HK1044386A1 - 利用內地總線協定通過任意長度的總線同步器 - Google Patents

利用內地總線協定通過任意長度的總線同步器

Info

Publication number
HK1044386A1
HK1044386A1 HK02104509.4A HK02104509A HK1044386A1 HK 1044386 A1 HK1044386 A1 HK 1044386A1 HK 02104509 A HK02104509 A HK 02104509A HK 1044386 A1 HK1044386 A1 HK 1044386A1
Authority
HK
Hong Kong
Prior art keywords
bus protocol
arbitrary lengths
native bus
synchronous busses
extending synchronous
Prior art date
Application number
HK02104509.4A
Other languages
English (en)
Inventor
L Truebenbach Eric
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of HK1044386A1 publication Critical patent/HK1044386A1/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31722—Addressing or selecting of test units, e.g. transmission protocols for selecting test units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4004—Coupling between buses
    • G06F13/4027—Coupling between buses using bus bridges
    • G06F13/4045—Coupling between buses using bus bridges where the bus bridge performs an extender function
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Debugging And Monitoring (AREA)
  • Bus Control (AREA)
  • Information Transfer Systems (AREA)
HK02104509.4A 1999-07-15 2002-06-19 利用內地總線協定通過任意長度的總線同步器 HK1044386A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/354,137 US6507920B1 (en) 1999-07-15 1999-07-15 Extending synchronous busses by arbitrary lengths using native bus protocol
PCT/US2000/018726 WO2001006369A1 (en) 1999-07-15 2000-07-10 Extending synchronous busses by arbitrary lengths using native bus protocol

Publications (1)

Publication Number Publication Date
HK1044386A1 true HK1044386A1 (zh) 2002-10-18

Family

ID=23392018

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02104509.4A HK1044386A1 (zh) 1999-07-15 2002-06-19 利用內地總線協定通過任意長度的總線同步器

Country Status (10)

Country Link
US (1) US6507920B1 (zh)
EP (1) EP1200895B1 (zh)
JP (1) JP4272833B2 (zh)
KR (1) KR100684130B1 (zh)
AU (1) AU775255B2 (zh)
CA (1) CA2379694C (zh)
DE (1) DE60005528T2 (zh)
HK (1) HK1044386A1 (zh)
IL (1) IL147616A0 (zh)
WO (1) WO2001006369A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6769035B1 (en) * 2000-04-07 2004-07-27 Infineon Technologies North America Corp. Same single board computer system operable as a system master and a bus target
JP2006330945A (ja) * 2005-05-25 2006-12-07 Matsushita Electric Ind Co Ltd デバイスの遠隔監視・修復システム
US8745337B2 (en) * 2007-12-31 2014-06-03 Teradyne, Inc. Apparatus and method for controlling memory overrun
KR101520055B1 (ko) * 2013-07-31 2015-05-19 에스케이하이닉스 주식회사 프로그래머블 로직을 이용한 메모리 테스트 왕복 시간 계산 장치
TWI525451B (zh) * 2014-07-21 2016-03-11 緯創資通股份有限公司 儲存系統及其資料傳輸方法
KR102392844B1 (ko) 2017-03-10 2022-05-03 삼성전자주식회사 메모리 컨트롤러 및 그것을 포함하는 저장 장치
US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
KR102563047B1 (ko) * 2021-09-14 2023-08-04 테크위드유 주식회사 효율적 채널 제어를 지원하는 프로브카드 용 pmic와 신호용 스위치 ｉｃ

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US772134A (en) 1899-12-27 1904-10-11 Everett D Chadwick Dry-pipe valve.
US2187315A (en) 1938-11-23 1940-01-16 Gerald G Greulich Bearing pile construction
US4718064A (en) * 1986-02-28 1988-01-05 Western Digital Corporation Automatic test system
JPH0624846A (ja) 1992-07-08 1994-02-01 Sumitomo Electric Ind Ltd 炭素繊維強化炭素複合材料の製造方法
JP3608804B2 (ja) * 1993-05-14 2005-01-12 株式会社ソニー・コンピュータエンタテインメント バス制御装置
US5507029A (en) * 1995-01-11 1996-04-09 International Business Machines Corporation Method for minimizing the time skew of electrical signals in very large scale integrated circuits
TW299404B (en) * 1995-11-02 1997-03-01 Ibm Adapter card slot isolation for hot plugging
US5893135A (en) * 1995-12-27 1999-04-06 Intel Corporation Flash memory array with two interfaces for responding to RAS and CAS signals
US5793987A (en) * 1996-04-18 1998-08-11 Cisco Systems, Inc. Hot plug port adapter with separate PCI local bus and auxiliary bus
US5857083A (en) 1996-06-07 1999-01-05 Yamaha Corporation Bus interfacing device for interfacing a secondary peripheral bus with a system having a host CPU and a primary peripheral bus
US5991844A (en) * 1998-04-17 1999-11-23 Adaptec, Inc. Redundant bus bridge systems and methods using selectively synchronized clock signals
US6070214A (en) 1998-08-06 2000-05-30 Mobility Electronics, Inc. Serially linked bus bridge for expanding access over a first bus to a second bus

Also Published As

Publication number Publication date
AU5924300A (en) 2001-02-05
AU775255B2 (en) 2004-07-22
IL147616A0 (en) 2002-08-14
US6507920B1 (en) 2003-01-14
JP4272833B2 (ja) 2009-06-03
KR100684130B1 (ko) 2007-02-16
EP1200895B1 (en) 2003-09-24
CA2379694C (en) 2007-02-13
DE60005528D1 (de) 2003-10-30
KR20020015375A (ko) 2002-02-27
CA2379694A1 (en) 2001-01-25
DE60005528T2 (de) 2004-07-08
JP2003505761A (ja) 2003-02-12
WO2001006369A1 (en) 2001-01-25
EP1200895A1 (en) 2002-05-02

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