HK1124392A1 - Exposed conductor system and method for sensing an electron beam - Google Patents

Exposed conductor system and method for sensing an electron beam

Info

Publication number
HK1124392A1
HK1124392A1 HK09101711.7A HK09101711A HK1124392A1 HK 1124392 A1 HK1124392 A1 HK 1124392A1 HK 09101711 A HK09101711 A HK 09101711A HK 1124392 A1 HK1124392 A1 HK 1124392A1
Authority
HK
Hong Kong
Prior art keywords
sensing
electron beam
exposed conductor
conductor system
exposed
Prior art date
Application number
HK09101711.7A
Other languages
English (en)
Inventor
Lars Aake Naeslund
Hans Hallstadius
Anders Kristiansson
Olsson Anders Hedse
Original Assignee
Tetra Laval Holdings & Finance
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tetra Laval Holdings & Finance filed Critical Tetra Laval Holdings & Finance
Publication of HK1124392A1 publication Critical patent/HK1124392A1/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J33/00—Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
    • H01J33/02—Details
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61L—METHODS OR APPARATUS FOR STERILISING MATERIALS OR OBJECTS IN GENERAL; DISINFECTION, STERILISATION OR DEODORISATION OF AIR; CHEMICAL ASPECTS OF BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES; MATERIALS FOR BANDAGES, DRESSINGS, ABSORBENT PADS OR SURGICAL ARTICLES
    • A61L2/00—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor
    • A61L2/02—Methods or apparatus for disinfecting or sterilising materials or objects other than foodstuffs or contact lenses; Accessories therefor using physical phenomena
    • A61L2/08—Radiation
    • A61L2/087—Particle radiation, e.g. electron-beam, alpha or beta radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means

Landscapes

  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Plasma Technology (AREA)
  • Electron Sources, Ion Sources (AREA)
HK09101711.7A 2005-10-26 2009-02-23 Exposed conductor system and method for sensing an electron beam HK1124392A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/258,212 US7375345B2 (en) 2005-10-26 2005-10-26 Exposed conductor system and method for sensing an electron beam
PCT/SE2006/001146 WO2007050007A1 (en) 2005-10-26 2006-10-10 Exposed conductor system and method for sensing an electron beam

Publications (1)

Publication Number Publication Date
HK1124392A1 true HK1124392A1 (en) 2009-07-10

Family

ID=37968045

Family Applications (1)

Application Number Title Priority Date Filing Date
HK09101711.7A HK1124392A1 (en) 2005-10-26 2009-02-23 Exposed conductor system and method for sensing an electron beam

Country Status (8)

