HK1222451A1 - 射線産品質量自動檢測裝置 - Google Patents

射線産品質量自動檢測裝置

Info

Publication number
HK1222451A1
HK1222451A1 HK16110517.5A HK16110517A HK1222451A1 HK 1222451 A1 HK1222451 A1 HK 1222451A1 HK 16110517 A HK16110517 A HK 16110517A HK 1222451 A1 HK1222451 A1 HK 1222451A1
Authority
HK
Hong Kong
Prior art keywords
inspection apparatus
product quality
automatic inspection
quality automatic
ray product
Prior art date
Application number
HK16110517.5A
Other languages
English (en)
Inventor
唐華平陳志强李元景劉卓炎王永剛秦占峰
Original Assignee
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nuctech Co Ltd filed Critical Nuctech Co Ltd
Publication of HK1222451A1 publication Critical patent/HK1222451A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/3416—Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3304—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts helicoidal scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
HK16110517.5A 2014-09-02 2016-09-02 射線産品質量自動檢測裝置 HK1222451A1 (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201410442128.3A CN105372269B (zh) 2014-09-02 2014-09-02 X射线产品质量自动检测装置

Publications (1)

Publication Number Publication Date
HK1222451A1 true HK1222451A1 (zh) 2017-06-30

Family

ID=55374653

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16110517.5A HK1222451A1 (zh) 2014-09-02 2016-09-02 射線産品質量自動檢測裝置

Country Status (6)

