HK1039521B - 直觀檢查隱藏焊縫的設備和方法 - Google Patents
直觀檢查隱藏焊縫的設備和方法Info
- Publication number
- HK1039521B HK1039521B HK02101279.8A HK02101279A HK1039521B HK 1039521 B HK1039521 B HK 1039521B HK 02101279 A HK02101279 A HK 02101279A HK 1039521 B HK1039521 B HK 1039521B
- Authority
- HK
- Hong Kong
- Prior art keywords
- lens head
- image
- deviation
- illuminating device
- optical inspection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/08—Testing mechanical properties
- G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0817—Monitoring of soldering processes
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Operations Research (AREA)
- General Health & Medical Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Instruments For Viewing The Inside Of Hollow Bodies (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Endoscopes (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19847913A DE19847913B4 (de) | 1998-10-19 | 1998-10-19 | Vorrichtung und Verfahren zur optischen Inspektion insbesondere verdeckter Lötverbindungen |
PCT/DE1999/002617 WO2000023844A1 (de) | 1998-10-19 | 1999-08-20 | Vorrichtung und verfahren zur optischen inspektion verdeckter lötverbindungen |
Publications (2)
Publication Number | Publication Date |
---|---|
HK1039521A1 HK1039521A1 (en) | 2002-04-26 |
HK1039521B true HK1039521B (zh) | 2005-04-29 |
Family
ID=7884793
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK02101279.8A HK1039521B (zh) | 1998-10-19 | 2002-02-21 | 直觀檢查隱藏焊縫的設備和方法 |
Country Status (16)
Country | Link |
---|---|
US (1) | US6580501B2 (zh) |
EP (1) | EP1123525B2 (zh) |
JP (1) | JP4030693B2 (zh) |
KR (1) | KR100620448B1 (zh) |
CN (1) | CN1166973C (zh) |
AT (1) | ATE221210T1 (zh) |
AU (1) | AU752862B2 (zh) |
BR (1) | BR9913735A (zh) |
CA (1) | CA2346914C (zh) |
DE (2) | DE19847913B4 (zh) |
DK (1) | DK1123525T4 (zh) |
ES (1) | ES2178485T5 (zh) |
HK (1) | HK1039521B (zh) |
MX (1) | MXPA01002436A (zh) |
PT (1) | PT1123525E (zh) |
WO (1) | WO2000023844A1 (zh) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4063469B2 (ja) * | 2000-03-10 | 2008-03-19 | 株式会社ハイロックス | 超微小空隙から内部を観察するための装置 |
KR100454216B1 (ko) * | 2001-10-22 | 2004-10-26 | 한전기공주식회사 | 측정게이지 조명장치 |
US6788406B2 (en) * | 2001-11-02 | 2004-09-07 | Delaware Capital Formation, Inc. | Device and methods of inspecting soldered connections |
US6847900B2 (en) * | 2001-12-17 | 2005-01-25 | Agilent Technologies, Inc. | System and method for identifying solder joint defects |
US7231833B2 (en) * | 2003-04-01 | 2007-06-19 | Intel Corporation | Board deflection metrology using photoelectric amplifiers |
JP3953988B2 (ja) * | 2003-07-29 | 2007-08-08 | Tdk株式会社 | 検査装置および検査方法 |
US7356936B1 (en) | 2004-01-14 | 2008-04-15 | Honda Motor Co., Ltd. | Apparatus and method for measuring coating accumulations in a spray booth |
DE102006003931B3 (de) * | 2006-01-26 | 2007-08-02 | Infineon Technologies Ag | Halbleiterbauteil mit oberflächenmontierbaren Außenkontakten und Verfahren zur Herstellung desselben |
