-07-12 1995-01-19 Mania Gmbh Vollmaterialadapter
US5602480A (en) * 1994-04-19 1997-02-11 Hitachi Medical Corporation Inspection method and apparatus using nuclear magnetic resonance
KR100212169B1 (ko) * 1996-02-13 1999-08-02 오쿠보 마사오 프로브, 프로브의 제조, 그리고 프로브를 사용한 수직동작형 프로브 카드 어셈블리
GB2311175A (en) * 1996-03-15 1997-09-17 Everett Charles Tech PCB / test circuitry connection interface with short circuiting means
DE19939955A1 (de) * 1999-08-23 2001-03-01 Atg Test Systems Gmbh Prüfnadel für einen Rasteranpassungsadapter einer Vorrichtung zum Testen von Leiterplatten
US7479794B2 (en) * 2007-02-28 2009-01-20 Sv Probe Pte Ltd Spring loaded probe pin assembly
CN102680809A (zh) * 2011-03-09 2012-09-19 瑞统企业股份有限公司 印刷电路板电性测试装置
DE102011051607A1 (de) * 2011-07-06 2013-01-10 Dtg International Gmbh Adapter für eine Prüfvorrichtung und Prüfvorrichtung zum Testen von Leiterplatten
US9201123B2 (en) * 2011-11-04 2015-12-01 Infineon Technologies Ag Magnetic sensor device and a method for fabricating the same
US9121880B2 (en) * 2011-11-04 2015-09-01 Infineon Technologies Ag Magnetic sensor device
ITVI20110343A1 (it) * 2011-12-30 2013-07-01 St Microelectronics Srl Sistema e adattatore per testare chips con circuiti integrati in un package
TWI467180B (zh) * 2012-11-29 2015-01-01 Winbond Electronics Corp 探針卡
TWI596346B (zh) 2016-08-24 2017-08-21 中華精測科技股份有限公司 垂直式探針卡之探針裝置
TWI640782B (zh) * 2017-08-25 2018-11-11 中華精測科技股份有限公司 垂直式探針卡之探針裝置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US68493A (en) * 1867-09-03 Improvement in wagon-look
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.
US4357062A (en) * 1979-12-10 1982-11-02 John Fluke Mfg. Co., Inc. Universal circuit board test fixture
DE3013215A1 (de) * 1980-04-03 1981-10-15 Luther & Maelzer Gmbh, 3050 Wunstorf Adapter fuer ein selbstprogrammierbares leiterplattenpruefgeraet
US4423376A (en) * 1981-03-20 1983-12-27 International Business Machines Corporation Contact probe assembly having rotatable contacting probe elements
US4506215A (en) * 1981-06-30 1985-03-19 International Business Machines Corporation Modular test probe
JPS5872060A (ja) * 1981-10-26 1983-04-28 Nippon Denshi Zairyo Kk プロ−ブカ−ド
DE3240916C2 (de) * 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten
JPS6049270A (ja) * 1983-08-27 1985-03-18 Kyoei Sangyo Kk プリント配線板検査機用アダプタ
GB2146849B (en) * 1983-09-17 1987-08-05 Marconi Instruments Ltd Electrical test probe head assembly
US4535536A (en) * 1983-11-03 1985-08-20 Augat Inc. Method of assembling adaptor for automatic testing equipment
ATE34621T1 (de) * 1983-12-08 1988-06-15 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet.
US4686467A (en) * 1984-03-21 1987-08-11 Dit-Mco International Corp. Circuit board testing system
US4774462A (en) * 1984-06-11 1988-09-27 Black Thomas J Automatic test system
US4622514A (en) * 1984-06-15 1986-11-11 Ibm Multiple mode buckling beam probe assembly
US4633176A (en) * 1984-06-20 1986-12-30 Gte Communication Systems Corp. Test fixture including deflectable probes
JPS6138575A (ja) * 1984-07-31 1986-02-24 Kyoei Sangyo Kk プリント配線板検査機用アダプタユニツト
DE3533218A1 (de) * 1984-09-18 1986-03-20 Feinmetall Gmbh, 7033 Herrenberg Kontaktnadel
JPS61176866A (ja) * 1985-01-31 1986-08-08 Anritsu Corp プリント配線板の導通検査用アダプタ装置
DE3507619C2 (de) * 1985-03-04 1994-06-30 Luther & Maelzer Gmbh Adapter für ein Leiterplattenprüfgerät

Also Published As

Publication number Publication date
EP0268969B1 (fr) 1992-07-29
DE3736689A1 (de) 1988-05-26
US4899104A (en) 1990-02-06
DE3780769D1 (de) 1992-09-03
EP0268969A1 (fr) 1988-06-01

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20051116