AU2001291552A1 - Method and system for testing and/or diagnosing circuits using test controller access data - Google Patents

Method and system for testing and/or diagnosing circuits using test controller access data

Info

Publication number
AU2001291552A1
AU2001291552A1 AU2001291552A AU9155201A AU2001291552A1 AU 2001291552 A1 AU2001291552 A1 AU 2001291552A1 AU 2001291552 A AU2001291552 A AU 2001291552A AU 9155201 A AU9155201 A AU 9155201A AU 2001291552 A1 AU2001291552 A1 AU 2001291552A1
Authority
AU
Australia
Prior art keywords
testing
access data
test controller
controller access
diagnosing circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001291552A
Inventor
Martin J. Bell
Givargis A. Danialy
Michael C. Howells
Charles Mc Donald
Stephen V. Pateras
Stephen K. Sunter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LogicVision Inc
Original Assignee
LogicVision Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LogicVision Inc filed Critical LogicVision Inc
Publication of AU2001291552A1 publication Critical patent/AU2001291552A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
AU2001291552A 2000-09-28 2001-09-14 Method and system for testing and/or diagnosing circuits using test controller access data Abandoned AU2001291552A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CA002321346A CA2321346A1 (en) 2000-09-28 2000-09-28 Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data
CA2321346 2000-09-28
PCT/CA2001/001296 WO2002027340A2 (en) 2000-09-28 2001-09-14 Method and system for testing and/or diagnosing circuits using test controller access data

Publications (1)

Publication Number Publication Date
AU2001291552A1 true AU2001291552A1 (en) 2002-04-08

Family

ID=4167265

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001291552A Abandoned AU2001291552A1 (en) 2000-09-28 2001-09-14 Method and system for testing and/or diagnosing circuits using test controller access data

Country Status (5)

Country Link
US (1) US6961871B2 (en)
JP (1) JP2004509425A (en)
AU (1) AU2001291552A1 (en)
CA (1) CA2321346A1 (en)
WO (1) WO2002027340A2 (en)

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Also Published As

Publication number Publication date
US6961871B2 (en) 2005-11-01
WO2002027340A2 (en) 2002-04-04
CA2321346A1 (en) 2002-03-28
WO2002027340A3 (en) 2002-05-16
US20020073374A1 (en) 2002-06-13
JP2004509425A (en) 2004-03-25

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