HK1078934A1 - Wrist joint for positioning a test head - Google Patents

Wrist joint for positioning a test head

Info

Publication number
HK1078934A1
HK1078934A1 HK06101559.5A HK06101559A HK1078934A1 HK 1078934 A1 HK1078934 A1 HK 1078934A1 HK 06101559 A HK06101559 A HK 06101559A HK 1078934 A1 HK1078934 A1 HK 1078934A1
Authority
HK
Hong Kong
Prior art keywords
load
positioning
test head
wrist joint
areas
Prior art date
Application number
HK06101559.5A
Other languages
English (en)
Inventor
Henri M Akouka
Christopher L West
Charles Nappen
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of HK1078934A1 publication Critical patent/HK1078934A1/xx

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/02—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
    • B25J9/04—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
    • B25J9/041—Cylindrical coordinate type
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/0004—Gripping heads and other end effectors with provision for adjusting the gripped object in the hand
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00—Gripping heads and other end effectors
    • B25J15/0019—End effectors other than grippers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T403/00—Joints and connections
    • Y10T403/32—Articulated members
    • Y10T403/32008—Plural distinct articulation axes

Landscapes

  • Engineering & Computer Science (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Pivots And Pivotal Connections (AREA)
  • Manipulator (AREA)
  • Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Microscoopes, Condenser (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Finger-Pressure Massage (AREA)
  • Adornments (AREA)
HK06101559.5A 2003-01-28 2006-02-06 Wrist joint for positioning a test head HK1078934A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44298803P 2003-01-28 2003-01-28
PCT/US2004/002103 WO2004070400A1 (fr) 2003-01-28 2004-01-26 Articulation de poignet pour positionner une tete d'essai

Publications (1)

Publication Number Publication Date
HK1078934A1 true HK1078934A1 (en) 2006-03-24

Family

ID=32850764

Family Applications (1)

Application Number Title Priority Date Filing Date
HK06101559.5A HK1078934A1 (en) 2003-01-28 2006-02-06 Wrist joint for positioning a test head

Country Status (10)

Country Link
US (1) US8444107B2 (fr)
EP (1) EP1601980B1 (fr)
JP (1) JP4791350B2 (fr)
CN (1) CN1745310B (fr)
AT (1) ATE493666T1 (fr)
DE (2) DE602004030768D1 (fr)
HK (1) HK1078934A1 (fr)
MY (1) MY144275A (fr)
TW (1) TWI266056B (fr)
WO (1) WO2004070400A1 (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2273279A1 (fr) * 2005-04-27 2011-01-12 Aehr Test Systems, Inc. Appareil pour tester des dispositifs électroniques
DE102005019564B4 (de) * 2005-04-27 2007-10-31 Hubertus Heigl Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung
TWI490513B (zh) * 2006-12-29 2015-07-01 Intest Corp 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
WO2013063674A1 (fr) 2011-11-04 2013-05-10 Titan Medical Inc. Appareil et procédé de commande d'un ensemble effecteur terminal
WO2013063675A1 (fr) 2011-11-04 2013-05-10 Titan Medical Inc. Appareil et procédé de commande d'un ensemble effecteur terminal
EP2785267B1 (fr) * 2011-11-30 2022-01-12 Titan Medical Inc. Appareil et procédé destinés à supporter un bras robotique
WO2013141869A1 (fr) * 2012-03-22 2013-09-26 Satterfield Johnny A Ensemble bras vidéo
TWI836645B (zh) 2016-01-08 2024-03-21 美商艾爾測試系統 測試器設備及測試微電子裝置的方法
EP4290243A3 (fr) 2017-03-03 2024-02-28 AEHR Test Systems Testeur électronique
CN112376686B (zh) * 2021-01-05 2021-09-14 安徽一品小院建筑科技有限公司 一种装配式混凝土结构通用钢榫连接节点及其施工方法
TWI770993B (zh) * 2021-05-07 2022-07-11 南亞科技股份有限公司 測試裝置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2481717A (en) * 1946-03-19 1949-09-13 Blair Hosea Tilting tripod head
US4194437A (en) 1978-03-09 1980-03-25 Rosheim Mark E Hydraulic servo mechanism
IT1162493B (it) * 1979-10-22 1987-04-01 Sante Zelli Perfezionamenti ai dispositivi di rullaggio per le vie di corsa di veicoli particolarmente per carrelli per riprese cinetelevisive
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
EP0188613A1 (fr) * 1984-08-07 1986-07-30 Klaus Walter Systeme a bras oscillants
JPH048655Y2 (fr) * 1984-11-14 1992-03-04
JPH04101763U (ja) * 1991-02-12 1992-09-02 株式会社椿本チエイン 吊下搬送装置のハンガー傾動機構
JPH08168480A (ja) * 1994-12-19 1996-07-02 Toshiba Corp Ｘ線診断装置
JP3618136B2 (ja) 1995-04-03 2005-02-09 株式会社日立メディコ Ｘ線ｃｔ装置
JPH09238931A (ja) 1996-03-13 1997-09-16 Toshiba Corp Ｘ線診断装置
US5971348A (en) * 1996-10-03 1999-10-26 Corning Incorporated Adjustable stand for a cantilevered load
US6023173A (en) * 1997-04-30 2000-02-08 Credence Systems Corporation Manipulator with expanded range of motion
US5821440A (en) * 1997-04-30 1998-10-13 Credence Systems Corporation Cable tray assembly for testing device
WO2000044530A1 (fr) * 1999-01-29 2000-08-03 Intertool Machines Ltd. Affuteur universel a deux supports incurves
DE29906613U1 (de) * 1999-04-14 2000-08-24 Merten Gmbh & Co Kg Fernbedienungsgerät
US6837125B1 (en) * 1999-07-14 2005-01-04 Teradyne, Inc. Automatic test manipulator with support internal to test head
US6838868B1 (en) * 2000-11-07 2005-01-04 Teradyne, Inc. Test head actuation system with positioning and compliant modes
JP2002159480A (ja) * 2000-11-22 2002-06-04 Hitachi Medical Corp 医用ｘ線装置
US6940273B2 (en) * 2001-07-05 2005-09-06 Cornelia Heigl Handling device, especially for positioning a test head on a testing device
US6828774B2 (en) * 2002-02-27 2004-12-07 Teradyne, Inc. Rear-mounted gimbal for supporting test head

Also Published As

Publication number Publication date
WO2004070400A1 (fr) 2004-08-19
EP1601980A1 (fr) 2005-12-07
MY144275A (en) 2011-08-29
EP1601980B1 (fr) 2010-12-29
TWI266056B (en) 2006-11-11
CN1745310A (zh) 2006-03-08
JP2006516733A (ja) 2006-07-06
US20060255222A1 (en) 2006-11-16
WO2004070400B1 (fr) 2004-11-25
DE602004030768D1 (de) 2011-02-10
ATE493666T1 (de) 2011-01-15
TW200506371A (en) 2005-02-16
CN1745310B (zh) 2010-10-13
DE04705321T1 (de) 2006-08-31
JP4791350B2 (ja) 2011-10-12
US8444107B2 (en) 2013-05-21

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20150126