Country Link
US (1) US10969346B2 (zh)
EP (1) EP3037809B1 (zh)
JP (1) JP6291068B2 (zh)
CN (1) CN105372269B (zh)
HK (1) HK1222451A1 (zh)
WO (1) WO2016034073A1 (zh)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8908995B2 (en) 2009-01-12 2014-12-09 Intermec Ip Corp. Semi-automatic dimensioning with imager on a portable device
US9779546B2 (en) 2012-05-04 2017-10-03 Intermec Ip Corp. Volume dimensioning systems and methods
US10007858B2 (en) 2012-05-15 2018-06-26 Honeywell International Inc. Terminals and methods for dimensioning objects
US10321127B2 (en) 2012-08-20 2019-06-11 Intermec Ip Corp. Volume dimensioning system calibration systems and methods
US20140104413A1 (en) 2012-10-16 2014-04-17 Hand Held Products, Inc. Integrated dimensioning and weighing system
US10228452B2 (en) 2013-06-07 2019-03-12 Hand Held Products, Inc. Method of error correction for 3D imaging device
US9823059B2 (en) 2014-08-06 2017-11-21 Hand Held Products, Inc. Dimensioning system with guided alignment
US10775165B2 (en) 2014-10-10 2020-09-15 Hand Held Products, Inc. Methods for improving the accuracy of dimensioning-system measurements
US10810715B2 (en) 2014-10-10 2020-10-20 Hand Held Products, Inc System and method for picking validation
US9779276B2 (en) 2014-10-10 2017-10-03 Hand Held Products, Inc. Depth sensor based auto-focus system for an indicia scanner
US9897434B2 (en) 2014-10-21 2018-02-20 Hand Held Products, Inc. Handheld dimensioning system with measurement-conformance feedback
US9752864B2 (en) 2014-10-21 2017-09-05 Hand Held Products, Inc. Handheld dimensioning system with feedback
US10060729B2 (en) 2014-10-21 2018-08-28 Hand Held Products, Inc. Handheld dimensioner with data-quality indication
US9786101B2 (en) 2015-05-19 2017-10-10 Hand Held Products, Inc. Evaluating image values
US10066982B2 (en) 2015-06-16 2018-09-04 Hand Held Products, Inc. Calibrating a volume dimensioner
US20160377414A1 (en) 2015-06-23 2016-12-29 Hand Held Products, Inc. Optical pattern projector
US9835486B2 (en) 2015-07-07 2017-12-05 Hand Held Products, Inc. Mobile dimensioner apparatus for use in commerce
EP3396313B1 (en) 2015-07-15 2020-10-21 Hand Held Products, Inc. Mobile dimensioning method and device with dynamic accuracy compatible with nist standard
US10094650B2 (en) 2015-07-16 2018-10-09 Hand Held Products, Inc. Dimensioning and imaging items
US20170017301A1 (en) 2015-07-16 2017-01-19 Hand Held Products, Inc. Adjusting dimensioning results using augmented reality
US10249030B2 (en) 2015-10-30 2019-04-02 Hand Held Products, Inc. Image transformation for indicia reading
US10225544B2 (en) 2015-11-19 2019-03-05 Hand Held Products, Inc. High resolution dot pattern
US10025314B2 (en) 2016-01-27 2018-07-17 Hand Held Products, Inc. Vehicle positioning and object avoidance
US10339352B2 (en) 2016-06-03 2019-07-02 Hand Held Products, Inc. Wearable metrological apparatus
US9940721B2 (en) 2016-06-10 2018-04-10 Hand Held Products, Inc. Scene change detection in a dimensioner
US10163216B2 (en) 2016-06-15 2018-12-25 Hand Held Products, Inc. Automatic mode switching in a volume dimensioner
US10909708B2 (en) 2016-12-09 2021-02-02 Hand Held Products, Inc. Calibrating a dimensioner using ratios of measurable parameters of optic ally-perceptible geometric elements
CN106841245A (zh) * 2017-03-08 2017-06-13 肇庆市嘉仪仪器有限公司 全自动x光检测仪及其检测方法
CN106944359B (zh) * 2017-04-01 2022-10-21 温州大学 一种可自动定位分拣的x射线自动检测系统
US10733748B2 (en) 2017-07-24 2020-08-04 Hand Held Products, Inc. Dual-pattern optical 3D dimensioning
WO2019100119A1 (en) * 2017-11-23 2019-05-31 Mickelbobs BBC Patents Pty Ltd Helmet testing
CN107855284B (zh) * 2017-12-06 2024-06-18 北京极智嘉科技股份有限公司 带有安检功能的物品分拣系统及方法
CN108008016A (zh) * 2018-01-03 2018-05-08 国网安徽省电力有限公司电力科学研究院 基于x射线与超声联合检测的电力电缆及接头无损检测系统及方法
US10584962B2 (en) 2018-05-01 2020-03-10 Hand Held Products, Inc System and method for validating physical-item security
CN108709896A (zh) * 2018-08-10 2018-10-26 孔玉 一种用于检测玻璃面板内部缺陷的检测设备
US11639846B2 (en) 2019-09-27 2023-05-02 Honeywell International Inc. Dual-pattern optical 3D dimensioning
CN110987984A (zh) * 2019-12-26 2020-04-10 广东正业科技股份有限公司 一种检测系统及其检测方法
CN111346839A (zh) * 2020-03-12 2020-06-30 江苏警官学院 一种危险物品的x射线检测装置
CN114923935A (zh) * 2022-04-02 2022-08-19 上海奕瑞光电子科技股份有限公司 在线3d扫描系统及在线3d扫描方法
CN116297569B (zh) * 2023-04-28 2023-09-05 杭州睿影科技有限公司 一种基于x射线的物体检测方法、系统及处理设备

