HK1222910A1 - 射線相襯成像系統與成像方法 - Google Patents

射線相襯成像系統與成像方法

Info

Publication number
HK1222910A1
HK1222910A1 HK16111105.1A HK16111105A HK1222910A1 HK 1222910 A1 HK1222910 A1 HK 1222910A1 HK 16111105 A HK16111105 A HK 16111105A HK 1222910 A1 HK1222910 A1 HK 1222910A1
Authority
HK
Hong Kong
Prior art keywords
ray
phase contrast
imaging system
imaging method
contrast imaging
Prior art date
Application number
HK16111105.1A
Other languages
English (en)
Inventor
張麗陳志强姜曉磊朱曉驊金鑫
Original Assignee
Univ Tsinghua
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Tsinghua, Nuctech Co Ltd filed Critical Univ Tsinghua
Publication of HK1222910A1 publication Critical patent/HK1222910A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/408—Imaging display on monitor
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Pulmonology (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
HK16111105.1A 2014-11-04 2016-09-22 射線相襯成像系統與成像方法 HK1222910A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410610466.3A CN105606633B (zh) 2014-11-04 2014-11-04 X射线相衬成像系统与成像方法

Publications (1)

Publication Number Publication Date
HK1222910A1 true HK1222910A1 (zh) 2017-07-14

Family

ID=55908576

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16111105.1A HK1222910A1 (zh) 2014-11-04 2016-09-22 射線相襯成像系統與成像方法

Country Status (5)

Country Link
US (1) US10267752B2 (zh)
EP (1) EP3048441B1 (zh)
CN (1) CN105606633B (zh)
HK (1) HK1222910A1 (zh)
WO (1) WO2016070771A1 (zh)

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US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
CN105606633B (zh) 2014-11-04 2019-03-19 清华大学 X射线相衬成像系统与成像方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
CN107807139B (zh) * 2016-09-05 2020-04-24 天津工业大学 一种无步进装置的双能x射线相衬成像系统及其实现方法
WO2018096759A1 (ja) * 2016-11-22 2018-05-31 株式会社島津製作所 Ｘ線位相イメージング装置
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
EP3448010A1 (en) * 2017-08-23 2019-02-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. System for analyzing a document and corresponding method
CN107607560B (zh) * 2017-09-22 2021-06-25 上海联影医疗科技股份有限公司 一种光学相位衬度成像系统、方法及计算机可读媒质
CN107677693B (zh) * 2017-09-26 2020-06-09 同方威视技术股份有限公司 用于物品安全检查的扫描成像系统及其成像方法
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
US10989822B2 (en) 2018-06-04 2021-04-27 Sigray, Inc. Wavelength dispersive x-ray spectrometer
WO2020023408A1 (en) 2018-07-26 2020-01-30 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
DE112019004433T5 (de) 2018-09-04 2021-05-20 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
WO2020090168A1 (ja) * 2018-10-31 2020-05-07 株式会社島津製作所 Ｘ線位相差撮影システム
EP3701868A1 (en) * 2019-02-28 2020-09-02 Koninklijke Philips N.V. System, method and computer program for acquiring phase imaging data of an object
CN109975334B (zh) * 2019-04-25 2021-12-28 兰州大学 一种单次曝光的x射线二维相衬成像方法
CN110095481B (zh) * 2019-05-24 2021-03-05 清华大学 X射线光栅成像系统与成像方法
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
DE112021002841T5 (de) 2020-05-18 2023-03-23 Sigray, Inc. System und Verfahren für Röntgenabsorptionsspektroskopie unter Verwendung eines Kristallanalysators und mehrerer Detektorelemente
JP2023542674A (ja) 2020-09-17 2023-10-11 シグレイ、インコーポレイテッド Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
KR20230109735A (ko) 2020-12-07 2023-07-20 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
CN114002242A (zh) * 2021-10-29 2022-02-01 北京师范大学 X射线相衬成像系统
WO2023149113A1 (ja) * 2022-02-03 2023-08-10 国立大学法人東北大学 弾性率算出方法及び弾性率算出装置
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CN105606633B (zh) 2014-11-04 2019-03-19 清华大学 X射线相衬成像系统与成像方法

Also Published As

Publication number Publication date
US20170227476A1 (en) 2017-08-10
EP3048441A4 (en) 2017-06-21
CN105606633A (zh) 2016-05-25
EP3048441A1 (en) 2016-07-27
EP3048441B1 (en) 2020-06-24
CN105606633B (zh) 2019-03-19
US10267752B2 (en) 2019-04-23
WO2016070771A1 (zh) 2016-05-12

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