US7643136B2 (en) * | 2006-02-02 | 2010-01-05 | Optilia Instrument Ab | Device for inspection of narrow spaces and objects in narrow spaces |
US8068228B2 (en) | 2007-08-07 | 2011-11-29 | Nanometrics Incorporated | In-plane optical metrology |
CN102770214B (zh) * | 2009-12-04 | 2014-08-20 | 巴里克黄金公司 | 使用空气-偏亚硫酸氢盐处理从黄铁矿中分离铜矿物 |
CN102183357B (zh) * | 2010-10-21 | 2012-11-14 | 中国人民银行印制科学技术研究所 | 防伪元件隐藏图像明暗区域对比度的检测方法与装置 |
JP6242078B2 (ja) * | 2013-05-20 | 2017-12-06 | オリンパス株式会社 | 半導体装置、および半導体装置の位置決め装置 |
CN104283144A (zh) * | 2013-07-01 | 2015-01-14 | 北京电研华源电力技术有限公司 | 一种观测环网柜隔离开关断口的方法及装置 |
CN105826787B (zh) * | 2016-05-09 | 2018-08-28 | 莱芜钢铁集团有限公司 | 滑线巡点检用工具 |
DE102023105796A1 (de) * | 2023-03-08 | 2024-09-12 | Göpel electronic GmbH | Lotspaltmessung an Bauteilen auf automatisch optisch zu prüfenden Leiterplatten |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE7440701U (de) | 1975-04-30 | Richard Wolf Gmbh | Endoskop, insbesondere Laryngoskop und Epipharyngoskop | |
US3021834A (en) * | 1954-03-11 | 1962-02-20 | Sheldon Edward Emanuel | Endoscopes |
JPS5389451A (en) * | 1977-01-18 | 1978-08-07 | Olympus Optical Co Ltd | Endoscope visual field direction changing attachment optical system |
JPS54154759U (zh) * | 1978-04-20 | 1979-10-27 | ||
JPS60247106A (ja) * | 1984-05-22 | 1985-12-06 | Fujitsu Ltd | 形状検査装置 |
US4699463A (en) † | 1985-11-01 | 1987-10-13 | Circon Corporation | Multidirectional viewing borescope |
US4727859A (en) * | 1986-12-29 | 1988-03-01 | Welch Allyn, Inc. | Right angle detachable prism assembly for borescope |
US4846154A (en) * | 1988-06-13 | 1989-07-11 | Macanally Richard B | Dual view endoscope |
FR2633360B1 (fr) † | 1988-06-22 | 1993-01-08 | Valeo | Dispositif amortisseur de torsion, notamment pour vehicule automobile |
JPH03215704A (ja) * | 1990-01-19 | 1991-09-20 | Fujitsu Ltd | バンプ検査装置 |
JPH0447255A (ja) * | 1990-06-15 | 1992-02-17 | Hitachi Ltd | 電子部品の微細接続検査装置 |
JPH0452614A (ja) * | 1990-06-20 | 1992-02-20 | Olympus Optical Co Ltd | 内視鏡 |
US5052802A (en) * | 1990-07-24 | 1991-10-01 | Hewlett-Packard Company | Device for viewing beneath circuit boards |
JPH0690362B2 (ja) * | 1991-04-08 | 1994-11-14 | 三菱電線工業株式会社 | ファイバスコープ |
JPH0694429A (ja) * | 1991-06-24 | 1994-04-05 | Mitsubishi Electric Corp | 表面実装部品半田付外観検査方法 |
DE4207874C2 (de) * | 1992-03-12 | 2002-12-12 | Fraunhofer Ges Forschung | Visuelle Kontrolleinrichtung |
US5295477A (en) † | 1992-05-08 | 1994-03-22 | Parviz Janfaza | Endoscopic operating microscope |
DE4304422C1 (de) * | 1993-02-13 | 1994-07-21 | Winter & Ibe Olympus | Endoskop |
JP3398754B2 (ja) * | 1993-02-20 | 2003-04-21 | ティーディーケイ株式会社 | 集積回路チップ浮き上がり検査装置 |
US5613936A (en) * | 1995-02-22 | 1997-03-25 | Concurrent Technologies Corp. | Stereo laparoscope apparatus |
US5644438A (en) * | 1995-10-30 | 1997-07-01 | Pottash; Paul C. | Optical device for viewing into restricted areas |
