HK1212096A1 - Semiconductor device on cover substrate and method of making same - Google Patents

Semiconductor device on cover substrate and method of making same

Info

Publication number
HK1212096A1
HK1212096A1 HK15112779.5A HK15112779A HK1212096A1 HK 1212096 A1 HK1212096 A1 HK 1212096A1 HK 15112779 A HK15112779 A HK 15112779A HK 1212096 A1 HK1212096 A1 HK 1212096A1
Authority
HK
Hong Kong
Prior art keywords
semiconductor device
making same
cover substrate
substrate
cover
Prior art date
Application number
HK15112779.5A
Other languages
English (en)
Chinese (zh)
Inventor
Vage Oganesian
Zhenhua Lu
Original Assignee
Optiz Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optiz Inc filed Critical Optiz Inc
Publication of HK1212096A1 publication Critical patent/HK1212096A1/xx

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12—Fingerprints or palmprints
    • G06V40/13—Sensors therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V40/00—Recognition of biometric, human-related or animal-related patterns in image or video data
    • G06V40/10—Human or animal bodies, e.g. vehicle occupants or pedestrians; Body parts, e.g. hands
    • G06V40/12—Fingerprints or palmprints
    • G06V40/1365—Matching; Classification
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/49—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions wire-like arrangements or pins or rods
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14636—Interconnect structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14638—Structures specially adapted for transferring the charges across the imager perpendicular to the imaging plane
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14645—Colour imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909—Post-treatment of the connector or wire bonding area
    • H01L2224/8592—Applying permanent coating, e.g. protective coating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015—Shape
    • H01L2924/10155—Shape being other than a cuboid
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015—Shape
    • H01L2924/10155—Shape being other than a cuboid
    • H01L2924/10156—Shape being other than a cuboid at the periphery

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Human Computer Interaction (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Coils Or Transformers For Communication (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Pressure Sensors (AREA)
HK15112779.5A 2013-12-27 2015-12-29 Semiconductor device on cover substrate and method of making same HK1212096A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201361921323P 2013-12-27 2013-12-27
US14/562,349 US20150189204A1 (en) 2013-12-27 2014-12-05 Semiconductor Device On Cover Substrate And Method Of Making Same

Publications (1)

Publication Number Publication Date
HK1212096A1 true HK1212096A1 (en) 2016-06-03

Family

ID=53483389

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15112779.5A HK1212096A1 (en) 2013-12-27 2015-12-29 Semiconductor device on cover substrate and method of making same

Country Status (5)

Country Link
US (1) US20150189204A1 (ko)
KR (1) KR20150077354A (ko)
CN (1) CN104752519A (ko)
HK (1) HK1212096A1 (ko)
TW (1) TWI545505B (ko)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI584418B (zh) 2016-05-16 2017-05-21 Egis Tech Inc 指紋感測器及其封裝方法
WO2018032871A1 (zh) 2016-08-16 2018-02-22 广东欧珀移动通信有限公司 指纹模组及具有其的移动终端
EP3457315B1 (en) 2016-08-16 2022-06-08 Guangdong Oppo Mobile Telecommunications Corp., Ltd. Fingerprint module and mobile terminal having same
US20180165495A1 (en) * 2016-12-09 2018-06-14 Fingerprint Cards Ab Electronic device
CN110300975A (zh) 2017-03-10 2019-10-01 指纹卡有限公司 包括指纹传感器装置和连接至该传感器装置的基板的指纹传感器模块
CN108267698B (zh) * 2018-01-08 2020-07-14 上海交通大学 一种提高层叠复合磁传感器灵敏度的方法
CN108334841B (zh) * 2018-02-01 2021-03-30 上海天马有机发光显示技术有限公司 显示面板、显示装置及显示面板的制作方法
KR102225956B1 (ko) * 2018-10-19 2021-03-12 세메스 주식회사 다이 본딩 장치, 기판 본딩 장치, 다이 본딩 방법 및 기판 본딩 방법
JP2020088066A (ja) * 2018-11-20 2020-06-04 キヤノン株式会社 電子部品および機器
CN113343829B (zh) * 2019-05-29 2024-04-09 深圳市汇顶科技股份有限公司 指纹识别装置和电子设备