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
JP2000241368A (ja) * 1999-02-23 2000-09-08 Stabic:Kk Ｘ線検査装置
US6449334B1 (en) * 2000-09-29 2002-09-10 Lunar Corporation Industrial inspection method and apparatus using dual energy x-ray attenuation
US6735271B1 (en) * 2000-11-28 2004-05-11 Ge Medical Systems Global Technology Company Llc Electron beam computed tomographic scanner system with helical or tilted target, collimator, and detector components to eliminate cone beam error and to scan continuously moving objects
JP2003107015A (ja) * 2001-09-28 2003-04-09 Anritsu Corp Ｘ線異物検出装置
US8223919B2 (en) * 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US7142629B2 (en) * 2004-03-31 2006-11-28 General Electric Company Stationary computed tomography system and method
US8688267B2 (en) * 2004-12-30 2014-04-01 John Bean Technologies Corporation Classifying workpieces to be portioned into various end products to optimally meet overall production goals
MY142674A (en) * 2006-08-11 2010-12-15 American Science & Eng Inc X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
CN101951837B (zh) 2008-02-22 2013-02-13 皇家飞利浦电子股份有限公司 用于采用分布式源进行x射线成像的高分辨率准静态设置
WO2009115982A1 (en) 2008-03-21 2009-09-24 Koninklijke Philips Electronics N.V. Computed tomography scanner apparatus and method for ct-based image acquisition based on spatially distributed x-ray microsources of the cone-beam type
US7742563B2 (en) * 2008-09-10 2010-06-22 Morpho Detection, Inc. X-ray source and detector configuration for a non-translational x-ray diffraction system
US8369481B2 (en) * 2009-06-08 2013-02-05 Ishida Co., Ltd. X-ray inspection device
EP2278305B1 (de) * 2009-07-24 2018-06-27 GE Sensing & Inspection Technologies GmbH Vorrichtung zur automatisierten Prüfung und/oder Vermessung einer Vielzahl im Wesentlichen identischer Bauteile mittels Röntgenstrahlung
EP2526410B1 (en) * 2010-01-19 2021-10-20 Rapiscan Systems, Inc. Multi-view cargo scanner
JP5605607B2 (ja) * 2010-03-19 2014-10-15 横河電機株式会社 Ｘ線測定装置
US8447013B2 (en) * 2010-03-22 2013-05-21 Xinray Systems Inc Multibeam x-ray source with intelligent electronic control systems and related methods
US9452735B2 (en) * 2011-02-10 2016-09-27 Ford Global Technologies, Llc System and method for controlling a restricted mode in a vehicle
EP2739995B1 (en) 2011-08-01 2017-05-24 Kromek Limited Detection and/or classification of materials
US10068740B2 (en) * 2012-05-14 2018-09-04 The General Hospital Corporation Distributed, field emission-based X-ray source for phase contrast imaging
CN104768467A (zh) * 2012-08-17 2015-07-08 北卡罗来纳大学教堂山分校 具有分布式x射线源阵列的固定台架计算机断层扫描系统和方法
CN103901057B (zh) * 2012-12-31 2019-04-30 同方威视技术股份有限公司 使用了分布式x射线源的物品检查装置
CN103760180B (zh) * 2014-01-27 2016-09-07 东南大学 基于x射线源阵列的实时在线工业ct检测系统
CN204359712U (zh) * 2014-09-02 2015-05-27 同方威视技术股份有限公司 X射线产品质量自动检测装置
CN204359711U (zh) * 2014-09-02 2015-05-27 同方威视技术股份有限公司 X射线产品质量在线检测装置

Also Published As

Publication number Publication date
US20160223474A1 (en) 2016-08-04
EP3037809A4 (en) 2017-03-15
CN105372269A (zh) 2016-03-02
EP3037809A1 (en) 2016-06-29
WO2016034073A1 (zh) 2016-03-10
JP2016536617A (ja) 2016-11-24
JP6291068B2 (ja) 2018-03-14
CN105372269B (zh) 2019-01-15
US10969346B2 (en) 2021-04-06
EP3037809B1 (en) 2022-03-23

Similar Documents

Publication Publication Date Title
HK1222451A1 (zh) 射線産品質量自動檢測裝置
HU4811U (hu) Berendezés kézfertõtlenítés minõségének ellenõrzésére
HK1222903A1 (zh) 射線產品質量在線檢測裝置
EP3229691A4 (en) X-ray imaging apparatus
GB2523657B (en) Screening apparatus
GB2528578B (en) Image forming apparatus
SG10201508270WA (en) Image forming apparatus
GB2535287B (en) Image forming apparatus
EP3159682A4 (en) Non-destructive inspection apparatus
HK1250963A1 (zh) 用於碎化食品的裝置
GB2532568B (en) Image forming apparatus
GB2528751B (en) Image forming apparatus
GB2541622B (en) Image forming apparatus
IL255477B (en) Metrology inspection apparatus
ZA201602971B (en) Apparatus & process
PL3238552T3 (pl) Urządzenie do kontroli filtra
GB201414395D0 (en) X-ray apparatus
GB2532564B (en) Image forming apparatus
SG10201606875VA (en) Visual inspection apparatus
KR101584285B9 (ko) X선 비파괴 검사 장치
GB2550553B (en) Document inspection apparatus
TWI563240B (en) Optical inspection apparatus
GB201507117D0 (en) Inspection Apparatus
PL2997815T3 (pl) Urządzenie do ładowania produktów włóknistych
TWM489949U (en) Holding apparatus for tube processing equipment

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20230901