GB2178604B - Apparatus for use in testing a printed circuit board - Google Patents

Apparatus for use in testing a printed circuit board

Info

Publication number
GB2178604B
GB2178604B GB08612929A GB8612929A GB2178604B GB 2178604 B GB2178604 B GB 2178604B GB 08612929 A GB08612929 A GB 08612929A GB 8612929 A GB8612929 A GB 8612929A GB 2178604 B GB2178604 B GB 2178604B
Authority
GB
United Kingdom
Prior art keywords
testing
circuit board
printed circuit
printed
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08612929A
Other versions
GB8612929D0 (en
GB2178604A (en
Inventor
Brian Diggle
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Publication of GB8612929D0 publication Critical patent/GB8612929D0/en
Publication of GB2178604A publication Critical patent/GB2178604A/en
Application granted granted Critical
Publication of GB2178604B publication Critical patent/GB2178604B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB08612929A 1985-07-25 1986-05-28 Apparatus for use in testing a printed circuit board Expired GB2178604B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB858518861A GB8518861D0 (en) 1985-07-25 1985-07-25 Testing printed circuit board

Publications (3)

Publication Number Publication Date
GB8612929D0 GB8612929D0 (en) 1986-07-02
GB2178604A GB2178604A (en) 1987-02-11
GB2178604B true GB2178604B (en) 1988-10-12

Family

ID=10582880

Family Applications (2)

Application Number Title Priority Date Filing Date
GB858518861A Pending GB8518861D0 (en) 1985-07-25 1985-07-25 Testing printed circuit board
GB08612929A Expired GB2178604B (en) 1985-07-25 1986-05-28 Apparatus for use in testing a printed circuit board

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB858518861A Pending GB8518861D0 (en) 1985-07-25 1985-07-25 Testing printed circuit board

Country Status (1)

Country Link
GB (2) GB8518861D0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2311175A (en) * 1996-03-15 1997-09-17 Everett Charles Tech PCB / test circuitry connection interface with short circuiting means
FR2772921B1 (en) 1997-12-24 2000-01-28 Sgs Thomson Microelectronics POINTED CARD FOR TESTING SEMICONDUCTOR COMPONENTS
CN108792638B (en) * 2018-06-25 2023-10-13 苏州富强科技有限公司 PCB board loading attachment

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2146849B (en) * 1983-09-17 1987-08-05 Marconi Instruments Ltd Electrical test probe head assembly

Also Published As

Publication number Publication date
GB8612929D0 (en) 1986-07-02
GB2178604A (en) 1987-02-11
GB8518861D0 (en) 1985-08-29

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20030528