HK1024560A1 - Apparatus for coupling a test head and probe card in a wafer testing system. - Google Patents
Apparatus for coupling a test head and probe card in a wafer testing system.Info
- Publication number
- HK1024560A1 HK1024560A1 HK00103404A HK00103404A HK1024560A1 HK 1024560 A1 HK1024560 A1 HK 1024560A1 HK 00103404 A HK00103404 A HK 00103404A HK 00103404 A HK00103404 A HK 00103404A HK 1024560 A1 HK1024560 A1 HK 1024560A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- coupling
- probe card
- testing system
- test head
- wafer testing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/126,267 US6259260B1 (en) | 1998-07-30 | 1998-07-30 | Apparatus for coupling a test head and probe card in a wafer testing system |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1024560A1 true HK1024560A1 (en) | 2000-10-13 |
Family
ID=22423906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK00103404A HK1024560A1 (en) | 1998-07-30 | 2000-06-05 | Apparatus for coupling a test head and probe card in a wafer testing system. |
Country Status (9)
Country | Link |
---|---|
US (1) | US6259260B1 (xx) |
EP (1) | EP0977045B1 (xx) |
JP (1) | JP2000058604A (xx) |
KR (1) | KR20000012098A (xx) |
CN (1) | CN1159757C (xx) |
DE (1) | DE69924194T2 (xx) |
HK (1) | HK1024560A1 (xx) |
SG (1) | SG110994A1 (xx) |
TW (1) | TW526328B (xx) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE20114544U1 (de) * | 2000-12-04 | 2002-02-21 | Cascade Microtech Inc | Wafersonde |
US20030011390A1 (en) * | 2001-07-09 | 2003-01-16 | Smith Douglas W. | Interface apparatus for integrated circuit testing |
JP2004205487A (ja) * | 2002-11-01 | 2004-07-22 | Tokyo Electron Ltd | プローブカードの固定機構 |
US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
DE202004021093U1 (de) | 2003-12-24 | 2006-09-28 | Cascade Microtech, Inc., Beaverton | Aktiver Halbleiterscheibenmessfühler |
US7595629B2 (en) * | 2004-07-09 | 2009-09-29 | Formfactor, Inc. | Method and apparatus for calibrating and/or deskewing communications channels |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
KR100704394B1 (ko) * | 2006-04-12 | 2007-04-09 | 리노공업주식회사 | 양면 사용 칩 테스트 소켓 |
DE202007018733U1 (de) * | 2006-06-09 | 2009-03-26 | Cascade Microtech, Inc., Beaverton | Messfühler für differentielle Signale mit integrierter Symmetrieschaltung |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7403028B2 (en) * | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US20080106292A1 (en) * | 2006-11-02 | 2008-05-08 | Corad Technology, Inc. | Probe card having cantilever probes |
CN101329366B (zh) * | 2007-06-22 | 2011-03-30 | 旺矽科技股份有限公司 | 一种探针短路防止结构的制作方法 |
CN101404830B (zh) * | 2008-11-11 | 2011-10-26 | 上海尚兰格暖芯科技有限公司 | 装配式穿刺连接电极 |
JP5438691B2 (ja) * | 2009-01-08 | 2014-03-12 | 株式会社アドバンテスト | 試験装置 |
EP2237052A1 (en) | 2009-03-31 | 2010-10-06 | Capres A/S | Automated multi-point probe manipulation |
CN103529252B (zh) * | 2013-10-18 | 2016-09-28 | 上海华力微电子有限公司 | 直插式通用电气连接装置 |
JP2020504309A (ja) * | 2017-01-12 | 2020-02-06 | フォームファクター, インコーポレイテッド | 垂直プローブヘッドのシールド |
WO2019046419A1 (en) * | 2017-08-30 | 2019-03-07 | Formfactor, Inc. | VERTICAL PROBE ARRANGEMENT COMPRISING A SPACE TRANSFORMER WITH MEMBRANE JUXTAPOSÉ |
TWI626453B (zh) * | 2017-09-29 | 2018-06-11 | 中華精測科技股份有限公司 | 探針組件及其空間轉換介面板 |
CN113504468B (zh) * | 2021-09-13 | 2022-02-08 | 苏州华兴源创科技股份有限公司 | 一种用于按键组件的检测设备 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3731191A (en) * | 1969-12-22 | 1973-05-01 | Ibm | Micro-miniature probe assembly |
US3968433A (en) * | 1974-08-22 | 1976-07-06 | Lawrence Peska Associates, Inc. | Fixture for testing flatpack modules |
US4668041A (en) | 1985-04-19 | 1987-05-26 | Intel Corporation | Low noise test contacts for pin grid array |
EP0369554B1 (en) | 1987-03-11 | 1994-07-13 | Hewlett-Packard Company | Apparatus for automatically scrubbing a surface |
US4967147A (en) | 1988-05-26 | 1990-10-30 | Zehntel, Inc. | Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies |
US5081415A (en) | 1990-08-07 | 1992-01-14 | United Microelectronics Corporation | Load board insertion system |
KR100248571B1 (ko) | 1992-08-31 | 2000-03-15 | 히가시 데쓰로 | 프로우브 장치 |
US5371654A (en) | 1992-10-19 | 1994-12-06 | International Business Machines Corporation | Three dimensional high performance interconnection package |
US5489853A (en) | 1993-05-19 | 1996-02-06 | Tokyo Electron Limited | Testing apparatus and connection method for the testing apparatus |
US5451883A (en) | 1994-04-07 | 1995-09-19 | Vlsi | Spring probe contactor with device stop for testing PGA devices and method therefor |
US5546405A (en) | 1995-07-17 | 1996-08-13 | Advanced Micro Devices, Inc. | Debug apparatus for an automated semiconductor testing system |
US5656943A (en) | 1995-10-30 | 1997-08-12 | Motorola, Inc. | Apparatus for forming a test stack for semiconductor wafer probing and method for using the same |
US5923178A (en) * | 1997-04-17 | 1999-07-13 | Cerprobe Corporation | Probe assembly and method for switchable multi-DUT testing of integrated circuit wafers |
-
1998
- 1998-07-30 US US09/126,267 patent/US6259260B1/en not_active Expired - Fee Related
-
1999
- 1999-07-29 DE DE69924194T patent/DE69924194T2/de not_active Expired - Fee Related
- 1999-07-29 EP EP99306010A patent/EP0977045B1/en not_active Expired - Lifetime
- 1999-07-29 SG SG9903659A patent/SG110994A1/en unknown
- 1999-07-30 KR KR1019990031260A patent/KR20000012098A/ko not_active Application Discontinuation
- 1999-07-30 CN CNB991116429A patent/CN1159757C/zh not_active Expired - Fee Related
- 1999-07-30 JP JP11218172A patent/JP2000058604A/ja not_active Withdrawn
- 1999-10-05 TW TW088113000A patent/TW526328B/zh not_active IP Right Cessation
-
2000
- 2000-06-05 HK HK00103404A patent/HK1024560A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0977045A2 (en) | 2000-02-02 |
CN1159757C (zh) | 2004-07-28 |
DE69924194D1 (de) | 2005-04-21 |
EP0977045A3 (en) | 2000-05-24 |
US6259260B1 (en) | 2001-07-10 |
TW526328B (en) | 2003-04-01 |
JP2000058604A (ja) | 2000-02-25 |
KR20000012098A (ko) | 2000-02-25 |
SG110994A1 (en) | 2005-05-30 |
CN1248063A (zh) | 2000-03-22 |
DE69924194T2 (de) | 2005-08-11 |
EP0977045B1 (en) | 2005-03-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20080730 |