HK1044820A1 - Method and apparatus for testing a video display chip. - Google Patents

Method and apparatus for testing a video display chip.

Info

Publication number
HK1044820A1
HK1044820A1 HK02106113A HK02106113A HK1044820A1 HK 1044820 A1 HK1044820 A1 HK 1044820A1 HK 02106113 A HK02106113 A HK 02106113A HK 02106113 A HK02106113 A HK 02106113A HK 1044820 A1 HK1044820 A1 HK 1044820A1
Authority
HK
Hong Kong
Prior art keywords
testing
video display
display chip
chip
video
Prior art date
Application number
HK02106113A
Other languages
English (en)
Inventor
Saroj Pathak
James E Payne
Glen A Rosendale
Nianglamching Hangzo
Original Assignee
Atmel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp filed Critical Atmel Corp
Publication of HK1044820A1 publication Critical patent/HK1044820A1/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/31855—Interconnection testing, e.g. crosstalk, shortcircuits
HK02106113A 1999-06-15 2002-08-21 Method and apparatus for testing a video display chip. HK1044820A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/333,805 US6115305A (en) 1999-06-15 1999-06-15 Method and apparatus for testing a video display chip
PCT/US2000/014189 WO2000077529A2 (en) 1999-06-15 2000-05-23 Method and apparatus for testing a video display chip

Publications (1)

Publication Number Publication Date
HK1044820A1 true HK1044820A1 (en) 2002-11-01

Family

ID=23304333

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02106113A HK1044820A1 (en) 1999-06-15 2002-08-21 Method and apparatus for testing a video display chip.

Country Status (11)

Country Link
US (1) US6115305A (zh)
EP (1) EP1192475A2 (zh)
JP (1) JP2003502787A (zh)
KR (1) KR20020013525A (zh)
CN (1) CN1171095C (zh)
CA (1) CA2365956A1 (zh)
HK (1) HK1044820A1 (zh)
MY (1) MY136005A (zh)
NO (1) NO20015197D0 (zh)
TW (1) TW490676B (zh)
WO (1) WO2000077529A2 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100390353B1 (ko) * 2000-12-14 2003-07-12 주식회사 아이오복스 레이저를 이용한 지하철 광고 시스템
US7075285B2 (en) * 2004-05-12 2006-07-11 Richard Chin Delay locked loop circuit and method for testing the operability of the circuit
TWI436080B (zh) * 2011-09-20 2014-05-01 Au Optronics Corp 檢測電路、顯示面板的驅動晶片、顯示模組以及傳輸介面的檢測方法
JP6162679B2 (ja) * 2014-12-19 2017-07-12 ファナック株式会社 コモン信号の故障箇所を検出するマトリクス回路
US9947712B2 (en) * 2016-01-27 2018-04-17 Varex Imaging Corporation Matrix type integrated circuit with fault isolation capability
JP6653593B2 (ja) * 2016-02-29 2020-02-26 パナソニック液晶ディスプレイ株式会社 表示装置及び表示装置の検査方法
JP7280874B2 (ja) * 2018-06-01 2023-05-24 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子、撮像装置、および、固体撮像素子の制御方法
CN111897155B (zh) * 2020-09-03 2023-04-11 业成科技（成都）有限公司 阵列基板及显示面板
CN116157694A (zh) * 2020-11-26 2023-05-23 华为技术有限公司 控制电路及其控制方法、集成电路芯片

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4654827A (en) * 1984-08-14 1987-03-31 Texas Instruments Incorporated High speed testing of semiconductor memory devices
JP2653550B2 (ja) * 1990-11-14 1997-09-17 三菱電機株式会社 固体撮像素子
JP2792634B2 (ja) * 1991-06-28 1998-09-03 シャープ株式会社 アクティブマトリクス基板の検査方法
JPH05274895A (ja) * 1992-03-26 1993-10-22 Nec Ic Microcomput Syst Ltd 半導体記憶装置
JP3086936B2 (ja) * 1993-05-12 2000-09-11 セイコーインスツルメンツ株式会社 光弁装置
US5392248A (en) * 1993-10-26 1995-02-21 Texas Instruments Incorporated Circuit and method for detecting column-line shorts in integrated-circuit memories
JP3530574B2 (ja) * 1994-05-20 2004-05-24 株式会社ルネサステクノロジ 半導体記憶装置
TW331599B (en) * 1995-09-26 1998-05-11 Toshiba Co Ltd Array substrate for LCD and method of making same
US5684809A (en) * 1996-05-02 1997-11-04 Micron Technology, Inc. Semiconductor memory with test circuit
US5748545A (en) * 1997-04-03 1998-05-05 Aplus Integrated Circuits, Inc. Memory device with on-chip manufacturing and memory cell defect detection capability
JPH1139898A (ja) * 1997-07-14 1999-02-12 Mitsubishi Electric Corp 半導体装置

Also Published As

Publication number Publication date
TW490676B (en) 2002-06-11
CA2365956A1 (en) 2000-12-21
WO2000077529A2 (en) 2000-12-21
CN1171095C (zh) 2004-10-13
KR20020013525A (ko) 2002-02-20
WO2000077529B1 (en) 2001-08-16
EP1192475A2 (en) 2002-04-03
US6115305A (en) 2000-09-05
WO2000077529A3 (en) 2001-06-28
MY136005A (en) 2008-07-31
NO20015197L (no) 2001-10-24
CN1355889A (zh) 2002-06-26
JP2003502787A (ja) 2003-01-21
NO20015197D0 (no) 2001-10-24

Similar Documents

Publication Publication Date Title
EP1163656A4 (en) METHOD AND APPARATUS FOR USING DISPLAY DEVICE AND DISPLAY CONDITION INFORMATION
GB2364726B (en) Method and apparatus for continuously testing a well
EP1079365A4 (en) PROCESS AND DEVICE FOR PROJECTION DISPLAY
GB2368130B (en) Method and apparatus for testing a well
IL178074A0 (en) Method and device for displaying image data
GB2326788B (en) Method for displaying TV programme progress time and device thereof.
GB9930787D0 (en) Method and apparatus for convrerting data streams
EP1117088A4 (en) IMAGE DISPLAY APPARATUS AND METHOD, AND IMAGE PROCESSING DEVICE AND METHOD
AU5878000A (en) Device and method for assessing cardiovascular function
HK1096191A1 (en) Method and apparatus for rendering video
HK1040120A1 (zh) 產生信息摘要的方法和裝置
EP1243929A4 (en) OPERATION CONTROL DEVICE AND DISTRIBUTOR CONTROL METHOD
HK1008595A1 (en) Display device, electronic device and method for manufacturing electronic device.
AU2982800A (en) Apparatus and methods for capturing defect data
HK1035234A1 (en) Method and apparatus for local time display
HK1055873A1 (en) Method and apparatus for simultaneous recording and displaying two different video programs
IL147743A0 (en) Method and apparatus for presenting video data obtained from a network
HK1055875A1 (en) Method and apparatus for simultaneous recording and displaying two different video programs
AU2581501A (en) Method and apparatus for device input identification
AU2542701A (en) Method and apparatus for displaying video
GB2385363B (en) An apparatus and method for coupling two elements
AU7783900A (en) Data processing method and apparatus for a display device
HK1044820A1 (en) Method and apparatus for testing a video display chip.
HK1051765A1 (en) A method and apparatus for video decoding.
EP1179250A4 (en) METHOD AND APPARATUS FOR CONTROLLING COMMUNICATED DATA

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20100523