HK1035400A1 - Apparatus for guiding x-rays. - Google Patents

Apparatus for guiding x-rays.

Info

Publication number
HK1035400A1
HK1035400A1 HK01105756A HK01105756A HK1035400A1 HK 1035400 A1 HK1035400 A1 HK 1035400A1 HK 01105756 A HK01105756 A HK 01105756A HK 01105756 A HK01105756 A HK 01105756A HK 1035400 A1 HK1035400 A1 HK 1035400A1
Authority
HK
Hong Kong
Prior art keywords
rays
guiding
slit
forming
radiation source
Prior art date
Application number
HK01105756A
Other languages
English (en)
Inventor
Volker Rossiger
Original Assignee
Helmut Fischer Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer Gmbh & Co filed Critical Helmut Fischer Gmbh & Co
Publication of HK1035400A1 publication Critical patent/HK1035400A1/xx

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Radiation-Therapy Devices (AREA)
  • X-Ray Techniques (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
HK01105756A 1999-11-12 2001-08-16 Apparatus for guiding x-rays. HK1035400A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19954520A DE19954520A1 (de) 1999-11-12 1999-11-12 Vorrichtung zur Führung von Röntgenstrahlen

Publications (1)

Publication Number Publication Date
HK1035400A1 true HK1035400A1 (en) 2001-11-23

Family

ID=7928847

Family Applications (1)

Application Number Title Priority Date Filing Date
HK01105756A HK1035400A1 (en) 1999-11-12 2001-08-16 Apparatus for guiding x-rays.

Country Status (7)

Country Link
US (1) US6438209B1 (xx)
EP (1) EP1100092B1 (xx)
JP (1) JP2001201599A (xx)
CN (1) CN1202416C (xx)
AT (1) ATE333702T1 (xx)
DE (2) DE19954520A1 (xx)
HK (1) HK1035400A1 (xx)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60035876T2 (de) 2000-09-27 2008-05-08 Euratom Mikrostrahl-Kollimator für Hochauflösungs-Röntgenstrahl-Beugungsanalyse mittels konventionellen Diffraktometern
JP2007304063A (ja) * 2006-05-15 2007-11-22 Shimadzu Corp ソーラスリット
JP2013528804A (ja) * 2010-05-19 2013-07-11 シルヴァー，エリック，エイチ ハイブリッドｘ線光学機器および方法
EP3115809B1 (en) * 2015-07-06 2021-04-28 Exruptive A/S A method of security scanning of carry-on items, and a security scanning system of carry-on items
US10765383B2 (en) * 2015-07-14 2020-09-08 Koninklijke Philips N.V. Imaging with enhanced x-ray radiation
DE102022105838B3 (de) 2022-03-14 2023-08-17 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Justiereinheit für eine Röntgenoptik in einem Röntgenfluoreszenzgerät sowie Röntgenfluoreszenzgerät

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02501338A (ja) * 1986-08-15 1990-05-10 コモンウェルス　サイエンティフィック　アンド　インダストリアル　リサーチ　オーガナイゼイション Ｘ線ビームもしくは中性子ビーム調節用計装装置
US4958363A (en) * 1986-08-15 1990-09-18 Nelson Robert S Apparatus for narrow bandwidth and multiple energy x-ray imaging
GB2217036B (en) * 1988-03-11 1992-08-12 Rosser Roy J Saddle toroid mirrors
US5001737A (en) * 1988-10-24 1991-03-19 Aaron Lewis Focusing and guiding X-rays with tapered capillaries
US5101422A (en) * 1990-10-31 1992-03-31 Cornell Research Foundation, Inc. Mounting for X-ray capillary
JPH0727946B2 (ja) * 1993-03-25 1995-03-29 東和科学株式会社 表面異物分析用ウエハ及びウエハ表面の金属不純物の評価方法
US5744813A (en) * 1994-07-08 1998-04-28 Kumakhov; Muradin Abubekirovich Method and device for controlling beams of neutral and charged particles
DE59700582D1 (de) * 1996-01-10 1999-11-25 Bastian Niemann Kondensor-monochromator-anordnung für röntgenstrahlung
JPH10221500A (ja) * 1997-02-03 1998-08-21 Olympus Optical Co Ltd 軟ｘ線検査装置
JP3771697B2 (ja) * 1997-11-01 2006-04-26 株式会社堀場製作所 螢光ｘ線分析装置

Also Published As

Publication number Publication date
JP2001201599A (ja) 2001-07-27
ATE333702T1 (de) 2006-08-15
DE19954520A1 (de) 2001-05-17
EP1100092A3 (de) 2003-03-26
EP1100092A2 (de) 2001-05-16
CN1202416C (zh) 2005-05-18
EP1100092B1 (de) 2006-07-19
CN1296178A (zh) 2001-05-23
DE50013184D1 (de) 2006-08-31
US6438209B1 (en) 2002-08-20

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Legal Events

Date Code Title Description
CHRG Changes in the register

Free format text: CORRECTION OF THE ENGLISH NAME OF APPLICANT/PROPRIETOR FROM HELMUT FISCHER GMBH + CO. INSTITUT FUR ELEKTRONIK UND MASSTECHNIK TO HELMUT FISCHER GMBH + CO. INSTITUT FUR ELEKTRONIK UND MESSTECHNIK

PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20191110