GB9516803D0 - Radiation source for a measuring system - Google Patents

Radiation source for a measuring system

Info

Publication number
GB9516803D0
GB9516803D0 GBGB9516803.5A GB9516803A GB9516803D0 GB 9516803 D0 GB9516803 D0 GB 9516803D0 GB 9516803 A GB9516803 A GB 9516803A GB 9516803 D0 GB9516803 D0 GB 9516803D0
Authority
GB
United Kingdom
Prior art keywords
radiation source
measuring system
measuring
radiation
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB9516803.5A
Other versions
GB2292479A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Draegerwerk AG and Co KGaA
Original Assignee
Draegerwerk AG and Co KGaA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Draegerwerk AG and Co KGaA filed Critical Draegerwerk AG and Co KGaA
Publication of GB9516803D0 publication Critical patent/GB9516803D0/en
Publication of GB2292479A publication Critical patent/GB2292479A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/0225—Out-coupling of light
    • H01S5/02257—Out-coupling of light using windows, e.g. specially adapted for back-reflecting light to a detector inside the housing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
    • H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/06804—Stabilisation of laser output parameters by monitoring an external parameter, e.g. temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
    • H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
GB9516803A 1994-08-19 1995-08-16 Spectroscopic system using surface emission laser Withdrawn GB2292479A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4429582A DE4429582C2 (en) 1994-08-19 1994-08-19 Radiation source for a measuring system

Publications (2)

Publication Number Publication Date
GB9516803D0 true GB9516803D0 (en) 1995-10-18
GB2292479A GB2292479A (en) 1996-02-21

Family

ID=6526177

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9516803A Withdrawn GB2292479A (en) 1994-08-19 1995-08-16 Spectroscopic system using surface emission laser

Country Status (2)

Country Link
DE (1) DE4429582C2 (en)
GB (1) GB2292479A (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1051067A (en) * 1996-04-29 1998-02-20 Motorola Inc Reflection type power monitoring system for vertical cavity surface emission laser
DE19717145C2 (en) * 1997-04-23 1999-06-02 Siemens Ag Method for the selective detection of gases and gas sensor for its implementation
GB2327297A (en) * 1997-07-14 1999-01-20 Mitel Semiconductor Ab Lens cap
JP3343680B2 (en) * 1999-07-12 2002-11-11 日本酸素株式会社 Laser spectrometer
DE10063678A1 (en) * 2000-12-20 2002-07-18 Siemens Ag Method for the selective detection of gases using laser spectroscopy
US20040190571A1 (en) * 2001-03-08 2004-09-30 Stephen Sutton Wavelength stabilised laser source
GB0105651D0 (en) * 2001-03-08 2001-04-25 Siemens Plc Temperature stabilised laser diode and gas reference package
US6868104B2 (en) * 2001-09-06 2005-03-15 Finisar Corporation Compact laser package with integrated temperature control
JP2008513736A (en) * 2004-09-14 2008-05-01 フラウンホーファー・ゲゼルシャフト ツア フェルデルンク デア アンゲヴァンテン フォルシュンク エー．ファウ． Equipment for measuring one or more types of gas components
DE102007039317A1 (en) * 2007-08-20 2009-02-26 Ses-Entwicklung Gmbh Method and device for the exact and regulated center of gravity adjustment of the emitted radiation of a light-emitting diode
DE102009033979A1 (en) * 2009-07-16 2011-01-20 Schmidt & Haensch Gmbh & Co. Device for focusing wavelength adjustment of emitted optical radiation
WO2019116660A1 (en) * 2017-12-15 2019-06-20 株式会社堀場製作所 Semiconductor laser device, and method and program for driving semiconductor laser device

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55148482A (en) * 1979-05-08 1980-11-19 Canon Inc Semiconductor laser device
US4730112A (en) * 1986-03-07 1988-03-08 Hibshman Corporation Oxygen measurement using visible radiation
DE3633931A1 (en) * 1986-10-04 1988-04-07 Kernforschungsz Karlsruhe METHOD AND DEVICE FOR CONTINUOUSLY MEASURING THE CONCENTRATION OF A GAS COMPONENT
DE8915890U1 (en) * 1989-10-26 1992-01-16 Messerschmitt-Boelkow-Blohm Gmbh, 8012 Ottobrunn, De
DE4110095C2 (en) * 1991-03-27 1998-02-12 Draegerwerk Ag Method for gas spectroscopic measurement of the concentration of a gas component
DE4122572A1 (en) * 1991-07-08 1993-01-14 Draegerwerk Ag METHOD FOR OPERATING A LASER DIODE
US5325386A (en) * 1992-04-21 1994-06-28 Bandgap Technology Corporation Vertical-cavity surface emitting laser assay display system
DE4216508A1 (en) * 1992-05-19 1993-11-25 Ortwin Dr Brandt IR analysis of solids via selective gasification - allows measurements of discrete rotational and vibrational spectral lines e.g. determn. of carbon sulphur in sample of iron as carbon- and sulphur di:oxide(s)
DE4235768A1 (en) * 1992-10-24 1994-05-19 Cho Ok Kyung Modified semiconductor laser diode with integrated temperature control part
US5311526A (en) * 1993-02-25 1994-05-10 At&T Bell Laboratories Article that comprises a semiconductor laser, and method of operating the article

Also Published As

Publication number Publication date
GB2292479A (en) 1996-02-21
DE4429582A1 (en) 1996-02-22
DE4429582C2 (en) 1998-02-26

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)