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6117705A (en) * 1997-04-18 2000-09-12 Amkor Technology, Inc. Method of making integrated circuit package having adhesive bead supporting planar lid above planar substrate
KR100611148B1 (ko) * 2003-11-25 2006-08-09 삼성에스디아이 주식회사 박막트랜지스터, 그의 제조방법 및 이를 사용하는 유기전계발광소자
CN101065844B (zh) * 2005-01-04 2010-12-15 株式会社映煌 固体摄像装置及其制造方法
US7393770B2 (en) * 2005-05-19 2008-07-01 Micron Technology, Inc. Backside method for fabricating semiconductor components with conductive interconnects
US8653612B2 (en) * 2006-08-25 2014-02-18 Sanyo Semiconductor Co., Ltd. Semiconductor device
TWI328776B (en) * 2006-12-26 2010-08-11 Egis Technology Inc Sweep-type fingerprint sensing device and method of packaging the same
JP4799543B2 (ja) * 2007-12-27 2011-10-26 株式会社東芝 半導体パッケージ及びカメラモジュール
JP2010114320A (ja) * 2008-11-07 2010-05-20 Panasonic Corp 半導体装置
US8193555B2 (en) * 2009-02-11 2012-06-05 Megica Corporation Image and light sensor chip packages
TWI497658B (zh) * 2009-10-07 2015-08-21 Xintec Inc 晶片封裝體及其製造方法
JP5709435B2 (ja) * 2010-08-23 2015-04-30 キヤノン株式会社 撮像モジュール及びカメラ

Also Published As

Publication number Publication date
US20150189204A1 (en) 2015-07-02
TWI545505B (zh) 2016-08-11
TW201528153A (zh) 2015-07-16
CN104752519A (zh) 2015-07-01
KR20150077354A (ko) 2015-07-07

Similar Documents

Publication Publication Date Title
HK1214408A1 (zh) 半導體裝置及其製造方法
HK1202983A1 (en) Semiconductor device and manufacturing method of the same
SG11201504442YA (en) Semiconductor device and method of making semiconductor device
EP2966673A4 (en) SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD
EP2930741A4 (en) SEMICONDUCTOR COMPONENT AND METHOD FOR PRODUCING A SEMICONDUCTOR COMPONENT
HK1201985A1 (en) Semiconductor device and interconnect substrate
SG11201602220TA (en) Substrate treatment method and substrate treatment device
EP2980833A4 (en) SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD
EP2985790A4 (en) SEMICONDUCTOR COMPONENT AND SEMICONDUCTOR COMPONENT MANUFACTURING METHOD
HK1212096A1 (en) Semiconductor device on cover substrate and method of making same
EP3015182A4 (en) DEVICE AND METHOD FOR PRODUCING A THIN-SUBSTRATED SUBSTRATE
HK1204506A1 (en) Semiconductor device and manufacturing method of semiconductor device
HK1198783A1 (en) Method of manufacturing semiconductor device and semiconductor device
EP3031789A4 (en) Circuit substrate and semiconductor device
SG11201605303XA (en) Silicon wafer pre-alignment device and method therefor
HK1198562A1 (en) Method of manufacturing semiconductor device, and semiconductor device
HK1219347A1 (zh) 半導體裝置及其製造方法
SG11201509734YA (en) Semiconductor wafer protective film and method of manufacturing semiconductor device
EP2955748A4 (en) SEMICONDUCTOR COMPONENT AND METHOD FOR THE PRODUCTION THEREOF
HK1202704A1 (en) Manufacturing method of semiconductor device
EP2966676A4 (en) SILICON CARBIDE SEMICONDUCTOR ELEMENT AND MANUFACTURING METHOD THEREFOR
SG11201505833XA (en) Semiconductor device inspection device and semiconductor device inspection method
SG11201508291QA (en) Semiconductor device and method for manufacturing semiconductor device
EP2991108A4 (en) Semiconductor device and method of manufacture thereof
SG11201510008UA (en) Semiconductor device and manufacturing method therefor