HK1222451A1 - 射線産品質量自動檢測裝置 - Google Patents
射線産品質量自動檢測裝置Info
- Publication number
- HK1222451A1 HK1222451A1 HK16110517.5A HK16110517A HK1222451A1 HK 1222451 A1 HK1222451 A1 HK 1222451A1 HK 16110517 A HK16110517 A HK 16110517A HK 1222451 A1 HK1222451 A1 HK 1222451A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- inspection apparatus
- product quality
- automatic inspection
- quality automatic
- ray product
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3416—Sorting according to other particular properties according to radiation transmissivity, e.g. for light, x-rays, particle radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3304—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts helicoidal scan
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/643—Specific applications or type of materials object on conveyor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/645—Specific applications or type of materials quality control
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Toxicology (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201410442128.3A CN105372269B (zh) | 2014-09-02 | 2014-09-02 | X射线产品质量自动检测装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1222451A1 true HK1222451A1 (zh) | 2017-06-30 |
Family
ID=55374653
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK16110517.5A HK1222451A1 (zh) | 2014-09-02 | 2016-09-02 | 射線産品質量自動檢測裝置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US10969346B2 (zh) |
EP (1) | EP3037809B1 (zh) |
JP (1) | JP6291068B2 (zh) |
CN (1) | CN105372269B (zh) |
HK (1) | HK1222451A1 (zh) |
WO (1) | WO2016034073A1 (zh) |
Families Citing this family (41)
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US8908995B2 (en) | 2009-01-12 | 2014-12-09 | Intermec Ip Corp. | Semi-automatic dimensioning with imager on a portable device |
US9779546B2 (en) | 2012-05-04 | 2017-10-03 | Intermec Ip Corp. | Volume dimensioning systems and methods |
US10007858B2 (en) | 2012-05-15 | 2018-06-26 | Honeywell International Inc. | Terminals and methods for dimensioning objects |
US10321127B2 (en) | 2012-08-20 | 2019-06-11 | Intermec Ip Corp. | Volume dimensioning system calibration systems and methods |
US20140104413A1 (en) | 2012-10-16 | 2014-04-17 | Hand Held Products, Inc. | Integrated dimensioning and weighing system |
US10228452B2 (en) | 2013-06-07 | 2019-03-12 | Hand Held Products, Inc. | Method of error correction for 3D imaging device |
US9823059B2 (en) | 2014-08-06 | 2017-11-21 | Hand Held Products, Inc. | Dimensioning system with guided alignment |
US10810715B2 (en) | 2014-10-10 | 2020-10-20 | Hand Held Products, Inc | System and method for picking validation |
US9779276B2 (en) | 2014-10-10 | 2017-10-03 | Hand Held Products, Inc. | Depth sensor based auto-focus system for an indicia scanner |
US10775165B2 (en) | 2014-10-10 | 2020-09-15 | Hand Held Products, Inc. | Methods for improving the accuracy of dimensioning-system measurements |
US9897434B2 (en) | 2014-10-21 | 2018-02-20 | Hand Held Products, Inc. | Handheld dimensioning system with measurement-conformance feedback |
US10060729B2 (en) | 2014-10-21 | 2018-08-28 | Hand Held Products, Inc. | Handheld dimensioner with data-quality indication |
US9752864B2 (en) | 2014-10-21 | 2017-09-05 | Hand Held Products, Inc. | Handheld dimensioning system with feedback |
US9786101B2 (en) | 2015-05-19 | 2017-10-10 | Hand Held Products, Inc. | Evaluating image values |
US10066982B2 (en) | 2015-06-16 | 2018-09-04 | Hand Held Products, Inc. | Calibrating a volume dimensioner |
US20160377414A1 (en) | 2015-06-23 | 2016-12-29 | Hand Held Products, Inc. | Optical pattern projector |
US9835486B2 (en) | 2015-07-07 | 2017-12-05 | Hand Held Products, Inc. | Mobile dimensioner apparatus for use in commerce |
EP3118576B1 (en) | 2015-07-15 | 2018-09-12 | Hand Held Products, Inc. | Mobile dimensioning device with dynamic accuracy compatible with nist standard |
