HK1122862A1 - Oscillating scanning probe with constant contact force - Google Patents

Oscillating scanning probe with constant contact force

Info

Publication number
HK1122862A1
HK1122862A1 HK08113968.3A HK08113968A HK1122862A1 HK 1122862 A1 HK1122862 A1 HK 1122862A1 HK 08113968 A HK08113968 A HK 08113968A HK 1122862 A1 HK1122862 A1 HK 1122862A1
Authority
HK
Hong Kong
Prior art keywords
contact force
scanning probe
constant contact
oscillating scanning
oscillating
Prior art date
Application number
HK08113968.3A
Other languages
English (en)
Inventor
Pascal Jordil
Bo Pettersson
Siercks Knut
Original Assignee
Hexagon Metrology Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hexagon Metrology Ab filed Critical Hexagon Metrology Ab
Publication of HK1122862A1 publication Critical patent/HK1122862A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00—Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002—Details
    • G01B3/008—Arrangements for controlling the measuring force
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
HK08113968.3A 2007-04-03 2008-12-24 Oscillating scanning probe with constant contact force HK1122862A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP07105559.4A EP1978328B1 (en) 2007-04-03 2007-04-03 Oscillating scanning probe with constant contact force

Publications (1)

Publication Number Publication Date
HK1122862A1 true HK1122862A1 (en) 2009-05-29

Family

ID=38982708

Family Applications (1)

Application Number Title Priority Date Filing Date
HK08113968.3A HK1122862A1 (en) 2007-04-03 2008-12-24 Oscillating scanning probe with constant contact force

Country Status (5)

Country Link
US (1) US7779553B2 (xx)
EP (1) EP1978328B1 (xx)
JP (1) JP2008256696A (xx)
CN (1) CN101281011B (xx)
HK (1) HK1122862A1 (xx)

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Also Published As

Publication number Publication date
JP2008256696A (ja) 2008-10-23
EP1978328A1 (en) 2008-10-08
CN101281011A (zh) 2008-10-08
US20080249737A1 (en) 2008-10-09
CN101281011B (zh) 2012-12-05
EP1978328B1 (en) 2015-02-18
US7779553B2 (en) 2010-08-24

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20170402