DE29603327U1 (de) * | 1996-02-16 | 1996-04-18 | Schich, Gisbert, 91522 Ansbach | Endoskop zur Rohrinnenwandprüfung |
DE19830710B4 (de) * | 1997-08-01 | 2010-10-28 | Carl Zeiss | Endoskop |
KR100278477B1 (ko) * | 1997-10-24 | 2001-03-02 | 윤종용 | 광학현미경 |
DE29805624U1 (de) * | 1998-03-27 | 1998-06-04 | Drendel, Andrea, 14532 Kleinmachnow | Beleuchtung für Staboptikendoskope und flexible Glasfaserendoskope in medizinischen und technischen Bereichen |
DE29806922U1 (de) * | 1998-04-17 | 1998-06-18 | Schich, Gisbert, 91522 Ansbach | Endoskop mit zwei Blickrichtungen |
-
1998
- 1998-10-19 DE DE19847913A patent/DE19847913B4/de not_active Expired - Lifetime
-
1999
- 1999-08-20 KR KR1020017004264A patent/KR100620448B1/ko not_active IP Right Cessation
- 1999-08-20 CN CNB998121738A patent/CN1166973C/zh not_active Expired - Fee Related
- 1999-08-20 MX MXPA01002436A patent/MXPA01002436A/es active IP Right Grant
- 1999-08-20 DK DK99953551T patent/DK1123525T4/da active
- 1999-08-20 CA CA002346914A patent/CA2346914C/en not_active Expired - Fee Related
- 1999-08-20 AU AU10277/00A patent/AU752862B2/en not_active Ceased
- 1999-08-20 AT AT99953551T patent/ATE221210T1/de active
- 1999-08-20 WO PCT/DE1999/002617 patent/WO2000023844A1/de active IP Right Grant
- 1999-08-20 BR BR9913735-6A patent/BR9913735A/pt not_active Application Discontinuation
- 1999-08-20 DE DE59902144T patent/DE59902144D1/de not_active Expired - Lifetime
- 1999-08-20 ES ES99953551T patent/ES2178485T5/es not_active Expired - Lifetime
- 1999-08-20 PT PT99953551T patent/PT1123525E/pt unknown
- 1999-08-20 EP EP99953551A patent/EP1123525B2/de not_active Expired - Lifetime
- 1999-09-10 JP JP25741599A patent/JP4030693B2/ja not_active Expired - Fee Related
-
2001
- 2001-05-25 US US09/866,400 patent/US6580501B2/en not_active Expired - Fee Related
-
2002
- 2002-02-21 HK HK02101279.8A patent/HK1039521B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ES2178485T3 (es) | 2002-12-16 |
BR9913735A (pt) | 2001-06-05 |
WO2000023844A1 (de) | 2000-04-27 |
HK1039521A1 (en) | 2002-04-26 |
AU752862B2 (en) | 2002-10-03 |
US6580501B2 (en) | 2003-06-17 |
EP1123525B1 (de) | 2002-07-24 |
CA2346914C (en) | 2008-02-05 |
DE19847913A1 (de) | 1999-05-06 |
JP4030693B2 (ja) | 2008-01-09 |
DK1123525T3 (da) | 2002-11-11 |
DE19847913B4 (de) | 2005-09-22 |
CN1323407A (zh) | 2001-11-21 |
CN1166973C (zh) | 2004-09-15 |
ATE221210T1 (de) | 2002-08-15 |
CA2346914A1 (en) | 2000-04-27 |
JP2000131029A (ja) | 2000-05-12 |
EP1123525A1 (de) | 2001-08-16 |
EP1123525B2 (de) | 2007-02-14 |
US20010024273A1 (en) | 2001-09-27 |
DK1123525T4 (da) | 2007-04-02 |
MXPA01002436A (es) | 2002-05-08 |
PT1123525E (pt) | 2002-11-29 |
ES2178485T5 (es) | 2007-10-01 |
KR100620448B1 (ko) | 2006-09-05 |
KR20010085882A (ko) | 2001-09-07 |
DE59902144D1 (de) | 2002-08-29 |
AU1027700A (en) | 2000-05-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20140820 |