US20170017301A1 (en) | 2015-07-16 | 2017-01-19 | Hand Held Products, Inc. | Adjusting dimensioning results using augmented reality |
US10094650B2 (en) | 2015-07-16 | 2018-10-09 | Hand Held Products, Inc. | Dimensioning and imaging items |
US10249030B2 (en) | 2015-10-30 | 2019-04-02 | Hand Held Products, Inc. | Image transformation for indicia reading |
US10225544B2 (en) | 2015-11-19 | 2019-03-05 | Hand Held Products, Inc. | High resolution dot pattern |
US10025314B2 (en) | 2016-01-27 | 2018-07-17 | Hand Held Products, Inc. | Vehicle positioning and object avoidance |
US10339352B2 (en) | 2016-06-03 | 2019-07-02 | Hand Held Products, Inc. | Wearable metrological apparatus |
US9940721B2 (en) | 2016-06-10 | 2018-04-10 | Hand Held Products, Inc. | Scene change detection in a dimensioner |
US10163216B2 (en) | 2016-06-15 | 2018-12-25 | Hand Held Products, Inc. | Automatic mode switching in a volume dimensioner |
US10909708B2 (en) | 2016-12-09 | 2021-02-02 | Hand Held Products, Inc. | Calibrating a dimensioner using ratios of measurable parameters of optic ally-perceptible geometric elements |
CN106841245A (zh) * | 2017-03-08 | 2017-06-13 | 肇庆市嘉仪仪器有限公司 | 全自动x光检测仪及其检测方法 |
CN106944359B (zh) * | 2017-04-01 | 2022-10-21 | 温州大学 | 一种可自动定位分拣的x射线自动检测系统 |
US10733748B2 (en) | 2017-07-24 | 2020-08-04 | Hand Held Products, Inc. | Dual-pattern optical 3D dimensioning |
WO2019100119A1 (en) * | 2017-11-23 | 2019-05-31 | Mickelbobs BBC Patents Pty Ltd | Helmet testing |
CN107855284B (zh) * | 2017-12-06 | 2024-06-18 | 北京极智嘉科技股份有限公司 | 带有安检功能的物品分拣系统及方法 |
CN108008016A (zh) * | 2018-01-03 | 2018-05-08 | 国网安徽省电力有限公司电力科学研究院 | 基于x射线与超声联合检测的电力电缆及接头无损检测系统及方法 |
US10584962B2 (en) | 2018-05-01 | 2020-03-10 | Hand Held Products, Inc | System and method for validating physical-item security |
CN108709896A (zh) * | 2018-08-10 | 2018-10-26 | 孔玉 | 一种用于检测玻璃面板内部缺陷的检测设备 |
US11639846B2 (en) | 2019-09-27 | 2023-05-02 | Honeywell International Inc. | Dual-pattern optical 3D dimensioning |
CN110987984A (zh) * | 2019-12-26 | 2020-04-10 | 广东正业科技股份有限公司 | 一种检测系统及其检测方法 |
CN111346839A (zh) * | 2020-03-12 | 2020-06-30 | 江苏警官学院 | 一种危险物品的x射线检测装置 |
CN113514482A (zh) * | 2021-05-07 | 2021-10-19 | 清华大学 | 静态ct检测设备 |
CN114923935A (zh) * | 2022-04-02 | 2022-08-19 | 上海奕瑞光电子科技股份有限公司 | 在线3d扫描系统及在线3d扫描方法 |
CN116297569B (zh) * | 2023-04-28 | 2023-09-05 | 杭州睿影科技有限公司 | 一种基于x射线的物体检测方法、系统及处理设备 |
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WO2013184213A2 (en) * | 2012-05-14 | 2013-12-12 | The General Hospital Corporation | A distributed, field emission-based x-ray source for phase contrast imaging |
US20150282774A1 (en) * | 2012-08-17 | 2015-10-08 | The University Of North Carolina At Chapel Hill | Stationary gantry computed tomography systems and methods with distributed x-ray source arrays |
CN103901057B (zh) * | 2012-12-31 | 2019-04-30 | 同方威视技术股份有限公司 | 使用了分布式x射线源的物品检查装置 |
CN103760180B (zh) * | 2014-01-27 | 2016-09-07 | 东南大学 | 基于x射线源阵列的实时在线工业ct检测系统 |
CN204359711U (zh) * | 2014-09-02 | 2015-05-27 | 同方威视技术股份有限公司 | X射线产品质量在线检测装置 |
CN204359712U (zh) * | 2014-09-02 | 2015-05-27 | 同方威视技术股份有限公司 | X射线产品质量自动检测装置 |
-
2014
- 2014-09-02 CN CN201410442128.3A patent/CN105372269B/zh active Active
-
2015
- 2015-08-27 US US14/901,989 patent/US10969346B2/en active Active
- 2015-08-27 JP JP2016546141A patent/JP6291068B2/ja not_active Expired - Fee Related
- 2015-08-27 EP EP15804297.8A patent/EP3037809B1/en active Active
- 2015-08-27 WO PCT/CN2015/088258 patent/WO2016034073A1/zh active Application Filing
-
2016
- 2016-09-02 HK HK16110517.5A patent/HK1222451A1/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CN105372269B (zh) | 2019-01-15 |
CN105372269A (zh) | 2016-03-02 |
US10969346B2 (en) | 2021-04-06 |
US20160223474A1 (en) | 2016-08-04 |
EP3037809A1 (en) | 2016-06-29 |
JP6291068B2 (ja) | 2018-03-14 |
WO2016034073A1 (zh) | 2016-03-10 |
EP3037809A4 (en) | 2017-03-15 |
JP2016536617A (ja) | 2016-11-24 |
EP3037809B1 (en) | 2022-03-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20230901 |