Country Link
US (1) US7375345B2 (xx)
EP (1) EP1943542B1 (xx)
JP (1) JP4729626B2 (xx)
CN (1) CN101297218B (xx)
BR (1) BRPI0617798A2 (xx)
HK (1) HK1124392A1 (xx)
RU (1) RU2407040C2 (xx)
WO (1) WO2007050007A1 (xx)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007107211A1 (de) * 2006-03-20 2007-09-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur eigenschaftsänderung dreidimensionaler formteile mittels elektronen
SE530019C2 (sv) * 2006-06-14 2008-02-12 Tetra Laval Holdings & Finance Sensor samt system för avkänning av en elektronstråle
JP5106284B2 (ja) * 2008-07-16 2012-12-26 パイオニア株式会社 撮像装置
US20100148065A1 (en) * 2008-12-17 2010-06-17 Baxter International Inc. Electron beam sterilization monitoring system and method
DE102009018210C5 (de) 2009-04-21 2022-08-18 Khs Gmbh Verfahren und Vorrichtung zur Überwachung der Intensität eines Elektronenstrahles
US8981316B2 (en) 2010-04-02 2015-03-17 Abbott Cardiovascular Systems Inc. Radiation sterilization of implantable medical devices
JP6078537B2 (ja) * 2011-07-04 2017-02-08 テトラ・ラヴァル・ホールディングス・アンド・ファイナンス・ソシエテ・アノニムＴｅｔｒａ Ｌａｖａｌ Ｈｏｌｄｉｎｇｓ ＆ Ｆｉｎａｎｃｅ Ｓ．Ａ． 冷却フランジを具備する電子ビーム放射器、当該放射器を備えた充填装置、当該放射器を冷却する方法、および当該冷却方法を備えた殺菌方法
JP6024500B2 (ja) * 2012-03-21 2016-11-16 Ｊｆｅエンジニアリング株式会社 アレイ型粒子線照射装置及びその制御方法
DE102012106379A1 (de) * 2012-07-16 2014-01-30 Krones Ag Messvorrichtung und Messverfahren für Behältnissterilisation
WO2014086675A2 (en) * 2012-12-03 2014-06-12 Tetra Laval Holdings & Finance S.A. Device and method for irradiating packaging containers with electron beam
EP2755052A1 (en) 2013-01-10 2014-07-16 Tetra Laval Holdings & Finance S.A. Device for monitoring an electron beam via bremsstrahlung imaging
EP2737909A1 (en) * 2012-12-03 2014-06-04 Tetra Laval Holdings & Finance S.A. Device and method for irradiating packaging containers with electron beam
JP6893879B2 (ja) 2014-11-18 2021-06-23 テトラ ラバル ホールディングス アンド ファイナンス エス エイ 低電圧電子ビームの線量計装置及び方法
CN106653528B (zh) * 2016-12-29 2019-01-29 清华大学 阴极组件及具有该阴极组件的x射线光源与ct设备
CN111741773B (zh) * 2018-02-19 2022-09-13 利乐拉瓦尔集团及财务有限公司 灭菌装置、具有灭菌装置的用于生产密封包装的包装机和用于灭菌的方法
US10751549B2 (en) * 2018-07-18 2020-08-25 Kenneth Hogstrom Passive radiotherapy intensity modulator for electrons
JP2022507900A (ja) * 2018-11-23 2022-01-18 テトラ ラバル ホールディングス アンド ファイナンス エス エイ 照射源用の測定ツール及び放射線を測定する方法
KR20230087241A (ko) * 2021-12-09 2023-06-16 주식회사 탑 엔지니어링 검사장치 및 이를 이용한 검사방법

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DE19502439B4 (de) * 1994-02-11 2007-08-16 Oc Oerlikon Balzers Ag Verfahren und Messanordnung zum Messen der pro Zeiteinheit einen Vakuumvolumenbereich in gegebener Richtung durchströmenden elektrischen Ladungsmenge und deren Verwendung für Massenspektrometer
DE4429925C1 (de) 1994-08-23 1995-11-23 Roentdek Handels Gmbh Verfahren und Detektoreinrichtung zur elektronischen positionsbezogenen Erfassung von Strahlung
US5672878A (en) * 1996-10-24 1997-09-30 Siemens Medical Systems Inc. Ionization chamber having off-passageway measuring electrodes
JP3212553B2 (ja) * 1998-04-23 2001-09-25 株式会社東京カソード研究所 微小径電子線検出子及びアノード電極の微小孔生成方法
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DE10232230A1 (de) * 2002-07-17 2004-02-05 Pro-Beam Ag & Co. Kgaa Verfahren zum Vermessen des Intensitätsprofils eines Elektronenstrahls, insbesondere eines Strahls eines Elektronenstrahlbearbeitungsgeräts, und/oder zum Vermessen einer Optik für einen Elektronenstrahl und/oder zum Justieren einer Optik für einen Elektronenstrahl, Meßstruktur für ein solches Verfahren und Elektronenstrahlbearbeitungsgerät
US6919570B2 (en) 2002-12-19 2005-07-19 Advanced Electron Beams, Inc. Electron beam sensor

Also Published As

Publication number Publication date
US7375345B2 (en) 2008-05-20
JP4729626B2 (ja) 2011-07-20
BRPI0617798A2 (pt) 2011-08-09
RU2407040C2 (ru) 2010-12-20
WO2007050007A1 (en) 2007-05-03
US20070114432A1 (en) 2007-05-24
RU2008120666A (ru) 2009-12-10
EP1943542A4 (en) 2016-11-09
EP1943542B1 (en) 2020-02-26
JP2009513972A (ja) 2009-04-02
CN101297218A (zh) 2008-10-29
EP1943542A1 (en) 2008-07-16
CN101297218B (zh) 2012-01-25

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20151010